The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.
The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.
Number | Date | Country | Kind |
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2016-003161 | Feb 2016 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
8715015 | Hwang | May 2014 | B2 |
9124012 | Sakai | Sep 2015 | B2 |
9130290 | Sakai | Sep 2015 | B2 |
9322846 | Sakai | Apr 2016 | B2 |
Entry |
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Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,441, filed Aug. 5, 2016, in the USPTO. |
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,446, filed Aug. 5, 2016, in the USPTO. |