The present invention relates to a probe pin cleaning sheet with cleaning power and a manufacturing method thereof, and more particularly to a probe pin cleaning sheet and a manufacturing method thereof.
In testing electronic components (such as, but not limited to, a final test (FT) or chip probing (CP)), it usually requires a probe pin to measure the electric properties. However, if there are impurities or scratches on the probe pin, the test results of the electronic components may be affected.
It is known that the foreign matters can be removed by piercing the tip of a probe pin into a cleaning part such as acrylic resin or polyurethane resin. Nevertheless, the shortcoming of this method is that the fragments of cleaning part will form new foreign matters that are adhered on the tip of probe pin, or the tip of probe pin may be damaged in piercing, which often results in that the tip of probe pin is worn out excessively or the cleaning cannot be done.
To solve the abovementioned issues, a cleaning sheet used to clean a probe card was developed and sold on the market (manufactured by the Nihon Micro Coating Co. Ltd., with the product name of MIPOX). The cleaning sheet is provided with a substrate of polyurethane and has a good buffering capacity. A surface of the substrate includes a polishing layer of fine abrasive powder, and the other surface of the substrate is an adhesive layer. Due to the adhesive layer, the cleaning sheet can be adhered on the substrate, such as a silicon chip, for use. Specifically, when the cleaning sheet is adhered on the substrate which is provided with the same shape and size as that of a semiconductor chip, the probe pin can press down and contact the surface of polishing layer to remove the foreign matters.
For the cleaning sheet used to remove the foreign matters attached on the tip of probe pin, a Japanese Patent Registration No. 3072423 and a Japanese Patent Publication No. 11-238768 have disclosed a cleaning sheet used to clean the tip of probe pin, including a cleaning thin film of fine abrasive powder fixed on the surface, an elastic sheet disposed below the cleaning thin film, and a substrate disposed below the elastic sheet. These reference documents also disclose a cleaning sheet used to clean the tip of probe pin. The structure of cleaning sheet includes a hard metallic thin film which replaces the fine abrasive cleaning thin film fixed on the surface to clean the tip of probe pin. The hard metallic thin film makes the surface rough, and the elastic sheet is made of silicon rubber and polyurethane rubber.
However, these conventional probe pin cleaning sheets cannot be used in normal temperature, high temperature or low temperature. In addition, as the probe pin can be easily damaged by a hard material, the tip of probe pin cannot be cleaned gently and very efficiently.
The object of present invention is to provide a probe pin cleaning sheet with cleaning power and a manufacturing method thereof, wherein foreign matters adhered on the tip and side of a probe pin are removed for cleaning by the contact with a cleaning layer. The cleaning sheet can be used in normal temperature, high temperature and low temperature. In addition, as the probe pin will not be damaged by a hard material, the tip of probe pin can be cleaned gently and very efficiently.
Accordingly, the probe pin cleaning sheet with cleaning power and the manufacturing method thereof include a release layer, a cleaning layer, and a substrate, wherein the release layer is disposed on a surface of the cleaning layer, the release layer can be a release film attached on a surface of the cleaning layer or a silicone coating coated on a surface of the cleaning layer, the substrate is disposed on the other surface of the cleaning layer, the cleaning layer is provided with a cleaning material, the cleaning material is formed by plural abrasive grains, each abrasive grain is formed by plural cleaning grains, the cleaning layer is made of silicone and is formed integrally with the cleaning material on the substrate, or is bonded with the substrate adhesively after being formed. Thus, in the process that the probe pin pierces the cleaning layer, through the material of cleaning layer, and the cleaning grains of abrasive material contained in the cleaning material in the cleaning layer, the cleaning power is increased to scrape off dirt from the surface of probe pin. In addition, by the negative charges and lipophilic property of the silicone itself, the dirt on the probe pin can be transferred onto the cleaning layer.
To enable a further understanding of the said objectives and the technological methods of the invention herein, the brief description of the drawings below is followed by the detailed description of the preferred embodiments.
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The release layer 10 is disposed on a surface of the cleaning layer 20, and can be a release film attached on a surface of the cleaning layer 20 or a silicone coating coated on a surface of the cleaning layer 20. The release layer 10 is used primarily to protect the surface of product in shipping.
The substrate 30 is disposed on the other surface of the cleaning layer 20. The cleaning layer 20 is provided with a cleaning material. The cleaning material is formed by plural abrasive grains 21, and each abrasive grain 21 is formed by plural cleaning grains 211. The cleaning layer 20 is made of silicone (silicone resin), and is formed integrally with the cleaning material on the substrate 30, so as to save the time in adhering for clients and prevent an adhesive layer from resulting in bubbles and peeling in high temperature. In addition, the cleaning layer 20 can be also bonded with the substrate 30 adhesively after being formed.
By the abovementioned structures, in the process that the probe pin 40 pierces the cleaning layer 20, through the material of cleaning layer 20, and the cleaning grains 211 of abrasive material contained in the cleaning material in the cleaning layer 20, the cleaning power is increased to scrape off dirt 41 from the surface of probe pin 40. In addition, by the negative charges and lipophilic property of the silicone itself, the dirt 41 on the probe pin 40 can be transferred onto the cleaning layer 20.
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As silicone can be pierced, when the probe pin 40 pierces through the surface of silicone, the silicone containing the abrasive material will wrap the probe pin 40, and the dirt 41 on the surface of probe pin 40 will be separated from the probe pin 40 by the friction between the silicone and the probe pin 40. This friction force results from the complex body of silicone and abrasive material. Then, by using the fact that the silicone itself carries the negative charges and is provided with the lipophilic property, the dirt 41 or oil stain will be transferred onto the contact surface between the silicone and the probe pin 40. In addition, as the abrasive material is filled in the elastic body, the direct abrasive force to the probe pin 40 will be controlled based upon the fill-in ratio of the abrasive material. If the fill-in ratio is high, the hardness of silicone and the abrasive force will be increased, but it will also result in a risk of wearing on the tip of probe pin 40 and powder falling off from the tip of probe pin 40. On the contrary, if the fill-in ratio is low, the cleaning power will be insufficient.
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In comparing with the prior art, the probe pin cleaning sheet with cleaning power and the manufacturing method of the probe pin cleaning sheet, provided by the present invention, are provided with following advantages that:
It is of course to be understood that the embodiments described herein is merely illustrative of the principles of the invention and that a wide variety of modifications thereto may be effected by persons skilled in the art without departing from the spirit and scope of the invention as set forth in the following claims.
Number | Date | Country | Kind |
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110144840 | Dec 2021 | TW | national |