This application is based upon and claims the benefit of priority of the prior Japanese Patent Application No. 2017-064664, filed on Mar. 29, 2017, the entire contents of which are incorporated herein by reference.
The embodiments described herein are related to a rectifier circuit and an electronic device.
In recent years, the importance of rectifier circuits which operate at low voltages is increasing. For example, radio frequency identification (RFID) tags or noncontact IC cards include no batteries and extract power from radio waves (e.g., 13.56-MHz carrier waves) emitted by readers (readers-writers). In electronic devices, as typified by such RFID tags, which extract power from radio waves and operate, P-N junction (PN) diodes or metal-oxide-semiconductor (MOS) transistors are generally used as rectifier circuits.
In, e.g., a rectifier circuit implemented in a diode-connected MOS transistor, when the voltage (Vgs) between the gate and the source of the transistor is higher than the threshold voltage (Vth) of the transistor, the transistor is turned on and a current flows from the drain to the source. When the voltage between the gate and the source is lower than the threshold voltage of the transistor, the transistor is turned off and no current flows. In the diode, a current flows when the anode voltage becomes greater than the cathode voltage by a forward voltage (Vf) or more.
As described earlier, in the rectifier circuit, a threshold voltage exists at which a switch (a transistor or a diode) is connected and disconnected (turned on/off), so conduction loss occurs upon rectification. The conduction loss may be improved by reducing the threshold voltage.
To reduce the threshold voltage, a shot key diode having a low forward voltage is used as the aforementioned diode, and a MOS transistor having a low threshold voltage is used as the aforementioned MOS transistor. However, the manufacture of, e.g., a MOS transistor having a low threshold voltage results in the addition of another process (manufacturing process), thus raising the manufacturing cost.
By the way, in the past, various proposals have been made for rectifier circuits which operate at low voltages.
Patent Document 1: Japanese Laid-open Patent Publication No. 2001-504676
Patent Document 2: Japanese Laid-open Patent Publication No. H03(1991)-218264
Patent Document 3: Japanese Laid-open Patent Publication No. 2008-085818
Patent Document 4: Japanese Laid-open Patent Publication No. 2006-101670
According to an aspect of the embodiments, there is provided a rectifier circuit including a switch element, controls connection and disconnection of an AC input voltage using the switch element to generate an output voltage. The switch element includes an n-channel MOS transistor.
The rectifier circuit further includes a booster circuit and a control signal generation unit, and establishes connection to the switch element at a peak portion of the input voltage. The booster circuit is configured to generate and apply a gate control signal including a voltage higher than a threshold voltage of the n-channel MOS transistor to a gate of the n-channel MOS transistor. The control signal generation unit is configured to generate and output a control signal for controlling connection and disconnection of the n-channel MOS transistor to the booster circuit.
The object and advantages of the invention will be realized and attained by means of the elements and combinations particularly pointed out in the claims.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are not restrictive of the invention.
First, before describing embodiments of a rectifier circuit and an electronic device, exemplary rectifier circuits and their problem will be described first with reference to
As illustrated in
When the voltage Vgs between the gate and the source is lower than the threshold voltage Vth, the transistor M0 is turned off and no current flows. In the diode, a current flows when the anode voltage becomes greater than the cathode voltage by a forward voltage (Vf) or more. The input voltage Vin is a signal obtained by receiving via an antenna (coil), radio waves applied from, e.g., a reader to, e.g., an RFID tag or a noncontact IC card equipped with the rectifier circuit 200.
The threshold voltage generator 10 includes a diode-connected pMOS transistor M2, a resistor R1, and a capacitor C10, as illustrated in
With this arrangement, a voltage close to a threshold with reference to the voltage Vb of the drain (node N1) of the transistor M1 may be applied to the gate (node N3) of the transistor M1 to reduce the threshold voltage (Vthp1) at which a current starts to flow between the source and the drain. In other words, conduction loss upon rectification is reduced by lowering the threshold voltage without adding another process (without any rise in manufacturing cost due to the addition of another manufacturing process). The rectifier circuit illustrated in
The transistors M1 and M2 are formed (manufactured) by adjusting their gate lengths and gate widths so that the threshold voltage Vthp1 of the transistor M1 is slightly greater (greater by a voltage ΔVthp) than the threshold voltage Vthp2 of the transistor M2. In other words, the transistors M1 and M2 may have only slightly different threshold voltages Vthp1 and Vthp2 and therefore may be formed in the same process with only slightly different gate lengths and gate widths.
A voltage lower than that of the node N1 is applied to the node N4 to turn on the transistor M2. Thus, a current flows from the node N1 to the node N4, and the voltage of the node N3 is made lower than that of the node N1 by the threshold voltage Vthp2 of the transistor M2 by the diode-connected transistor M2.
In other words, a voltage lower than that of the node N1 by the threshold voltage Vthp2 of the transistor M2 is applied to the gate of the transistor M1. When the voltage Va (input voltage Vin) of a node N2 becomes higher than the voltage Vb (output voltage Vout′) of the node N1 by the voltage ΔVthp, a potential difference corresponding to the threshold voltage Vthp1 occurs between the node N2 and the gate of the transistor M1, and the transistor M1 is turned on. In this manner, the rectifier circuit 300 illustrated in
However, during conduction of the transistor M1, the voltage Vgs between the gate and the source of the transistor M1 becomes close to the threshold voltage Vth of the pMOS transistor. Therefore, the potential difference between the nodes N1 and N2 is large, and the conduction loss still remains as high as, e.g., about 0.3 V at 100 μA.
Below, embodiments of a rectifier circuit and an electronic device will be described in detail below with reference to the accompanying drawings.
The rectifier circuit 100 includes an n-channel MOS (nMOS) transistor Q1, a capacitor C1, a control signal generation unit 500, and a booster circuit 7, as illustrated in
The control signal generation unit 500 includes a reference voltage generator 1, an oscillator 2, a comparator 3, a digital timer 4, a pulse generator (analog timer) 5, a timing control circuit 6, an inverter I1, a NOR gate NOR1, an OR gate OR1, and an AND gate AND1. NOR1 and OR1 function as a switch circuit 8 which performs switching between analog control using a pulse signal PULSE from the pulse generator 5 and digital control using an output (digital signal) GCTd of the digital timer 4, based on an enable signal CEBL.
The nMOS transistor Q1 may be turned on during the period of an AC input voltage Vin higher in digital control using the digital signal GCTd than in analog control using the pulse signal PULSE. The capacitor C1 is used to smooth the rectified output voltage Vout (VDD) (maintain it constant).
The nMOS transistor Q1 is placed between the input terminal IN and the output terminal OUT, and a gate control signal GCTL boosted by the booster circuit 7 is input to its control electrode (gate). In other words, the transistor Q1 functions as a switch element, undergoes ON/OFF control based on the gate control signal GCTL, and rectifies the AC input voltage Vin to generate an output voltage Vout. The nMOS transistor Q1 is used as a switch element in this case, so that its size may be smaller and a current may be supplied in larger amounts than in the use of a pMOS transistor. Although a diode D1 is connected between the source and the drain of the transistor Q1, the timing at which the transistor Q1 is turned on is the highest voltage (peak) portion of the AC input voltage Vin and conduction loss generated by the diode D1 is negligible, as will be described later.
The pulse generator 5 serves as a circuit which generates a pulse signal (analog pulse) PULSE to turn on the nMOS transistor Q1 during the period of a possible high AC input voltage Vin (the neighborhood of the highest voltage). When the rectifier circuit 100 according to this embodiment is applied to, e.g., an RFID tag (electronic device 150), as long as radio waves from a reader have a known frequency (e.g., 13.56 MHz), the pulse generator 5 generates a signal PULSE corresponding to the radio waves from the reader.
The digital timer 4 receives a clock CLK from the oscillator 2, a power supply voltage VDD (output voltage Vout), and a signal SS1 output from the comparator 3, and generates and outputs an enable signal CEBL and a digital signal GCTd. The digital timer 4 is used to generate a signal for defining a range (narrow period) closer to the highest AC input voltage Vin than the analog pulse PULSE from the pulse generator 5 to improve the accuracy of the ON period of the nMOS transistor Q1.
The switch circuit 8 performs ON/OFF control of the nMOS transistor Q1 by analog control based on the analog pulse PULSE from the pulse generator 5, for example, immediately after the startup of a power supply. The switch circuit 8 further performs ON/OFF control of the nMOS transistor Q1 by switching from the above-mentioned analog control to digital control based on the digital signal (count value) GCTd from the digital timer 4, for example, after the oscillation frequency of the internal oscillator 2 is stabilized.
As illustrated in
After the oscillation frequency of the oscillator 2 is stabilized, the enable signal CEBL changes from “L” to high level “H” and the output of the switch circuit 8 becomes a digital signal GCTd from the digital timer 4 via the OR gate OR1. As a result, the output (control signal) SSin of the AND gate AND1 becomes a signal having the same logic as that of the output of the switch circuit 8 during the period in which the signal SS1 output from the comparator 3 is at “H.”
With this operation, the gate control signal GCTL for ON/OFF control of the nMOS transistor Q1 acts as a signal based on the analog pulse PULSE immediately after the startup of a power supply and as a signal based on the digital signal GCTd after the oscillation frequency of the oscillator 2 is stabilized. In other words, as indicated by Vout in
The booster circuit 7 receives a delay signal DELAY, a capacitance control signal CTL, and a boosting signal BST from the timing control circuit 6, and the power supply voltage VDD (output voltage Vout) and outputs the boosted gate control signal GCTL to the gate of the nMOS transistor Q1. The booster circuit 7 includes a level shifter 71, a regulator 72, a pMOS transistor Q2, a capacitor C2, inverters 12 and 13, and a diode D2, as illustrated in
The booster circuit 7 is used to, e.g., raise a signal level of about 2 V to about 3 to 4 V that is higher (sufficiently higher) than the threshold voltage (Vthn) of the nMOS transistor Q1 to reliably turn on the nMOS transistor Q1 to suppress any conduction loss. The capacitor C2 is used to accumulate charges of a signal BOOST output from the inverter 13 controlled by the regulator 72 and boost the delay signal DELAY via the pMOS transistor Q2 to generate a gate control signal GCTL.
The level shifter 71 receives the capacitance control signal CTL, makes a level shift, and generates a capacitance control signal CCTL for ON/OFF control of the pMOS transistor Q2. The diode D2 is connected between the source and the drain of the transistor Q2. A boosting signal BOOST is generated using the boosting signal BST via the inverter 12 and the inverter 13 controlled by the regulator 72. The booster circuit 7 illustrated in
As illustrated in
The delay signal DELAY is applied to the gate (one end of the capacitor C2) of the nMOS transistor Q1 upon turn-on of the pMOS transistor Q2, boosted by the boosting signal BOOST applied to the other end of the capacitor C2, and generated as a gate control signal GCTL. The gate control signal GCTL is boosted to a voltage higher than the threshold voltage Vthn of the nMOS transistor Q1 to perform ON/OFF control of the transistor Q1 while reducing the conduction loss upon rectification.
The digital timer 4 includes flip-flops (FFs) 41, 43, and 44, a counter 42, and comparators 45 and 46, as illustrated in
The flip-flop 41 captures and holds the signal SS1 input to the D (Data) terminal in accordance with the clock CLK and outputs it from the Q terminal as a signal SS2. The signal SS2 corresponds to a signal obtained by delaying the signal SS1 by one period of the clock CLK, as illustrated in
The count value COUNT and the transition signal EDGE from the counter 42 are input to the D terminal and the EN (ENable) terminal of the flip-flop 43. The count value COUNT is also input to the comparator 46 and the transition signal EDGE is also input to the EN terminal of the flip-flop 44. In other words, the flip-flop 43 captures and holds the count value COUNT input to the D terminal in accordance with the clock CLK and outputs it from the Q terminal as a signal B, when the transition signal EDGE is at “H.”
The signal B from the flip-flop 43 is input to the D terminal of the flip-flop 44 and the comparator 45. The flip-flop 44 captures and holds the signal B input to the D terminal when the last transition signal EDGE is at “H,” in accordance with the clock CLK, and outputs it from the Q terminal as a signal A. The comparator 45 receives the signal A from the flip-flop 44, together with the signal B from the flip-flop 43, and compares the signals A and B with each other.
The comparator 45 captures and compares the signals A and B with each other, and sets the enable signal CEBL at “H” when, for example, A=B, A=B+1, or A=B−1. In other words, an input signal SS1 having a certain period is counted by the clock CLK from the oscillator 2, count values COUNT before and after one period are compared with each other, and the enable signal CEBL is set at “H” after stabilization is determined when the difference in count value falls within the range of ±1. The enable signal CEBL from the comparator 45 is also input to the comparator 46 and compared with the count value COUNT from the counter 42.
The comparator 46 outputs a digital signal GCTd having a predetermined count value (e.g., COUNT=2) in a certain cycle of the clock CLK after the enable signal CEBL changes to “H.” In other words,
The resistors R11 and R12 are divided so that, for example, a node Na has a voltage equal to a voltage BGR0 output from the bandgap reference circuit 11 when the power supply voltage VDD (output voltage Vout) reaches a desired voltage (e.g., 2 V). The switch SW1 is controlled by the output SCTL of the operational amplifier 12 so that SCTL is set at “L” and ½×VDD is selected when the power supply voltage VDD is 2 V or less, and SCTL is set at “H” and ¾×VDD is selected when VDD is higher than 2 V.
For example, ½×VDD is assumed to be selected as a reference voltage VREF when the power supply voltage VDD (output voltage Vout) is 2 V or less, as illustrated in
The comparison between
The reference voltage generator 1 described with reference to
The delay circuits 61 to 63 form filters using the resistors 613, 623, and 633 and the capacitors 615, 625, and 635, respectively, to adjust the delay times using the time constants of the filters. In the delay circuits 61 and 63, the diodes 614 and 634 are connected in parallel to the resistors 613 and 633 to allow the delay signal DELAY and the boosting signal BST to delay only at the leading edges. In the delay circuit 62, the values of the resistor 623 and the capacitor 625 are set to delay both the leading and trailing edges of the capacitance control signal CTL to obtain respective desired delay times. The configuration of the timing control circuit 6 is not limited to that illustrated in
The RFID tag 150, for example, receives via the antenna 151, a high-frequency (RF) signal emitted by the reader-writer and inputs an AC signal (input voltage Vin) from the terminals RF+ and RF− of the antenna 151 to the rectifier circuit 100. In other words, the input voltage Vin is a voltage based on radio waves emitted by the reader (reader-writer). The rectifier circuit 100 converts an AC input voltage Vin into a DC voltage (an output voltage Vout or a power supply voltage VDD) and controls the power supply voltage VDD at a certain level using the shunt circuit (shunt regulator) 152, as described above.
The power supply voltage VDD stabilized by the shunt circuit 152 is applied to, e.g., the demodulator circuit 153, the modulator circuit 154, the clock generator circuit 155, the logic circuit 156, and the memory circuit 157, which perform respective predetermined operations. In other words, the demodulator circuit 153 demodulates a signal received from the antenna 151 (RF+, RF−), operates the logic circuit 156 in accordance with a clock generated by the clock generator circuit 155, and performs read/write of the memory circuit 157. The modulator circuit 154 is used to, e.g., modulate the data held in the memory circuit 157 and send the data to the reader-writer via the antenna 151.
The rectifier circuit 100 according to this embodiment is not limited to application to the RFID tag 150 illustrated in
All examples and conditional language provided herein are intended for the pedagogical purposes of aiding the reader in understanding the invention and the concepts contributed by the inventor to further the art, and are not to be construed as limitations to such specifically recited examples and conditions, nor does the organization of such examples in the specification relate to a showing of the superiority and inferiority of the invention. Although one or more embodiments of the present invention have been described in detail, it should be understood that the various changes, substitutions, and alterations could be made hereto without departing from the spirit and scope of the invention.
Number | Date | Country | Kind |
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2017-064664 | Mar 2017 | JP | national |