Vacuum process chambers are often employed in manufacturing to provide a vacuum environment for tasks such as semiconductor wafer fabrication, electron microscopy, gas chromatography, and others. Such chambers are typically achieved by attaching a vacuum pump to the vacuum process chamber by a vacuum connection such as a flange and a conduit. The vacuum pump operates to remove substantially all of the molecules from the process chamber, therefore creating a vacuum environment.
A cryogenic vacuum pump, known as a cryopump, employs a refrigeration mechanism to achieve low temperatures that will cause many gases to condense onto a surface cooled by the refrigeration mechanism. One type of cryopump is disclosed in U.S. Pat. No. 5,862,671, issued Jan. 26, 1999 and assigned to the assignee of the present application. Such a cryopump uses a two-stage helium driven refrigerator to cool a cold finger to near 10 degrees Kelvin(K.). Another type of cryopump, often referred to as a water pump is disclosed in U.S. Pat. No. 5,887,438, issued Mar. 30, 1999 and also assigned to the assignee of the present application. A cryogenic water pump is typically employed in conjunction with a turbomolecular pump, and is also used to condense gases onto a helium cooled surface, or cryogenic array, which is cooled to around 100K.
Since the cryogenic arrays are cooled to very low temperatures, heat flow to the cryogenically cooled surface is ideally minimized. Undesired heat increases the time required to cool down the pump, increases the helium consumption of the pump, and influences the minimum temperature the cryopump achieves.
Note that both a cryopump and a waterpump, as disclosed herein, employ one or more refrigerant-cooled surfaces for condensing gases for the purpose of removing the gases from a closed environment such as a process chamber. A waterpump, for example, may be considered functionally equivalent to a cryopump having a single refrigerant-cooled surface, or stage. Accordingly, both a cryopump and a waterpump may benefit from radiation absorption as disclosed herein and therefore, the term “cryopump” may hereinafter be taken to imply either a cryopump or a waterpump.
A radiation shield may be employed around the cryogenic array to minimize the thermal load on the cryogenic array. Such a radiation shield may take the form of an enclosure around the cryogenic array, and may include louvers or chevrons to allow fluid communication with the vacuum process chamber. Louvers and chevrons, however, can interfere with the fluid communication, or gaseous flow, from the vacuum process chamber, decreasing flow rate and efficiency, and, therefore, increasing the time required to achieve the desired vacuum state.
A radiation shield for such a vacuum system employs a vacuum conduit connected to a vacuum pump, the vacuum conduit having an internal shield surface which absorbs radiation to reduce the total radiation falling on the vacuum pump. Since the surface treatment is on the interior surface of the conduit and does not extend into the center of a fluid path defined by the conduit, gaseous flow to the pump is not impeded. A vacuum system which eliminates the radiation load from the process chamber before the radiation falls on the cryogenic array, and which does not obstruct the flow of gases to the cryogenic array, provides an unimpeded flow of gases while also reducing the radiation load on the cryogenic array. The system therefore minimizes the radiation load on the cryogenic array in the vacuum pump without interfering with the gaseous flow through the vacuum pump.
The use of a surface treatment having a high emissivity causes more radiation from a high temperature source to be absorbed, because emissivity is directly related to absorption, and therefore less radiation from the high temperature source is reflected onto the vacuum pump. Since the vacuum conduit comprising the surface treatment may be a preexisting conduit in the fluid path between the vacuum pump and vacuum process chamber, no additional surface area is introduced into the vacuum system. In this manner, an existing vacuum conduit is adapted to reduce the total radiation load which the cryopump would otherwise need to accommodate by intercepting some incoming thermal radiation and re-radiating it from a lower temperature.
The foregoing and other objects, features and advantages of the invention will be apparent from the following more particular description of preferred embodiments of the invention, as illustrated in the accompanying drawings in which like reference characters refer to the same parts throughout the different views. The drawings are not necessarily to scale, emphasis instead being placed upon illustrating the principles of the invention.
a and 3b show surfaces having different emissivity;
c shows the effect of emissivity and temperature on a cryopump;
a shows a cryopump employing the surface of
b shows a cryopump employing the surface of
a shows a perspective view of a vatterfly valve assembly employing a surface treatment; and
b shows a side view of the vatterfly valve assembly of
A description of preferred embodiments of the invention follows.
In a cryogenic vacuum pump, a cooling surface, or cryogenic array, is cooled by a helium refrigerator. As helium remains gaseous at very low temperatures, helium is an ideal refrigerant for a cryogenic process. As the cryogenic array is cooled, it achieves a temperature low enough to condense gases from the vacuum process chamber. As the gases are condensed or adsorbed onto the cryogenic array, a vacuum is created in the vacuum process chamber. The cryogenic array may be cooled to a point at which most gases will condense, or may be cooled to a point at which most of the water vapor will condense, while the remaining gases may be removed by a supplemental vacuum pump such as a turbomolecular pump.
Prior to discussing the invention as defined by the present claims, a discussion of a cryopumping apparatus adapted for a vacuum process chambers may be beneficial.
A first-stage heat station 50 is mounted at the cold end of the first stage 52 of the refrigerator. Similarly, heat station 54 is mounted to the cold end of the second stage 56. Suitable temperature sensor elements 58 and 60 are mounted to the rear of the heat stations 50 and 54.
The primary pumping surface is a cryopanel array 62 mounted to the heat station 54. This array comprises a plurality of disks as disclosed in U.S. Pat. No. 4,555,907. Low temperature adsorbent is mounted to protected surfaces of the array 62 to adsorb noncondensible gases.
A cup-shaped radiation shield 64 is mounted to the first stage heat station 50. The second stage of the cold finger extends through an opening in that radiation shield 64. This radiation shield 64 surrounds the primary cryopanel array to the rear and sides to minimize heating of the primary cryopanel array by radiation. The temperature of the radiation shield may range from as low as 40K at the heat station 50 to as high as 130K adjacent to the opening 68 to an evacuated chamber.
A frontal cryopanel array 70 serves as both a radiation shield for the primary cryopanel array and as a cryopumping surface for higher boiling temperature gases such as water vapor. This panel comprises a circular array of concentric louvers and chevrons 72 joined by a spoke-like plate 74. The configuration of this cryopanel 70 need not be confined to circular, concentric components; but it should be so arranged as to act as a radiant heat shield and a higher temperature cryopumping panel while providing a path for lower boiling temperature gases to the primary cryopanel. The frontal cryopanel array 70, while effective at reducing radiation, may tend to impede the flow of gases past the chevrons and louvers.
Also illustrated in
The cryopump is typically attached to a vacuum process chamber via a conduit including a flange 22. In accordance with the present invention, adhesion of a high emissivity surface treatment to a shield surface defined by the interior surface of the conduit forms a radiation shield for the cryopump which can absorb radiation which would otherwise have fallen on the cryopump. Such a surface treatment is typically employed in conjunction with the existing louvers and chevrons, however, in alternate embodiments could be employed alone, if operating conditions permit. Since ideally the conduit is a vessel which is already in the system, no additional conduit length which could impede gaseous flow is imposed. Further, although the emissive and reflective properties are discussed herein with respect to a surface treatment, such properties may also apply to the surface of a conduit formed from a homogeneous substance.
In operation, in order to evacuate the process chamber 15, refrigerator 16 is turned on, cooling the array 30 to cryogenic temperatures. Turbomolecular pump 12 is turned on and rotating turbine blades of turbomolecular pump 12 begin to pump gases from process chamber 15 through water pump 10. The non-condensing gases pass through array 30 while water vapor condenses on the surfaces of array 30. The remaining non-condensing gases such as nitrogen and argon are pumped from the system by turbomolecular pump 12. Periodically, when the array 30 becomes full with frost, water pump 10 is regenerated to release the water vapor trapped on the array 30.
The array 30 operates on the principle that gases passing through fluid conduit 32 and the central opening 24 in array 30 flow in a typical molecular flow pattern. Array 30 is capable of trapping about 90% of the water vapor passing through water pump 10. For example, if a 4 inch turbomolecular pump 12 is used without water pump 10, the water pumping speed is only about 250 liters per second at a pressure of about 10−5 torr. The addition of water pump 10 to turbomolecular pump 12 increases the water pumping speed to about 1300 liters per second at a pressure of about 10−5 torr.
Continuing to refer to
The surface treatment is ideally a substance with a high emissivity, as described further below. Briefly discussing pertinent aspects of radiated electromagnetic energy, the properties of a surface which affect the radiated energy include emissivity ε, reflectance r, transmittance t, and absorbency α. A further component, scattering, may also affect the radiated energy. The reflectance of a surface is the percentage of total radiation falling on a body which is reflected back from the surface. Reflectance is zero for a blackbody and nearly 1.00 for a highly polished surface. Transmissivity is the percentage of total radiation falling on a body which passes directly through it without being absorbed. Transmissivity is zero for a blackbody and nearly 1.00 for a material like glass. The emissivity of an object is the ratio of radiant energy emitted by that object divided by the radiant energy which a blackbody would emit at the same temperature. Emissivity ε equals absorbency α at a constant temperature. Further, since the total radiation received is either absorbed, reflected, or transmitted:
1=α+r+t
As disclosed herein, the fluid conduit 21 is typically an opaque material in a closed system, therefore transmission and scattering effects are negligible, and accordingly, emissivity and reflectivity are the properties considered herein. Referring to
ε=0.9
r=0.1
α=0.9
Accordingly, 10% of the received energy is reflected, as shown by arrows 206, and the remaining 90% is absorbed, as shown by arrow 208, consistent with the above equations.
Referring to
ε=0.1
r=0.9
α=0.1
Accordingly, only 10% of the received energy is absorbed, as shown by arrows 218, with the remaining 90% being reflected, as shown by arrows 216.
Accordingly, application of a surface treatment having a high emissivity in the path of gaseous flow to a cryopump can have the effect of absorbing radiation which would have otherwise have fallen on the cryopump. A particular radiation absorbing surface treatment can be applied to a cryopump, water pump, or other cryogenic apparatus as described further below. In a particular embodiment, the emissivity of the surface treatment should be greater than 0.8, so that sufficient radiation may be absorbed. However, emissive properties of even a small degree will tend to absorb more energy than is emitted if the emissive surface is maintained at a low temperature relative to the radiation source.
c shows a general example of radiation activity in a cryopump. Radiation emitted from a body varies with temperature. The Stefan-Boltzman law indicates that the radiation emitted increases as the fourth power of the absolute temperature:
Q=AσεT4
where σ is the Stefan's constant, 5.67*10−8Wm−2*K−4 and A is the area. This law illustrates that as the temperature of a radiated body increases, the emitted energy increases exponentially. Conversely, if the temperature decreases, emitted radiation can be reduced by an exponential amount. Therefore, by keeping the temperature of an emissive body relatively low, emitted radiation is limited, while, since the surface is not reflective, radiation is still absorbed.
Referring to
In a typical vacuum environment, the temperature in the process chamber is relatively higher than the cryopump 20 or the surface 102, and therefore the process chamber tends to be the primary source of radiation, because of the T34 term. Similarly, if the surface 102 has a high emissivity and is maintained at a relatively low temperature, the reflected energy and T24 terms remain relatively small, resulting in reduced radiation emitted or reflected onto the cryopump from the surface 102.
a and 4b show an example of radiation activity in a cryopump employing the surface treatments of
Qreflect=10 kW*0.1=1 kW
and the radiation absorbed is:
Qabsorb=10 kW*0.9=9 kW
The absorbed radiation, however, results in emitted radiation back onto the cryopump, as follows. For this example, the conduit 104 shown is 20 cm in diameter and 20 cm long. For simplification, assume that we ignore the effects of radiation from the cryopump, and assume further that all the radiation reflected and emitted from the surface 102 falls on the cryopump. In actuality, these effects would further reduce the radiation falling on the cryopump; however, the example herein will be illustrative, nonetheless. As indicated above, the conduit has an interior surface with the properties of the material shown in
Qblack=1200 cm2*0.05 w/cm2=60 W
The surface material shown in
Qemit=1200 cm2*(0.05*0.9)W/cm2=54 W@300K
Consistent with the two assumptions described above. Note that the actual radiation falling on the cryopump would be less, because the cryopump emits some radiation back to the chamber and because not all the emitted radiation falls on the cryopump. Accordingly, the total radiation falling on the cryopump is the sum of radiation reflected and radiation emitted in all directions:
Qcryo=1000 W+54 W=1054 W
The surface treatment 100 maybe an emissive substance such as paint, amythrocite, polytetrafluoroethylene (TEFLON®), oxide or glass adapted to absorb radiation. Since it is applied to the interior surface of the vacuum conduit 104, it ideally has low outgassing properties so as to not compromise the vacuum environment.
Referring now to the prior art of
Qreflect=10 kW*0.9=9 kW
and absorbs:
Qabsorb=10 kW*0.1=1 kW
Further, the radiation absorbed results in radiation emitted:
Qemit=1200 cm2*(0.05*0.1)w/cm2=6 W
The total radiation falling on the cryopump, therefore, is:
Qcryo=9000 W+6 W=9006 W
In contrast to the vacuum conduit shown in
a and 6b show another particular embodiment adapted for a cryopump employing a vatterfly valve. The vacuum conduit 104 is defined by the interior of a vatterfly valve 110. The vatterfly valve is adapted to be disposed between a vacuum process chamber 15 and a vacuum pump (not shown). The surface treatment 100 is applied to the interior walls 112 of the vatterfly valve 110. A valve plate 120 is operable to rotate 90° as shown by arrow 122 for sealing off the process chamber 15. As described above, the surface treatment is highly emissive so as to absorb radiation, and has low outgassing properties.
While this invention has been particularly shown and described with references to preferred embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the scope of the invention encompassed by the appended claims. Accordingly, the present invention is not intended to be limited except by the following claims.
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