Claims
- 1. A process for forming a reflective surface, comprising the steps of:
- providing at least a part of at least one unanodized surface which has a peak-to-valley height Ra of equal to or less than 1 micron, and wherein said unanodized surface is selected from the group consisting of (1) refined aluminum with a degree of purity equal to or greater than 98.3% by weight aluminum and (2) aluminum alloys with at least one element selected from the group consisting of Si, Mg, Mn, Cu, Zn, Fe, and wherein said unanodized surface is in a form selected from the group consisting of rolled foil, rolled sheets and rolled strips;
- using said unanodized surface as a substrate;
- depositing at least two layers from the gas phase on said unanodized surface, wherein said two layers include a ceramic adhesive layer from the gas phase deposited on said unanodized surface and at least one reflecting layer from the gas phase deposited on said adhesive layer for the reflection of radiation with wavelengths in the optical range, said reflecting layer being selected from the group consisting of aluminum, silver, gold, copper and alloys containing at least one of aluminum, silver, gold and copper.
- 2. Process according to claim 1, wherein said step of depositing is performed in vacuum.
- 3. Process according to claim 1, wherein said at least a part of said at least one unanodized surface has a peak-to-valley height Ra of from 0.001 to 1 micron.
- 4. Process according to claim 1, including the step of depositing a transparent protective layer over said at least one reflecting layer.
- 5. Process according to claim 1, wherein each of said at least two layers is deposited in a thickness of 1 to 200 nm.
- 6. Process according to claim 1, wherein said at least one unanodized surface is provided in the form of refined aluminum with a purity of 99.0% by weight aluminum and higher.
- 7. Process according to claim 1, wherein said at least one unanodized surface is provided in the form of an aluminum alloy containing at least one of the following: from 0.25% to 5% by weight magnesium; from 0.1 to 12% by weight copper; from 0.5 to 5% by weight zinc; from 0.5 to 5% by weight iron; and from 0.2 to 2% by weight manganese.
- 8. Process according to claim 1, wherein said adhesive layer contains at least one of (1) compounds of the formula SiOx, where x is a number from 1 to 2, and (2) compounds of the formula AlyOz where y/z represents a number from 0.2 to 1.5.
Priority Claims (1)
Number |
Date |
Country |
Kind |
0068/91 |
Jan 1991 |
CHX |
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CROSS-REFERENCE TO RELATED APPLICATIONS
This is a divisional of application Ser. No. 044,451, filed Apr. 9, 1993, now U.S. Pat. No. 5,403,657 which in turn is a Continuation of application Ser. No. 07/812,750, filed Dec. 23, 1991, now abandoned.
US Referenced Citations (3)
Number |
Name |
Date |
Kind |
4358507 |
Senaha et al. |
Nov 1982 |
|
4475794 |
Baker et al. |
Oct 1984 |
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4482209 |
Grewal et al. |
Nov 1984 |
|
Foreign Referenced Citations (3)
Number |
Date |
Country |
225235 |
Jul 1985 |
DEX |
60-247602 |
Dec 1985 |
JPX |
61-26768 |
Feb 1986 |
JPX |
Non-Patent Literature Citations (1)
Entry |
Hartsough, L. D. and McLeod, P. S., "High-rate sputtering of enhanced aluminum mirrors," J. Vac. Sci. Technol., vol. 14, No. 1 (Jan./Feb. 1977) pp. 123-126. |
Divisions (1)
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Number |
Date |
Country |
Parent |
44451 |
Apr 1993 |
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Continuations (1)
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Number |
Date |
Country |
Parent |
812750 |
Dec 1991 |
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