In the area of Automated Manufacturing, it becomes very important to be able to adapt computing and information processing capabilities to a more competitive, technologically advanced, and error free environment. But because legacy systems are critical components in any production automated lines, much effort and expense must be undertaken in attempting to either completely rewrite the legacy systems software or to move or migrate the system functionality into a more efficient, functional and cost-effective production environment. Rewriting a legacy system from scratch is usually not a viable option, because of the inherent liabilities of the system, the risk of failures, data loss, and no understanding of how the system architecture of legacy system is designed and how it actually performs internally, as all support ceases from the Original Equipment Manufacturer (OEM).
Automated systems have been used in a variety of microelectronic manufacturing and packaging processes. For example, in a typical semiconductor manufacturing facility (Fab), the sliced wafers are often loaded onto the equipment after setup and configuring the device parameters. These processes are usually done by an operator which is prone to errors and further affected by the feet that each operator can set up and configure the device parameters for a particular lot in different ways. After processing a wafer the operator is further required to re-inspect the defective silicon chips and decide if they are really detective or should they be reclassified as non-defective. Again here the human factor is subjected to a lot of errors. Manual operation of equipment in a manufacturing facility has been gradually replaced by an automated process to alleviate costly semiconductor manufacturing problems associated with non-automated, manual operations.
Some processes of manual operations continued even after the legacy manufacturing systems reached a point where the Original Equipment manufacturers decided to cease upgrading support or forced customers to buy new models of equipment to cater for new inspection features or simply to automate a particular task or process. Manufacturers were left in a dilemma as increased capital spending to buy new models of equipment would increase their overall production costs along with strapping of their old but reliable legacy systems. Some critical manual operations involving Human operators for Setup, Configuration and verifying detects or classifying some types of new defects continued to be essential to ensure defect free products to customers. It is a well-known fact that such manual operations involving human inspectors were prone to errors during operation, inspection, classification, documentation and training, as human error and fatigue were a constant hindering factor in maintaining efficient and optimum quality.
In addition, setting up of the legacy manufacturing systems for inspecting new kinds of silicon chips or integrated circuits was highly dependent on the operator's ability, experience and the training they have been through. Selecting the correct recipe file for a particular device setup was especially important if multiple types of silicon chips belonging to the same family of products were encountered. Recipe or configuration setup files would have accumulated over the years and new human inspectors would find it difficult to choose the correct file for optimal setup of the machine. Another problem area in manual operation at any process relates to collection and classification of data. Data could be in the form of parameter setup, defect classification, data collection related to manufacturing processes . . . etc. Manufacturing operators or inspectors often manually enter data at each process step and interact with the system computer program several times for every individual wafer lot being processed. There is also the problem of inconsistency between different operators/inspectors which further leads to error prune quality checks. The issue of consistency therefore is an issue that is to be appropriately addressed.
What is clearly needed for the manufacturer is an appropriate solution or a framework for ensuring that multiple interfaces in communication with legacy systems are fully and safely integrated through a tool that will remain transparent to the manufacturer/End user and yet introduce a new art that offers a fully automated and Reinforcement learning system that enables them to continue to use their existing base of legacy machines and eliminate or minimise all human intervention whether it is related to machine setup or post-inspection quality checks to ensure high consistency in accuracy and repeatability for a high quality output. While this requirement may apply to legacy machines it can also be suitably applied to newer equipment which may still need humans to make certain critical decisions at different process steps.
The present invention which will henceforth be referred to as a “Proxy Interpreter” provides a system and method of automating a manufacturing process by configuring a hardware proxy interpreter unit that will build domain knowledge through Reinforcement learning to operate a piece of legacy equipment by monitoring every single activity of the human inspector on the mouse/keyboard and a set of Input/output ports. The Domain knowledge resident within the proxy interpreter will be utilised to control the legacy equipment and eventually eliminate the need for a human inspector. In one embodiment of the invention, a system and method for implementing a proxy interpreter to manage and control at least one legacy system is provided. The system and method includes steps for (a) Capturing the image of the display monitor that is being viewed and inspected by the setup and quality control operator; (b) Collecting keyboard and mouse positional coordinates with respect to the captured image during the process of setup and configuration; (c) Logging and storing the mouse, certain Input/Output ports and keyboard commands triggered by the operator and analysing the activity started by the relevant command; (d) analyzing and monitoring the subsequent results displayed on the monitor and all Input/Output ports activated by the command; (e) mapping the responses by the legacy system to build a response library based on the activated commands; and (f) using the response library to analyze multiple command activity and subsequently to control the legacy equipment without any human intervention. Eventually, the proxy interpreter overrides legacy system's input mouse-keyboard commands with its own command sequence, effectively acting as a human controlling the legacy system. The end objective of automating the legacy system without installing any software on the legacy system itself, is thus achieved.
In another embodiment of the present invention, a system and method for creating a configuration and recipe file for multiple devices is provided within the proxy interpreter to automate the Equipment set up. The system and method includes the steps of (a) Capturing the image of the display monitor that is being viewed by the quality control operator; (b) Collecting keyboard, mouse positional coordinates and certain inputs ports, with respect to the captured image during the process of setup and configuration; (c) Logging and storing the mouse, certain Input/Output ports, keyboard commands triggered by the operator and analysing the activity started by the relevant command; (d) Creating recipe or setup files that consists of configuration parameters for a particular device; and (e) Using the recipe files to automatically setup and configure the legacy system, with no human intervention during subsequent the production process.
In another embodiment of the present invention, a system and method for implementing a Deep learning module is provided within the proxy interpreter to enhance the quality of defect inspection. The system and method includes steps for (a) Classifying the defect criteria as indicated by the human inspector; (b) Applying Deep learning techniques on the classified defects and improving the defect identification process; (c) Creating new domain knowledge based on Deep learning techniques; and (d) Using the new domain knowledge to inspect and reclassify defects where applicable, to further enhance the accuracy and repeatability of inspection; This new reclassification result is used by the proxy interpreter to change the inspection result in legacy system, by overriding mouse-keyboard inputs and replicating how a human would manually change results.
The present invention will be described with respect to a particular embodiment thereof, and reference will be made to the drawings in which like numbers designate like parts and in which:
The present invention relates to a method of automating the setup, configuration and operation of a microelectronic manufacturing process. While the embodiments provided below relate to a method of automating a microelectronic manufacturing process used to manufacture Semiconductor devices, it is understood that the method of the present invention may be used to automate any micro electronic manufacturing process to manufacture, for example, flat panel devices, disk drive devices, and the like. The intent is to automate a set of processes to enable legacy equipment to be used is a way that minimizes human intervention, improves the quality of the process through the use of Deep learning techniques to improve the quality of the manufacturing process and in the process extend the useful life of the legacy equipment. The present invention relates to the method of automating the manufacturing process rather than the particular type of equipment or manufacturing process being automated.
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The main network gets input from feature maps 164 within the Frozen Model 160, generated by an object detection model for the display screen 178, such as a modified YOLO (You Only Look Once) and also a confidence vector for the image and text in the screen from Deep learning networks such as a modified YOLO and a modified CTPN (Connectionist Text Proposal Network) respectively. The confidence vector is used as a filter to guarantee no action is taken by the Action classifier 162 which is not relevant to the current state. Also, a custom built LSTM (Long Short Term Memory) model is used to distinguish between similar screens in different states.
Deep learning modules in Step 133 are built with architectures including a modified EfficientNet and a modified Faster-RCNN (Region-based Convolutional Neural Networks), These Deep learning models are trained to identify defects on object surfaces by analysing the input image with modified ResNET-101 (Residual NETworks) layers.
Results arrived at Step 133 are compared with the results in Step 130 in Step 134. If the compared results are the same the operation proceeds to Step 128 where the machine indexes the wafer to the next Silicon chip to be inspected. If the compared results in Step 134 are not the same, in Step 132 the proxy interpreter sends relevant keyboard and mouse commands to the legacy control system, to update the current silicon chip results in the wafer map file. In effect, the results present in the wafer map file in Step 124, is overwritten with new results in Step 132 for the Silicon Chip under inspection.
The operation proceeds to Step 128 where the next Silicon chip to be inspected is indexed under the Camera. Subsequently, the operation proceeds to Step 126. The flow continues and repeats until the last Silicon chip to be inspected. This key essential feature of applying new and enhanced inspection methodology to a legacy machine through a proxy interpreter system, is the primary feature of the present invention.
The methods set forth herein are not necessarily required to be performed in the order described, and the order of the steps of such methods should be understood to be merely exemplary. Likewise, additional steps may be included in such methods, and certain steps may be omitted or combined, in methods consistent with various embodiments of the present invention.
Although embodiments of the present invention have been described herein, it should be understood that the foregoing embodiments and advantages are merely examples and are not to be construed as limiting the present invention or the scope of the claims. Numerous other modifications and embodiments can be devised by those skilled in the art by applying any neural based computational model that will fall within the spirit and scope of the principles of this disclosure. The present teaching can also be readily applied to other types of legacy systems. More particularly, multiple variations and modifications are possible in the arrangements of the subject combination arrangement within the scope of the disclosure, the drawings and the appended claims. In addition to variations and modifications in the arrangements, alternative uses will also be apparent to those skilled in the art.
Number | Date | Country | Kind |
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10202008231S | Aug 2020 | SG | national |