The following description is provided to assist the understanding of the reader. None of the information provided or references cited is admitted to be prior art.
Microelectromechanical systems (MEMS) such as MEMS microphones include a diaphragm and a backplate. An air gap between the diaphragm and the backplate is squeezed as the diaphragm oscillates, inducing squeeze film damping which is one of the major sources of noise in MEMS devices. Traditionally, holes are introduced within the backplate to reduce the squeeze film damping by allowing air to flow through the holes. However, the squeeze film damping may only be reduced so much before the sensitivity of the MEMS device is hindered since the size of the holes reduces the effective capacitive surface area of the backplate, which thereby reduces the sensitivity of the MEMS device.
In general, one aspect of the subject matter described in this specification can be embodied as a microelectromechanical systems (MEMS) device. The MEMS device includes a diaphragm and a backplate spaced a distance from the diaphragm forming an air gap therebetween. The backplate includes a first surface facing toward the diaphragm and an opposing second surface facing away from the diaphragm. The first surface and the opposing second surface of the backplate cooperatively define a plurality of through-holes that extend through the backplate allowing air from the air gap to flow therethrough. Each of the plurality of through-holes include an first aperture disposed along the first surface, a second aperture disposed along the opposing second surface, and a sidewall extending between the first surface and the opposing second surface. According to an exemplary embodiment, the first aperture and the second aperture have different dimensions (e.g., sizes, diameters, widths, shapes, areas, etc.).
In general, another aspect of the subject matter described in this specification can be embodied in a backplate for a microelectromechanical systems (MEMS) device. The backplate includes a first surface configured to face toward a diaphragm and an opposing second surface configured to face away from the diaphragm. The first surface has a first plurality of apertures that define a first perforation ratio of the first surface. The opposing second surface has a second plurality of apertures that define a second perforation ratio of the opposing second surface. According to an exemplary embodiment, the first perforation ratio of the first surface is less than the second perforation ratio of the opposing second surface.
In general, another aspect of the subject matter described in this specification can be embodied in a microelectromechanical systems (MEMS) device. The MEMS device includes a diaphragm and a backplate spaced a distance from the diaphragm forming an air gap therebetween. The backplate includes a first surface facing toward the diaphragm and an opposing second surface facing away from the diaphragm. The first surface has a first plurality of apertures that define a first perforation ratio of the first surface. The opposing second surface has a second plurality of apertures that define a second perforation ratio of the opposing second surface. According to an exemplary embodiment, the first perforation ratio of the first surface is less than the second perforation ratio of the opposing second surface.
The foregoing summary is illustrative only and is not intended to be in any way limiting. In addition to the illustrative aspects, embodiments, and features described above, further aspects, embodiments, and features will become apparent by reference to the following drawings and the detailed description.
The foregoing and other features of the present disclosure will become more fully apparent from the following description and appended claims, taken in conjunction with the accompanying drawings. Understanding that these drawings depict only several embodiments in accordance with the disclosure and are, therefore, not to be considered limiting of its scope, the disclosure will be described with additional specificity and detail through use of the accompanying drawings.
In the following detailed description, reference is made to the accompanying drawings, which form a part hereof. In the drawings, similar symbols typically identify similar components, unless context dictates otherwise. The illustrative embodiments described in the detailed description, drawings, and claims are not meant to be limiting. Other embodiments may be utilized, and other changes may be made, without departing from the spirit or scope of the subject matter presented here. It will be readily understood that the aspects of the present disclosure, as generally described herein, and illustrated in the figures, can be arranged, substituted, combined, and designed in a wide variety of different configurations, all of which are explicitly contemplated and make part of this disclosure.
According to an exemplary embodiment, a MEMS device (e.g., a MEMS microphone; for a smartphone, a tablet, a laptop, a hearing aid, a video camera, a communications device; etc.) includes a diaphragm and at least one backplate. The backplate is positioned relative to the diaphragm with a spaced relationship such that an air gap is formed therebetween. The diaphragm is configured to receive and convert acoustic energy (e.g., sound energy, etc.) into an electrical signal. During such a conversion, the acoustic energy causes the diaphragm to flex and oscillate back and forth (e.g., vibrate, etc.) from impinging waves of acoustic pressure thereon. The air gap between the diaphragm and the backplate is squeezed as the diaphragm flexes, inducing squeeze film damping (SFD). SFD is one of the major sources of noise in such MEMS devices. Traditionally, through-holes may be introduced within the backplate to reduce the SFD by allowing air within the air gap to flow through the through-holes. However, the effective capacitive surface area of the backplate is reduced from the introduction of the through-holes. As the effective capacitive surface area of the backplate is reduced (e.g., the size and/or number of the through-holes is increased, etc.), so does the inherent sensitivity of the MEMS device. Thus, increasing the size and/or number of through-holes may advantageously reduce the SFD, but consequentially reduces the effective capacitive surface area of the backplate which thereby adversely affects the sensitivity of the MEMS device. According to an exemplary embodiment, the backplate of the present disclosure is configured such that the shape of the through-holes is modified such that the effective capacitive surface area of the backplate facing the diaphragm may be unchanged or increased to maintain or increase the sensitivity of the MEMS device, while effectively reducing SFD to improve the signal-to-noise ratio (SNR) of the MEMS device (e.g., relative to a traditional backplate with through-holes having straight, vertical profiles, etc.).
Referring now to
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The interior apertures 46 define a first perforation ratio of the interior surface 42 (e.g., the area of the interior apertures 46 relative to the surface area of the interior surface 42 of the backplate 40 without the interior apertures 46, etc.) and the exterior apertures 48 define a second perforation ratio of the exterior surface 44 (e.g., the area of the exterior apertures 48 relative to the surface area of the exterior surface 44 of the backplate 40 without the exterior apertures 48, etc.). As shown in
While the backplate 40 may reduce the SFD induced within the MEMS device 10 due to the introduction of the through-holes 50, the effective capacitive surface area of the backplate 40 (e.g., the surface area of the interior surface 42, the surface area of the interior surface 42 of the backplate 40 without the interior apertures 46 minus the area of the interior apertures 46, etc.) is reduced, and thus the sensitivity of the MEMS device 10 is also reduced. To further reduce the SFD, the diameter D1 of both the interior apertures 46 and the exterior apertures 48 of the backplate 40 must be increased, thereby further reducing the effective capacitive surface area of the backplate 40 and further reducing the sensitivity of the MEMS device 10. Such a reduction in the sensitivity may adversely affect the performance and operation of the MEMS device 10.
According to the exemplary embodiment shown in
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The interior apertures 146 define a first perforation ratio of the interior surface 142 (e.g., the area of the interior apertures 146 relative to the surface area of the interior surface 142 of the backplate 140 without the interior apertures 146, etc.) and the exterior apertures 148 define a second perforation ratio of the exterior surface 144 (e.g., the area of the exterior apertures 148 relative to the surface area of the exterior surface 144 of the backplate 140 without the exterior apertures 148, etc.). According to an exemplary embodiment, the interior apertures 146 and the exterior apertures 148 have different dimensions (e.g., shapes, diameters, widths, areas, etc.). According to the exemplary embodiments shown in
As shown in
According to an exemplary embodiment, the interior diameter D2 of the interior apertures 146 of the backplate 140 is less than or equal to the interior diameter D1 of the interior apertures 46 of the backplate 40. Therefore, the first perforation ratio of the interior surface 142 of the backplate 140 may be less than or equal to the perforation ratio of the interior surface 42 of the backplate 40. Thus, the effective capacitive surface area of the interior surface 142 of the backplate 140 may be greater than or equal to the effective capacitive surface area of the interior surface 42 of the backplate 40 such that the sensitivity of the MEMS device 100 either remains the same or increases (e.g., relative to the MEMS device 10, etc.). According to an exemplary embodiment, the exterior diameter D3 of the exterior apertures 148 of the backplate 140 is greater than the exterior diameter D1 of the exterior apertures 48 of the backplate 40. Therefore, the second perforation ratio of the exterior surface 144 of the backplate 140 may be greater than the perforation ratio of the exterior surface 44 of the backplate 40. According to an exemplary embodiment, maintaining or decreasing the first perforation ratio of the interior surface 142 of the backplate 140, while increasing the second perforation ratio of the exterior surface 144 of the backplate 140 reduces the SFD (e.g., relative to the backplate 40 of the MEMS device 10, etc.) without adversely affecting (and potentially increasing) the sensitivity of the MEMS device 100.
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In some embodiments, the backplate 140 has through-holes 150 having sidewalls 152 with various, different profiles. As shown in
According to an exemplary embodiment, the SFD experienced by a MEMS device may be determined using the following expressions:
where Ctotal is s the total SFD coefficient for the MEMS device (e.g., the MEMS device 10, the MEMS device 100, etc.), Cgap is the SFD coefficient due to an air gap (e.g., the air gap 30, the air gap 130, etc.), and Choles is the SFD coefficient due to through-holes (e.g., the through-holes 50, the through-holes 150, etc.).
Referring now to Table 1, the total calculated SFD coefficient for various profiles of a backplate (e.g., the backplate 40, the backplate 140, etc.) is shown. For the straight profile 80 of the backplate 40, the diameter D1 was selected such that the interior surface 42 and the exterior surface 44 has a perforation ratio of 34%. For the notched profile 180 of the backplate 140, the interior diameter D2 was selected such that the interior surface 142 has a perforation ratio of 34% and the exterior diameter D3 was selected such that the exterior surface 144 has a perforation ratio of 68%. For the linearly sloped profile 184 of the backplate 140, the interior diameter D2 was selected such that the interior surface 142 has a perforation ratio of 34% and the exterior diameter D3 was selected such that the exterior surface 144 has a perforation ratio of 68%. Therefore, the effective capacitive area of the interior surface 42 of the backplate 40 and the effective capacitive area of the interior surface 142 of the backplate 140 are identical, and therefore so is the sensitivity of the respective MEMS devices.
As shown in Table 1, the SFD coefficient due to the through-holes (e.g., the through-holes 50, the through-holes 150, etc.) is dominant and significant to the total SFD coefficient. However, by changing the perforation ratio of the exterior surface 144 of the backplate 140 relative to the perforation ratio of the exterior surface 44 of the backplate 40, the total SFD coefficient may be reduced. Therefore, the backplate 140 of the MEMS device 100 having at least one of the various shaped profiles of the through-holes 150 (e.g., the notched profile 180, the stepped profile 182, the linearly sloped profile 184, the first non-linear profile 186, the second non-linear profile 188, etc.) facilitates maintaining or increasing the effective capacitive surface area of the interior surface 142, and therefore maintaining or increasing the sensitivity of the MEMS device 100, while effectively reducing SFD and therefore total noise to improve the SNR of the MEMS device 100 (e.g., relative to the backplate 40 of the MEMS device 10, etc.).
According to the exemplary embodiment shown in
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The interior apertures 166 define a third perforation ratio of the interior surface 162 (e.g., the area of the interior apertures 166 relative to the surface area of the interior surface 162 of the backplate 160 without the interior apertures 166, etc.) and the exterior apertures 168 define a fourth perforation ratio of the exterior surface 164 (e.g., the area of the exterior apertures 168 relative to the surface area of the exterior surface 164 of the backplate 160 without the exterior apertures 168, etc.). According to an exemplary embodiment, the interior apertures 166 and the exterior apertures 168 have different dimensions (e.g., shapes, diameters, widths, areas, etc.). According to the exemplary embodiments shown in
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The herein described subject matter sometimes illustrates different components contained within, or connected with, different other components. It is to be understood that such depicted architectures are merely exemplary, and that in fact many other architectures can be implemented which achieve the same functionality. In a conceptual sense, any arrangement of components to achieve the same functionality is effectively “associated” such that the desired functionality is achieved. Hence, any two components herein combined to achieve a particular functionality can be seen as “associated with” each other such that the desired functionality is achieved, irrespective of architectures or intermedial components. Likewise, any two components so associated can also be viewed as being “operably connected,” or “operably coupled,” to each other to achieve the desired functionality, and any two components capable of being so associated can also be viewed as being “operably couplable,” to each other to achieve the desired functionality. Specific examples of operably couplable include but are not limited to physically mateable and/or physically interacting components and/or wirelessly interactable and/or wirelessly interacting components and/or logically interacting and/or logically interactable components.
With respect to the use of substantially any plural and/or singular terms herein, those having skill in the art can translate from the plural to the singular and/or from the singular to the plural as is appropriate to the context and/or application. The various singular/plural permutations may be expressly set forth herein for sake of clarity.
It will be understood by those within the art that, in general, terms used herein, and especially in the appended claims (e.g., bodies of the appended claims) are generally intended as “open” terms (e.g., the term “including” should be interpreted as “including but not limited to,” the term “having” should be interpreted as “having at least,” the term “includes” should be interpreted as “includes but is not limited to,” etc.).
It will be further understood by those within the art that if a specific number of an introduced claim recitation is intended, such an intent will be explicitly recited in the claim, and in the absence of such recitation no such intent is present. For example, as an aid to understanding, the following appended claims may contain usage of the introductory phrases “at least one” and “one or more” to introduce claim recitations. However, the use of such phrases should not be construed to imply that the introduction of a claim recitation by the indefinite articles “a” or “an” limits any particular claim containing such introduced claim recitation to inventions containing only one such recitation, even when the same claim includes the introductory phrases “one or more” or “at least one” and indefinite articles such as “a” or “an” (e.g., “a” and/or “an” should typically be interpreted to mean “at least one” or “one or more”); the same holds true for the use of definite articles used to introduce claim recitations. In addition, even if a specific number of an introduced claim recitation is explicitly recited, those skilled in the art will recognize that such recitation should typically be interpreted to mean at least the recited number (e.g., the bare recitation of “two recitations,” without other modifiers, typically means at least two recitations, or two or more recitations).
Furthermore, in those instances where a convention analogous to “at least one of A, B, and C, etc.” is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., “a system having at least one of A, B, and C” would include but not be limited to systems that have A alone, B alone, C alone, A and B together, A and C together, B and C together, and/or A, B, and C together, etc.). In those instances where a convention analogous to “at least one of A, B, or C, etc.” is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., “a system having at least one of A, B, or C” would include but not be limited to systems that have A alone, B alone, C alone, A and B together, A and C together, B and C together, and/or A, B, and C together, etc.). It will be further understood by those within the art that virtually any disjunctive word and/or phrase presenting two or more alternative terms, whether in the description, claims, or drawings, should be understood to contemplate the possibilities of including one of the terms, either of the terms, or both terms. For example, the phrase “A or B” will be understood to include the possibilities of “A” or “B” or “A and B.” Further, unless otherwise noted, the use of the words “approximate,” “about,” “around,” “substantially,” etc., mean plus or minus ten percent.
The foregoing description of illustrative embodiments has been presented for purposes of illustration and of description. It is not intended to be exhaustive or limiting with respect to the precise form disclosed, and modifications and variations are possible in light of the above teachings or may be acquired from practice of the disclosed embodiments. It is intended that the scope of the invention be defined by the claims appended hereto and their equivalents.