Claims
- 1. A method for obtaining information about an object, comprising steps of:placing a plurality of regions onto the object, each region emitting a predetermined wavelength of light; detecting the light; and decoding information from the detected light, wherein at least one region is comprised of semiconductor particles having a radius larger than a quantum dot radius for a corresponding semiconductor material, and a chemical composition selected to provide the predetermined wavelength of light, where the semiconductor material is comprised of one of a Group II-VI alloy, or a Group III-V alloy, or a compound comprised of an indirect bandgap material, and wherein the concentrations of the alloy or compound constituent elements are preselected to provide the predetermined emission wavelength.
- 2. A method as in claim 1, wherein the semiconductor material is further comprised of a dopant.
- 3. A method as in claim 1, wherein the semiconductor material alloy has the form ABxC1−x, where A, B and C are each a different element.
- 4. A method as in claim 1, wherein the semiconductor material alloy has the form ABxC1−x, where A, B and C are each a different element, and where in at least two of said plurality of regions the value of x is different.
- 5. A system for obtaining information about an object, comprising:a plurality of regions associated with the object, each region emitting a predetermined wavelength of light; a detector for detecting the light; and a decoder for decoding information from the detected light, wherein at least one region is comprised of semiconductor particles having a radius larger than a quantum dot radius for a corresponding semiconductor material, and a chemical composition selected to provide the predetermined wavelength of light, wherein the semiconductor material is comprised of one of a Group II-VI alloy, or a Group III-V alloy, or a compound comprised of an indirect bandgap material, and wherein the concentrations of the alloy or compound constituent elements are preselected to provide the predetermined emission wavelength.
- 6. A system as in claim 5, wherein the semiconductor material is further comprised of a dopant.
- 7. A system as in claim 5, wherein the semiconductor material alloy has the form ABxC1−x, where A, B and C are each a different element.
- 8. A system as in claim 5, wherein the semiconductor material alloy has the form ABxC1−x, where A, B and C are each a different element, and where in at least two of said plurality of regions the value of x is different.
- 9. A system for obtaining information about a substrate comprising:a substrate having a plurality of discrete regions thereon, at least one of the discrete regions containing particles, each of the particles having a surface dimension greater than a quantum dot dimension for a corresponding semiconductor material, wherein the particles are preselected to emit an associated predetermined emission wavelength; an excitation source, adapted to provide radiation that causes the particles of a particular region to emit the associated predetermined emission wavelength of the particular region; a detection unit adapted to detect the associated predetermined emission wavelength from the particles of each region and the detection unit adapted to generate electrical signals as a function of the detected associated predetermined emission wavelength; and a processing unit adapted to receive the electrical signals from the detection unit and process the electrical signals to establish a characteristic of the substrate.
- 10. A system as in claim 9, farther comprising:a memory unit, coupled to the processing unit, the memory unit adapted to store data relating to selected characteristics of a plurality of substrates.
- 11. A system as in claim 9, wherein the particles include CdSxSe1−x.
- 12. A system as in claim 9, wherein the particles include ZnSxSe1−x.
- 13. A system as in claim 9, wherein each particle has a surface dimension that exceeds approximately 15 nanometers.
- 14. A system as in claim 9, wherein at least one region has particles comprised of an indirect bandgap material.
- 15. A system as in claim 14, wherein the indirect bandgap material is Si.
- 16. A system as in claim 14, wherein the indirect bandgap material is Ge.
- 17. A method as in claim 1, wherein the indirect bandgap material is Si.
- 18. A method as in claim 1, wherein the indirect bandgap material is Ge.
Parent Case Info
This application claims the benefit of Provisional Application No. 60/187,607, filed Mar. 7, 2000.
US Referenced Citations (16)
Foreign Referenced Citations (1)
Number |
Date |
Country |
WO-9614206 |
May 1996 |
WO |
Non-Patent Literature Citations (3)
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International Search Report for PCT Patent Application No. PCT/US01/07328. Filed Mar. 7, 2001. |
Chan et al. “Quantum Dot Bioconjugates for Ultrasensitive Nonisotopic Detection.” http://www.sciencemag.org. Jun. 7, 1999. |
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Provisional Applications (1)
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Number |
Date |
Country |
|
60/187607 |
Mar 2000 |
US |