Claims
- 1. A process for producing a thin film of hydrogenated amorphous silicon which comprises decomposing a film-forming gas composed of disilane by glow discharge while said gas is flowing, and thereby forming a thin film of hydrogenated amorphous silicon on a substrate, wherein the amount of energy for decomposition to be applied per unit weight of the gas is adjusted to such an amount that the speed of forming the thin film depends mainly upon the flow rate of the gas and is not substantially affected by the amount of the energy, said supplied energy being at least 6 KJ per gram of said gas and wherein the speed of forming the thin film is increased to prevent crystallization of the thin film.
- 2. The process of claim 1 wherein the amount of the energy is adjusted to at least 6 KJ per gram of said gas, and the speed of forming the thin film is adjusted to at least 6 .ANG./sec.
- 3. The process of claim 1 wherein the amount of the energy is adjusted to at least 10 KJ per gram of said gas, and the speed of forming the thin film is adjusted to at least 10 .ANG./sec.
- 4. The process of claim 1 wherein the amount of the energy is adjusted to 10 to 100 KJ per gram of said gas, and the speed of forming the thin film is adjusted to at least 15 .ANG./sec.
- 5. The process of any one of claims 1 to 4 wherein the thin film is formed at a temperature of 200.degree. to 450.degree. C.
- 6. The process of any one of claims 1 to 4 wherein the thin film is formed under a pressure of 1 to 10 torr.
- 7. The process of any one of claims 1 to 4 wherein the film-forming gas is diluted with helium, argon or hydrogen.
- 8. The process of claim 7 wherein the film-forming gas is diluted to a concentration of 5 to 20% by volume.
- 9. A process for producing a solar cell, which comprises decomposing a film-forming gas composed of disilane while it is flowing, and successively forming an amorphous silicon thin film layer of a first type electrical conductor, an essentially intrinisic amorphous silicon thin film layer, an amorphous silicon thin film layer of a second type electrical conductor and a second electrode in this order on a substrate having a first electrode, wherein at least the essentially intrinsic amorphous silicon thin film layer is composed of a thin film of hydrogenated amorphous silicon which is formed by adjusting the amount of energy for decomposition to be applied per unit weight of the gas to such an amount that the speed of forming the thin film depends mainly upon the flow rate of the gas and is not substantially affected by the amount of the energy, said supplied energy being at least 6 KJ per gram of said gas and increasing the speed of forming the thin film to prevent cyrstallization of the thin film.
- 10. The process of claim 9 wherein the amount of the energy is adjusted to at least 6 KJ per gram of said gas, and the speed of forming the thin film is adjusted to at least 6 .ANG./sec.
- 11. The process of claim 9 wherein the amount of the energy is adjusted to at least 10 KJ per gram of said gas, and the speed of forming the thin film is adjsuted to at least 10 .ANG./sec.
- 12. The process of claim 9 wherein the amount of the energy is adjusted to 10 to 100 KJ per gram of said gas, and the speed of forming thin film is adjusted to at least 15 .ANG./sec.
- 13. The process of any one of claims 9 to 12 wherein the thin film is formed at a temperature of 200.degree. to 450.degree. C.
- 14. The process of any one of claims 9 to 12 wherein the thin film is formed under a pressure of 1 to 10 torr.
- 15. The process of any one of claims 9 to 12 wherein the film-forming gas is diluted with helium, argon or hydrogen.
- 16. The process of claim 15 wherein the film-forming gas is diluted to a concentration of 5 to 20% by volume.
- 17. A process for producing a thin film of hydrogenated amorphous silicon comprising:
- decomposing a film-forming, flowing gas of disilane by glow discharge whereby an amount of energy for said decomposing is adjusted to at least 6 KJ per gram of said gas;
- forming said thin film of hydrogenated amorphous silicon on a substrate, said film being formed at a speed adjusted to at least 6 .ANG./sec between a temperature of 200.degree. to 450.degree. C. and a pressure of 1 to 10 torr, said speed of forming said thin film being selectively increased to prevent crystallization of said thin film.
- 18. The process of claim 17 wherein the amount of the energy is adjusted to at least 10 KJ per gram of said gas, and the speed of forming said thin film is adjusted to at least 10 .ANG./sec.
- 19. The process of claim 18 wherein the amount of the enegy is adjusted to 10 to 100 KJ per gram of said gas, and the speed of forming the thin film is adjusted to at least 15 .ANG./sec.
- 20. The process of claim 19 further comprising: deleting said film-forming gas with helium, argon, or hydrogen.
- 21. The process of claim 20 wherein said diluting of said film-forming gas is to a concentration of 5 to 20% by volume.
Parent Case Info
This is a continuation application of U.S. patent application No. 653,246, filed Sept. 7, 1984, now abandoned,
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Apr 1983 |
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Cannella et al. |
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Non-Patent Literature Citations (1)
Entry |
The Journal of Non-Crystalline Solids, 32 (1979), 393-403. |
Continuations (1)
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Number |
Date |
Country |
Parent |
653246 |
Sep 1984 |
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