The present invention relates to differential comparator systems with offset voltage reduction.
A comparator, in its basic form, compares two input signals to determine which one is of higher magnitude. It outputs a high or low response depending on whether a first input is higher than a second input. Comparators have internal sources of errors that cause the output voltage level transitions to occur at a level different than when the input voltage levels transitions pass being equal. This error is referred to as the offset voltage.
One current way of way of compensating for offset voltage is by trimming the device. In this method, a set of resistors is implanted on a chip. During the manufacturing process, but after the chip is made, the bias is determined and compensated for by fusing or severing the links between the resistors on the chip. On-chip trimming techniques can reduce offset voltage to a very low value.
The trimming technique has a drawback in that it is one time or a single shot operation and is therefore only provides compensation for the offset at the conditions under which it was tested. For a system that may undergo a wide range of operating conditions, trimming may not be optimal. This is because the actual comparator offset voltage value is subject to deviations due to variations in input common mode voltage, temperature, and supply voltage.
The present invention is a method for comparing two signals with increased accuracy by using a reduced offset voltage comparator. This comparator has a offset zero mode and amplify mode. Additional conventional comparators are used to indicate when the two signal are close in value. When the signals are close the reduced offset voltage comparator operation is changed from offset zero mode to amplify mode. The reduced offset voltage comparator is now used to make an accurate comparison of the two signal levels. When the conventional comparators indicate that the two signal are not close in value, the reduced offset voltage comparator operation is changed from amplify mode to offset zero mode. During the offset zero mode the reduced offset voltage comparator reduces the offset voltage is to almost zero.
Mechanical stress, thermal stress, and other operating condition variations will not significantly effect performance because the reduced offset voltage comparator circuit frequently returns to the offset zero mode to keep reducing the offset voltage. Further, if the offset is stored digitally as opposed to with a capacitor, the circuit can extend periods of time between returns to the offset zero mode.
The present invention solves the problem of maintaining a desired low offset voltage over a wide range of operating conditions including common mode voltage, temperature, and supply voltage even as the conditions change.
The Reduced Offset Voltage Comparator System 100
Amplifier system 50 has it's negative input connected to reference voltage 5 and it's positive input connected to line 13. Comparators 8 has it's negative input connected to ground and it's positive input connected to the output of Amplifier system 50. Comparators 8 output is on line 21. Comparator 17 output is on line 20 and Comparator 14 output is on line 22. Line 20 and 22 are connected to the inputs of NOR gate 16. The output of NOR gate 16 on line 11 is low when either line 20 or 22 is high. Line 20 is also connected to the input of Time delay 33. Output terminal 9 is connected by switch 19 to either the output of Comparator 8 or Time delay 33.
Reference voltage 5 is set to the same value as the input signal level that is to be detected by comparison. Reference voltage 18 is set greater than that of reference voltage 5 and Reference voltage 15 is set less than that of reference voltage 5 so that comparators 17 and 14 output signal transitions always occurs at a higher or lower input signal level than Reference voltage 5 level under all conditions including their own internal offset voltages.
When the voltage level at input terminal 1, as shown at time A in
Amplifier system 50 has two operating modes. When line 11 is high it is in amplify mode and when line 11 is low it is in offset zero mode. Amplifier system 50 is now in offset zero mode in which the signal at input 1 is not being amplified and the offset voltage of Amplifier system 50 is being stored.
When the voltage level at input terminal 1 as shown at time B in
Time delay 30 and 33 are controlled by the signal level of line 11. When line 11 goes high, Time delay 30 and 33 have their input signals delayed by a fixed time period. The delay time of Time delay 33 is longer than that of Time delay 30. line 11 also provides a high signal level to the input of Time delay 30. The delay time produced by Time delay 30 allows Amplifier system 50 and Comparator 8 to stabilize at their correct low output level. Time delay 33 maintains the low signal level on line 34 even though the signal at its input on line 20 has now gone high. Output terminal 9 is now connected by switch 19 to line 21.
When the voltage level at input terminal 1 as shown at time C in
When the voltage level at input terminal 1 increases to the level as shown at time D in
Amplifier system 50 is now placed in offset zero mode in which the signal a input 1 is not being amplified and the offset voltage of Amplifier system 50 is being stored.
One implementation of Amplifier system 50, Amplifier system 50A is shown in
When the signal level on line 11 is low Amplifier system 50A is in offset zero mode. Switch 2 is open and switches 3 and 7 are closed. Amplifier 41 negative input and positive input through offset voltage 51 are both connected to voltage references 5. Capacitor 6 is now connected between ground and Amplifier 41 output. During this time a voltage level needed to cancel out from Amplifier 41 output signal the error caused by the offset voltage 51 is stored in Capacitor 6.
When the signal level on line 11 is high Amplifier system 50A is in amplify mode. Switch 2 is closed and switches 3 and 7 are open. Amplifier 4 negative input is connected to voltage references 5 and positive input is connected through Offset voltage 51 and switch 2 to input terminal 1. Amplifier 41 output is applied through Capacitor 6 to Comparator 8 input. Amplifier 41 output is the, (amplified combination of input terminal 1 signal plus offset voltage 51), minus the stored voltage on Capacitor 6. Since the voltage on Capacitor 6 and amplified offset voltage level are nearly equal, the error caused by the offset voltage 51 is nearly reduced to zero.
Other well known methods of offset voltage reduction store the offset correction voltage digitally as opposed to with a capacitor or stores the offset correction voltage in the gate capacitance of the input stage MOSFET. These circuits have the advantage that they can withstand longer periods of time between being placed in offset zero mode.
Although the above description has been directed to preferred embodiments of the invention, it will be understood and appreciated by those skilled in the art that other variations and modifications may be made without departing from the spirit and scope of the invention, and therefore the invention includes the full range of equivalents of the features and aspects set forth in the claims.
The benefits of filing this invention as Provisional application for patent “REDUCED OFFSET VOLTAGE COMPARATOR SYSTEM”, U.S. PTO 60/755,115 filed Dec. 31, 2005 by Fred Mirow are claimed.
Number | Name | Date | Kind |
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3968486 | Gerdes | Jul 1976 | A |
5068662 | Guddanti et al. | Nov 1991 | A |
6498577 | Lin | Dec 2002 | B1 |
20070241953 | Morisson | Oct 2007 | A1 |
Number | Date | Country | |
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20070152717 A1 | Jul 2007 | US |
Number | Date | Country | |
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60755115 | Dec 2005 | US |