Number | Name | Date | Kind |
---|---|---|---|
3559167 | Carter et al. | Jan 1971 | |
3602886 | Carter et al. | Aug 1971 | |
3634665 | Carter et al. | Jan 1972 | |
3636443 | Singh et al. | Jan 1972 | |
3803568 | Higashide | Apr 1974 | |
3825894 | Johnson, Jr. | Jul 1974 | |
3838393 | Dao | Sep 1974 | |
4122995 | Franke | Oct 1978 | |
4570084 | Griffin et al. | Feb 1986 |
Entry |
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E. F. Hahn et al, IBM Technical Disclosure Bulletin, vol. 25, No. 2, Jul. 1982, p. 709, "VLSI Testing by On-Chip Error Detection". |