1. Field of the Invention
The present invention relates to a connector, and more particularly to a probe connector.
2. The Related Art
Probe connectors are mainly used in mobile phones for electrically connecting with cards or batteries received in the mobile phones. A conventional probe connector generally includes an insulating housing and a plurality of probe pin assemblies mounted in the insulating housing. The probe pin assembly includes a cylindraceous barrel having a bottom plate closing one end mouth thereof, a spring received in the barrel, a probe of which a bottom end is movably inserted in the barrel and designed with a receiving hole for receiving a top of the spring therein. A top end of the probe is stretched outside from the other open end mouth of the barrel for contacting an external device.
However, the probes of the probe connector need to be separately made by a turning process. As a result, it is hard to hold the probe in the process of electroplating the probe on account of the probe being small size that causes the probe easily to drop and results in a great loss of the probe. Furthermore, the receiving hole of the probe is often so small that it hard to clean the receiving hole and electroplate periphery inner sides of the receiving hole. As a result, the receiving hole of the probe is often amassed by grease therein or has a poor electroplate effect on the periphery inner sides thereof. It further results in low production efficiency and poor product yield of the probe connector.
An object of the present invention is to provide a probe connector which includes an insulating housing and a plurality of probe pin assemblies. The insulating housing defines a plurality of accommodating cavities each penetrating through a rear side of the insulating housing, and a plurality of receiving cavities each penetrating through a front side of the insulating housing and connected with a front of one accommodating cavity. A blocking rib is protruded at the junction of the accommodating cavity and the receiving cavity. A top wall of each accommodating cavity is provided with an inserting slot penetrating through the rear side of the insulating housing and further connected with the receiving cavity. The probe pin assembly includes a probe curved from a metal board and having a first base board, a second base board and an arched contact head connecting two ends of the first base board and the second base board to make the first base board and the second base board apart face each other in parallel. The other end of the first base board is perpendicularly bent downward to form a resisting board, and further has two opposite side edges thereof extended downward and then face-to-face protruded to form a pair of blocking boards. The end of the probe with the blocking boards is disposed in the accommodating cavity, and the contact head retractably stretches forward out of the receiving cavity, wherein the blocking boards can be blocked by the blocking rib to prevent the probe from sliding out of the receiving cavity. A terminal has a base plate blocking a rear end of the accommodating cavity. A bottom edge of the base plate is bent rearward to form a soldering tail projected behind the insulating housing. A top edge of the base plate extends forward to form an elastic arm fastened in the inserting slot. A free end of the elastic arm stretches into the receiving cavity and is further arched downward to form a contact portion electrically abutting against the first base board. An elastic element is received in the accommodating cavity and retractably located between the resisting board of the probe and the base plate of the terminal.
As described above, the probe is punched or curved from the metal board. So, the probe can be mass-produced by means of successively punching the metal boards apart arranged to a side edge of a material belt, with the resisting board being connected with the side edge of the material belt after processing the probe. Furthermore, the probe can be punched without a receiving hole shown in the prior art. Therefore, the probe can be electroplated continuously to realize a good electric conductivity and further improve production efficiency of the probe connector.
The present invention will be apparent to those skilled in the art by reading the following description thereof, with reference to the attached drawings, in which:
With reference to
The insulating housing 10 is of a rectangular shape, and defines a plurality of inserting passages 11 arranged side by side along a transverse direction thereof and each extending longitudinally to penetrate through the insulating housing 10. The inserting passage 11 includes an accommodating cavity 111 penetrating through a rear side of the insulating housing 10, and a receiving cavity 112 penetrating through a front side of the insulating housing 10 and connected with a front of the accommodating cavity 111. A blocking rib 113 is protruded at the junction of the accommodating cavity 111 and the receiving cavity 112. A top side of the insulating housing 10 defines a plurality of receiving fillisters 14 arranged apart along the transverse direction thereof and each further extending downward to be connected with a top of one receiving cavity 112. A top wall of each accommodating cavity 111 is provided with an inserting slot 12 extending longitudinally to penetrate through the rear side of the insulating housing 10 and having a longitudinal middle thereof connected with a top of the accommodating cavity 111. The inserting slot 12 is further connected with the receiving cavity 112. Two opposite side walls of each accommodating cavity 111 are provided with a pair of fastening slots 13 each extending longitudinally to penetrate through the rear side of the insulating housing 10.
Referring to
The probe 40 is curved from a metal board and has a long rectangular first base board 41, a long rectangular second base board 45, and an arched contact head 43 connecting two end edges of the first base board 41 and the second base board 45 to make the first base board 41 and the second base board 45 apart face each other in parallel. The other end edge of the first base board 41 extends downward to form a resisting board 42 perpendicular to the first base board 41 and facing the contact head 43. The end of the first base board 41 adjacent to the resisting board 42 has two opposite side edges thereof extended downward and then face-to-face protruded to form a pair of blocking boards 44. In this embodiment, the elastic element 30 is a spring.
Referring to
In use, the contact head 43 of the probe 40 electrically connects with external mating contact (not shown) and is gradually pressed inward by the mating contact so as to further compress the elastic element 30 by virtue of the resisting board 42 of the probe 40. Accordingly, the elastic element 30 reflects an elasticity force back to the resisting board 42 of the probe 40 to make the contact head 43 of the probe 40 steadily connected with the mating contact.
As described above, the probe 40 of the probe connector 100 is punched or curved from the metal board. So, the probe 40 can be mass-produced by means of successively punching the metal boards apart arranged to a side edge of a material belt (not shown), with the resisting board 42 being connected with the side edge of the material belt after processing the probe 40. Furthermore, the probe 40 is punched without a receiving hole shown in the prior art. Therefore, the probe 40 can be electroplated continuously to realize a good electric conductivity and further improve the production efficiency of the probe connector 100.
The foregoing description of the present invention has been presented for the purposes of illustration and description. It is not intended to be exhaustive or to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. Such modifications and variations that may be apparent to those skilled in the art are intended to be included within the scope of this invention as defined by the accompanying claims.
Number | Name | Date | Kind |
---|---|---|---|
6814626 | Wen-Yao | Nov 2004 | B2 |
7134878 | Zheng et al. | Nov 2006 | B2 |