Probe pin

Information

  • Patent Grant
  • D788616
  • Patent Number
    D788,616
  • Date Filed
    Friday, August 5, 2016
    7 years ago
  • Date Issued
    Tuesday, June 6, 2017
    7 years ago
  • US Classifications
    Field of Search
    • US
    • D10 78
    • D10 80
    • CPC
    • G01R1/067
    • G01R1/06705
    • G01R1/06711
    • G01R1/06716
    • G01R1/06722
    • G01R1/06727
    • G01R1/06733
    • G01R1/06738
    • G01R1/06744
    • G01R1/0675
    • G01R1/06766
    • G01R1/06772
    • G01R1/06777
    • G01R1/06783
    • G01R1/0678
  • International Classifications
    • 1004
    • Term of Grant
      15Years
Abstract
Description


FIG. 1 is a front, top, and right side perspective view of a probe pin showing our new design;



FIG. 2 is a front view thereof;



FIG. 3 is a rear view thereof;



FIG. 4 is a left side view thereof;



FIG. 5 is a right side view thereof;



FIG. 6 is a top view thereof; and,



FIG. 7 is a bottom view thereof.


The even broken lines shown in the figures illustrate portions of the probe pin that form no part of the claimed design. The uneven broken lines shown in the figures represent unclaimed boundaries.


Claims
  • The ornamental design for a probe pin, as shown and described.
Priority Claims (1)
Number Date Country Kind
2016-003161 Feb 2016 JP national
US Referenced Citations (4)
Number Name Date Kind
8715015 Hwang May 2014 B2
9124012 Sakai Sep 2015 B2
9130290 Sakai Sep 2015 B2
9322846 Sakai Apr 2016 B2
Non-Patent Literature Citations (2)
Entry
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,441, filed Aug. 5, 2016, in the USPTO.
Hirotada Teranishi et al., Probe Pin, Design U.S. Appl. No. 29/573,446, filed Aug. 5, 2016, in the USPTO.