Number | Date | Country | Kind |
---|---|---|---|
3811907 | Apr 1988 | DEX |
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---|---|---|---|
3955038 | Lindstrom et al. | May 1976 | |
4145224 | Mehalchick et al. | Mar 1979 | |
4284687 | Dreyer et al. | Aug 1981 | |
4336215 | Yajima et al. | Jun 1982 | |
4399168 | Kullander et al. | Aug 1983 | |
4447263 | Sugizawa et al. | May 1984 | |
4469801 | Hirai et al. | Sep 1984 | |
4522453 | Lammer et al. | Jun 1985 | |
4525415 | Porat | Jun 1985 | |
4598024 | Stinton et al. | Jul 1986 | |
4645715 | Ovshinsky et al. | Feb 1987 | |
4670024 | Bhat et al. | Jun 1987 | |
4675206 | Ikegaya et al. | Jun 1987 | |
4714660 | Gates, Jr. | Dec 1987 | |
4731302 | Weissmantel et al. | May 1988 | |
4749630 | Konig et al. | Jun 1988 | |
4835062 | Holleck | May 1989 | |
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4961529 | Gottselig et al. | Oct 1990 |
Number | Date | Country |
---|---|---|
0229522 | Jul 1987 | EPX |
Entry |
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"Electric Properties of Ti-Si-N Thin Cement Films Deposited in a Triode Sputtering System with a Hot Cathode", W. Posadowski, Thin Solid Films, vol. 162, Aug. 1988, pp. 111 to 117, Elsevier Sequoia, Lausanne, Switzerland. |
"Structure of Thin Films Prepared by the Cosputtering of Titanium and Aluminum or Titanium and Silicon", G. Beensh-Marchwicka et al, Thin Solid Films, vol. 82, 1981, pp. 313-320, Elseview Sequoia, Lausanne, Switzerland. |
World Patent Index, No. 77-13584Y/08. |