Claims
- 1. A process for the preparation of high temperature superconducting oxide films, comprising the following steps:
- (a) respectively placing a substrate on an anode and a sintered body of an oxide superconductor on a cathode in a deposition chamber, wherein the sintered body on the cathode is used as a sputtering target;
- (b) adjusting the positions of the cathode and the anode so as to control the distance between the surface of the substrate and the surface of the sputtering target;
- (c) exhausting gases from the deposition chamber to a pressure below 10.sup.-3 torr and then introducing pure oxygen to a pressure of 1 atmosphere;
- (d) heating the substrate to a desired temperature under said pressure of 1 atmosphere in the deposition chamber;
- (e) again exhausting the gases from the deposition chamber and then introducing a mixture of argon and oxygen gases and maintaining a desired gas pressure by an automatic pressure-control valve;
- (f) turning on an electric power supply to produce glow discharge between the substrate and the sputtering target so as to grow a superconducting oxide film on the substrate to a desired thickness; and
- (g) cooling the coated substrate to a temperature below 100.degree. C. to in-situ obtain the high temperature superconducting oxide film.
- 2. The process of claim 1, wherein step (f) further comprises controlling the electric current density for sputtering so that the composition of the film is the same as that of the sputtering target.
- 3. The process of claim 2, wherein the electric current density for sputtering is in the range of 5-35 mA/cm.sup.2.
- 4. The sputtering of claim 1, wherein the material of the substrate is selected from the group consisting of Si, SiO.sub.2, Al.sub.2 O.sub.3, MgO, SrTiO.sub.3, YSZ, single crystal or polycrystal LaAlO.sub.3, Ni, Ni-based superalloy, Ag, Au, and Pt.
- 5. The process of claim 1, wherein the component of the target is YBa.sub.x Cu.sub.y O.sub.7-.delta. where 1.5.ltoreq.x.ltoreq.3 and 2.5.ltoreq.y.ltoreq.3.5.
- 6. The process of claim 5, wherein in step (g), before said cooling pure oxygen gas is introduced into the deposition chamber and the substrate is cooled by furnace-cooling or by controlling the temperature to below 100.degree. C. under a pressure between 200 torr and 1 atmosphere to obtain a Y-Ba-Cu-O high temperature superconducting oxide film.
- 7. The process of claim 1, wherein the component of the target is BiSrCa.sub.x Cu.sub.y O.sub.z where 0.5.ltoreq.x.ltoreq.1.5 and 1.ltoreq.y.ltoreq.2.
- 8. The process of claim 7, wherein in step (g), the film is immediately quenched in air from a deposition temperature to obtain a Bi-Sr-Ca-Cu-O high temperature superconducting oxide film.
- 9. The process of claim 1, wherein the distance between the surface of the target and the surface of the substrate is in the range of 1.5-4 cm.
- 10. The process of claim 1, wherein the substrate is heated to a temperature in the range of 650.degree.-810.degree. C.
- 11. The process of claim 1, wherein a mixture of argon and oxygen with a volume percentage of oxygen in the range of 20-80% is used.
- 12. The process of claim 1, wherein the pressure of the deposition chamber is in the range of 0.5-2.5 torr after the gas mixture of argon and oxygen is introduced.
Parent Case Info
This is a divisional of application Ser. No. 08/176,725, filed on Jan. 3, 1994, now U.S. Pat. No. 5,441,623, issued Aug. 15, 1995.
US Referenced Citations (1)
Number |
Name |
Date |
Kind |
5154811 |
Nishibori |
Oct 1992 |
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Non-Patent Literature Citations (1)
Entry |
R. J. Lin et al., "In situ growth of superconducting YBa.sub.2 Cu.sub.3 O.sub.3-x thin films by a hot-wall sputtering process", Appl. Phys. Lett., vol. 62, No. 1, Jan. 1993, pp. 105-107. |
Divisions (1)
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Number |
Date |
Country |
Parent |
176725 |
Jan 1994 |
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