Probe for testing device under test

Information

  • Patent Grant
  • D983681
  • Patent Number
    D983,681
  • Date Filed
    Friday, May 28, 2021
    3 years ago
  • Date Issued
    Tuesday, April 18, 2023
    a year ago
Abstract
Description


FIG. 1 is a perspective view of a first embodiment of a probe according to our design;



FIG. 2 is an enlarged, broken away perspective view taken along line A-A on FIG. 1;



FIG. 3 is an enlarged, broken away front view taken along line A-A on FIG. 1;



FIG. 4 is an enlarged, broken away rear view taken along line A-A on FIG. 1;



FIG. 5 is an enlarged left side elevational view of the first embodiment of the probe shown in FIG. 1;



FIG. 6 is an enlarged right side elevational view of the first embodiment of the probe shown in FIG. 1;



FIG. 7 is an enlarged, broken away top plan view taken along line A-A on FIG. 1;



FIG. 8 is an enlarged, broken away bottom plan view taken along line A-A on FIG. 1;



FIG. 9 is another enlarged, broken away perspective view taken along line A-A on FIG. 1;



FIG. 10 is a perspective view of a second embodiment of a probe according to our design;



FIG. 11 is an enlarged, broken away perspective view taken along line B-B on FIG. 10;



FIG. 12 is an enlarged, broken away front view taken along line B-B on FIG. 10;



FIG. 13 is an enlarged, broken away rear view taken along line B-B on FIG. 10;



FIG. 14 is an enlarged left side elevational view of the second embodiment of the probe shown in FIG. 10;



FIG. 15 is an enlarged right side elevational view of the second embodiment of the probe shown in FIG. 10;



FIG. 16 is an enlarged, broken away top plan view taken along line B-B on FIG. 10;



FIG. 17 is an enlarged, broken away bottom plan view taken along line B-B on FIG. 10; and,



FIG. 18 is another enlarged, broken away perspective view taken along line B-B on FIG. 10.


The broken lines depict portions of the probe and form no part of the claimed design. The dash-dot-dash lines depict boundaries between claimed portion and unclaimed portion of the probe and form no part of the claimed design.


Claims
  • The ornamental design for a probe for testing a device under test, as shown and described.
Priority Claims (2)
Number Date Country Kind
109306822 Dec 2020 TW national
109306823 Dec 2020 TW national
US Referenced Citations (23)
Number Name Date Kind
D444721 Campbell Jul 2001 S
D445350 Bystrom Jul 2001 S
D756818 Hashimoto May 2016 S
D769747 Teranishi Oct 2016 S
D769748 Teranishi Oct 2016 S
D769749 Teranishi Oct 2016 S
D769751 Teranishi Oct 2016 S
D769752 Teranishi Oct 2016 S
D769753 Teranishi Oct 2016 S
D776551 Teranishi Jan 2017 S
D776552 Teranishi Jan 2017 S
D787351 Hashimoto May 2017 S
D787352 Hashimoto May 2017 S
D788614 Hashimoto Jun 2017 S
D788615 Teranishi Jun 2017 S
D788616 Teranishi Jun 2017 S
D789222 Hashimoto Jun 2017 S
D789223 Teranishi Jun 2017 S
D789224 Teranishi Jun 2017 S
D789225 Teranishi Jun 2017 S
D894025 Kaida Aug 2020 S
D904212 Symanczyk Dec 2020 S
20210373048 Chen Dec 2021 A1