Process and apparatus for producing krypton and/or xenon by low-temperature fractionation of air

Information

  • Patent Grant
  • 6612129
  • Patent Number
    6,612,129
  • Date Filed
    Thursday, October 31, 2002
    22 years ago
  • Date Issued
    Tuesday, September 2, 2003
    21 years ago
Abstract
In a process and apparatus used to produce krypton and/or xenon by low-temperature fractionation of air, compresses and clean charge air (1) is introduced into a rectification system for nitrogen-oxygen separation. The rectification system includes at least a high-pressure column (2) and a low-pressure column (3). A krypton- and xenon-containing fraction (13, 14, 15, 16) is removed from the high-pressure column (2) and introduced into the evaporation space of a condenser-evaporator (17), where it is partially evaporated. A purge liquid (26) is extracted from the evaporation space of the condenser-evaporator (17) and fed to a krypton-xenon enrichment column (24). A krypton-xenon concentrate (30) is removed from the krypton-xenon enrichment column (24). A liquid from the lower region of the krypton-xenon enrichment column (24) is introduced into a second condenser-evaporator (27), which is separate from the first condenser-evaporator (17).
Description




DESCRIPTION




The invention relates to a process which is used to produce krypton and/or xenon by low-temperature fractionation of air.




The basic principles of the low-temperature fractionation of air in general and the structure of rectification systems for nitrogen-oxygen separation specifically are described in the monograph “Tieftemperaturtechnik” [Cryogenic Engineering] by Hausen/Linde (2nd Edition, 1985) and in an article by Latimer in Chemical Engineering Progress (Vol. 63, No. 2, 1967, page 35). The high-pressure column is operated under a higher pressure than the low-pressure column; the two columns are preferably in heat-exchanging relationship with one another, for example via a main condenser, in which top gas from the high-pressure column is liquefied against evaporating bottom liquid from the low-pressure column. The rectification system of the invention may be designed as a conventional double column system, but may also be designed as a three-column or multicolumn system. In addition to the columns for nitrogen-oxygen separation, there may also be further apparatus for producing other air components, in particular noble gases, for example an argon production apparatus.




A process for producing krypton and/or xenon by low-temperature fractionation of air and a corresponding apparatus are known from DE 10000017 A1. In this process, a krypton- and xenon-containing fraction, specifically the bottom liquid, from the high-pressure column of the double column for nitrogen-oxygen separation is passed, without any measures which change the concentrations, into a further column which is used to produce krypton-xenon.




DE 2605305 A shows a process and an apparatus for producing krypton and/or xenon by low-temperature fractionation of air of the type described in the introduction. In this document, the first condenser-evaporator is heated by condensing top gas from a crude argon column and, at the same time, forms the bottom heating of the krypton-xenon enrichment column. All the vapour which rises in the krypton-xenon enrichment column is produced in the first condenser-evaporator.




An object of the invention is to further improve the production of krypton and xenon, and in particular to carry out this production in a particularly economic way.




Upon further study of the specification and appended claims, further objects and advantages of this invention will become apparent to those skilled in the art.




These objects are achieved by introducing a liquid from the lower region of the krypton-xenon enrichment column into a second condenser-evaporator, which is separate from the first condenser-evaporator.




In the invention, therefore, there is a separate heat exchanger, the “second condenser-evaporator”, in which rising vapour for the krypton-xenon enrichment column is produced independently of the first condenser-evaporator, and in this way relatively low-volatility constituents are concentrated further. The second condenser-evaporator is preferably designed for bottom heating of the krypton-xenon enrichment column. It may be arranged inside this column or in a separate vessel.




The second condenser-evaporator leads to a less high oxygen concentration being established in the first condenser-evaporator, so that, on account of the correspondingly reduced temperature difference, the overall size of the first condenser-evaporator can be reduced. Moreover, there is less intensive concentration of relatively low-volatility constituents in the first condenser-evaporator, which is undesirable at this location for operational reasons. Within the context of the invention, the choice of heating means for the second condenser-evaporator can be selected as desired. In principle, any suitable process fraction can be used, for example, nitrogen, perhaps from the high-pressure column, any other fraction from the high-pressure column, a part-stream of the charge air or a fraction from a crude argon column which is connected to the low-pressure column, in particular crude argon from the top of a crude argon column of this type.




The “purge liquid” of the first condenser-evaporator serves as a charge fraction for the krypton-xenon enrichment column. In the present context, the term “krypton-xenon enrichment column” is understood as meaning a countercurrent mass transfer column in which a fraction which has a higher concentration of krypton and/or xenon than each of the charge fractions of this column is produced. By way of example, the krypton-xenon concentrate has a higher molar level of krypton and/or xenon than the “purge liquid” which is fed into the krypton-xenon enrichment column. This column may, for example, be designed as a transfer column, as described in DE 1000017 A1, and/or may at the same time be used to expel methane.




It is preferable for the purge liquid to be introduced in the lower region, for example directly above the bottom. In this case, a liquid is added to the top of the krypton-xenon enrichment column, in order to force the krypton which is present in the rising vapour downwards and to force methane upwards. This liquid may, for example, be removed from the high-pressure column, for example from the bottom of this column or a few plates above it. A possible alternative or additional source is the evaporation space of the top condenser of a pure argon column. In the bottom of the krypton-xenon enrichment column, the liquid flowing down can be boiled by means of a bottom evaporator. This allows the krypton and xenon contents of the krypton-xenon concentrate to be increased further. The bottom evaporator can be operated, for example, with compressed air or with compressed nitrogen from the top of the high-pressure column.




In the invention, an intermediate step, in the form of a partial evaporation in the first condenser-evaporator, may be carried out between the extraction of the krypton- and xenon-containing fraction from the high-pressure column and the feeding of this fraction into the krypton-xenon enrichment column. This step is used to concentrate krypton and/or xenon even before the krypton-xenon enrichment column is reached. As a further effect, all the other components with a lower volatility than oxygen are guided with the purge liquid out of the partial evaporation into the krypton-xenon enrichment column and are in this way kept away from other parts of the installation, in particular the low-pressure column.




The krypton-xenon concentrate which is produced in the krypton-xenon enrichment column has a krypton content of, for example, 600 to 5 000 ppm, preferably 1 200 to 4 000 ppm, a xenon content of, for example, 60 to 500 ppm, preferably 120 to 400 ppm. Otherwise, it consists mainly of oxygen and typically up to about 10 mol % of nitrogen.




The invention can particularly advantageously be implemented as part of an air fractionation plant with argon production in which an argon-containing fraction from the low-pressure column is introduced into a crude argon rectification stage. The crude argon rectification stage is used in particular for argon-oxygen separation and may be carried out in one or more columns (cf. for example EP 377117 B2 or EP 628777 B1). The cooling of the crude argon rectification stage which is in any case required is, in the context of the invention, effected by the krypton- and xenon-containing fraction, an argon-enriched vapour from the crude argon rectification coming into indirect heat exchange with the evaporating krypton- and xenon-containing fraction in the first condenser-evaporator. The partial evaporation as part of the krypton-xenon production therefore simultaneously serves to produce reflux and/or liquid product in the crude argon rectification stage.




In many cases, there is a liquid charge-air stream, for example in the internal compression of one or more products. The liquefied air is often split between high-pressure column and low-pressure column, for example by being introduced into a vessel which is arranged inside the high-pressure column and part of the liquid being removed again from this vessel and passed to the low-pressure column. Within the context of the invention, it is expedient if, instead, an oxygen-containing liquid is extracted from the high-pressure column and introduced into the low-pressure column, this oxygen-containing liquid originating from a second intermediate point, which is arranged above the first intermediate point at which the liquid charge air is introduced into the high-pressure column. This ensures that the krypton and xenon which are present in the liquid charge air flows towards the bottom of the high-pressure column and is not passed into the low-pressure column, where it would be lost to the krypton-xenon production. Moreover, other low-volatility impurities are kept .away from the main condenser. According to this aspect of the invention, the liquefied air (or an oxygen-containing liquid of similar composition) is formed by substantially krypton-and xenon-free reflux liquid of the high-pressure column.




This aspect of the invention can advantageously be applied to any process in which a fraction from the high-pressure column is fed to a krypton-xenon production stage. Its use is not limited to processes and apparatus with partial evaporation of the krypton-and xenon-containing fraction. The same applies to the corresponding further configurations.




It is preferable for there to be no mass transfer elements, i.e., plates or packing, arranged between the first intermediate point and the second intermediate point. As a result, the oxygen-containing liquid has substantially the same composition as the air, apart from the undesirable components which boil at a higher temperature than oxygen.




In the high-pressure column, there may be barrier plates, the krypton- and xenon-containing fraction being extracted below the barrier plates and an oxygen-enriched liquid being removed above the barrier plates. Therefore, the oxygen-enriched liquid contains significantly less krypton and xenon than the krypton-and xenon-containing fraction and may, for example, be passed directly into the low-pressure column and/or used to cool the top condenser of a pure argon column, without significant quantities of krypton and xenon being lost as a result. The number of barrier plates is, for example, one to nine, preferably two to six (theoretical plates).




In addition to the purge liquid, a gaseous stream can be extracted from the evaporation space of the first condenser-evaporator and likewise fed to the krypton-xenon enrichment column, for example at the same point as the purge liquid. As a result, the krypton which is still present in the evaporated part of the krypton-and xenon-containing fraction is also fed to the krypton-xenon production stage.




In the process, refrigeration can be generated by work-performing expansion of air—for example in a medium-pressure turbine—to approximately the operating pressure of the high-pressure column, which regularly involves partial liquefaction of the air. Within the context of the invention, this air which has been expanded in a work-performing manner can be fed to a phase separation, and at least part of the liquid fraction from the phase separation can be fed to the krypton-xenon enrichment column and/or the evaporation space of the first condenser-evaporator.




As an alternative or in addition, air may be expanded in a work-performing manner to approximately low-pressure column pressure, for example in a low-pressure turbine. The krypton and xenon which are present in the low-pressure air stream can be recovered if this air stream is fed to a stripping column and the bottom liquid from the stripping column is fed to the krypton-xenon enrichment column, preferably at the top or at an intermediate point a few plates below it. Moreover, the stripping column also retains other low-volatility components, such as N


2


O, which are undesirable in the low-pressure column.




The advantages of the aspects of the invention which are associated with the work-performing expansion of air are not restricted to processes and apparatus with partial evaporation of the krypton- and xenon-containing fraction. Rather, these process steps may also be used in other processes for krypton-xenon production.




In addition, the invention relates to an apparatus for producing krypton and/or xenon by low-temperature fractionation of air comprising:




a rectification system for nitrogen-oxygen separation comprising at least a high-pressure column (


2


), and a low-pressure column (


3


), and a charge-air line (


1


) for introducing compressed and precleaned charge air into the rectification system,




a first condenser-evaporator (


17


),and a removal line (


13


,


14


,


15


,


16


,


416


) for removing a krypton- and xenon-containing fraction from the high-pressure column (


2


),and introducing the krypton- and xenon-containing fraction into the evaporation space of the first condenser-evaporator (


17


),




a krypton-xenon enrichment column (


24


)and a purge-liquid line (


26


,


226


) connected to the evaporation space of the condenser-evaporator (


17


) and to the krypton-xenon enrichment column (


24


), and




a product line (


30


) for removing a krypton-xenon concentrate from the krypton-xenon enrichment column (


24


), and




a second condenser-evaporator (


27


), separate from the first condenser-evaporator (


17


), wherein the evaporation space of the second condenser-evaporator (


27


) is in flow communication with the lower region of the krypton-xenon enrichment column (


24


).




According to an additional aspect of the invention, the apparatus further comprises an argon transfer line (


48


) connected to the low-pressure column (


3


) and connected to a crude argon rectification stage (


18


,


19


), and the liquefaction space of the first condenser-evaporator (


17


) is in flow communication with the crude argon rectification stage (


18


,


19


).




The entire disclosure of all applications, patents and publications, cited above and below, and of corresponding German Application No. 101 53 252.0, filed Oct. 31, 2001, and of corresponding European Application No. 02001356.1, filed Jan. 18, 2002, is hereby incorporated by reference.











BRIEF DESCRIPTION OF THE DRAWINGS




The invention and further details of the invention are explained in more detail below with reference to exemplary embodiments which are diagrammatically depicted in the drawings, wherein like reference characters designate the same or similar parts throughout the several views, and in which:





FIG. 1

shows a first exemplary embodiment of the invention,





FIG. 2

shows a modification with barrier plates in the high-pressure column,





FIG. 3

shows a further exemplary embodiment with a medium-pressure turbine,





FIG. 4

shows a fourth exemplary embodiment with a low-pressure turbine, and





FIG. 5

shows a further variant with a turbine between high-pressure column and low-pressure column.











Cleaned air which has been cooled approximately to dew point flows in gas form, via line


1


in

FIG. 1

, into the high-pressure column


2


of a rectification system for nitrogen-oxygen separation, which also includes a low-pressure column


3


and a main condenser


4


, which in the present example is designed as a falling-film evaporator. A first part


6


of the gaseous nitrogen


5


from the top of the high-pressure column is fed to the condensation space of the main condenser


4


. A first part


8


of the condensate


7


which is formed in that space is added to the high-pressure column as reflux. A second part


9


is supercooled in a supercooling countercurrent heat exchanger


10


and fed via line


11


and throttle valve


12


to the top of the low-pressure column


3


. A part


92


of condensate


7


can be obtained as liquid nitrogen product (LIN).




The oxygen-enriched bottom liquid


13


from the high-pressure column


2


is likewise cooled in the supercooling countercurrent heat exchanger


10


. The supercooled oxygen-enriched liquid


14


is moved onwards in two part-streams. The first part-stream


15


-


16


is introduced as “krypton- and xenon-containing fraction” into the evaporation space of a “first condenser-evaporator”


17


, which represents the top condenser of a crude argon rectification stage


18


/


19


. A second part-stream


15


-


20


is fed into the evaporation space of a top condenser


21


of a pure argon column


22


.




The first condenser-evaporator


17


is designed as a forced circulation evaporator, i.e., the evaporation space contains a liquid bath in which a heat exchanger block is, e.g., partially immersed. (Preferably, the heat exchanger block is—deviating from the drawing—totally immersed in the liquid bath.) Liquid is sucked in by the thermosiphon effect at the lower end of the evaporation passages. A mixture of vapour and unevaporated liquid emerges at the upper end thereof, the unevaporated liquid flowing back into the liquid bath. The krypton- and xenon-containing fraction


16


is partially evaporated in the first condenser-evaporator


17


; by way of example, 0.5 to 10 mol %, preferably 1 to 5 mol %, of the liquid


16


which is introduced is extracted in liquid form, as purge liquid


26


, from the evaporation space of the first condenser-evaporator


17


. This partial evaporation increases the concentration of relatively low-volatility components, in particular of krypton and xenon, in the liquid and reduces it in the vapour (in each case compared to the composition of the krypton- and xenon-containing fraction


16


). The vapour produced during the partial evaporation is extracted as gaseous stream


25


from the evaporation space of the first condenser-evaporator


17


. Residual liquid is discharged from the liquid bath as “purge liquid”


26


and is fed to the krypton-xenon enrichment column


24


immediately above the bottom.




The krypton-xenon enrichment column


24


has a bottom evaporator (“second condenser-evaporator”)


27


, which can be heated using any suitable fraction. In the exemplary embodiment, pressurized nitrogen


28


from the top of the high-pressure column


2


is used as heating means. (Alternatively, any other fraction from the high-pressure column, a part-stream of the charge air or a part of the crude argon


50


from the top of the second crude argon column


19


could be used.) The nitrogen


29


which has been liquefied in the bottom evaporator


27


is mixed with the liquid


7


from the main condenser


4


. A part-stream


23


of the purge liquid from the evaporator of the top condenser


21


of the pure argon column


22


is added to the top of the krypton-xenon enrichment column


24


as reflux liquid. The vapour which rises from the bottom evaporator


27


comes into countercurrent mass transfer with the liquid


23


, which contains less krypton and xenon, in the krypton-xenon enrichment column. As a result, these components are washed into the bottom, whereas most of the methane is expelled together with the top gas


31


. In the present exemplary embodiment, the latter is fed to the low-pressure column


3


at a suitable intermediate point. A krypton-xenon concentrate


30


in liquid form (LOX/Kr/Xe) is removed from the bottom of the krypton-xenon enrichment column


24


, this concentrate having, for example, a krypton content of approximately 2 400 ppm and a xenon content of approximately 200 ppm: otherwise, the concentrate


30


consists mainly of oxygen and also contains approximately 10 mol % of nitrogen. The concentrate


30


can be stored in a liquid tank or fed directly for further processing for the production of pure krypton and/or xenon.




In addition to the liquid nitrogen


92


, pure gaseous nitrogen


32


, at the top, impure nitrogen


33


, likewise in gas form, and oxygen


34


in liquid form are at least in part extracted from the low-pressure column


3


as products. The gaseous products


32


,


33


are heated in the supercooling countercurrent heat exchanger


10


and then further in a main heat exchanger (not shown). The liquid oxygen


34


is divided into a total of three parts. A first part and a second part are initially conveyed together via line


35


and pump


36


. The first part


37


flows to the evaporation space of the main condenser


4


, where it is partially evaporated. The vapour-liquid mixture


38


formed flows back to the bottom of the low-pressure column


3


. The second part is extracted via the lines


39


and


40


as liquid product (LOX), if appropriate after supercooling in the supercooling countercurrent heat exchanger


10


.




The third part


41


of the liquid oxygen


34


from the bottom of the low-pressure column


3


is subjected to internal compression by being brought to the desired product pressure in a pump


42


, and is fed via line


43


(LOX-IC) to one or more heat exchangers, in which it is evaporated (or—in the case of supercritical product pressure—pseudo-evaporated) and heated to approximately ambient temperature. Evaporation and heating may be carried out, for example, in indirect heat exchange with a high-pressure air stream. The liquefied (or supercritical) high-pressure air is expanded (not shown) and fed as liquefied air


44


to the high-pressure column


2


at a “first intermediate point”. An oxygen-containing liquid


45


, the quantity of which at least corresponds to a part of the liquid air


44


, is extracted from the high-pressure column at a “second intermediate point”, which is arranged directly above this first intermediate point; the stream


45


may also be greater than the stream


44


. There are no plates or other mass transfer elements between the first intermediate point and the second intermediate point. The oxygen-containing liquid


45


, the composition of which substantially corresponds to air, after supercooling in the supercooling countercurrent heat exchanger


10


is fed into the low-pressure column


3


via line


46


and throttle valve


47


.




An argon-containing fraction from the low-pressure column


3


is passed via an argon transfer line


48


into a crude argon rectification stage, which in the present example is carried out in two series-connected crude argon columns


18


and


19


. The argon-containing fraction


48


is fed in gas form to the first crude argon column


18


immediately above the bottom. The argon content in the rising vapour increases. The top gas from the first crude argon column


18


flows onward via line


49


to the bottom of the second crude argon column


19


.




Argon-enriched vapour (crude argon)


50


is produced at the top of the second crude argon column


19


and is largely condensed in the first condenser-evaporator


17


. The liquid


51


produced is added to the second crude argon column


19


as reflux liquid. The liquid


52


which is produced in the bottom of the second crude argon column


19


is conveyed by means of a pump


53


, via line


54


, to the top of the first crude argon column


18


. Bottom liquid


55


from the first crude argon column


18


flows back into the low-pressure column


3


via a further pump


56


and line


57


.




Crude argon


58


, which has remained in gas form, from the liquefaction space of the first condenser-evaporator


17


is broken down further in the pure argon column, with in particular relatively high-volatility constituents, such as nitrogen, being removed. Pure argon product (LAR) is extracted in liquid form via the lines


59


and


60


. Another part


61


of the bottom liquid is evaporated in a pure argon evaporator


63


with connected separator


62


and is returned via line


64


, as rising vapour, to the pure argon column


22


. The pure argon evaporator


63


is heated by indirect heat exchange with at least a part of the bottom liquid


15


from the high-pressure column


2


, which is supercooled in the heat exchange. As has already been described, the top condenser


21


of the pure argon column is cooled using a part


20


of this supercooled liquid. Vapour


66


and residual liquid


23


,


65


are extracted from the evaporation space of the top condenser


21


and fed into the low-pressure column


3


at suitable intermediate points and/or (


23


) added to the krypton-xenon enrichment column


24


. Top gas


67


of the pure argon column


22


partially condenses in the liquefaction space. Reflux liquid


68


which is produced in the process is added to the pure argon column. Residual vapour


69


is blown off to atmosphere.




In the exemplary embodiment shown in

FIG. 1

, all the oxygen-enriched liquid which is produced in the high-pressure column


2


is extracted from the bottom (line


13


). This allows the high-pressure column


2


to be of relatively uncomplicated structure.

FIG. 2

shows a modification of this process, in which the yield of krypton and xenon is improved further. In this case, there is a further intermediate take-off for liquid


270


from the high-pressure column


2


, which is separated from the bottom take-off


213


by about four barrier plates


271


. These plates retain most of the low-volatility constituents, in particular krypton and xenon, in the bottom of the high-pressure column


2


. As a result, the stream


270


has a significantly lower krypton and xenon content than the bottom liquid


213


. A part


220


of this stream is passed via the supercooling countercurrent heat exchanger


10


into the evaporation space of the top condenser


21


of the pure argon column


22


. The remainder


223


flows to the top of the krypton-xenon enrichment column


24


. This results in there being a particularly low krypton and xenon content both in the fractions


265


,


266


which flow out of the top condenser


21


to the low-pressure column


3


and in the reflux liquid


223


. Both lead to a particularly high yield in the krypton and xenon production.




A large proportion (typically about 90 mol %) of the krypton and xenon present in the air flows together with the bottom liquid


213


via the supercooling countercurrent heat exchanger


10


and line


215


, the pure argon evaporator


63


, the line


216


and the first condenser-evaporator


17


and onwards via the line


225


and


226


to the krypton-xenon enrichment column


24


, where it is almost completely recovered together with the krypton-xenon concentrate


30


.




If necessary, a part of the liquid


270


from the intermediate take-off can be admixed with the bottom liquid


213


via the bypass line


272


. By way of example, there are two to


14


, preferably about five to eight, theoretical plates between this intermediate take-off and the first intermediate point at which the liquid


44


from the internal compression is introduced.




While the production of refrigeration is not illustrated in

FIGS. 1 and 2

, the system shown in

FIG. 3

differs from that which is outlined in

FIG. 1

in that the refrigeration is obtained by means of a medium-pressure turbine. The turbine itself is not shown, but rather only the part-stream


373


which comes from its outlet and is in the form of a two-phase mixture is illustrated. It is introduced into a separator (phase separator)


274


. The vapour


375


from the separator


374


is, as is customary, fed into the high-pressure column


2


together with the direct air


1


. The liquid


376


, which has an increased level of krypton and xenon, by contrast, is introduced, together with a part of the supercooled bottom liquid


14


from the high-pressure column


2


, via line


416


into the evaporation space of the first condenser-evaporator


17


. Another part


323


of the supercooled bottom liquid


14


is added to the top of the krypton-xenon enrichment column


24


. Of course, the additional features in

FIG. 3

may also be combined with the variant shown in FIG.


2


.




In

FIG. 4

, process refrigeration is produced by means of a low-pressure turbine. The air


477


which comes from the outlet of this turbine is at approximately the operating pressure of the low-pressure column


3


, but in this case is not passed directly into this column, but rather is introduced into a stripping column


478


, in which the relatively low-volatility fractions are washed out into the bottom. The bottom liquid


479


is then fed to a suitable intermediate point on the krypton-xenon enrichment column


24


. It forms part of the reflux liquid for the krypton-xenon enrichment column


24


. Only the low-krypton and low-xenon top gas


480


from the stripping column


478


flows directly into the low-pressure column


3


, in this way bypassing the krypton-xenon production. In each case a part-stream


423


,


492


of the supercooled bottom liquid


14


from the high-pressure column is added to the top of the krypton-xenon enrichment column


24


and of the stripping column


478


.




High-pressure column


2


, low-pressure column


3


and main condenser


4


are illustrated as a double column in

FIG. 5

, for the sake of simplicity. In this case, refrigeration is produced by work-performing expansion of a gaseous intermediate fraction


581


from an intermediate point above the barrier plates


271


. This fraction can be heated in the main heat exchanger


582


against charge air


583


which is to be cooled, can be fed to a recompressor


585


via line


584


and then passed onwards (


586


) to the warm end of the main heat exchanger


582


. It is removed from the main heat exchanger


582


at an intermediate temperature via line


587


and is fed to the work-performing expansion


588


. The turbine


588


preferably drives the recompressor


585


via a direct mechanical coupling. The stream which has undergone work-performing expansion is finally introduced into the low-pressure column


3


at a suitable point (


589


). Alternatively, the recompression and complete heating can be dispensed with if the stream, via the line


590


illustrated by dashed lines, is only heated to the inlet temperature of the turbine


588


in the main heat exchanger


582


and is then fed directly to this turbine (line


587


).




The argon production and the krypton-xenon production are not illustrated in FIG.


5


. They are carried out in the same way as in

FIG. 1

or


2


. In

FIG. 5

, there is no internal compression.




From the foregoing description, one skilled in the art can easily ascertain the essential characteristics of this invention and, without departing from the spirit and scope thereof, can make various changes and modifications of the invention to adapt it to various usages and conditions.



Claims
  • 1. A process for producing krypton, xenon, or both by low-temperature fractionation of air, comprising:introducing a compressed and cleaned charge air (1) into a rectification system for nitrogen-oxygen separation, said rectification system comprising at least a high-pressure column (2) and a low-pressure column (3), removing a krypton- and xenon-containing fraction (13, 14, 15, 16, 416) from the high-pressure column (2), introducing said krypton- and xenon-containing fraction (13, 14, 15, 16, 416) into the evaporation space of a first condenser-evaporator (17), where said krypton- and xenon-containing fraction is partially evaporated, extracting a purge liquid (26, 226) from said evaporation space of said first condenser-evaporator (17), feeding said purge liquid into a krypton-xenon enrichment column (24), removing a krypton-xenon concentrate (30) from said krypton-xenon enrichment column (24), and introducing a liquid from the lower region of said krypton-xenon enrichment column (24) into a second condenser-evaporator (27), which is separate from said first condenser-evaporator (17).
  • 2. A process according to claim 1, further comprising removing an argon-containing fraction (48) from the low-pressure column (3), and introducing said argon-containing fraction (48) into a crude argon rectification stage (18, 19), and bringing an argon-enriched vapour (50) from said crude argon rectification stage (18, 19) into indirect heat exchange with the evaporating krypton- and xenon-containing fraction (16) in the first condenser-evaporator (17).
  • 3. A process according to claim 2, wherein: a partial stream (44) of the charge air is fed into the high-pressure column (2) in the liquid state at a first intermediate point; an oxygen-containing liquid (45) is extracted from the high-pressure column (2) at a second intermediate point, which is arranged above this first intermediate point; and said oxygen-containing liquid (45) is introduced into the low-pressure column (3).
  • 4. A process according to claim 3, wherein: there are no mass transfer elements between the first intermediate point and the second intermediate point.
  • 5. A process according to claim 4, wherein there are barrier plates (271) arranged in the high-pressure column (2), and the krypton- and xenon-containing fraction (213) is extracted below said barrier plates (271), and an oxygen-enriched liquid (270) is removed above said barrier plates.
  • 6. A process according to claim 5, wherein a gaseous stream (25, 225) is extracted from the evaporation space of the first condenser-evaporator (17) and is fed to the krypton-xenon enrichment column (24).
  • 7. A process according to claim 6, wherein: a partial stream (373) of the charge air is expanded in a work-performing manner to approximately the operating pressure of the high-pressure column (2) and is then fed to a phase separator (374); and at least part of the liquid fraction (376) from said phase separator (374) is fed into the krypton-xenon enrichment column (24) or is fed into the evaporation space of the first condenser-evaporator (17).
  • 8. A process according to claim 7, wherein: a partial stream (477) of the charge air is expanded in a work-performing manner to approximately the operating pressure of the low-pressure column and is fed into a stripping column (478); and bottom liquid (479) from said stripping column (478) is fed into the krypton-xenon enrichment column (24).
  • 9. A process according to claim 3, wherein there are barrier plates (271) arranged in the high-pressure column (2), and the krypton- and xenon-containing fraction (213) is extracted below said barrier plates (271), and an oxygen-enriched liquid (270) is removed above said barrier plates.
  • 10. A process according to claim 2, wherein there are barrier plates (271) arranged in the high-pressure column (2), and the krypton- and xenon-containing fraction (213) is extracted below said barrier plates (271), and an oxygen-enriched liquid (270) is removed above said barrier plates.
  • 11. A process according to claim 1, wherein: a partial stream (44) of the charge air is fed into the high-pressure column (2) in the liquid state at a first intermediate point; an oxygen-containing liquid (45) is extracted from the high-pressure column (2) at a second intermediate point, which is arranged above this first intermediate point; and said oxygen-containing liquid (45) is introduced into the low-pressure column (3).
  • 12. A process according to claim 11, wherein there are no mass transfer elements between the first intermediate point and the second intermediate point.
  • 13. A process according to claim 12, wherein there are barrier plates (271) arranged in the high-pressure column (2), and the krypton- and xenon-containing fraction (213) is extracted below said barrier plates (271), and an oxygen-enriched liquid (270) is removed above said barrier plates.
  • 14. A process according to claim 11, wherein there are barrier plates (271) arranged in the high-pressure column (2), and the krypton- and xenon-containing fraction (213) is extracted below said barrier plates (271), and an oxygen-enriched liquid (270) is removed above said barrier plates.
  • 15. A process according to claim 1, wherein there are barrier plates (271) arranged in the high-pressure column (2), and the krypton- and xenon-containing fraction (213) is extracted below said barrier plates (271), and an oxygen-enriched liquid (270) is removed above said barrier plates.
  • 16. A process according to claim 1, wherein a gaseous stream (25, 225) is extracted from the evaporation space of the first condenser-evaporator (17) and is fed to the krypton-xenon enrichment column (24).
  • 17. A process according to claim 1, wherein: a partial stream (373) of the charge air is expanded in a work-performing manner to approximately the operating pressure of the high-pressure column (2) and is then fed to a phase separator (374); and at least part of the liquid fraction (376) from said phase separator (374) is fed into the krypton-xenon enrichment column (24) or is fed into the evaporation space of the first condenser-evaporator (17).
  • 18. A process according to claim 1, wherein: a partial stream (477) of the charge air is expanded in a work-performing manner to approximately the operating pressure of the low-pressure column and is fed into a stripping column (478); and bottom liquid (479) from said stripping column (478) is fed into the krypton-xenon enrichment column (24).
  • 19. An apparatus for producing krypton, xenon, or both by low-temperature fractionation of air, said apparatus comprising:a rectification system for nitrogen-oxygen separation comprising at least a high-pressure column (2), and a low-pressure column (3), and a charge-air line (1) for introducing compressed and precleaned charge air into said rectification system, a first condenser-evaporator (17),and a removal line (13, 14, 15, 16, 416) for removing a krypton- and xenon-containing fraction from said high-pressure column (2),and introducing said krypton- and xenon-containing fraction into the evaporation space of said first condenser-evaporator (17), a krypton-xenon enrichment column (24)and a purge-liquid line (26, 226) connected to said evaporation space of the condenser-evaporator (17) and to said krypton-xenon enrichment column (24), and a product line (30) for removing a krypton-xenon concentrate from said krypton-xenon enrichment column (24), and a second condenser-evaporator (27), separate from said first condenser-evaporator (17), wherein the evaporation space of said second condenser-evaporator (27) is in flow communication with the lower region of said krypton-xenon enrichment column (24).
  • 20. An apparatus according to claim 14, further comprising an argon transfer line (48) connected to said low-pressure column (3) and connected to a crude argon rectification stage (18, 19), and the liquefaction space of said first condenser-evaporator (17) is in flow communication with said crude argon rectification stage (18, 19).
  • 21. A process for producing krypton, xenon, or both, comprising:introducing a krypton- and xenon-containing fraction (13, 14, 15, 16, 416) into the evaporation space of a first condenser-evaporator (17), where said krypton-and xenon-containing fraction is partially evaporated, extracting a purge liquid (26, 226) from said evaporation space of said first condenser-evaporator (17), feeding said purge liquid into a krypton-xenon enrichment column (24), removing a krypton-xenon concentrate (30) from said krypton-xenon enrichment column (24), and introducing a liquid from the lower region of said krypton-xenon enrichment column (24) into a second condenser-evaporator (27), which is separate from said first condenser-evaporator (17).
Priority Claims (2)
Number Date Country Kind
101 53 252 Oct 2001 DE
02001356 Jan 2002 EP
US Referenced Citations (4)
Number Name Date Kind
4401448 La Clair Aug 1983 A
4568528 Cheung Feb 1986 A
5067976 Agrawal et al. Nov 1991 A
6314757 Dray et al. Nov 2001 B1
Foreign Referenced Citations (5)
Number Date Country
26 05 305 Aug 1977 DE
100 00 017 Jun 2000 DE
0 377 117 Jul 1990 EP
0 628 777 Dec 1994 EP
1 006 326 Jun 2000 EP