Claims
- 1) A method for detecting a manufacturing defect in microarray production comprising:
Detecting surface properties of an array; Comparing the surface properties of the array with a reference to determine whether the array is defective.
- 2) The method of claim 1 wherein the surface properties are detected using FTIR.
- 3) The method of claim 1 wherein the surface properties are detected using Surface Raman spectroscopy.
- 4) The method of claim 1 wherein the surface properties are determined by X-ray diffraction (XRD).
- 5) The method of claim 1 wherein the surface properties include refractive index.
- 6) The method of claim 1 wherein the surface properties include change in polarization state.
- 7) The method of claim 1 wherein the surface properties include change in extinction coefficient.
- 8) A process for making a microarray comprising:
Spotting at least 1000 different polymers onto a substrate, wherein each of the different polymers is immobilized on a different location; Detecting surface properties of the substrate to determine whether the spotting step is successful; and Correcting spotting failure.
- 9) The method of claim 8 wherein the surface properties are detected using FTIR.
- 10) The method of claim 9 wherein the surface properties are detected using Surface Raman spectroscopy.
- 11) The method of claim 10 wherein the surface properties are determined by X-ray diffraction (XRD).
- 12) The method of claim 11 wherein the surface properties include refractive index.
- 13) The method of claim 12 wherein the surface properties include change in polarization state.
- 14) The method of claim 13 wherein the surface properties include change in extinction coefficient.
- 15) The method of claim 8 wherein the correcting failure step comprises spotting a defective spot.
RELATED APPLICATIONS
[0001] This application claims the priority of U.S. Provisional Application Serial No. 60/400,179, filed on Jul. 31, 2002. The '179 application is incorporated herein by reference for all purposes.
Provisional Applications (2)
|
Number |
Date |
Country |
|
60400179 |
Jul 2002 |
US |
|
60400421 |
Jul 2002 |
US |