Claims
- 1. A reactive agent for decomposing fluorine compounds, comprising alumina and an alkaline earth metal compound.
- 2. The reactive agent for decomposing fluorine compounds as claimed in claim 1, wherein said alumina has a specific surface area of 50 m2/g or more.
- 3. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, wherein said alumina is pseudo boehmite alumina.
- 4. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, wherein said alumina is obtained by baking pseudo boehmite alumina at a baking temperature of from 400 to 1,000° C.
- 5. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, wherein said alkaline earth metal compound is carbonate of magnesium, calcium, strontium or barium.
- 6. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, wherein the alumina and the alkaline earth metal compound present in said reactive agent each is in the form of powder having a particle size of 100 μm or less.
- 7. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, wherein the alumina and the alkaline earth metal compound are present in said reactive agent at a mass ratio of from 1:9 to 1:1.
- 8. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, which additionally contains at least one oxide of a metal selected from the group consisting of copper, tin, nickel, cobalt, chromium, molybdenum, tungsten and vanadium.
- 9. The reactive agent for decomposing fluorine compounds as claimed in claim 8, wherein the content of said metal oxide, in terms of a ratio to the total mass of said alumina and alkaline earth metal compound, is from 1:99 to 5:95.
- 10. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, which has an alkali metal content of 0.1 mass % or less.
- 11. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, which is a granular product obtained by baking at a temperature of from 400 to 700° C.
- 12. The reactive agent for decomposing fluorine compounds as claimed in claim 11, which is a granular product having a particle size of from 0.5 to 10 mm.
- 13. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, which has a water content of 1 mass % or less.
- 14. The reactive agent for decomposing fluorine compounds as claimed in claim 1 or 2, wherein said fluorine compound is at least one fluorine compound selected from the group consisting of a perfluorocarbon, a hydrofluorocarbon, a chlorofluorocarbon, a hydrochlorofluorocarbon, a perfluoroether, a hydrofluoroether, a fluoroolefin, sulfur fluoride, SiF4 and COF2.
- 15. The reactive agent for decomposing fluorine compounds as claimed in claim 14, wherein said fluorine compound contains hydrogen chloride, hydrogen fluoride or a mixture of hydrogen chloride and hydrogen fluoride.
- 16. A process for decomposing fluorine compounds, comprising contacting a reactive agent with a fluorine compound at a temperature of 200° C. or more, wherein said reactive agent comprises alumina and an alkaline earth metal compound.
- 17. The process for decomposing fluorine compounds as claimed in claim 16, wherein the fluorine compound concentration in a gas to be treated by contacting it with the reactive agent is from 0.01 to 10 vol %.
- 18. A process for decomposing fluorine compounds, comprising contacting a reactive agent with a fluorine compound at a temperature of 500° C. or more in the presence of oxygen gas, thereby controlling the generation of carbon monoxide, wherein said reactive agent comprises alumina and an alkaline earth metal compound.
- 19. The process for decomposing fluorine compounds as claimed in claim 18, wherein the oxygen gas concentration in a gas to be treated is 20 vol % or less.
- 20. The process for decomposing fluorine compounds as claimed in claim 16 or 18, wherein chlorine atom, fluorine atom and/or sulfur atom produced on contacting the reactive agent with a fluorine compound are fixed as an alkaline earth metal chloride, an alkaline earth metal fluoride and/or an alkaline earth metal sulfate, respectively.
- 21. A process for manufacturing a semiconductor device, comprising an etching or cleaning step using as an etching gas or cleaning gas at least one fluorine compound selected from the group consisting of a perfluorocarbon, a hydrofluorocarbon, a chlorofluorocarbon, a hydrochlorofluorocarbon, a perfluoroether, a hydrofluoroether, a fluoroolefin and sulfur fluoride, and decomposing step of decomposing the fluorine compound-containing gas discharged from said etching or cleaning step using a reactive agent comprising alumina and an alkaline earth metal compound.
- 22. The process for manufacturing a semiconductor device as claimed in claim 21, wherein the gas discharged from said etching or cleaning step is a gas containing at least one fluorine compound selected from the group consisting of a perfluorocarbon, a hydrofluorocarbon, a chlorofluorocarbon, a hydrochlorofluorocarbon, a perfluoroether, a hydrofluoroether, a fluoroolefin, sulfur fluoride, SiF4 and COF2.
- 23. The process for manufacturing a semiconductor device as claimed in claim 22, wherein said fluorine compound-containing gas contains hydrogen chloride, hydrogen fluoride or a mixture of hydrogen chloride and hydrogen fluoride.
- 24. The process for manufacturing a semiconductor device as claimed in claim 21, wherein in said decomposing step, the fluorine compound in a gas to be treated is decomposed at a temperature of 200° C. or more.
- 25. The process for manufacturing a semiconductor device as claimed in claim 21, wherein in said decomposing step, the fluorine compound concentration in a gas to be treated is from 0.01 to 10 vol %.
- 26. The process for manufacturing a semiconductor device as claimed in claim 21, wherein the decomposing step is performed at a temperature of 500° C. or more in the presence of oxygen gas, thereby controlling the generation of carbon monoxide.
- 27. The process for manufacturing a semiconductor device as claimed in claim 26, wherein in said decomposing step, the oxygen gas concentration in a gas to be treated is 20 vol % or less.
- 28. The process for manufacturing a semiconductor device as claimed in claim 21, wherein chlorine atom, fluorine atom and/or sulfur atom produced in the decomposing step of decomposing the gas discharged from said etching or cleaning step using the reactive agent are fixed as an alkaline earth metal chloride, an alkaline earth metal fluoride and/or an alkaline earth metal sulfate, respectively.
Priority Claims (3)
Number |
Date |
Country |
Kind |
HEI. 11-122728 |
Apr 1999 |
JP |
|
HEI. 11-310509 |
Nov 1999 |
JP |
|
P2000-62430 |
Mar 2000 |
JP |
|
CROSS REFERENCE TO RELATED APPLICATIONS
[0001] This application is an application filed under 35 U.S.C. §111(a) claiming benefit pursuant to 35 U.S.C. §119(e)(1) of the filing date of the Provisional Application No. 60/156,871 filed Sep. 30, 1999 pursuant to 35 U.S.C. §111(b).
Provisional Applications (1)
|
Number |
Date |
Country |
|
60156871 |
Dec 1999 |
US |
Divisions (1)
|
Number |
Date |
Country |
Parent |
09559732 |
Apr 2000 |
US |
Child |
09956796 |
Sep 2001 |
US |