Recording head and recording apparatus using the same

Information

  • Patent Grant
  • 6302504
  • Patent Number
    6,302,504
  • Date Filed
    Wednesday, June 25, 1997
    27 years ago
  • Date Issued
    Tuesday, October 16, 2001
    22 years ago
Abstract
Upon executing printing by latching an input digital image signal temporarily stored in a shift register (502) by a latch circuit (501), and energizing and driving a heater (401) using a power transistor (410) using an nMOSFET on the basis of the latched image signal, a voltage converter (111) boosts a voltage representing the ON state of the latched digital signal, and applies the boosted voltage to the power transistor (410).
Description




BACKGROUND OF THE INVENTION




The present invention relates to a recording head substrate, a recording head using the recording head substrate, and a recording apparatus using the recording head.




A recording head mounted on a conventional ink-jet recording apparatus has a circuit arrangement, as shown in FIG.


10


. In such printing head, electro-thermal conversion elements (heaters) and a driving circuit therefor are formed on a single substrate using the semiconductor process technique, as disclosed in, e.g., Japanese Patent Laid-Open No. 5-185594.




Referring to

FIG. 10

, reference numeral


401


denotes electro-thermal conversion elements (heaters) for generating heat energy;


451


, power transistors each for supplying a desired current to the corresponding heater


401


;


502


, a shift register for temporarily storing image data indicating whether or not currents are supplied to the individual heaters


401


to eject ink from the nozzles of the recording head;


503


, an image data input terminal for serially inputting image data (DATA) for turning on/off the heaters


401


;


504


, an input terminal provided to the shift register


502


to receive transfer clock pulses (CLK);


501


, latch circuits for storing image data (DATA) corresponding to the heaters


401


in units of heaters;


505


, a latch signal input terminal for inputting a latch timing signal (LT) to the latch circuits


501


;


506


, switches for determining the supply timings of currents to the heaters


401


;


452


, a power supply line for applying a predetermined voltage to the heaters to supply currents; and


453


, a GND line into which currents that flowed through the heater


401


and the power transistor


451


flow.




Note that the number of bits of image data stored in the shift register


502


, the number of power transistors


451


, and the number of heaters


401


are equal to each other.





FIG. 11

is a timing chart of various signals for driving the recording head driving circuit shown in FIG.


10


.




The operation of the recording head driving circuit shown in

FIG. 10

will be described below with reference to

FIG. 11. A

number of transfer clock pulses (CLK) corresponding to the number of bits of image data stored in the shift register


502


is input to the transfer clock input terminal


504


. In this case, assume that data is transferred to the shift register


502


in synchronism with the leading edge of the transfer clock pulses (CLK), and image data (DATA) for turning on/off the heaters


401


is input from the image data input terminal


503


.




Since the number of bits of image data stored in the shift register


502


, the number of heaters


401


, and the number of power transistors


451


for current driving are equal to each other, transfer clock pulses (CLK) corresponding to the number of heaters


401


are input to transfer the image data (DATA) to the shift register


502


. Thereafter, a latch signal (LT) is supplied to the latch signal input terminal


505


to latch image data corresponding to the heaters


401


in the latch circuits


501


.




Thereafter, when the switches


506


are set in the “ON” state for an appropriate period of time, currents are supplied to the power transistors


451


and heaters


401


via the power supply line


451


in correspondence with the ON durations of the switches


506


, and the currents then flow into the GND line


453


. At this time, each heater


401


generates heat required for ejecting ink, and ink corresponding to the image data (DATA) is ejected from the nozzles of the recording head.




The above-mentioned arrangement is conventionally known. Furthermore, a recording head having an arrangement shown in

FIG. 12

, as an improved arrangement of

FIG. 10

, is also proposed.




Referring to

FIG. 12

, reference numeral


410


denotes nMOS field effect transistors (FETs) serving as power transistors for supplying desired currents to the heaters.




When this circuit arrangement is compared with that shown in

FIG. 10

, the arrangement shown in

FIG. 10

uses Darlington-connected npn transistors as each power transistor. In this arrangement, a logic circuit such as a shift register, a latch, or the like normally uses a CMOS gate, and a BiCMOS process is used to form npn transistors simultaneously with such gate. However, the BiCMOS process requires a large number of masks, and results in high cost. In view of this problem, as shown in

FIG. 12

, when nMOS transistors are used in place of npn transistors, the power transistors can be formed using the same process (CMOS process) as that of the logic circuit, thus allowing the manufacture of a recording head with relatively low cost.




An ink-jet printing method (i.e., a printing method by ejecting liquid) can realize high speed printing and has negligibly small noise produced upon printing, and has received a lot of attention recently since it can attain printing without requiring any special process, i.e., a so-called fixing process to a normal paper sheet.




Among such ink-jet printing methods, the liquid-jet printing methods described in, e.g., Japanese Patent Laid-Open No. 54-51834 and DOLS No. 2843064 have features different from other liquid-jet printing methods in that they acquire a driving force for ejecting a droplet by applying heat energy to the liquid.




More specifically, the printing method disclosed in the above references is characterized in that the liquid that received the applied heat energy undergoes changes in state accompanying an abrupt increase in volume and is ejected by an effect obtained based on the changes in state from each orifice at the distal end of a recording head to form a flying droplet, and the droplet becomes attached to a printing medium to attain recording.




Especially, the liquid-jet printing method disclosed in DOLS No. 2843064 is very effectively applied to a so-called drop-on demand printing method, and can easily realize a full-line type, high-density, multi-orifice recording head. For this reason, high-speed printing of a high-resolution, high-quality image can be achieved.




The recording head that uses the above-mentioned printing method is built by a recording head substrate which comprises liquid ejection portions having orifices formed to eject a liquid, heat applying portions which communicate with the orifices to apply heat energy for ejecting a droplet to the liquid, liquid channels including the heat applying portions, and substrate of recording head including electro-thermal conversion elements (heating elements) as means for generating heat energy.




In recent years, on such substrate, not only a plurality of heating elements are formed, but also logic circuits such as a plurality of drivers for driving the individual heating elements, a shift register for temporarily storing image data having the same number of bits as the number of heating elements to parallelly transfer the image data, serially input from a recording apparatus, to the drivers, latch circuits for temporarily latching data output from the shift register, and the like can be mounted on the single substrate.





FIG. 19

is a block diagram showing the logic circuit arrangement of a conventional recording head having N heating elements (print elements).




Referring to

FIG. 19

, reference numeral


700


denotes a substrate;


701


, heating elements;


702


, power transistors;


703


, an N-bit latch circuit; and


704


, an N-bit shift register. Reference numeral


715


denotes a sensor for monitoring the resistances of the heating elements


701


or the temperature of the substrate


700


, or a heater for keeping the substrate


700


at a desired temperature. A plurality of such sensors and heaters may be mounted, and the sensor and heater may be integrally arranged. Reference numerals


705


to


714


, and


716


denote input/output pads. Of these input/output pads, reference numeral


705


denotes a clock input pad for inputting clock pulses (CLK) for operating the shift register


704


;


706


, an image data input pad for serially inputting image data (DATA);


707


, a latch input pad for inputting a latch clock pulses (LTCLK) for controlling the latch circuit


703


to latch image data;


708


, a driving signal input pad for inputting heat pulses (HEAT) for externally controlling the driving time in which the power transistors


702


are turned on to energize and drive the heating elements


701


;


709


, a driving power supply input pad for inputting a driving power supply voltage (3 to 8 V, normally, 5 V) for the logic circuits;


710


, a GND terminal;


711


, a heating element power supply input pad for inputting a power supply voltage for driving the heating elements


701


;


712


, a reset input pad for inputting a reset signal (RST) for initializing the latch circuit


703


and the shift register


704


; and


713


, a terminal for a heating element driving power supply.




Reference numerals


714


-(


1


) to


714


-(n) denote output pads for monitoring signals and input pads for control signals for driving the sensor and the temperature control heater. Furthermore, reference numerals


716


-(


1


) to


716


-(n) denote block selection input pads for inputting block selection signals (BLK


1


, BLK


2


, . . . , BLKn) for selecting a block when the N heating elements are divided into n blocks, and the n blocks are to be time-divisionally driven. Reference numeral


717


denotes AND gates for logically ANDing the outputs from the latch circuit


702


, the heat signals (HEAT), and the block selection signals (BLK


1


, BLK


2


,. . . , BLKn).




The driving sequence of the recording head with the above arrangement is as follows. Note that image data (DATA) is binary data which is defined by one bit per pixel.




When a recording apparatus main body to which the recording head is attached serially outputs image data (DATA) in synchronism with clock pulses (CLK), the output data is input to the shift register


704


. The input image data (DATA) is temporarily stored in the latch circuit


703


, which generates ON/OFF outputs corresponding to the value (“0” or “1” ) of image data.




In this state, when the heat pulse (HEAT) and the block selection signal are input, the latch circuit


703


supplies ON outputs, and the power transistors corresponding to the heating elements selected as a block by the block selection signal are driven during the ON time of the input heat pulse (HEAT), thus supplying currents to the corresponding heating elements to execute printing.




In the logic circuit of the recording head shown in

FIG. 19

, the power transistors


702


comprise npn bipolar transistors, and the logic circuit is formed using a BiCMOS process. However, in some cases, using MOSFETs as the power transistors, the logic circuit may be formed using the CMOS process as the manufacturing process in lieu of the BiCMOS process. With this process, not only the number of steps in the manufacturing process can be reduced, but also the space required for element isolation can be reduced, thus achieving a size reduction of the substrate.




This will be explained in more detail below with reference to

FIGS. 20A

to


22


D.





FIGS. 20A and 20B

are logic circuit diagrams showing a power transistor for driving a single heating element when the power transistor uses bipolar transistors.

FIG. 20A

is an equivalent circuit diagram of a circuit using two npn bipolar transistors


702




a


and


702




b


, and

FIG. 20B

is a sectional view of the substrate. Referring to

FIG. 20A

, a logic output


721


corresponds to the output from the AND gate


717


.

FIG. 20B

shows how to form n-type regions


723


,


725


,


726


, and


727


, and p-type regions


724


,


728


, and


729


on the substrate so as to construct the npn bipolar transistor. Also, in

FIG. 20B

, symbols B, E, and C respectively denote the base, emitter, and collector.





FIGS. 21A

to


21


D are respectively a circuit diagram and sectional views of a substrate when the power transistor uses a MOSFET, and the entire logic circuit is formed by the CMOS process.





FIG. 21A

is an equivalent circuit diagram of a circuit used when the power transistor for driving a single heating element uses an nMOS


720


,

FIG. 21B

is a sectional view of the substrate that makes up the circuit shown in

FIG. 21A

, and

FIGS. 21C and 21D

are sectional views of substrates that form nMOS and pMOS transistors used in logic circuits such as the latch circuit


703


, the shift register


704


, and the like. In

FIGS. 21B

to


21


D, symbols S, G, and D respectively denote the source, gate, and drain;


731


,


732


, and


736


, n-type regions; and


733


to


735


, p-type regions.




When the power transistor uses a MOSFET, the entire logic circuit can be formed by a CMOS process, and the necessity of n


+


-type regions


726


and


727


for the collector, n-type epitaxial layer


725


, p-type element isolation region


729


, and the like (FIG.


20


B), which are required in the BiCMOS process in addition to CMOS circuits including the nMOS transistors (

FIG. 21C

) and pMOS transistors (

FIG. 21D

) that form the logic circuit, can be obviated.




As a MOS power transistor, an nMOS transistor is popularly used owing to its specific electron mobility, and the like. When the nMOS transistor is used in the logic circuit of the ink-jet recording head, a voltage of 20 V or higher is applied to the drain (D) of the power transistor which is not driven. In consideration of such voltage, in order to assure such breakdown voltage, it is a common practice to form an n


31


-type region in the drain region (offset type MOS transistor), as shown in FIG.


21


B.




SUMMARY OF THE INVENTION




However, in the conventional CMOS logic circuit, a digital signal which has 0 V/5 V as its Low/Hi level is normally used as a signal, and the output from the latch circuit


501


shown in

FIG. 12

does not exceed 5 V when its signal level is “Hi”. Hence, a high voltage of 5 V or higher cannot be applied as the gate voltage of the power transistor


502


. On the other hand, the nMOS transistor normally has the current-voltage characteristics, as shown in FIG.


13


. That is, if the gate voltage (VG) is raised, the maximum value of the current (drain-source current: IDS) that can be supplied increases accordingly, and the operation point of the drain voltage (drain-source voltage: VDS) at that time lowers. More specifically, the drivability of the nMOS transistor is improved as the gate voltage (VG) is higher.




For this reason, since the gate voltage of the power transistor using the nMOS transistor is defined by 5 V as the signal amplitude in the CMOS logic circuit in the recording head built by the CMOS logic circuits and power transistors using nMOS transistors, drivability that can fully use the characteristics of the nMOS transistors cannot be sufficiently obtained.




The present invention has been made in consideration of the above-mentioned prior art, and has as its object to provide a recording head which adopts a power transistor using, e.g., an nMOS transistor, and can improve the drivability of the nMOS transistor, and a recording apparatus using the recording head.




In order to achieve the above object, a recording head according to the present invention comprises the following arrangement.




That is, a recording head comprises a heater, a power transistor for driving the heater, a logic circuit for driving the power transistors, and a voltage converter for converting the voltage amplitude of a signal output from the logic circuit into a higher voltage amplitude, and applying the signal with the converted amplitude to the gate electrode of the power transistor.




With this arrangement, upon driving the heater by inputting a logic circuit output corresponding to a digital signal, which respectively expresses OFF and ON by 0 V and 5 V, to the power transistor, e.g., a FET, the output can be boosted and applied to the power transistor.




Such power supply conversion circuit is inserted between the output of a latch circuit and the gate of the power transistor such as a FET, and supplies a voltage with an amplitude higher than the digital signal amplitude of 0 V/5 V to the gate of the power transistor.




Note that the recording head can use a recording head that performs printing in accordance with an ink-jet method.




According to another invention, a recording apparatus uses the recording head with the above arrangement.




On the other hand, as shown in

FIG. 12

, a recording head, which uses a MOS transistor as a power transistor, cannot often operate desirably due to variations in the manufacturing process. Such problem will be explained below with reference to the graph showing the current-voltage characteristics of an nMOS transistor in FIG.


15


.

FIG. 15

shows the static characteristic curve of the nMOS transistor, and the load curve due to the resistance of the heater of the recording head.




When a recording head shown in

FIG. 14

is mounted on a recording apparatus, and executes printing by ejecting ink, an nMOS transistor is turned on, and supplies a current to the corresponding heater. At this time, a voltage (VOP) which is applied across the drain-source path of the nMOS transistor and a current (IOP) that flows through the drain-source path correspond to the intersection (operation point) between the static characteristic curve of the nMOS transistor and the load curve due to the heater resistance. If VH represents the voltage to be applied to the heater, energy generated by the heater upon ejecting ink is (VH−VOP)×IOP.




On the other hand, in a recording head according to the ink-jet method, the drain-source voltage (VOP) upon ejecting ink preferably assumes a small value to improve electro-thermal conversion efficiency. For this purpose, the nMOS transistor is preferably designated to operate in a triode region at the operation point of the nMOS transistor. The relationship between the drain current (IDS) and the drain-source voltage (VDS) at that time is given by equation (1) below:








IDS


=(


W/L





μn·COX


[(


VG−VTH





VDS


−(½)


VDS




2


]  (1)






where W: gate width, L: gate length, μn: electron mobility, COX: thickness of a gate oxide film, VG: gate voltage, and VTH: threshold voltage.




As is known, among the causes that drift the characteristics of the nMOS transistor, process variations in gate length (L) have the most serious influence. For example, when an nMOS transistor having a gate length (L, μm) that satisfies 3≦L is manufactured, it is a common practice to use a mirror projection aligner (MPA) in the manufacture of the transistor. However, this aligner may produce maximum process variations of ±1.0 μm with respect to the design value (L


0


).




As can be seen from equation (1), since the gate length (L) is inversely proportional to the drain current (IDS), and the rate of change in size due to the process variations with respect to the design value (L


0


) is large, the static characteristics of the nMOS transistor are seriously influenced. In

FIG. 15

, the broken curve represents the static characteristics when the gate length (L) becomes larger than the design value (L


0


), and the dotted curve represents the static characteristics when the gate length (L) becomes smaller than the design value (L


0


).




According to such changes in characteristics, when the gate length (L) becomes larger than the design value (L


0


) (L>L


0


), both the voltage applied from the nMOS transistor to the header and the current supplied to the heater decrease, and energy generated by the heater is reduced. Conversely, when the gate length (L) becomes smaller than the design value (L


0


) (L<L


0


), the driving force of the nMOS transistor is improved, and both the voltage applied to the heater and the current supplied to the heater increase, thus increasing energy generated by the heater.




Hence, when the energy generated by the heater becomes larger than the design value, ink is not ejected; conversely, when the energy generated by the heater is smaller than the design value, ink scorches on the heater or the service life of the heater is shortened. In this manner, the driving force of the nMOS transistor changes depending on variations in the manufacturing process of the recording head, and as a result, such changes have serious influences on the printing operation and service life of the recording head.




It is an object of the present invention to provide an ink-jet recording head, which adopts an MOS transistor in a driving circuit, and can normally operate even when the characteristics of the MOS transistor change due to variations in the manufacturing process, and a recording apparatus using the recording head.




In order to achieve the above object, a recording head of the present invention has the following arrangement.




More specifically, a recording head comprises a heater, a power transistor for driving the heater, a logic circuit for driving the power transistor, a voltage converter for converting the voltage amplitude of a signal output from the logic circuit into a higher voltage amplitude, and applying the signal with the converted amplitude to the gate electrode of the power transistor, and a correction circuit for correcting characteristic variations of the power transistor.




Note that variations in gate length of a MOS transistor as a power transistor in the semiconductor manufacturing process are included in factors of characteristic variations. The correction circuit controls the gate voltage of the MOS transistor to compensate for the characteristic variations due to the variations in gate length, thereby suppressing drain current drifts of the MOS transistor. More specifically, when the gate length becomes smaller than the design value due to variations in the semiconductor manufacturing process, the correction circuit controls to lower the gate voltage; when the gate length becomes larger than the design value, the correction circuit controls to raise the gate voltage.




Furthermore, the recording head has a first power supply line for applying a first voltage to the heater, a second power supply line for applying a second voltage to the logic circuit, and a third power supply line for applying a third voltage to the voltage converter, and the correction circuit includes a second resistor as a polysilicon resistor, and a third nMOS transistor connected to the resistor.




Note that one terminal of the second resistor may be connected to the first power supply line, the node between the other terminal of a first resistor and the drain of the third nMOS transistor may be connected to the third power supply line, and the source of the third nMOS transistor may be connected to ground.




Alternatively, the recording head may further have a source-follower circuit consisting of a fourth nMOS transistor, and a third resistor connected between the source of the transistor and ground, the drain of the fourth nMOS transistor may be connected to the first power supply line, the node between the other terminal of the second resistor and the drain of the third nMOS transistor may be connected to the gate of the fourth nMOS transistor, and the node between the source of the fourth nMOS transistor and the third resistor may be connected to the second power supply line.




Note that a driving circuit may be either a circuit formed by a CMOS process or a circuit formed by an nMOS process.




This recording head may be either an ink-jet recording head that performs printing by ejecting ink, or a recording head which ejects ink using heat energy and comprises a heat energy conversion element for generating heat energy to be applied to the ink.




According to another invention, a recording apparatus uses the recording head with the above arrangement.




In addition to the problems associated with driving of the power transistors and the arrangement of gate voltage booster circuits, another problem is posed when the manufacturing process changes from the BiCMOS process to the simple CMOS process. Such problem is posed when a temperature sensor, especially, a diode, is used, and it will be described below with reference to FIG.


22


.




As shown in

FIG. 22

, when a diode has a conventional MOS structure, for example, a {circle around (1+L )} “p


+


-type region” serving as a source-drain region


415


of a CMOS logic pMOS must be used as the anode, and a {circle around (2+L )} “n-type region” serving as a substrate region


416


of the CMOS logic pMOS must be used as the cathode to build the diode. In this case, when a forward current is supplied from the anode to the cathode, since a p-type substrate


414


is present below the {circle around (2+L )} n-type region


416


, a pnp structure is formed here, and a parasitic pnp transistor operates to supply currents to the substrate. Especially, in the case of CMOS, such currents lead to a problem such as latch-up. When two or more diodes with this structure are connected in series for the purpose of increasing the output amplitude of a sensor, averaging sensors at a plurality of points, and the like, even when constant current driving is done, currents are supplied from the first diode to the substrate, and only currents


1


/{hFE} of the parasitic transistor are supplied to the second and subsequent diodes. In this manner, it is impossible to attain a series connection of diodes in practice since “the temperature characteristics vary depending on the diode positions, “the influence of variations of the current gain hFE of the transistor, i.e., the semiconductor manufacturing process is serious”, and so on.




The present invention has been made in consideration of the above situation, and has as its object to provide a recording head substrate which can form a CMOS inverter circuit, comprising a pMOS or nMOS element that can withstand the driving voltage of a heating element, at the input side of a power transistor, without increasing consumption power, without requiring another power supply, and without causing any voltage drifts, a recording head using the recording head substrate, and a recording apparatus using the recording head.




It is another object of the present invention to provide a recording head substrate, which has a structure in which a p





-type layer or n-type layer is added to the pMOS or nMOS element of the CMOS inverter circuit, so that a diode sensor has an npnp or pnpn structure and is completely isolated from a p- or n-type substrate, and which can realize a series connection of diodes while preventing the influence of a parasitic transistor, a recording head using the recording head substrate, and a recording apparatus using the recording head.




In order to solve the above-mentioned problems and to achieve the above objects, a recording head of the present invention comprises the following arrangement.




a heater corresponding to a print element;




a power transistor for energizing and driving the heater;




a logic circuit for driving the power transistor; and




a voltage converter for converting a voltage amplitude of a signal output from the logic circuit to a higher voltage amplitude, and applying the signal with the converted amplitude to the gate electrode of the MOS transistor,




the voltage converter including:




a first resistor;




a first nMOS transistor, a drain of which is connected to the first resistor; and




a CMOS inverter circuit consisting of a first pMOS transistor and a second nMOS transistor, gates of which are connected between the first resistor and the drain of the first nMOS transistor, and




the CMOS inverter circuit having a CMOS inverter circuit having an nMOS element and a pMOS element for determining a voltage to be applied to the gate of the power transistor, and low-concentration regions being formed in drains of the nMOS and pMOS elements.




Also, a recording head of the present invention comprises the following arrangement.




a heater corresponding to a print element;




a power transistor for energizing and driving the heater;




a logic circuit for driving the power transistor; and




a voltage converter for converting a voltage amplitude of a signal output from the logic circuit to a higher voltage amplitude, and applying the signal with the converted amplitude to the gate electrode of the MOS transistor,




the voltage converter including:




a first resistor;




a first nMOS transistor, a drain of which is connected to the first resistor; and




a CMOS inverter circuit consisting of a first pMOS transistor and a second nMOS transistor, gates of which are connected between the first resistor and the drain of the first nMOS transistor, and




the CMOS logic circuit having a CMOS inverter circuit having an nMOS element and a pMOS element for determining a voltage to be applied to the gate of the power transistor, and low-concentration regions being formed in drains of the nMOS and pMOS elements.




A recording head of the present invention uses the recording head substrate.




A recording apparatus of the present invention mounts the recording head.




In the above-mentioned prior art, when a MOSFET is used as each power transistor serving as a driving circuit of a recording head, the following problems remain unsolved.




{circle around (1+L )} When switching is done while a voltage of 25 V or higher is applied across the drain-source path of an nMOS serving as a power transistor, an impact ionization phenomenon occurs. That is, electrons as carriers are accelerated by a high voltage in the drain-source path at the instance of turning off the nMOS, and collide against Si atoms to generate ions. These ions readily generate a large leakage current in the drain-source path. If this phenomenon occurs, the entire substrate may be destroyed.




{circle around (2+L )} When the heating element is not driven, the potential difference between the heating element, and the substrate, i.e., the substrate surface contacting ink, silicon (Si) that makes up the substrate, and the like adversely influences the service life of the recording head. More specifically, in the case of a substrate which mounts an nMOS that drives the heating element, elements are generally formed on a p-type silicon (Si) substrate. In this case, the p-type substrate portion serves as GND, while ink reaches the side portions of the substrate and is electrically short-circuited with the substrate. Since ink has conductivity, the ink always serves as GND. Under such condition, in the OFF state of the nMOS, most substrate portion that contacts the ink as well as the heating element is set at a power supply voltage (VH) for driving the heating element via a protection insulating film. While the recording head and the recording apparatus that mounts the head are in the ON state, the actual energization time of the heating element is very short and no printing is made during the remaining time period with the power supply voltage being kept applied. Hence, an electric field is kept generated in the ink and the substrate surface for a very long period of time, and shortens the service life of the protection insulating film, that is, the service life of the recording head is shortened.




The present invention has been made in consideration of the above-mentioned prior art, and has as its object to provide a recording head which has a simple circuit arrangement and high reliability, and can assure long service life, and a recording apparatus using the recording head.




In order to achieve the above object, a recording head according to the present invention comprises the following arrangement.




a heater corresponding to a print element;




a power transistor for energizing and driving the heater;




a logic circuit for driving the power transistor; and




a voltage converter for converting a voltage amplitude of a signal output from the logic circuit to a higher voltage amplitude, and applying the signal with the converted amplitude to the gate electrode of the MOS transistor,




the power transistor comprising a pMOS transistor, and the voltage converter having an inverter including at least one nMOS transistor which boosts the voltage to be applied by receiving a print signal output from the logic circuit, and outputs the voltage to the gate of the pMOS transistor, and




the pMOS transistor and the heater being serially connected between a power supply line of the heater and ground return from the power supply line side.




According to another invention, a recording apparatus uses the recording head with the above arrangement.




In the recording head with the above arrangement, the pMOS transistor and nMOS transistor may use offset type transistors.




The pMOS transistor and nMOS transistor may be driven by a predetermined power supply voltage, and the heating element, pMOS transistor, and nMOS transistor are formed on a p-type silicon substrate.




Furthermore, the inverter may include a resistor connected between the nMOS transistor and a power supply voltage terminal.




The above-mentioned recording head is suitably applied to an ink-jet recording head that prints by ejecting ink. The ink contacts the heating element via an electrical insulating layer, and is heated by the heating element during printing.











BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a perspective view showing the outer appearance of one mode of an ink-jet recording apparatus main body according to an embodiment of the present invention;





FIG. 2

is a block diagram showing the control circuit arrangement of the ink-jet recording apparatus shown in

FIG. 1

;





FIG. 3

is a perspective view for explaining another mode of an ink-jet recording head shown in

FIG. 1

;





FIG. 4

is a schematic perspective view showing the arrangement of the ink-jet recording head according to an embodiment of the present invention;





FIG. 5

is a circuit diagram showing the arrangement of a logic circuit of a recording head according to the first embodiment of the present invention;





FIG. 6

is a circuit diagram showing the arrangement of a logic circuit of a recording head, in which a circuit for voltage-dividing a heater power supply voltage, and supplying it to a voltage converter is added to the logic circuit arrangement shown in

FIG. 5

, according to the second embodiment of the present invention;





FIG. 7

is a circuit diagram showing the arrangement of a driving circuit of a recording head according to the third embodiment of the present invention;





FIG. 8

is a circuit diagram when the circuit shown in

FIG. 7

is fabricated by an nMOS process according to the fourth embodiment of the present invention;





FIG. 9

is a circuit diagram showing the arrangement of a driving circuit of a recording head according to the fifth embodiment of the present invention;





FIG. 10

is a circuit diagram showing the circuit arrangement of a conventional recording head according to the ink-jet method;





FIG. 11

is a timing chart showing various signals for driving the driving circuit of the recording head shown in

FIG. 10

;





FIG. 12

is a block diagram of the prior art which uses nMOSFETs as power transistors of a recording head;





FIG. 13

is a graph showing the VD-ID characteristics of an nMOS transistor;





FIG. 14

is a block diagram of the prior art which uses nMOSFETs as power transistors of a recording head;





FIG. 15

is a graph showing the VD-ID characteristics of an nMOS transistor;





FIG. 16A

is a circuit diagram of a heating element driving circuit mounted on an ink-jet recording head substrate according to the sixth embodiment of the present invention;





FIG. 16B

is a circuit diagram of a heating element driving circuit mounted on an ink-jet recording head substrate according to another mode of the sixth embodiment of the present invention;





FIG. 17A

is a sectional view showing the structure of an offset pMOS transistor shown in

FIG. 16A

;





FIG. 17B

is a sectional view showing the structure of an offset nMOS transistor shown in

FIG. 16A

;





FIG. 17C

is a sectional view showing the structure of an offset nMOS transistor shown in

FIG. 16B

;





FIG. 17D

is a sectional view showing the structure of an offset pMOS transistor shown in

FIG. 16B

;





FIG. 18A

is a sectional view showing the structure of a diode sensor according to an embodiment of the present invention;





FIG. 18B

is a sectional view showing the structure of a diode sensor according to another mode of the embodiment;





FIG. 19

is a circuit diagram of a conventional ink-jet recording head substrate;





FIG. 20A

is a circuit diagram of a conventional driving circuit for a heating element using a bipolar power transistor;





FIG. 20B

is a sectional view showing the structure of the bipolar power transistor shown in

FIG. 20A

;





FIG. 21A

is a circuit diagram of a conventional driving circuit for a heating element using a MOS power transistor;





FIG. 21B

is a sectional view showing the structure of a conventional offset nMOS power transistor;





FIG. 21C

is a sectional view of a substrate that forms an nMOS transistor used in a logic circuit when the entire logic circuit is formed by a CMOS process using a MOSFET as a power transistor;





FIG. 21D

is a sectional view of a substrate that constructs a pMOS transistor used in a logic circuit when the entire logic circuit is formed by a CMOS process using a MOSFET as a power transistor;





FIG. 22

is a sectional view showing the structure of a conventional diode sensor;





FIG. 23

is a circuit diagram of a circuit for boosting the gate voltage of a power transistor;





FIG. 24

is a circuit diagram showing the circuit arrangement for driving one print element of a recording head according to the seventh embodiment of the present invention;





FIG. 25A

is a sectional view of a pMOS power transistor shown in

FIG. 24

; and





FIG. 25B

is a sectional view showing an nMOS transistor in a gate voltage booster shown in FIG.


24


.











DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS




The preferred embodiments of the present invention will be described in detail hereinafter with reference to the accompanying drawings.




Ink-jet Recording Apparatus Main Body




An ink-jet recording apparatus of this embodiment will be described below.

FIG. 1

is a perspective view showing the outer appearance of an ink-jet recording apparatus


900


according to an embodiment of the present invention.




Referring to

FIG. 1

, a recording head


810


is mounted on a carriage


920


which engages with a spiral groove


921


of a lead screw


904


, which rotates via driving force transmission gears


902


and


903


in accordance with the forward/reverse rotation of a driving motor


901


. The recording head


810


is reciprocally movable in the direction of an arrow a or b along a guide


919


together with the carriage


920


by the driving force of the driving motor


901


. A paper press plate


905


for a print paper sheet P which is fed onto a platen


906


from a print medium feeder (not shown) presses the print paper sheet against the platen


906


along the carriage moving direction.




Photocouplers


907


and


908


comprises a home position detection means which confirms the presence of a lever


909


provided to the carriage


920


in the region of the photocouplers


907


and


908


and performs switching of the rotation direction of the driving motor


901


, and the like. A support member


910


supports a cap member


911


that caps the surface of the recording head


810


, and a suction means


912


draws the interior of the cap member


911


by suction to attain suction recovery of the recording head


810


via an intra-cap opening


513


. A moving member


915


allows a cleaning blade


914


to be movable in the back-and-forth direction in

FIG. 1

, and the cleaning blade


914


and the moving member


915


are supported by a main body support plate


916


. The cleaning blade


914


is not limited to the illustrated one, but a known cleaning blade may be applied to this embodiment, needless to say. A lever


917


is arranged to initiate the suction process of the suction recovery, and moves upon movement of a cam


918


which engages with the carriage


920


. The movement control of the lever


917


is done by a known transmission means such as clutch switching or the like using the driving force from the driving motor


901


. A print controller (not shown) is arranged on the recording apparatus main body side. The print controller supplies a signal to a heating unit


806


formed on the recording head


810


, and performs driving control of the individual mechanisms such as the driving motor


901


and the like.




The ink-jet recording apparatus


900


with the above-mentioned arrangement performs printing with respect to the print paper sheet P fed onto the platen


906


from the print medium feeder while the recording head


810


reciprocally moves across the total width of the print paper sheet P. The recording head


810


can perform high-precision, high-speed printing since it is manufactured using an ink-jet recording head substrate having the circuit structure of each of the above-mentioned embodiments.




Arrangement of Control Circuit




The arrangement of a control circuit for executing the print control of the above-mentioned recording apparatus will be explained below.

FIG. 2

is a block diagram showing the arrangement of the control circuit for the ink-jet recording apparatus


900


. Referring to

FIG. 2

that shows the control circuit, reference numeral


1700


denotes an interface for inputting a print signal;


1701


, an MPU;


1702


, a program ROM which stores a control program executed by the MPU


1701


; and


1703


, a dynamic RAM for holding various data (the print signal, print data to be supplied to the head, and the like). Reference numeral


1704


denotes a gate array for executing supply control of print data to a recording head


1708


, and also performing data transfer control among the interface


1700


, MPU


1701


, and RAM


1703


. Reference numeral


1710


denotes a carrier motor for conveying the recording head


1708


; and


1709


, a feed motor for feeding a print paper sheet. Reference numeral


1705


denotes a head driver for driving the head, and


1706


and


1707


, motor drivers for respectively driving the feed motor


1709


and the carrier motor


1710


.




The operation of the control arrangement will be explained below. When a print signal is input to the interface


1700


, the print signal is converted into print data for printing by the gate array


1704


and the MPU


1701


. The motor drivers


1706


and


1707


are driven, and the recording head is driven in accordance with the print signal supplied to the head driver


1705


, thus attaining printing.




Another Mode of Recording Head




As shown in

FIG. 3

, the ink-jet recording head


810


comprises a recording head unit


811


having a plurality of ejection orifices


800


, and an ink tank


812


containing ink to be supplied to the recording head unit


811


. The ink tank


812


is detachably attached to the recording head unit


811


to have a boundary line K as a boundary. The ink-jet recording head


810


has electrical contacts (not shown) for receiving electrical signals from the carriage side when it is mounted on the recording apparatus shown in

FIG. 1

, and heaters are driven by the electrical signals. The ink tank


812


includes a fibrous or porous ink absorber for holding ink, and the ink is held by such ink absorber.




In contrast to this, in the ink-jet recording head


810


shown in

FIG. 1

, the recording head unit


811


and the ink tank


812


are formed as a single unit.




Ink-jet Recording Head Substrate




The ink-jet recording head substrate of this embodiment will be described below.

FIG. 4

is a perspective view showing the arrangement of the ink-jet recording head substrate in detail.




As shown in

FIG. 4

, the ink-jet recording head substrate can be manufactured with the ink-jet recording head


810


by assembling channel wall members


801


that form ink channels


805


communicating with the plurality of ejection orifices


800


, and a top plate grooved member


802


having an ink supply port


803


. In this case, the ink injected from the ink supply port


803


is stored in an internal common ink chamber


804


and is supplied to the individual ink channels


805


. In this state, by driving a heater


806


connected to a lead


807


on a base


808


, ink is ejected from the ejection orifices


800


.




When the recording head


810


shown in

FIG. 4

is mounted on the ink-jet recording apparatus, and the recording apparatus main body controls signals to be supplied to the recording head


810


, an ink-jet recording apparatus which can realize high-speed, high-quality printing can be provided.




Logic Circuit Arrangement of Recording Head




In this embodiment, when MOS transistors are used as power transistors, as shown in

FIG. 12

, gate voltage boosters


111


are inserted between switches


506


and power transistors


410


, as shown in FIG.


14


. Each gate voltage booster


111


converts the voltage amplitude of a digital signal output from a corresponding latch


501


into a higher voltage amplitude, and applies the signal with the converted amplitude to the gate of the power transistor


410


, thereby increasing the driving force of the power transistor. By increasing the driving power of each power transistor, the area required for each power transistor in a driving circuit can be reduced, and hence, a size reduction of the entire circuit can be realized.




First Embodiment





FIG. 5

is a circuit diagram showing the logic circuit arrangement of the first embodiment of the recording head


810


shown in

FIG. 1

, and also showing the arrangement of the gate voltage booster shown in

FIG. 14

in detail. Note that the same reference numerals in

FIG. 5

denote the same parts as those in the conventional recording head shown in

FIGS. 10 and 12

, and a detailed description thereof will be omitted. The characteristic elements of this embodiment alone will be explained below.




Referring to

FIG. 5

, reference numeral


111


denotes gate voltage boosters each for converting the voltage amplitude of a digital signal output from a corresponding latch


501


into a higher voltage amplitude, and applying the signal with the converted amplitude to the gate of a corresponding power transistor


410


; and


116


, a power supply line for the gate voltage boosters


111


. Each gate voltage booster


111


is built by a resistor


112


, an nMOS transistor


113


, the drain of which is connected to the resistor


112


, and a CMOS inverter constituted by a pMOS transistor


114


and an nMOS transistor


115


.




Note that the number of bits of image data stored in a shift register


502


, the number of power transistors


410


, and the number of heaters


401


are equal to each other.




The recording head


810


with the above-mentioned circuit arrangement performs the same operations as those of the conventional recording head shown in

FIG. 10

in accordance with the timing chart shown in FIG.


11


.




More specifically, image data (DATA) for turning on/off the heaters


401


is input from an image data input terminal


503


of the shift register


502


in synchronism with the leading edge timing of the transfer clock pulses. Since the number of bits of the image data stored in the shift register


502


is equal to the number of heaters


401


and the number of power transistors


410


for current driving, the transfer clock pulses (CLK) are input in correspondence with the number of heaters


401


to transfer the image data (DATA) to the shift register


502


. Thereafter, a latch signal is supplied to a latch signal input terminal


505


to latch image data corresponding to the heaters in the latch circuits


501


.




Thereafter, when switches


506


are turned on, Low/Hi signals corresponding to image data are output from the latch circuits


501


, and the output voltages are applied to the gates of the nMOS transistors


113


in the gate voltage booster


111


.




A case will be examined below wherein the output from a certain latch circuit


501


is “Low”. At this time, since the nMOS transistor


113


is turned off, the voltage from the power supply line


116


is directly supplied to the gate of the CMOS inverter constituted by the pMOS transistor


114


and the nMOS transistor


115


via the resistor


112


. Since the output from the CMOS inverter goes “Low”, a voltage “0 V” is supplied to the gate of the corresponding power transistor


410


. More specifically, when the output from the latch circuit


501


is “Low (no image data or the value of an image signal is “0”)”, the gate voltage of the power transistor


410


is set at “0 V”, and no current is supplied to the heater


401


. As a result, no printing is done.




Next, a case will be examined below wherein the output from a certain latch circuit


501


is “Hi”. At this time, since the shift register


502


and latch circuits


501


are normally made up of CMOS gates, and all the external transfer clock pulses (CLK), image signal (DATA), latch timing signal (LT) have a signal amplitude of 0 V/5 V, the power supply voltage associated with each latch circuit


501


is often 5 V. Hence, when the output from the latch circuit


501


is “Hi”, its signal voltage is 5 V. The voltage of 5 V is applied to the gate of the nMOS transistor


113


via the switch


506


. In response to this voltage signal, since the nMOS transistor


113


is turned on, a current flows via the resistor


112


.




When the resistance of the resistor


112


is set at a value sufficiently larger than that in the ON state of the nMOS transistor


113


, a voltage close to 0 V is supplied to the gate of the CMOS inverter, and the input from the gate of the CMOS inverter can be set in the “Low” state. In this manner, the output from the CMOS inverter goes “Hi”, and the voltage value of the power supply line


116


directly appears as the output voltage level at that time. This voltage is supplied to the gate of the power transistor


401


. More specifically, when the output from the latch circuit


501


is “Hi (the value of an image signal being “1”)”, the voltage on the power supply line


116


is applied to the gate of the power transistor


410


to turn on the power transistor


410


, and a current is supplied to the heater


401


, thus performing printing by ejecting ink.




At this time, when the voltage on the power supply line


116


is set to be higher than 5 V as the power supply voltage of the shift register


502


and latch circuits


501


, the voltage is applied to the gate of the power transistor


410


, thus improving the drivability of the power transistor


410


. The voltage on the power supply line


116


at this time can be arbitrarily set. For example, the highest possible voltage within the allowable range of the breakdown voltage of the CMOS inverter is preferably set. For example, the voltage of a power supply line


452


to the heaters


401


and the power supply line


116


of the gate voltage boosters


111


may be commonly used, and with this arrangement, desired characteristics can be obtained without using two power supplies, thus simplifying the recording head.




In this embodiment, current is supplied from the power supply line


116


for the gate voltage booster


111


when the nMOS transistor


113


is ON; no current is supplied when the transistor


113


is OFF. Normally, in an ink-jet recording apparatus, the number of heaters


401


which are to be simultaneously turned on is often limited to about {fraction (1/10)} of the total number of heaters in association with the power supply performance of the recording apparatus, and in many cases, the number of OFF heaters is larger than that of ON heaters. Hence, when currents are supplied to the gate voltage boosters corresponding to the OFF heaters, if the number of OFF heaters is large, a large current is supplied to one gate voltage booster as a whole. In the state wherein all the heaters are OFF, i.e., in a so-called idling state, if currents are supplied to the gate voltage boosters corresponding to all the heaters, such currents raise the temperature of the chip, thus adversely influencing the operation and service life of the recording head.




For these reasons, it is preferable that no current be supplied to the gate voltage boosters corresponding to OFF heaters. In this embodiment, no current flows when the nMOS transistor


113


is OFF.




Therefore, according to the above-mentioned embodiment, the gate voltage boosters


111


are inserted between the power transistors


410


for driving the heaters of the recording head, and the latch circuits


501


for outputting image data, and when the heater is driven, the corresponding power transistor


410


can be driven by a voltage higher than the output voltage from the latch circuit


501


. Especially, when an nMOS transistor is used as the power transistor, the drivability of the power transistor can be improved. Upon manufacturing the recording head with the above-mentioned circuit arrangement, no extra process is required.




Since no current flows when the nMOS transistor


113


that constitutes the gate voltage booster


111


is OFF, no unwanted consumption power is generated, and the operation and service life of the recording head do not have any adverse influence.




In the description of the above embodiment, the voltage on the power supply line


116


for the gate voltage boosters


111


is preferably set at the highest possible value without exceeding the breakdown voltage of the CMOS inverter, and can be commonly used as the heater voltage if possible. However, since the heater voltage is normally set at a high voltage of 20 V or higher, and the breakdown voltage of the CMOS inverter is about 15 V, it is difficult to share the power supply in practice. However, adding a power supply for the gate voltage boosters


111


leads to an increase in circuit scale in the recording apparatus as a whole, resulting in an increase in cost.




Accordingly, in order to satisfy such requirement, an arrangement for voltage-dividing the heater power supply voltage, and supplying the divided voltage to the gate voltage boosters


111


may be added to the circuit of the recording head shown in FIG.


5


.




Second Embodiment





FIG. 6

is a circuit diagram showing the arrangement of a recording head in which a circuit for voltage-dividing a heater power supply voltage and supplying the divided voltage to the gate voltage booster is added to the arrangement of the recording head shown in FIG.


5


.




Referring to

FIG. 6

, reference numeral


131


denotes a voltage supply circuit for supplying a power supply voltage onto the power supply line


116


for the gate voltage boosters


111


using a voltage supplied from the power supply line


452


to the heaters


401


;


132


and


133


, resistors;


134


, an nMOS transistor; and


135


, a resistor connected to the source of the nMOS transistor


134


. The nMOS transistor


134


and the resistor


135


form a source-follower type buffer.




With this arrangement, a voltage is generated based on the voltage from the heater power supply line


452


at the voltage dividing ratio of the resistors


132


and


133


, and is supplied to the gate voltage booster


111


via the source-follower circuit built by the nMOS transistor


134


and the resistor


135


. In this manner, an optimal voltage can be supplied to each gate voltage booster


111


without adding another power supply. Since such buffer is arranged, a voltage drop caused by a current that flows when the nMOS transistor


113


in each gate voltage booster


111


is turned on can be absorbed, and consequently, a voltage can be supplied to each gate voltage booster


111


without impairing the circuit characteristics.




Third Embodiment





FIG. 7

is a circuit diagram showing the arrangement of a driving circuit of a recording head. Note that the same reference numerals in

FIG. 7

denote the same parts as those in the recording head shown in

FIG. 5

, and a detailed description thereof will be omitted. The characteristic elements of this embodiment alone will be explained below.




Referring to

FIG. 7

, reference numeral


141


denotes a correction circuit for applying a desired voltage to the gate voltage boosters


111


. The correction circuit


141


is built by a polysilicon resistor


142


, an nMOS transistor


143


, and an input terminal


144


for determining the ON resistance when the nMOS transistor


143


is ON. Note that the polysilicon electrodes of the circuit formed by the polysilicon resistor


142


, the nMOS transistor


143


, and the power transistors


410


are formed in a single manufacturing process.




The recording head with the above-mentioned arrangement performs the same operations as those of the conventional recording head shown in

FIG. 10

in accordance with the timing chart shown in FIG.


11


.




A case will be examined below wherein the output from a certain latch circuit


501


is “Low”. At this time, since the nMOS transistor


113


is turned off, the voltage on the power supply line


116


is directly applied to the gate of the CMOS inverter constituted by the pMOS transistor


114


and the nMOS transistor


115


via the resistor


112


. In response to this voltage, since the output from the CMOS inverter goes “Low”, a voltage “0 V” is supplied to the gate of the corresponding power transistor


410


. More specifically, when the output from the latch circuit


501


is “Low (no image data or the value of an image signal is “0”)”, the gate voltage of the power transistor


410


is set at “0 V”, and no current is supplied to the heater


401


. As a result, no printing is done.




Next, a case will be examined below wherein the output from a certain latch circuit


501


is “Hi”. Since the shift register


502


and latch circuits


501


are normally made up of CMOS gates, and all the external transfer clock pulses (CLK), image signal (DATA), latch timing signal (LT) have a signal amplitude of 0 V/5 V, a power supply voltage associated with each latch circuit


501


is often 5 V. Hence, when the output from the latch circuit


501


is “Hi”, its signal voltage is 5 V. The voltage of 5 V is applied to the gate of the nMOS transistor


113


via the switch


506


. In response to this voltage signal, since the nMOS transistor


113


is turned on, a current flows via the resistor


112


.




At this time, when the resistance of the resistor


112


is set at a value sufficiently larger than the ON resistance of the nMOS transistor


113


, a voltage very close to 0 V is supplied to the gate of the CMOS inverter, and the output from the CMOS inverter goes “Hi”. Hence, the voltage value on the power supply line


116


directly appears as the output voltage level of the CMOS inverter, and is supplied to the gate of the power transistor


410


.




More specifically, when the output from the latch circuit


501


is “Hi”, the voltage on the power supply line


116


is applied to the gate of the power transistor


410


to turn it on. As a result, a current is supplied to the heater


401


to heat ink, and ink is ejected to attain printing. In this manner, the voltage applied to the gate electrode of the power transistor


410


is that of the power supply line


116


. This voltage is generated by the correction circuit


141


.




In the manufacturing process of the recording head, the polysilicon electrodes of the polysilicon resistor


142


and the nMOS transistor


143


are formed simultaneously with the polysilicon gate electrodes of the nMOS transistors


410


as the power transistors for supplying currents to the heaters


401


, and these electrode sizes are designed, as will be described below. Hence, the correction circuit


141


operates as a circuit for suppressing changes in ink ejection state with changes in driving force of each power transistor


410


.




More specifically, when an MPA is used as an aligner, as described in the prior art, the gate length (L) of an nMOS transistor suffers process variations of a maximum of ±0.5 to ±1.0 μm with respect to its design value. Such process variations depend on the exposure condition and etching condition, and drift considerably among manufacturing lots and among wafers. On the other hand, as for variations in a single wafer, the above-mentioned variations have occurred with respect to the design value, but relative variations in the wafer are relatively small. That is, if the polysilicon width of a certain portion of a wafer is 1 μm smaller than the design value, the polysilicon widths of other portions are similarly expected to be 1 μm smaller than the design value.




A case will be examined below wherein the design value of the polysilicon gate length (L) of the power transistor


410


is 4 μm, and this value has changed to 3 μm due to process variations.




In this case, as can be understood from equation (1), since the driving force of the MOS transistor increases by 4/3, the energy generated by the heater


401


becomes larger than the design value. As a result, ink scorches, or the heater service life is shortened.




At this time, if the width of the polysilicon resistor


142


in the correction circuit


141


and the gate length (L) of the nMOS transistor


143


are designed at 4 μm, and the directions of the polysilicon gates of the power transistors


410


and the nMOS transistors


143


agree with the direction of the polysilicon resistor


142


, these values are similarly expected to change to 3 μm in a single wafer.




A case will be explained below wherein the circuit is designed so that the voltage on the power supply line


452


becomes 24 V and the voltage on the power supply line


116


becomes 16 V, i.e., the ratio of the polysilicon resistor


142


to the ON resistance of the nMOS transistor


143


is 1:2.




Since the width of the polysilicon resistor


142


changes from 4 μm to 3 μm like in the gate length (L) of each power transistor


410


, the resistance of the polysilicon resistor


142


increases to 1.33 times. On the other hand, since the gate length (L) of the nMOS transistor


143


in the correction circuit


141


changes from 4 μm to 3 μm, the ON resistance of the nMOS transistor decreases to 0.75 times. As a result, the voltage generated by the correction circuit


141


and supplied to the power supply line


116


changes from 16 V as the design value to about 12.5 V.




As has already described above, this voltage is applied to the gate electrode of each power transistor


410


. Since the gate voltage (VG) and the drain current (IDS) have the relationship given by equation (1), when the gate voltage (VG) changes from 16 V to 12.5 V, the drain current (IDS) changes to about 0.75 times. Therefore, when the gate length of each power transistor


410


changes, the driving force of the MOS transistor increases to about 1.33 times, but changes in driving force by the MOS transistor with changes in gate voltage (VG) are about 0.75 times. Hence, changes in driving force of the MOS transistor are about 0.998 times as a whole, i.e., the driving force changes little.




As described above, when the gate length of each power transistor


410


becomes smaller than the design value, it acts to improve the driving force of the MOS transistor. However, since the voltage applied to the gate electrode of the transistor lowers by the operation of the correction circuit


141


, the driving force of the MOS transistor is suppressed. Conversely, when the gate length of each power transistor


410


becomes larger than the design value, it acts to decrease the driving force of the MOS transistor. However, since the voltage applied to the gate electrode of the transistor increases, decrease in driving force of the MOS transistor is suppressed.




As described above, according to this embodiment, even when the driving force of the MOS transistor drifts due to variations in the manufacturing process, the correction circuit


141


operates to compensate for such drifts, and controls the driving force of each MOS transistor, thus minimizing the influence of drifts on ink ejection. Hence, variations in ink ejection ascribed to variations of the characteristics of the power transistors that build the circuit of the recording head can be suppressed, and more stable ink ejection can be realized, thus printing an image with higher quality.




Since no heavy load acts on the heaters, this embodiment can contribute to prolong the service life of the recording head.




In the description of the above embodiment, the gate lengths of the power transistors


410


, the width of the polysilicon resistor


142


, and the gate length of the nMOS transistor


143


have equal design values. In an actual manufacturing process of a recording head, when the circuit is designed in this manner, the driving forces of the MOS transistors can be corrected best. However, the present invention is not limited to such specific arrangement, and these values need not always assume identical design values.




In the above embodiment, the correction circuit


141


is constituted by the polysilicon resistor and the MOS transistor. However, the present invention is not limited to such specific circuit arrangement. Either one of these elements may be used, and for example, a correction circuit may be made up by a combination of a polysilicon resistor having substantially the same width as the gate length of the power transistor, and a polysilicon resistor which is thick enough not to be influenced by process variations.




In the above embodiment, the gate voltage boosters


111


correspond to a circuit arrangement formed by the CMOS process. However, the present invention is not limited to such specific arrangement.




Fourth Embodiment




For example, as shown in

FIG. 8

, each gate voltage booster


111


may be built by nMOS transistors alone. In

FIG. 8

, reference numeral


312


denotes a resistor; and


313


to


315


, nMOS transistors.




In this manner, when each gate voltage booster


111


is built by nMOS transistors alone, and the logic circuits such as the shift register, latch circuits, and the like are also built by nMOS transistors alone, the circuit of the recording head can be manufactured by an nMOS process, and the manufacturing cost can be reduced although consumption power becomes larger than that in a CMOS circuit.




Fifth Embodiment




In the above embodiment, upon ejecting ink, the nMOS transistor


113


is turned on, and currents flow from the power supply line


116


to GND. At this time, in order to suppress changes in voltage of the power supply line


116


, the resistance of the resistor


142


and the ON resistance of the nMOS transistor


143


must be set to be sufficiently smaller than the resistance of the resistor


112


. With this arrangement, however, a large punch-through current is generated from the power supply line


452


to GND via the resistor


142


and the MOS transistor


143


, and electric power is consumed.




In this embodiment, in order to reduce such consumption power, a buffer


131


is inserted between the correction circuit


141


and the power supply line, and the circuit of the recording head is arranged, as shown in FIG.


9


. In

FIG. 9

, reference numeral


131


denotes a source-follower buffer that converts an input/output impedance;


132


, an nMOS transistor; and


133


, a resistor. As can be seen from the circuit arrangement shown in

FIG. 9

, the basic operation of the circuits other than the source-follower buffer


131


is the same as that in the circuit shown in FIG.


7


.




In order to drive each heater


401


by such circuit arrangement, the drain current of the nMOS transistor


132


need only be supplied onto the power supply line


116


. On the other hand, this current is controlled by the gate voltage of the nMOS transistor


132


. Accordingly, only the voltage output from the correction circuit


141


and applied to the gate of the nMOS transistor


132


is important, and the correction circuit


141


may have low current supply performance. Hence, the resistance of the resistor


142


and the ON resistance of the MOS transistor


143


can be increased. As a result, currents that flow from the power supply line


452


to GND via the resistor


142


and the MOS transistor


143


become small, and the consumption power can be suppressed.




In this embodiment, when the output from the correction circuit


141


is input to the buffer


131


, and the corresponding buffer output is generated as the source-drain current of the nMOS transistor


132


, a voltage drop corresponding to the threshold voltage (VTH) of the nMOS transistor


132


is generated. However, the basic operation is the same as that in the above embodiment.




Therefore, according to this embodiment, extra power consumption can be minimized, and the consumption power can be further reduced.




An improved arrangement of each gate voltage booster required for driving the power transistor will be explained below.




Even if a logic output


721


as a voltage of about 3 to 8 V (normally, 5 V) is applied to the gate (G) of a power transistor, as shown in

FIG. 21A

, it is hard to supply currents of at least 100 to 200 mA required for foaming ink to a heating element. Even if it is possible, the ON voltage in the drain (D)-source (S) path becomes large, and energy is wastefully consumed. Accordingly, in order to improve the driving performance of the power transistor, a gate voltage booster


740


for boosting the voltage applied to the gate (G) of the power transistor is arranged at the input side of the an nMOS power transistor


720


.





FIG. 23

shows an example of the arrangement of the gate voltage booster


740


. Referring to

FIG. 23

, reference numeral


411


denotes an offset nMOS transistor;


412


, a booster resistor; and


413


, an operational amplifier. Also, reference numeral


414


denotes a power supply line input from a heating element power supply input pad


711


. This circuit makes up an nMOS inverter using the offset nMOS transistor


411


.




However, with this circuit arrangement, while the heating element is not driven, i.e., while the power transistor


720


is OFF, the nMOS transistor


411


is turned on, and a current flows based on a power supply voltage (VTH)


414


applied from a power supply via the booster resistor


412


. Since this current is kept supplied during the non-driving period of the heating element, energy loss occurs. Also, when the number of heating elements increases, such current alone may raise the internal temperature of the recording head.




As shown in

FIG. 5

, when the gate voltage booster is arranged at the input side of the nMOS power transistor


410


, a punch-through current can be prevented due to the CMOS circuit when the power transistor


410


is OFF. However, in the pMOS transistor


114


in the CMOS inverter circuit, it is hard to obtain a breakdown voltage nearly equal to the power supply voltage of about 20 V on the power supply line


452


for driving each heating element


401


in terms of the circuit arrangement. Hence, the breakdown voltage of the pMOS transistor


114


must be set at 10 to 14 V, and another power supply line


116


of 14 V or less must be additionally supplied from an external circuit. On the other hand, the power supply voltage of the power supply line


452


may be stepped down by an internal circuit and may be used as an inverter circuit power supply (not shown). In this case, however, basis for reduction of power loss caused by voltage step-down, and voltage drifts depending on the number of heating elements to be simultaneously driven by the power supply voltage of the inverter circuit, and the like are posed (not shown).




Sixth Embodiment




In order to solve such basis, in the sixth embodiment to be described below, a gate voltage booster is arranged, as shown in FIG.


16


A.





FIG. 16A

is a circuit diagram showing a heating element driving circuit mounted on an ink-jet recording head according to the sixth embodiment of the present invention, and showing a circuit from a logic circuit output


108


to a gate voltage booster


101


and an nMOS power transistor


410


via an inverter element


107


.




Referring to

FIG. 16A

, reference numeral


104


denotes the characteristic feature portion of this embodiment, i.e., a high-breakdown voltage offset pMOS transistor which is formed by forming a p





-type impurity region


202


shown in

FIG. 17A

between a p


+


-type impurity layer


201


and the gate G of a pMOS transistor to raise its breakdown voltage from about 10 to 14 V of the conventional circuit to 250 V or higher, and builds an inverter circuit. Reference numeral


401


denotes a heating element;


410


, an offset nMOS power transistor with a structure shown in

FIG. 17B

for driving the heating element


401


;


103


and


105


, high-breakdown voltage (25 V or higher) offset nMOS transistors which have the same structure as that of the offset nMOS power transistor


410


, and constitute the gate voltage booster


101


for boosting the voltage to be applied to the gate of the offset nMOS power transistor


410


from the logic circuit output


108


and the inverter element


107


(0 V to 5 V) to a power supply line


130


(15 to 25 V); and


102


, a booster resistor.




The operation of the heating element driving circuit mounted on the ink-jet recording head of this embodiment will be explained below.




Referring to

FIG. 16A

, when the nMOS power transistor


410


is OFF, i.e., when the heating element


401


is not driven (in the power-ON state of a recording apparatus, since the voltage application time to each heating element


401


upon ink-jet printing is about 3 to 7 μs with respect to a period of 100 to 200 μs, most power transistors are OFF, and it is important especially for battery-driven devices to reduce consumption power in the OFF state), the nMOS transistor


105


in the inverter circuit (


104


,


105


) is turned on. However, since the pMOS transistor


104


is OFF, no punch-through current flows. Furthermore, since the nMOS transistor


103


at the input side of these transistors is OFF in this state, no punch-through current flows on this side, and the consumption power in the non-driving state approaches “0”. Hence, by using the circuit structure shown in

FIG. 5

, a punch-through current, that flows in the non-driving state along the power supply line


414


→the booster resistor


412


→the nMOS transistor


411


→GND, as described in

FIG. 23

, can be prevented. Furthermore, since the breakdown voltage of the pMOS transistor


104


can be set at 25 V or higher, no extra power supply line is required in addition to the power supply line


452


, and the power supply line


452


can be shared with the power supply line


130


, thus simultaneously realizing a reduction of power supply cost and a size reduction of the recording apparatus.




Furthermore, in the above embodiment, as shown in

FIGS. 17A and 17B

, the p





-type impurity layer


202


as the feature of this embodiment is doped deeper than the n





-type impurity layer


212


and shallower than an n-type substrate region


203


that makes up the offset pMOS transistor


104


, thus forming a diode sensor shown in

FIG. 18A

at the same time. In

FIG. 18A

, reference numeral


211


denotes an n


+


-type impurity layer that makes up the source/drain of the offset nMOS transistor, and serves as the cathode (K) of the diode sensor; and


202


, a p





-type impurity layer which is the same as the p





-type impurity layer of the offset pMOS transistor


104


(

FIG. 17A

) and serves as the anode (A) of the diode sensor.




With the above-mentioned structure, in the conventional transistor structure shown in

FIG. 21D

, currents that flow to the regions other than the anode (A) and cathode (K) such as leakage current to the substrate produced by a parasitic pnp transistor formed by the p


+


-type region (


735


), n-type region (


725


or


736


), and p-type substrate (


728


or


734


), and the like can be completely eliminated, and the problem of, e.g., latch-up due to the leakage current can be solved. In addition, the problem that diode sensors cannot be connected in series in the prior art can be solved at the same time, and diode sensors can be connected in series.




Furthermore, the merit of this embodiment lies in that the temperature characteristics of the diode sensor can be set within a broader range than the transistor structure of the third embodiment, since the temperature characteristics of the diode sensor depend mainly on the low-concentration impurity layer of a p-n junction, and the p





-type impurity layer


202


(

FIG. 18A

) that makes up the anode A of this diode need only have a concentration high enough to obtain the breakdown voltage of the pMOS transistor.




Also, when the p





-type impurity layer is added to the conventional MOS process structure to be shallower than the n-type layer that makes up the substrate of the pMOS transistor and to be deeper than the n


+


-type layer that makes up the drain/source of the nMOS transistor, a CMOS inverter circuit which comprises a pMOS transistor that can withstand the heating element driving voltage can be constituted at the input side of the power transistor.




In addition, since the p





-type layer is added, the diode sensor can have an npnp structure, and can be completely isolated from the p-type substrate, thereby eliminating the influence of a parasitic transistor and realizing a series connection of diode sensors.




Note that p


+


-type layer/region denotes high impurity density of p MOS layer/region which shows low resistivity; n


+


-type layer/region denotes high impurity density of n MOS layer/region which shows low resistivity; p





-type layer/region denotes low impurity density of p MOS layer/region which shows high resistivity; and n





-type layer/region denotes high impurity density of n MOS layer/region which shows high resistivity.




Another Embodiment




In the above embodiments, the cases using the nMOS power transistors have been exemplified. The present invention can be easily applied to a transistor structure using pMOS power transistors by reversing the conductivity types of all the impurity layers, and such structure is also included in the technical scope of the present invention.




More specifically, in

FIG. 16B

, reference numeral


154


denotes an nMOS transistor in which an n





-type impurity layer


252


shown in

FIG. 17C

is formed between a drain p


+


-type impurity layer


251


and the gate G of a pMOS transistor. Also, reference numeral


460


denotes an offset pMOS power transistor with a structure shown in

FIG. 17B

for driving the heating element


401


. Reference numeral


155


denotes an offset pMOS power transistor having the same structure as that of the offset pMOS power transistor


460


. Reference numeral


102


denotes a booster resistor.




As shown in

FIGS. 17C and 17D

, when the n





-type impurity layer


252


is doped deeper than a p





-type impurity layer


262


that makes up the offset pMOS transistor


155


and shallower than a p-type substrate region


253


that makes up the offset nMOS transistor


154


, a diode sensor shown in

FIG. 18B

can be simultaneously formed. In

FIG. 18B

, reference numeral


261


denotes a p


+


-type impurity layer that makes up the drain/source of the offset pMOS transistor, and serves as the cathode (K) of the diode sensor; and


252


, an n





-type impurity layer which is the same as that of the offset nMOS transistor


252


(

FIG. 17C

) and serves as the anode (A) of the diode sensor.




Note that the gate voltage booster


111


shown in

FIG. 5

or the gate voltage booster


101


shown in

FIG. 16A

has a larger circuit scale than the circuit shown in

FIG. 23

since it additionally has an inverter, resulting in an increase in substrate chip size, i.e., an increase in cost.




Seventh Embodiment





FIG. 24

shows the arrangement of a circuit for driving one print element of a recording head. Since the arrangement of the logic circuit of the recording head is the same as that of the conventional logic circuit shown in

FIG. 19

, a detailed description thereof will be omitted, and such constituting elements will be quoted using the same reference numerals in

FIG. 23

, as needed. The above-mentioned print element corresponds to a circuit built by a heating element which operates to eject ink from a single orifice, and a power transistor.




Referring to

FIG. 24

, since a gate voltage booster


740


is an nMOS inverter having the same arrangement as that shown in

FIG. 23

, the same reference numerals in

FIG. 24

denote the same parts as in

FIG. 23

, and a detailed description thereof will be omitted. A logic output


721


shown in

FIG. 24

expresses its ON/OFF state by a voltage of 5 V. Reference numeral


501


denotes a pMOS transistor. Also, a portion A includes a heating element and a wiring portion that face a p-type silicon (Si) substrate and ink via a protection insulating film alone.




In

FIG. 24

, reference numeral


501


denotes a pMOS transistor which serve s as a power transistor, and drives a heating element


701


.





FIGS. 25A and 25B

are sectional views of a substrate in which the pMOS transistor


501


, and an nMOS transistor


411


of the gate voltage booster


740


are formed.

FIG. 25A

shows the arrangement of the pMOS transistor


501


, and

FIG. 25B

shows the arrangement of the nMOS transistor


411


.




As shown in

FIG. 25A

, the pMOS transistor


501


has a structure (offset MOS) in which a p





-type impurity layer


202


is formed between a p


+


-type impurity layer


201


serving as the drain (D), and the gate (G), so as to raise its breakdown voltage beyond 25 V from that (about 10 to 14 V) of a normal pMOS transistor having no offset structure.




On the other hand, as shown in

FIG. 25B

, the nMOS transistor


411


has a structure (offset MOS) in which an n





-type impurity layer


212


is formed between an n


+


-type impurity layer


211


serving as the drain (D), and the gate (G), so as to similarly raise its breakdown voltage as in the above-mentioned pMOS transistor. Note that this structure is the same as that of the offset nMOS transistor shown in FIG.


21


B.




In

FIGS. 25A and 25B

, reference numeral


203


denotes an n-type region; and


204


, a p-type silicon (Si) substrate.




The operation of the print element and the gate voltage booster


740


of the recording head with the above arrangement will be explained below.




When the pMOS transistor


501


as a power transistor is OFF, i.e., it does not drive the heating element


701


, the nMOS transistor


411


is also in the OFF state, and no current is supplied to the gate voltage booster


740


. That is, when no printing is done, the consumption power becomes zero. On the other hand, since the nMOS transistor


411


has the offset MOS structure, i.e., has high-breakdown voltage characteristics, a power supply voltage VH on a power supply line


414


is directly applied to an inverter (nMOS transistor


411


).




As has been described above, since ink has conductivity, and contacts the p-type silicon (Si) substrate as GND on the side of the substrate, the entire ink serves as GND. On the other hand, when the pMOS transistor


501


is OFF, the heating element and the wiring portion, indicated by the portion A in

FIG. 24

, which contact the ink via the protection insulating film alone serve as GND. Hence, no electric field is generated between the ink and the portion A via the protection insulating film.




Therefore, according to the above-mentioned embodiment, since no current is supplied to the gate voltage booster


740


when no printing is desired, the consumption power of the recording head in the non-printing state can be reduced. Also, since the gate voltage booster can have a simple arrangement, the number of elements of the overall circuit can be reduced. In this manner, a reduction of the circuit scale of the recording head and a reduction of manufacturing cost can be realized.




For example, as compared to the circuit arrangement shown in

FIG. 16A

, the number of elements of the gate voltage booster per print element can be halved. When the power switch of the recording apparatus is turned on to perform printing, the print period in which the recording head performs printing is about 200 μs, while the actual energization time of each heating element is about 3 to 7 μs, and no printing is performed during most of the print period, i.e., each power transistor is OFF. Since the gate voltage booster


740


does not consume any electric power in such idling state during the print period, the effect of this embodiment is remarkable in terms of a reduction of consumption power.




Furthermore, in the above embodiment, since a pMOS transistor is used as a power transistor, the impact ionization phenomenon that generates ions upon collision of carriers is harder to occur than the nMOS transistor, and production of a leakage current in the drain-source path upon turning off the driven heating element can be suppressed. In this manner, the reliability of the recording head can be improved.




Moreover, in the above embodiment, when the power transistor is OFF, no electric field is generated between the ink and the substrate surface and, hence, the load acting on the protection insulating film can be reduced. Thus, the service life of the substrate can be prolonged, and the reliability of the recording head can also be improved.




In the above embodiment, the inverter at the input side of the pMOS transistor


501


is built by a resistor and an nMOS transistor. However, the present invention is not limited to such specific arrangement. For example, the inverter may be built by an nMOS transistor.




Furthermore, in the above embodiment, both the pMOS transistor as the power transistor, and the nMOS transistor of the gate voltage booster have the offset MOS transistor structure. However, the present invention is not limited to such specific structure. For example, when these MOS transistor can withstand the heating element driving voltage without using an offset structure, one or both of these transistor need not have an offset structure.




In the above embodiment, an ink-jet recording head has been exemplified. However, the present invention is not limited to such head. For example, the present invention can be applied to a thermal head that attains printing by a thermal transfer method.




The above embodiment can achieve high-density, high-definition printing using a system, which comprises means (e.g., an electro-thermal conversion element, laser beam, and the like) for generating heat energy as energy utilized upon ejecting ink, and causes changes in state of ink by the heat energy, among the ink-jet printing systems.




As the representative arrangement and principle of such ink-jet printing system, one practiced by use of the basic principle disclosed in, for example, U.S. Pat. Nos. 4,723,129 and 4,740,796 is preferred. The above system is applicable to either one of so-called on-demand type and continuous type. Particularly, in the case of the on-demand type, the system is effective because, by applying at least one driving signal, which corresponds to printing information and gives a rapid temperature rise exceeding film boiling, to each of electro-thermal conversion elements arranged in correspondence with a sheet or liquid channels holding liquid (ink), heat energy is generated by the electro-thermal conversion element to effect film boiling on the heat acting surface of the recording head, and consequently, a bubble can be formed in the liquid (ink) in one-to-one correspondence with the driving signal. By ejecting the liquid (ink) through an ejection opening by growth and shrinkage of the bubble, at least one droplet is formed. If the driving signal is applied as a pulse signal, the growth and shrinkage of the bubble can be attained instantly and adequately to achieve ejection of the liquid (ink) with particularly high response characteristics.




As the pulse driving signal, signals disclosed in U.S. Pat. Nos. 4,463,359 and 4,345,262 are suitable. Note that further excellent printing can be performed by using the conditions described in U.S. Pat. No. 4,313,124 of the invention which relates to the temperature rise rate of the heat acting surface.




As an arrangement of the recording head, in addition to the arrangement as a combination of orifices, liquid channels, and electro-thermal conversion elements (linear liquid channels or right-angled liquid channels) as disclosed in the above specifications, the arrangement using U.S. Pat. Nos. 4,558,333 and 4,459,600, which disclose an arrangement having a heat acting portion arranged in a bent region may be used. In addition, an arrangement based on Japanese Patent Laid-Open No. 59-123670 which discloses an arrangement using a slit common to a plurality of electro-thermal conversion elements as an ejection portion of the electro-thermal conversion elements, or Japanese Patent Laid-Open No. 59-138461 which discloses an arrangement having an opening for absorbing a pressure wave of heat energy in correspondence with an ejection portion, may be used.




Furthermore, as a full line type recording head having a length corresponding to the width of a maximum print medium which can be printed by the recording apparatus, either the arrangement which satisfies the full-line length by combining a plurality of recording heads as disclosed in the above specification or the arrangement as a single recording head obtained by forming recording heads integrally may be used.




In addition, an exchangeable chip type recording head which can be electrically connected to the recording apparatus main body or can receive ink from the recording apparatus main body upon being mounted on the recording apparatus main body may be used in addition to a cartridge type recording head in which an ink tank is integrally arranged on the recording head itself, described in the above embodiment.




It is preferable to add recovery means for the recording head, preliminary means, and the like to the arrangement of the recording apparatus of the present invention since printing can be further stabilized. Examples of such means include, for the recording head, capping means, cleaning means, pressurization or suction means, and preliminary heating means using electro-thermal conversion elements, another heating element, or a combination thereof. It is also effective for stable printing to execute a preliminary ejection mode which performs ejection independently of printing.




Furthermore, as the print mode of the recording apparatus, the recording apparatus may have not only the print mode of only a primary color such as black or the like but also at least one of a multiple-color print mode using a plurality of different colors or a full-color print mode by mixing colors, which modes may be attained by either an integrated recording head or a combining a plurality of recording heads.




Moreover, in the above-mentioned embodiment, ink is described as a liquid. Alternatively, the present invention may use even ink which is solid at room temperature or less, and ink which softens or liquefies at room temperature. Alternatively, since it is a common practice in the ink-jet method to perform temperature control of the ink itself within the range from 30° C. to 70° C. so that the ink viscosity falls within the stable ejection range, any types of ink may be used as long as they liquefy upon application of a use print signal.




In addition, in order to prevent a temperature rise caused by heat energy by positively utilizing it as energy for causing changes in state of the ink from the solid state to the liquid state, or to prevent evaporation of the ink, ink which is solid in a non-use state and liquefies upon heating may be used. In any case, the present invention can be applied to a case wherein ink which liquefies upon application of heat energy, such as ink which liquefies upon application of heat energy according to a print signal and is ejected in the liquid state, ink which begins to solidify when it reaches a print medium, or the like, is used. In the present invention, the above-mentioned film boiling system is most effective for the above-mentioned inks.




Also, the recording apparatus of the present invention may be arranged integrally or separately as the image output terminal of information processing equipment such as a computer or the like, or may be used in a copying machine combined with a reader and the like, and a facsimile apparatus having a transmission/reception function.




Note that the present invention may be applied to either a system built by a plurality of devices (e.g., a host computer, interface device, reader, recording apparatus, and the like), or an apparatus (such as a copying machine, facsimile apparatus, or the like) consisting of a single device.




In the above description, the ink-jet recording head substrate is used in an ink-jet recording head. The substrate structure based on the present invention can also be applied to, e.g., a thermal head substrate.




Effect




As described above, according to the present invention, upon driving a heater by inputting a latch output corresponding to a digital signal that expresses OFF and ON using, e.g., 0 V and 5 V, to a power transistor such as a FET, the latch output can be boosted, and the boosted output can be applied to the power transistor. For this reason, the drivability of the power transistor such as a FET can be improved, and a recording head with higher performance, and a recording apparatus using the recording head can be realized.




According to the present invention, even when the characteristics of a MOS transistor that drives a heater vary depending on the semiconductor manufacturing process, the variations in characteristics can be corrected by a correction circuit. Accordingly, the recording head can operate stably, and high-quality image printing can be attained.




Furthermore, according to the present invention, since lightly-doped regions are formed on the drains of nMOS and pMOS elements in a CMOS inverter circuit of a recording head substrate to add p





- or n





-type regions to the conventional element structure, a CMOS inverter circuit which comprises a pMOS or nMOS element that can withstand the driving voltage of the heating element can be arranged at the input side of the power transistor without increasing consumption power or without arranging another power supply or any fear of voltage drifts, thus realizing a high-breakdown voltage CMOS inverter circuit for driving the power transistor.




Since the p





-or n





-type layer is added to the pMOS or nMOS element of the CMOS inverter circuit, a diode sensor can have an npnp or pnpn structure to be perfectly isolated from a p- or n-type substrate. Hence, a diode sensor which is free from any influence of a parasitic transistor and is perfectly isolated can be formed at the same time.




Since the diode sensor can be perfectly isolated, a series connection of diode sensors can be realized. An increase in the number of terminals of the sensors can be prevented, and the dynamic range can be accurately broadened by a series connection of diode sensors.




Since a power supply voltage can be commonly supplied from a power supply for driving print elements, no additional power supply is required, and the need for a step-down circuit can be obviated. Also, a punch-through current can be eliminated since the CMOS structure is used. In this manner, since temperature rise of the recording head can be prevented, and energy savings can be attained, the present invention is suitable for a battery-driven recording apparatus, or the like.




Furthermore, since the recording head of the present invention uses the above-mentioned recording head substrate, and the recording apparatus of the present invention mounts the recording head, a reduction of power supply cost and a size reduction of the recording apparatus can be realized.




In addition, according to the present invention, the circuit scale of the recording head can be reduced, and current leakage in the drain-source path of the power transistor for driving the heating element can be suppressed, thereby improving the reliability of the recording head and reducing the consumption power of the recording head.




Moreover, ink contacts the heating element via an electric insulating layer, and is printed upon heating. However, since no electric field is generated between the ink and the heating element via the insulating layer in the non-printing state, the load acting on the insulating layer can be reduced, thus improving the reliability of the recording head and prolonging its service life.



Claims
  • 1. A recording head comprising:a heater corresponding to a print element; a MOS power transistor connected to said heater in electrical series for energizing and driving said heater; a MOS logic circuit for driving said MOS power transistor; and a voltage converter for converting a voltage amplitude of a signal output from said MOS logic circuit into a higher voltage amplitude, and applying a signal with the converted amplitude to a gate electrode of said MOS power transistor.
  • 2. The recording head according to claim 1, wherein said MOS logic circuit comprises:a shift register for temporarily storing an input digital image signal; and a latch circuit for latching the digital image signal stored in said shift register, and said voltage converter boosts a voltage that expresses an ON state of the digital signal latched by said latch circuit, and applies the boosted voltage to said MOS power transistor.
  • 3. The recording head according to claim 1, wherein said MOS power transistor comprises an n-type MOSFET.
  • 4. The recording head according to claim 3, wherein said voltage converter is arranged between a gate of said n-type MOSFET and an output terminal of said latch circuit.
  • 5. The recording head according to claim 4, wherein said voltage converter comprises:a first resistor; a first nMOS transistor, a drain of which is connected to said first resistor; and a CMOS inverter built by a first pMOS transistor and a second nMOS transistor, gates of which are connected between said first resistor and the drain.
  • 6. The recording head according to claim 5, wherein lightly-doped regions are formed in drains of the first pMOS transistor and the second nMOS transistor of said CMOS inverter circuit.
  • 7. The recording head according to claim 6, wherein a lightly-doped p-type impurity region in the drain of said first pMOS transistor is shallower than an n-type region serving as a pMOS substrate of said CMOS inverter circuit, and is deeper than a heavily-doped n-type impurity region serving as a drain and source of said second nMOS transistor of said CMOS inverter circuit.
  • 8. The recording head according to claim 7, wherein a temperature sensor is formed as a diode having an npnp structure made up of the heavily-doped n-type impurity region serving as the drain and source of said second nMOS transistor, the lightly-doped p-type impurity region in the drain of said first pMOS transistor, and the n-type region and a p-type substrate serving as the pMOS substrate of said CMOS inverter circuit, so as to use the heavily-doped n-type impurity region as a cathode and the lightly-doped p-type impurity region as an anode.
  • 9. The recording head according to claim 6, wherein said recording head is an ink-jet recording head that attains printing by ejecting ink.
  • 10. The recording head according to claim 6, wherein said recording head is a recording head that ejects ink using heat energy, and comprises a heat energy conversion element for generating heat energy that is applied to the ink.
  • 11. A recording apparatus comprising the recording head of claim 6.
  • 12. The recording apparatus according to claim 11, wherein said MOS power transistor comprises an n-type MOSFET.
  • 13. The recording apparatus according to claim 12, wherein said voltage converter is arranged between a gate of said n-type MOSFET and an output terminal of said latch circuit.
  • 14. The recording apparatus according to claim 13, wherein said voltage converter comprises:a first resistor; a first nMOS transistor, a drain of which is connected to said first resistor; and a CMOS inverter built by a first pMOS transistor and a second nMOS transistor, gates of which are connected between said first resistor and the drain.
  • 15. The recording apparatus according to claim 11, further comprising a carriage for carrying the recording head.
  • 16. The recording head according to claim 5, wherein said MOS power transistor comprises a pMOS transistor, and lightly-doped regions are formed in drains of the first pMOS transistor and the second nMOS transistor of said CMOS inverter circuit.
  • 17. The recording head according to claim 16, wherein a lightly-doped n-type impurity region in the drain of said second nMOS transistor is shallower than a p-type region serving as an nMOS substrate of said CMOS inverter circuit, and is deeper than a heavily-doped p-type impurity region serving as a drain and source of said first pMOS transistor of said CMOS inverter circuit.
  • 18. The recording head according to claim 17, wherein a temperature sensor is formed as a diode having a pnpn structure made up of the heavily-doped p-type impurity region serving as the drain and source of said first pMOS transistor, the lightly-doped n-type impurity region in the drain of said second nMOS transistor, and the p-type region and an n-type substrate serving as the nMOS substrate of said CMOS inverter circuit, so as to use the heavily-doped p-type impurity region as an anode and the lightly-doped n-type impurity region as a cathode.
  • 19. The recording head according to claim 16, wherein said recording head is an ink-jet recording head that attains printing by ejecting ink.
  • 20. The recording head according to claim 16, wherein said recording head is a recording head that ejects ink using heat energy, and comprises a heat energy conversion element for generating heat energy that is applied to the ink.
  • 21. A recording apparatus comprising the recording head of claim 16.
  • 22. The recording apparatus according to claim 21, wherein said MOS power transistor comprises an n-type MOSFET.
  • 23. The recording apparatus according to claim 22, wherein said voltage converter is arranged between a gate of said n-type MOSFET and an output terminal of said latch circuit.
  • 24. The recording apparatus according to claim 23, wherein said voltage converter comprises:a first resistor; a first nMOS transistor, a drain of which is connected to said first resistor; and a CMOS inverter built by a first pMOS transistor and a second nMOS transistor, gates of which are connected between said first resistor and the drain.
  • 25. The recording apparatus according to claim 21, further comprising a carriage for carrying the recording head.
  • 26. The recording head according to claim 1, further comprising:a first power supply line for applying a first voltage to said heater; and a second power supply line for applying a second voltage to said voltage converter.
  • 27. The recording head according to claim 26, further comprising:a voltage-dividing circuit for generating the second power supply voltage by voltage-dividing the first power supply voltage, and wherein a common power supply is used for the first and second power supply voltages.
  • 28. The recording head according to claim 27, wherein said voltage-dividing circuit includes a source-follower circuit.
  • 29. The recording head according to claim 1, wherein said recording head is an ink-jet head that attains printing by ejecting ink.
  • 30. A recording apparatus using a recording head of claim 1.
  • 31. The recording head according to claim 1, further comprising:a correction circuit for correcting a characteristic variation of said MOS power transistor.
  • 32. The recording head according to claim 31, wherein causes of the characteristic variation include a variation in gate length of said MOS power transistor in a semiconductor manufacturing process.
  • 33. The recording head according to claim 32, wherein said correction circuit suppresses a drift of a drain current of said MOS power transistor by controlling a gate voltage of said MOS power transistor to compensate for the characteristic variation owing to the variation in gate length.
  • 34. The recording head according to claim 33, wherein said correction circuit lowers the gate voltage when the gate length becomes smaller than a design value due to the variation in the semiconductor manufacturing process, and raises the gate voltage when the gate length becomes larger than the design value.
  • 35. The recording head according to claim 34, wherein said correction circuit includes a second resistor and a third nMOS transistor connected to said second resistor.
  • 36. The recording head according to claim 35, wherein said second resistor comprises a polysilicon resistor.
  • 37. The recording head according to claim 36, further comprising:a source-follower circuit built by a fourth nMOS transistor, and a third resistor connected between a source of said fourth nMOS transistor and ground, and wherein a drain of said fourth nMOS transistor is connected to the first power supply line, a node between the other terminal of said second resistor and the drain of said third nMOS transistor is connected to a gate of said fourth nMOS transistor, and a node between the source of said fourth nMOS transistor and said third resistor is connected to the second power supply line.
  • 38. The recording head according to claim 35, wherein one terminal of said second resistor is connected to a first power supply line, a node between the other terminal of said second resistor and a drain of said third nMOS transistor is connected to a second power supply line, and a source of said third nMOS transistor is connected to ground.
  • 39. The recording head according to claim 31, wherein said MOS logic circuit and said voltage converter are circuits formed by a CMOS process.
  • 40. The recording head according to claim 11, wherein said MOS logic circuit and said voltage converter are circuits formed by an nMOS process.
  • 41. The recording head according to claim 31, wherein said recording head is an ink-jet recording head that attains printing by ejecting ink.
  • 42. The recording head according to claim 31, wherein said recording head is a recording head that ejects ink using heat energy, and comprises a heat energy conversion element for generating heat energy that is applied to the ink.
  • 43. A recording apparatus comprising the recording head of claim 31.
  • 44. The recording apparatus according to claim 43, wherein said MOS power transistor comprises an n-type MOSFET.
  • 45. The recording apparatus according to claim 44, wherein said voltage converter is arranged between a gate of said n-type MOSFET and an output terminal of said latch circuit.
  • 46. The recording apparatus according to claim 45, wherein said voltage converter comprises:a first resistor; a first nMOS transistor, a drain of which is connected to said first resistor; and a CMOS inverter built by a first pMOS transistor and a second nMOS transistor, gates of which are connected between said first resistor and the drain.
  • 47. The recording apparatus according to claim 43, further comprising a carriage for carrying the recording head.
  • 48. The recording head according to claim 1, wherein said MOS power transistor comprises a pMOS transistor, and said voltage converter has an inverter including at least one nMOS transistor, which boosts a voltage that is applied by receiving a print signal output from said MOS logic circuit, and outputs the boosted voltage to a gate of said pMOS transistor, andsaid pMOS transistor and said heater are serially connected between a power supply line of said heater and ground in turn from the power supply line side.
  • 49. The recording head according to claim 48, wherein said pMOS transistor and nMOS transistor are offset type transistors.
  • 50. The recording head according to claim 48, wherein said pMOS transistor and nMOS transistor are driven by a voltage on the predetermined power supply line.
  • 51. The recording head according to claim 48, wherein said heater, said pMOS transistor, and said nMOS transistor are formed on a p-type silicon substrate.
  • 52. The recording head according to claim 48, wherein said voltage converter includes a resistor connected between said nMOS transistor and the power supply line.
  • 53. The recording head according to claim 48, wherein said recording head is an ink-jet recording head that attains printing by ejecting ink.
  • 54. The recording head according to claim 53, wherein the ink contacts said heater via an electric insulating film, and is heated by said heater upon printing.
  • 55. A recording apparatus comprising the recording head of claim 48.
  • 56. The recording apparatus according to claim 55, wherein said MOS power transistor comprises an n-type MOSFET.
  • 57. The recording apparatus according to claim 56, wherein said voltage converter is arranged between a gate of said n-type MOSFET and an output terminal of said latch circuit.
  • 58. The recording apparatus according to claim 57, wherein said voltage converter comprises:a first resistor; a first nMOS transistor, a drain of which is connected to said first resistor; and a CMOS inverter built by a first pMOS transistor and a second nMOS transistor, gates of which are connected between said first resistor and the drain.
  • 59. The recording apparatus according to claim 55, further comprising a carriage for carrying the recording head.
  • 60. An ink-jet head cartridge comprising the recording head of claim 1 and an ink tank.
  • 61. The ink-jet head cartridge according to claim 60, wherein said MOS power transistor comprises an n-type MOSFET.
  • 62. The ink-jet head cartridge according to claim 61, wherein said voltage converter is arranged between a gate of said n-type MOSFET and an output terminal of said latch circuit.
  • 63. The ink-jet head cartridge according to claim 62, wherein said voltage converter comprises:a first resistor; a first nMOS transistor, a drain of which is connected to said first resistor; and a CMOS inverter built by a first pMOS transistor and a second nMOS transistor, gates of which are connected between said first resistor and the drain.
  • 64. The recording head according to claim 1, further comprising a carriage for carrying the recording head.
  • 65. The ink-jet head cartridge according to claim 60, further comprising a carriage for carrying the recording head.
  • 66. A substrate for driving a recording head, said substrate comprising:a heater corresponding to a print element; a MOS power transistor connected to said heater in electrical series for energizing and driving said heater; a MOS logic circuit for driving said MOS power transistor; and a voltage converter for converting a voltage amplitude of a signal output from said MOS logic circuit into a higher voltage amplitude, and applying a signal with the converted amplitude to a gate electrode of said MOS power transistor.
  • 67. The substrate according to claim 66, wherein said MOS power transistor comprises an n-type MOSFET.
  • 68. The substrate according to claim 67, wherein said voltage converter is arranged between a gate of said n-type MOSFET and an output terminal of said latch circuit.
  • 69. The substrate according to claim 68, wherein said voltage converter comprises:a first resistor; a first nMOS transistor, a drain of which is connected to said first resistor; and a CMOS inverter built by a first pMOS transistor and a second nMOS transistor, gates of which are connected between said first resistor and the drain.
  • 70. The substrate according to claim 66, further comprising a carriage for carrying the recording head.
  • 71. A recording head comprising a substrate, said substrate comprising:a heater corresponding to a print element; a MOS power transistor connected to said heater in electrical series for energizing and driving said heater; a MOS logic circuit for driving said MOS power transistor; and a voltage converter for converting a voltage amplitude of a signal output from said MOS logic circuit into a higher voltage amplitude, and applying a signal with the converted amplitude to a gate electrode of said MOS power transistor.
Priority Claims (4)
Number Date Country Kind
8-166089 Jun 1996 JP
8-197241 Jul 1996 JP
8-231081 Aug 1996 JP
8-300417 Nov 1996 JP
US Referenced Citations (19)
Number Name Date Kind
4313124 Hara Jan 1982
4345262 Shirato et al. Aug 1982
4459600 Sato et al. Jul 1984
4463359 Ayata et al. Jul 1984
4558333 Sugitani et al. Dec 1985
4723129 Endo et al. Feb 1988
4740796 Endo et al. Apr 1988
4831395 Pham et al. May 1988
4947191 Nozawa et al. Aug 1990
5006867 Koizumi et al. Apr 1991
5081474 Shibata et al. Jan 1992
5083137 Badyal et al. Jan 1992
5175565 Ishinaga et al. Dec 1992
5300968 Hawkins Apr 1994
5479197 Fujikawa et al. Dec 1995
5491505 Suzuki et al. Feb 1996
5580468 Fujikawa et al. Dec 1996
5602576 Murooka et al. Feb 1997
5850242 Asaba Mar 1996
Foreign Referenced Citations (13)
Number Date Country
2843064 Apr 1979 DE
195 01 707 Jun 1996 DE
0 605 211 Jul 1994 EP
0 646 461 Apr 1995 EP
0 690 411 Jan 1996 EP
54-51834 Apr 1979 JP
59-123670 Jul 1984 JP
59-138461 Aug 1984 JP
59-212283 Dec 1984 JP
63-174422 Jul 1988 JP
3-074870 Mar 1991 JP
5-185594 Jul 1993 JP
8-156248 Jun 1996 JP
Non-Patent Literature Citations (1)
Entry
Millman, Jacob, Microelectronics: Digital and Analog Circuits and Systems, Mc Graw-Hill, Inc, p.233, figures 6-26 and 6-27, 1987.