Probe for measuring electrical characteristics

Information

  • Patent Grant
  • D1024815
  • Patent Number
    D1,024,815
  • Date Filed
    Tuesday, April 26, 2022
    2 years ago
  • Date Issued
    Tuesday, April 30, 2024
    9 months ago
  • US Classifications
    Field of Search
    • US
    • D10 78
    • D10 80
    • D10 102
    • D10 103
    • CPC
    • G01R1/07314
    • G01R1/06761
    • G01R1/06766
    • G01R1/06772
    • G01R1/06
    • G01R1/067
    • G01R1/06705
    • G01R1/06711
    • G01R1/06716
    • G01R1/06722
    • G01R1/06727
    • G01R1/06733
    • G01R1/06738
    • G01R1/06744
    • G01R1/0675
    • G01R1/06777
    • G01R1/06783
    • G01R1/06788
    • G01R1/06794
    • G01R1/07
    • G01R1/071
    • G01R1/072
    • G01R3/00
    • G01R31/2886
    • G01R31/2887
    • G01R31/2889
    • G01R31/2891
    • H05K3/4007
    • H01L23/544
    • H01L2223/54473
    • H01L2924/00
    • H01L2924/0002
    • H01R2201/20
  • International Classifications
    • 1004
    • Term of Grant
      15Years
Abstract
Description


FIG. 1 is a perspective view of a probe for measuring electrical characteristics showing my new design;



FIG. 2 is a front view thereof, the rear view being a mirror image thereof;



FIG. 3 is a right side view thereof, the left side view being a mirror image thereof;



FIG. 4 is a top view thereof;



FIG. 5 is a bottom view thereof;



FIG. 6 is a cross-sectional view thereof taken along line 6-6 in FIG. 2;



FIG. 7 is an enlarged cross-sectional view thereof taken along line 7-7 in FIG. 2; and,



FIG. 8 is an enlarged cross-sectional view thereof taken along line 8-8 in FIG. 2.


The dashed broken lines illustrate portions of the probe for measuring electrical characteristics that form no part of the claimed design. The dot-dash broken lines define boundaries of the claimed design and form no part thereof.


Claims
  • The ornamental design for a probe for measuring electrical characteristics, as shown and described.
Priority Claims (1)
Number Date Country Kind
2021-024968 D Nov 2021 JP national
US Referenced Citations (3)
Number Name Date Kind
D827459 Matsumiya et al. Sep 2018 S
11639945 Jeong May 2023 B2
11719720 Wei Aug 2023 B2
Foreign Referenced Citations (5)
Number Date Country
305059488 Mar 2019 CN
D1445607 Jul 2012 JP
D1635839 Jul 2019 JP
D1716912 Jun 2022 JP
D198372 Jul 2019 TW
Non-Patent Literature Citations (1)
Entry
Anonymous, “Contact probe / checker pin,” SK Koki Co., Ltd., accessed Jul. 2022, pp. 1-6, Available at: http://www.sk-kohki.co.jp/content.php?tp=n&c1=12.