Claims
- 1. A non-invasive process for detecting a sub-surface material flaw within a metal substrate comprising the steps of:
inducing higher frequency and lower frequency eddy current fields in a test substrate; measuring the magnitude of the eddy currents produced within the substrate at the surface of the substrate; subtracting the higher frequency eddy current field from the lower frequency eddy current field.
- 2. The method according to claim 1, wherein the substrate surface is measured at a plurality of surface locations.
- 3. The method according to claim 1 wherein the eddy current magnitude for the sector is the sum of the eddy current magnitudes of the locations located within the sector.
- 4. The method according to claim 1, wherein the eddy current fields are induced substantially simultaneously.
- 5. The method according to claim 1, wherein the sub-surface comprises an opposing surface.
- 6. The method according to claim 1, wherein the sub-surface material flaw is located more than about 0.100 inch from the material surface.
- 7. The method according to claim 1, wherein the sub-surface material flaw is located a distance from the surface of from about 0.100 inch to about 0.750 inch.
- 8. The method according to claim 1 further comprising the steps of:
inducing eddy currents in a reference substrate; measuring the magnitude of the eddy current produced within the substrate at a plurality of locations of known volume loss on the surface of the substrate; and determining a calibration factor (Cf) based on the measured magnitudes at the locations on the reference substrate.
- 9. The method according to claim 8 wherein the step of:
determining the calibration factor (Cf) comprises selecting a sector of predetermined volume loss and surface area, summing the eddy current measurements for the locations within the sector, to provide an eddy current magnitude for the sector and dividing the predetermined volume loss of the sector by the eddy current magnitude for the sector and the surface area of the sector to produce calibration factor (Cf).
- 10. The method according to claim 1 further comprising the steps of:
inducing eddy currents in a reference substrate having a surface comprising a plurality of sectors of predetermined surface area and predetermined volume loss such that at least a portion of the sectors have minimum volume loss and at least a portion of the sectors have a positive volume loss; measuring the magnitude of the eddy current produced within the reference substrate at a plurality of locations within each sector; averaging the eddy current magnitudes measured for the locations having minimal volume loss to provide a threshold level (T); normalizing the eddy current magnitudes for the locations in the sectors having positive volume loss by subtracting the threshold level (T) from the measured magnitudes at the locations; summing the normalized eddy current magnitudes measured at each of the locations in a sector to provide a normalized eddy current magnitude for the sector; and determining a calibration factor (Cf) representing the measured volume per unit area eddy current magnitude by dividing the predetermined volume loss of the sector by the normalized eddy current magnitude for the sector and the surface area of the sector.
- 11. The method according to claim 10, wherein at least a portion of the sectors have no volume loss.
- 12. The method according to claim 10, wherein the eddy currents are induced substantially simultaneously.
- 13. The method according to claim 10, wherein the sub-surface comprises an opposing surface.
- 14. A method for measuring the sub-surface volume loss of a metal substrate comprising the steps of:
inducing high and low frequency eddy current fields substantially simultaneously to a metal reference substrate sub-surface having a sub-surface comprising a plurality of sectors of predetermined surface area and predetermined volume loss such that at least a portion of the sectors have minimum volume loss and at least a portion of the sectors have a positive volume loss; measuring the magnitude of the eddy current fields produced within the reference substrate at a plurality of locations within each sector; averaging the eddy current field magnitudes measured for the locations in the sectors having minimum volume loss to provide a threshold level (T); subtracting the threshold level (T) from the measured magnitudes for the locations in the sectors having positive volume loss to provide a normalized eddy current field magnitude for each location; summing the normalized eddy current magnitudes measured at each of the locations in the sector having the greatest volume loss to provide a normalized eddy current field magnitude for the sector of greatest volume loss; dividing the predetermined volume of the sector of greatest volume loss by the normalized eddy current magnitude for the sector of greatest volume loss and the surface area of the sector of greatest volume loss to produce a calibration factor (Cf) representing the measured volume per unit area eddy current magnitude; inducing high and low frequency eddy current fields in a metal test substrate; subtracting the high frequency eddy current field from the low frequency eddy current field to achieve a resulting eddy current field; measuring the magnitude of the resulting eddy current field produced within the test substrate at a plurality of sub-surface locations within sectors of predetermined surface area; subtracting the resulting measured eddy current field at the locations from the threshold value (T) to produce normalized eddy current magnitudes at the locations; summing the normalized eddy current magnitudes for the locations within each sector to produce a normalized eddy current magnitude for each sector; and multiplying the normalized eddy current magnitudes for each sector by the calibration factor (Cf) and by the surface area of the sector to provide volumetric measurements of the volume loss at the locations thereby providing a surface profile of volume loss on the test surface.
- 15. The method according to claim 14, wherein a portion of the sectors have no volume loss.
- 16. The method according to claim 14, wherein the sub-surface comprises an opposing surface.
- 17. A system for producing a profile of the volume loss along a surface of a metal substrate comprising:
a plurality of eddy current inducers positioned at a first surface for simultaneously inducing eddy current field having varied frequencies beneath the surface of a test substrate; a measurement device for measuring the magnitude of the eddy current fields produced beneath the substrate surface; and a converter device for converting the measured magnitudes at the locations to corresponding volume losses on a second surface.
- 18. The system according to claim 17 wherein said measurement device is an eddy current inspection probe having an inspection surface which corresponds to the test surface.
- 19. The system according to claim 17 wherein the eddy current inducer generates a primary magnetic field in the test substrate.
- 20. The system according to claim 17 wherein the test surface comprises sectors of predetermined surface area and the conversion device comprises:
an eddy current normalizer to normalize magnitudes measured on the surface of the substrate; means for summing the normalized eddy current magnitudes within a sector to provide a normalized eddy current magnitude for the sector; and means for multiplying the normalized eddy current magnitude of the sector by the surface area of the sector and a calibration factor (Cf) representing the volume per unit area eddy current magnitude to calculate the actual volume loss on the surface of the substrate within each sector.
- 21. The system according to claim 17, wherein the second surface is an opposing surface.
- 22. The system according to claim 17, wherein the plurality of eddy current fields are induced substantially simultaneously.
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This application claims the benefit of U.S. Provisional Patent Application No. 60/297,535, filed Jun. 12, 2001.
Provisional Applications (1)
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Number |
Date |
Country |
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60297535 |
Jun 2001 |
US |