This U.S. non-provisional patent application claims priority under 35 U.S.C. §119 of Korean Patent Application No. 10-2012-0129580, filed on Nov, 15, 2012, the entire contents of which are hereby incorporated by reference.
The present invention disclosed herein relates to a pulse noise suppression circuit and a pulse noise suppression method thereof in order to reject a pulse noise in digital signal transfer between chips.
In digital signal transfer between chips, a pulse noise may be flowed into the signal transfer due to an external interference signal. A typical technology for reducing an effect of inflow of the pulse noise is as shown in
However, there are two limitations in the typical technology for reducing the pulse noise. A first of them is that an error signal may be generated for continuous pulse noises of a short interval. As may be seen in
The present invention provides a pulse noise suppression circuit having a simple configuration and low power consumption, and a pulse noise suppression method thereof.
Embodiments of the present invention provide pulse noise suppression circuits including a filter circuit converting an input signal of a pulse type into an increasing or decreasing filter signal; a level reset circuit resetting the filter signal in response to the input signal and an output signal; and an output circuit converting the filter signal into the output signal of a pulse type, wherein the level reset circuit resets the filter signal to have a high level when the input signal and the output signal all have a high level, and resets the filter signal to have a low level when the input signal and the output signal all have a low level.
In other embodiments of the present invention, pulse noise suppression methods includes: converting an input signal of a pulse type into a filter signal of an increasing or decreasing type; performing a reset operation of the filter signal in response to the input signal and an output signal; and converting the filter signal into the output signal of a pulse type, wherein, in the performing of a reset operation, when the input and output signals all have a high level, the filter signal is reset to have a high level, and when the input and output signals all have a low level, the filter signal is reset to have a low level.
The accompanying drawings are included to provide a further understanding of the present invention, and are incorporated in and constitute a part of this specification. The drawings illustrate exemplary embodiments of the present invention and, together with the description, serve to explain principles of the present invention. In the drawings:
Preferred embodiments of the present invention will be described below in more detail with reference to the accompanying drawings. The present invention may, however, be embodied in different forms and should not be constructed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the present invention to those skilled in the art.
Hereinafter, it will be described about an exemplary embodiment of the present invention in conjunction with the accompanying drawings. Like reference numerals refer to like elements throughout.
A pulse width discriminating a normal signal from a pulse noise is defined as a pulse noise reference time ΔT. The pulse noise reference time ΔT is determined by characteristics of elements included in a circuit.
The filter circuit 110 receives an input signal Vin of a pulse type, which is a digital signal, by using characteristics of a low frequency filter, and converts the input signal Vin into a filter signal Vfilter having a gradually increasing and decreasing type. The filter signal Vfilter is transmitted to an input stage of the output circuit 130.
The level reset circuit 120 resets the filter signal Vfilter in response to the input signal Vin and an output signal Vout. For example, when the input signal Vin and the output signal Vout all have a low level Low, the level reset circuit 120 resets the filter signal Vfilter to have a low level Low. When the input signal Vin and the output signal Vout all have a high level High, the level reset circuit 120 resets the filter signal Vfilter to have a high level High. The input signal Vin and the output signal Vout have different levels, the level reset circuit 120 does not reset the filter signal Vfilter. In this case, the filter signal Vfilter passing through the filter circuit 110 is transferred to the output circuit 130 without change.
The output circuit 130 receives the filter signal Vfilter. When a voltage level of the filter signal Vfilter is higher than the reference voltage of the output circuit 130, the output circuit 130 converts the filter signal Vfilter to an output signal Vout of a high level High. When a voltage level of the filter signal Vfilter is lower than the reference voltage of the output circuit 130, the output circuit 130 converts the filter signal Vfilter into an output signal Vout of a low level Low.
The filter circuit 110a includes an inverter INV1, a driver circuit 111a and a capacitor circuit 112a. Due to characteristics of a low frequency filter configured of a combination of the driver circuit 111a and the capacitor circuit 112a, the filter circuit 100a converts an input signal Vin of a pulse type into a gradually increasing or decreasing filter signal Vfilter. The converted filter signal Vfilter is transferred to an input stage of the output circuit 130a.
The inverter INV1 inverts the input signal Vin and transfers to the driver circuit 111a. The inverter INV1 is a typical inverter circuit.
The driver circuit 111a includes a P-channel metal-oxide-semiconductor (PMOS) transistor MP1 and an N-channel metal-oxide-semiconductor (NMOS) transistor MN1. The PMOS transistor MP1 and the NMOS transistor MN1 have a smaller current amount flowing therethrough than elements used in a typical inverter INV1. The driver circuit 111a is combined with the capacitor circuit 112a to control the filter signal Vfilter to be gradually increased or decreased. It is well understood that the driver circuit 111a is not limited thereto, and may be variously applied to an inverter or the like which adopts elements having a smaller current amount flowing therethrough than a typical inverter INV1.
The capacitor circuit 112a includes a PMOS transistor MP2 and an NMOS transistor MN2. The PMOS transistor MP2 and the NMOS transistor MN2 form a pair to play a role of a capacitor of a low frequency filter. The PMOS transistor MP2 and NMOS transistor MN2 enable the filter signal Vfilter to be gradually increased or decreased by charging and discharging. The capacitor circuit 112a is not limited thereto. It will be well understood that the capacitor circuit 112a is variously applied to a parasitic capacitor having capacitor characteristics of charging/discharging a charge in the filter circuit 110a, a MOS capacitor (MOSCAP) using transistors, or a capacitor formed by laminating a dielectric film and a conductor film in a manufacturing process of the filter circuit 110a.
The level reset circuit 120 includes a NAND gate NAND, a NOR gate NOR, a PMOS switch MP3, and an NMOS switch MN3. When a pulse noise having a pulse width shorter than the pulse noise reference time ΔT is flowed into the input signal Vin, the level reset circuit 120 rapidly resets the filter signal Vfilter to have a low level Low. Then a voltage level of the filter signal Vfilter does not become higher than the reference voltage of the output circuit 130. Their configurations and operations are described below.
The NAND gate NAND controls the PMOS switch MP3 in response to the input signal Vin and the output signal Vout. The source of the PMOS switch MP3 is connected to a power supply stage, and the drain thereof is connected to a node N1. For example, when a signal is not applied, the input signal Vin has a low level Low. Then an output value of the NAND gate NAND is a high level High. When a normal signal is applied, the input signal Vin has a high level and the filter signal Vfilter gradually increases. From a time when the signal is input and after the pulse noise reference time ΔT, the voltage level of the filter signal Vfilter is higher than the reference voltage of the output circuit 130a, the output signal Vout becomes to have a high level High. Then an output value of the NAND gate NAND changes into a low level Low and the PMOS switch is turned on. Therefore, the filter signal Vfilter is reset to have a high level High.
The NOR gate NOR controls the NMOS switch MN3 in response to the input signal Vin and the output signal Vout. The source of the NMOS switch MN3 is connected to ground and the drain thereof is connected to a node N1. For example, when a signal is not applied, the input signal Vin and the output signal Vout all have a low level Low, an output value of the NOR gate NOR is a high level High. Therefore, the NMOS switch MN3 maintains a turned-on state. In this case, the filter signal Vfilter is maintained to have a low level Low. When a pulse noise having a pulse width shorter than the reference time ΔT is input, the input signal Vin has a high level High, Then an output of the NOR gate NOR becomes to have a low level Low and the NMOS switch MN3 is turned off. Since the pulse width of the pulse noise is shorter than the reference time ΔT, the input signal Vin becomes to have again a low level Low, while the output signal Vout is still in a low level state. Then NMOS switch MN3 is turned on again, and the filter signal Vfilter having been gradually increased is rapidly reset to have a low level Low.
When the input signal Vin and the output signal Vout are different from each other, the PMOS switch MP3 and the NMOS switch MN3 all become turned off. When the input signal Vin and the output signal Vout all have a high level High, only the PMOS switch MP3 is turned on. When the input signal Vin and the output signal Vout all have a low level Low, only the NMOS switch MN3 is turned on. Therefore, there is not a case where the two switches are simultaneously turned on. The filter signal Vfilter reset by the level reset circuit 120 is transferred to the output circuit 130a.
The output circuit 130a includes two inverters INV2 and INV3. The inverter INV2 converts the filter signal Vfilter into a digital signal to transfer to the inverter INV3. A voltage level of the filter signal Vfilter is lower than a threshold voltage of the inverter INV2, the inverter INV2 converts the filter signal Vfilter to a low level Low. When the voltage level is higher than a threshold voltage of the inverter INV2, the inverter INV2 converts the filter signal Vfilter into a high level High. The inverter INV3 inverts a signal transferred from the inverter INV2 to output as the output signal Vout.
Vin and the output signal Vout all have a low level Low, an output value of the NOR gate NOR is a high level High. Then the NMOS switch MN3 is turned on, and the filter signal Vfilter is rapidly reset to have a low level Low. The PMOS switch MP3 is still in a turned-off state.
NOR is a high level High. Then the NMOS switch MN3 is turned on, and the filter signal Vfilter is rapidly reset to have a low level Low. The PMOS switch MP3 is still in a turned-off state. When a second pulse noise is flowed into at a time t4, the filter signal Vfilter is gradually increased by the same process as described above. When the second pulse noise becomes to have a low level Low at a time t5, the filter signal Vfilter is rapidly reset to have a low level Low.
By the above described process, even though a continuous pulse noise at a short interval is applied as an input, an overlap of the filter signal Vfilter, which occurs in a typical technology, does not occur, and an error pulse is not generated in the output signal Vout.
In order to set the pulse noise reference time ΔT′ to be long, the driver circuit 111b of the filter circuit 110b includes a current source Isrc and two switches MP1 and MN1. The current source Isrc of the driver circuit 111b adjusts an amount of a current flowing through the transistor MP1 and MN1. Accordingly, since a charging/discharging speed of the capacitor circuit 111b may be greatly lowered, a rate of voltage rise/voltage drop of the filter signal Vfilter may be lowered. Then a time for a voltage level of the filter signal Vfilter reaching the reference voltage of the output circuit 130b becomes longer. Accordingly, the pulse noise reference time ΔT′ may be set to be long.
In order to set the pulse noise reference time ΔT′ to be long, the output circuit 130b includes a Schmitt trigger and an inverter INV3. A typical inverter has a single threshold voltage value. In contrast, the Schmitt trigger has two different threshold voltage values when an input voltage increases or decreases. Therefore, by using the Schmitt trigger, a time for a voltage level of the filter signal Vfilter reaching the reference voltage of the output circuit 130b becomes longer. Accordingly the pulse noise reference time ΔT′ can be set to be long.
The current source Isrc in the driver circuit 111b and the Schmitt trigger in the output circuit 130b may be used separately. When the current source Isrc in the driver circuit 111b and the Schmitt trigger in the output circuit 130b are combined to be used, the pulse noise reference time ΔT′ can be set to be longer.
According to embodiments of the present invention, an error signal due to inflow of continuous pulse noise can be suppressed and a pulse noise can be suppressed without changes in widths of input/output pulses. A pulse noise suppression circuit miniaturized through a simple configuration can be provided. In addition, a pulse noise suppression circuit having low power consumption without any separate delay circuit can be provided. The present invention provides a method of enhancing reliability in digital signal transmission and reception. Therefore, the present invention may be applied to all the circuits performing digital signal transfer.
The above-disclosed subject matter is to be considered illustrative, and not restrictive, and the appended claims are intended to cover all such modifications, enhancements, and other embodiments, which fall within the true spirit and scope of the present invention. Thus, to the maximum extent allowed by law, the scope of the present invention is to be determined by the broadest permissible interpretation of the following claims and their equivalents, and shall not be restricted or limited by the foregoing detailed description.
Number | Date | Country | Kind |
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10-2012-0129580 | Nov 2012 | KR | national |