Number | Date | Country | Kind |
---|---|---|---|
8-264439 | Oct 1996 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4375373 | Abe et al. | Mar 1983 |
Number | Date | Country |
---|---|---|
0693580 | Jan 1996 | EPX |
56-38472 | Apr 1981 | JPX |
57-196744 | Dec 1982 | JPX |
7-196342 | Aug 1995 | JPX |
Entry |
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Ohsaki et al., "Structural Analysis of SiO.sub.2 Gel Films by High Energy Electron Diffraction", J. of Sol-Gel Science and Technology, 2, 245-249, (1994) (No month available.). |
Kagaku Kogaku Ronbunshu (Reports on Chemical Engineering), vol. 21, No. 5, pp. 879-885, 1995. |
Effects of H.sub.2 O on structure of acid-catalysed SiO.sub.2 sol-gel films, Journal of Non-Crystalline Solids 183 (1995) Apr. 11, No. 3, pp 260-267. |