Claims
- 1. A radioactive implantable device comprising:
a base; a first layer comprising Cu and a radioactive isotope on the base; and a second layer comprising Sn on the first layer.
- 2. The radioactive implantable device of claim 1 wherein the base comprises stainless steel.
- 3. The radioactive implantable device of claim 1 wherein the radioactive isotope comprises a radioisotope of Re.
- 4. The radioactive implantable device of claim 3 wherein the radioactive isotope of Re comprises 188Re or 186Re.
- 5. A process of producing a radioactive implantable device comprising a base, the process comprising:
depositing a first layer comprising Cu and a radioactive isotope on the base; and depositing a second layer comprising Sn on the first layer.
- 6. The process of claim 5 wherein the radioactive isotope comprises a radioisotope of Re.
- 7. The process of claim 6 wherein the radioactive isotope of Re comprises 188Re or 186 Re.
- 8. The process of claim 5 wherein the base comprises stainless steel.
- 9. The process of claim 8, further comprising the step of removing Cr2O3 from the base prior to depositing the first layer thereon.
- 10. The process of claim 9 wherein the removal step comprises electroetching the base.
- 11. The process of claim 10 wherein the electroetching step comprises placing the base in a solution comprising HCl and Re.
- 12. The process of claim 10 wherein the electroetching step is conducted on the base until a voltage drop is observed.
- 13. The process of claim 9 wherein the removal step comprises immersing the base in an acid solution.
- 14. The process of claim 13 wherein the acid solution comprises HCl.
- 15. The process of claim 14 wherein the acid solution is heated to approximately 1000° C.
- 16. The process of claim 5, further comprising the step of rinsing the base prior to depositing the first layer thereon.
- 17. The process of claim 16 wherein the rinsing step is conducted to degrease the base, maintain the sterility of the base and/or minimize microbiological activity on the base.
- 18. The process of claim 16 wherein the rinsing step comprises immersing the base in ethanol or water.
- 19. The process of claim 5 wherein the first layer is deposited on the base by electrochemical deposition comprising a cathode and an anode connected to a voltage source and immersed in a solution.
- 20. The process of claim 19 wherein the cathode comprises the base, the anode comprises Cu and the solution comprises a radioactive isotope in HCl.
- 21. The process of claim 20 wherein the radioactive isotope comprises a radioactive isotope of Re.
- 22. The process of claim 21 wherein the radioactive isotope of Re comprises 188Re or 186Re.
- 23. The process of claim 21 wherein Cu2+ is released from the anode into the solution and then co-deposited with the radioactive isotope of Re onto the base.
- 24. The process of claim 5 wherein the second layer is deposited on the first layer by electrochemical deposition comprising a cathode and an anode connected to a voltage source and immersed in a solution.
- 25. The process of claim 19 wherein the length of the anode is substantially equal to the length of the cathode.
- 26. The process of claim 19 wherein the anode substantially extends along the length of the cathode.
- 27. The process of claim 26 wherein the anode is substantially disposed around the circumference of the cathode.
- 28. The process of claim 27 wherein the anode comprises a plurality of turns.
- 29. The process of claim 28 wherein the anode comprises two ends sections and a middle section, and further wherein the turns in the middle section are more tightly wound than the turns in the end sections.
- 30. The process of claim 19 wherein the anode does not substantially extend along the length of the cathode.
- 31. The process of claim 19 wherein the current level is reduced from a first level to a second level during the electrochemical deposition.
- 32. The process of claim 31 wherein the reduction in current level optimizes the surface finish of the first layer.
- 33. The process of claim 19 wherein the current direction is switched from a first direction to a second direction during the electrochemical deposition.
- 34. The process of claim 33 wherein the switch in current direction is maintained for a period of time during the electrochemical deposition.
- 35. The process of claim 33 wherein the switch in current direction optimizes the surface finish of the first layer.
- 36. The process of claim 19 wherein the duration of the electrochemical deposition is adjusted to customize the results thereof.
- 37. The process of claim 19 wherein the current is adjusted during the electrochemical deposition to customize the results thereof.
- 38. The process of claim 19 wherein the current and duration of the electrochemical deposition is adjusted to customize the results thereof.
- 39. The process of claim 5, further comprising:
rinsing the base comprising the first layer deposited thereon prior to depositing the second layer thereon.
- 40. The process of claim 39 wherein the rinsing step is conducted to adjust the amount of radioactivity provided by the radioactive isotope on the base.
- 41. The process of claim 40 wherein the rinsing step comprises immersing the base in ethanol or water.
- 42. The process of claim 5 wherein the steps of depositing the first and second layers occurs by electrochemical deposition.
- 43. The process of claim 42 wherein the electrochemical deposition of the first and second layers occurs in a single electrochemical cell.
- 44. The process of claim 42 wherein the electrochemical deposition of the first layer occurs in a first electrochemical cell and the electrochemical deposition of the second layer occurs in a second electrochemical cell.
- 45. The process of claim 27 wherein the anode comprises a cylindrical mesh.
- 46. The process of claim 27 wherein the anode comprises a solid cylindrical sheet.
- 47. The process of claim 26 wherein the anode comprises a wire.
- 48. The process of claim 19 wherein gas is released from the solution during the electrochemical deposition.
- 49. The process of claim 48 wherein the release of the gas mixes the solution and improves the deposition of the radioactive isotope on the base.
- 50. The process of claim 48 wherein the gas is O2 or H2 or any combination of these gases.
- 51. A process of producing a radioactive implantable device comprising a base, the process comprising:
depositing a layer comprising Cu, Sn and a radioactive isotope on the base.
- 52. The process of claim 51 wherein the radioactive isotope comprises a radioisotope of Re.
- 53. The process of claim 52 wherein the radioactive isotope of Re comprises 188Re or 186Re.
- 54. The process of claim 51 wherein the base comprises stainless steel.
- 55. The process of claim 51 wherein the layer is deposited on the base by electrochemical deposition comprising a cathode and an anode connected to a voltage source and immersed in a solution.
- 56. The process of claim 55 wherein the cathode comprises the base, the anode comprises Sn and the solution comprises a Cu chelate, SnSO4 and a radioactive isotope.
- 57. The process of claim 56 wherein the radioactive isotope comprises a radioactive isotope of Re.
- 58. The process of claim 57 wherein the radioactive isotope of Re comprises 188Re or 186Re.
- 59. A process of preparing a stainless steel implantable device for radiolabeling, comprising:
removing Cr2O3 from the implantable device prior to radiolabeling.
- 60. The process of claim 59 wherein the removal step comprises electroetching the implantable device.
- 61. The process of claim 60 wherein the electroetching step comprises placing the implantable device in a solution comprising HCl and Re.
- 62. The process of claim 60 wherein the electroetching step is conducted on the implantable device until a voltage drop is observed.
- 63. The process of claim 59 wherein the removal step comprises immersing the implantable device in an acid solution.
- 64. The process of claim 63 wherein the acid solution comprises HCl.
- 65. The process of claim 64 wherein the acid solution is heated to approximately 1000° C.
- 66. The process of claim 59, further comprising the step of rinsing the implantable device.
- 67. The process of claim 66 wherein the rinsing step occurs prior to the removal step.
- 68. The process of claim 66 wherein the rinsing step is conducted to degrease the implantable device, maintain the sterility of the implantable device and/or minimize microbiological activity on the implantable device.
- 69. The process of claim 66 wherein the rinsing step comprises immersing the implantable device in ethanol or water.
- 70. A process of optimizing the surface finish of a radiolabeled implantable device produced by electrochemical deposition, the process comprising:
reducing the current level from a first level to a second level during the electrochemical deposition.
- 71. The process of claim 70, further comprising:
increasing the current level from the second level to the first level during the electrochemical deposition.
- 72. The process of claim 70, further comprising:
switching the current direction from a first direction to a second direction during the electrochemical deposition.
- 73. The process of claim 72, further comprising:
switching the current direction from the second direction to the first direction during the electrochemical deposition.
- 74. The process of claim 72 wherein the switch in current direction is maintained for a period of time during the electrochemical deposition.
- 75. The process of claim 70, further comprising:
adjusting the duration of the electrochemical deposition.
- 76. A process of adjusting the radioactivity of a radiolabeled implantable device, the process comprising:
rinsing the implantable device to remove a desired amount of radioactivity therefrom.
- 77. The process of claim 76 wherein the rinsing step removes all of the radioactivity from the implantable device.
- 78. The process of claim 76 wherein the rinsing step comprises immersing the implantable device in ethanol or water.
- 79. A process of customizing a radiolabeled implantable device produced by electrochemical deposition of a radioactive isotope on the implantable device, the process comprising:
compensating for the radioactive decay of the radioactive isotope by adjusting the duration of the electrochemical deposition.
- 80. The process of claim 79, further comprising:
adjusting the current level of the electrochemical deposition.
- 81. A process of customizing a radiolabeled implantable device produced by electrochemical deposition of a radioactive isotope on the implantable device, the process comprising:
compensating for the radioactive decay of the radioactive isotope by adjusting the current level during the electrochemical deposition.
- 82. The process of claim 81, further comprising:
adjusting the duration of the electrochemical deposition.
- 83. A process of customizing the radioactivity of a radiolabeled implantable device produced by electrochemical deposition, the process comprising:
adjusting the configuration of the anode to vary the deposition of the radioactive isotope on the implantable device.
- 84. The process of claim 83 wherein the adjusting step comprises varying the length of the anode.
- 85. The process of claim 84 wherein the length of the anode is shorter than the length of the implantable device.
- 86. The process of claim 83 wherein the anode is substantially disposed around the circumference of the implantable device.
- 87. The process of claim 86 wherein the anode comprises a plurality of turns.
- 88. The process of claim 87 wherein the anode comprises two ends sections and a middle section, and further wherein the turns in the middle section are more tightly wound than the turns in the end sections.
- 89. The process of claim 88 wherein the level of radioactivity is lower on portions of the implantable device corresponding to the end sections of the anode than on the portion of the implantable device corresponding to the middle section of the anode.
- 90. The radioactive implantable device of claim 1 wherein the radioactive isotope is selected from the group consisting of radioactive isotopes of Re, Be, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb, Te, Hf, Ta, W, Os, Ir, Pt, Au, Hg, Tl, Pb, Bi, Po, At, Th, Pa, U, Np, Pu, Am, Cm, Bk, Cf, Es, Fm, Md, No and Lr.
CROSS REFERENCE TO RELATED APPLICATION
[0001] This application claims the benefit of U.S. Provisional Application Serial No. 60/312,029, filed on Aug. 13, 2001, the contents of which are incorporated herein by reference.
Provisional Applications (1)
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Number |
Date |
Country |
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60312029 |
Aug 2001 |
US |