1. Field of the Invention
The present invention generally relates to a reference current generating apparatus for generating an electric reference current (which may hereinafter be referred to as a reference current), in order to generate an electric reference voltage (which may hereinafter be referred to as a reference voltage) in a semiconductor integrated circuit. More particularly, the present invention relates to a reference current generating apparatus which is capable of adjusting non-uniformity of a reference current which might occur due to, for example, an error in the accuracy of resistance ratio and the like which may occur during manufacture of the apparatus.
2. Description of the Related Art
A typical example of a conventional electric circuit for generating a reference current in order to generate a reference voltage is disclosed in Japanese Laid-open Patent Application Publication No. 2000-75947. A band gap reference circuit (BGR circuit) is shown in
In addition, a band gap reference circuit is shown in
Nevertheless, the band gap reference circuit disclosed in Japanese Laid-open Patent Application Publication No. 2000-75947 has no means for adjusting error in specific accuracy which may occur due to mismatch of resistor R4 and resistor R1 in view of manufacture thereof, and an error in specific accuracy which may occur due to mismatch of resistor R3 and resistor R1 in view of manufacture thereof, due to mask misalignment, dispersion of impurity concentration and the like. This makes it difficult for individual elements to generate a constant reference voltage (=R4/R1*[Vbe+R1/R3*kT/q*LN(n)]) having no dependency on temperature.
In the meantime,
However, in order to adjust a mismatch error in specific accuracy of resistor R2 and resistor R1 due to manufacture thereof (resistance of an output resistor 170/R1*[Vbe+R1/R2*kT/q*LN(n)]), the resistance of resistor R2 in FIG. of U.S. Pat. No. 6,501,256 is varied by selectively switching on or off MOS switches 312 through 328 that are connected in series to parallel unit resistors of the resistor R2, as shown in
To overcome this problem, it is an object of the invention to provide a reference current generating apparatus which is capable of generating a reference current having no temperature dependency, without increasing layout area.
To achieve the above object, according to the present invention, there is provided a reference current generating apparatus for generating a reference current, including
a first constant current generator including a first current source transistor and a first diode connected to each other at a first connection node, a second current source transistor and a first resistor connected to each other at a second connection node, a second diode and the first resistor connected to each other at a third connection node, the second diode having a current capacity larger than a current capacity of the first diode, the first connection node and the second connection node respectively connected to inputs of a first differential amplifier that maintains the first and second connection nodes at an identical electric potential, gates of the first and second current source transistors connected to an output of the first differential amplifier, a transistor connected to the output of the first differential amplifier and that turns on the first and second current source transistors at a time when a power supply is turned on, and a third current source transistor connected to a second transistor by a fourth connection node and that biases the first differential amplifier via the fourth connection node;
a second constant current generator including a second differential amplifier having inputs, the third connection node connected to one of the inputs of the second differential amplifier, a fourth current source transistor and a second resistor connected to each other at a fifth connection node, the second resistor having a plurality of voltage dividing resistors connected in series to each other by dividing nodes, a voltage of a selected one of the dividing nodes of the second resistor being applied to another of the inputs of the second differential amplifier, gates of the fourth current source transistor and a fifth current source transistor are connected to an output of the second differential amplifier, a third transistor connected to the output of the second differential amplifier that turns on the fourth current source rasistor, the second transistor and a plurality of transistors forming a first current mirror connected to the fifth connection node via respective selected ones of the plurality of transistors to turn on the fourth current source transistor at the time when the power supply is turned on, and the fifth current source transistor connected to a fourth transistor by a sixth connection node and that biases the second differential amplifier via the sixth; and
an output circuit including a sixth current source transistor connected to the output of the second differential amplifier, a seventh connection node between the sixth current source transistor and a third resistor providing a first reference output, and the fourth transistor and a fifth transistor connected to each other and forming a second current mirror, and an eighth connection node between the fifth transistor and a fourth resistor providing a second reference output.
According to the present invention, there is provided a reference current generating apparatus in which a differential amplifier is used for summing a constant current proportional to a thermal voltage and a constant current proportional to a diode voltage, thereby generating a reference current. This reference current generating apparatus includes circuitry for adjusting a non-uniformity of the reference current, which might occur due to a mismatch error in specific accuracy of resistances, in view of the manufacture thereof. The circuitry enables selection of a mirror ratio of a MOS transistor configured to conduct summing of the constant current proportional to the thermal voltage, and also enables a voltage node, which is divided when a dividing voltage is applied to a high impedance MOS gate, to be selectively switched to an input of the differential amplifier that generates a constant current proportional to the diode voltage.
With this configuration, it is possible to prevent temperature dependency of on-resistance of MOS switches from having an effect on a generated reference current in a configuration where resistance is varied by on/off selection of MOS switches inserted in series with resistors. In addition, although it has been necessary in a conventional configuration to increase a size of a MOS switch so that on-resistance of a MOS transistor switch can be extremely smaller than the resistance of a resistor connected in series to the MOS transistor, the configuration of this invention can prevent an increase in layout area.
In addition, when it is configured so that non-uniformity of a reference current is adjusted by selection of a dividing voltage of a resistor connected in series to a diode for a diode voltage input side of a differential amplifier that generates a constant current proportional to a diode voltage, it is possible to further enhance accuracy of adjustment.
The above and other aspects and features of the present invention will become readily apparent from the detailed description that follows, with reference to the accompanying drawings, in which:
The present invention will now be described by way of preferred, but non-limiting embodiments of the invention. The referenced drawings are presented for illustrative purposes only, and are not intended to limit the scope of the invention.
Now, a reference current generating circuit according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings.
As shown in
Transistor MP2 and a resistor R3 are connected in series via a connection node Vb, between power terminal Vcc and ground GND. Diodes D2, having current capacity which is n times (n is a natural number greater than 2) as high as the current capacity of diode D1, are connected to the other terminal of resistor R3. Transistor MP2, resistor R3 and diodes D2 thereby form a second current path. Connection node Vb in the second current path is connected to the other input of differential amplifier 12. The connection node V2b between the resistor R3 and the diodes D2 is also connected to the constant current generating circuit 18 (
Differential amplifier 12 generates a constant current in proportion to a thermal voltage, and also a constant current in proportion to a diode voltage. An output of differential amplifier 12 has a positive temperature characteristic. Differential amplifier 12 drives the gates of transistors MP1, MP2 and MP6 (
Referring to
Next, as shown in
The resistor R1 in
The constant current generating circuit 18 in
The connection node V21 in
In addition, resistor R5 and current source N-channel MOS type transistor MN30 are connected in
In view of the above described configuration, operation of reference current generating circuit 10 will now be described. First, assuming that transistors MP1, MP2 and MP6 of constant current generating circuit 14 in
Ids=1/R3*[kT/q*LN(n)] (1)
wherein, k is Boltzmann's constant, T is absolute temperature, q is units of electric charge, and n is diode capacitance ratio (aspect ratio). The current Ids depends on a thermal voltage and has a positive temperature coefficient proportional to the absolute temperature. In addition, as the same current Ids as the current Ids flowing into transistor MP6 flows into transistor MN2, the above equation (1) may be established.
Assuming that transistor MP21 and transistor MP26 of constant current generating circuit 18 in
IdsMP21=IdsMP26=Ir1+IdsMN2b (2).
For example, when a high (H) level signal is applied to a selected one of the input terminals Trmc0 to Trmc2 in
The voltage of connection node V2a in
Ir1=α*Vbe/R1 (3),
wherein α is determined by selection via input terminals Trmc0 to Trmc2 and a division ratio of voltage dividing resistors R1-0 to R1-2 in resistor R1.
As transistor MN2 and transistors MN2b0 to MN2b2 in
IdsMN2b=β*(1/R3*[kT/q*LN(n)]) (4),
wherein β is determined by selection via input terminals Trmb0 to Trmb2 and a mirror ratio of transistors MN2 and MN2b0 to MN2b2.
From the above equations (2), (3) and (4), the current IdsMP26 flowing into transistor MP26 can be expressed as shown in equation (5), and a reference current proportional to 1/R1 of a band gap voltage (Vbe+R1/R3*kT/q*LN(n)) having no temperature dependency can be generated:
IdsMP26=α*Vbe/R1+β*(1/R3*[kT/q*LN(n)])=1/R1*{α*Vbe+β*(R1/R3*[kT/q*LN(n)])} (5).
From the above equation (5), the voltage Vref1 appearing at the output terminal Vref1 of the output circuit 20 in
Vref1=R4*IdsMP26=R4/R1*{α*Vbe+β*(R1/R3* [kT/q*LN(n)])} (6).
Accordingly, it is possible to generate at output terminal Vref1 a constant reference voltage which is R4/R1 times as high as the band gap voltage and which has no temperature dependency.
In the mean time, assuming that the mirror ratio of transistor MN22 and transistor MN30 is one, from the above equation (5), the voltage Vref2 appearing at output terminal Vref2 can be expressed as follows:
Vref2=Vcc−R5*IdsMP26=Vcc−R5/R1*{α*Vbe+β*(R1/R3*[kT/q*LN(n)])} (7).
Accordingly, it is possible to generate at output terminal Vref2 a constant reference voltage which is R5/R1 times as high as the band gap voltage from power voltage Vcc and which has no temperature dependency.
Next, a reference current generating circuit according to another embodiment will be described. This embodiment has the same configuration as the above-described first embodiment shown in
As shown in
An operation of reference current generating circuit having constant current generating circuit 400 as shown in
Ids=1/R3*[kT/q*LN(n)] (8).
As the same current Ids as the current Ids flowing into transistor MP6 flows into transistor MN2, the above equation (8) may be established.
Assuming that transistor MP21 and transistor MP26 in constant current generating circuit 18 shown in
IdsMP21=IdsMP26=Ir1+IdsMN2b (9).
Here, when a high (H) level signal is applied to a selected one of input nodes Trma0 to Trma2, and a low (L) level signal is applied to the remaining input nodes, one of transistors MNta0 to MNta2 is selected and is turned on, and a voltage of the connection node V2b becomes a voltage of the connection nodes Vb0, Vb1 and Vb2 of voltage dividing resistors R3-1 and R3-2 in resistor R3. From the above equation (8), connection nodes Vb0, Vb1 and Vb2 have respective voltages as follows:
Vb0=Vbe
Vb1=Vbe+R3−2/R3*[kT/q*LN(n)]
Vb2=Vbe+(R3−1+R3−2)/R3*[kT/q*LN(n)]=Vbe+[kT/q*LN(n)].
Accordingly, the voltage of connection node V2b is as follows: Vb2=Vbe when input node Trma0 goes to a high level and input nodes Trma1 and Trma2 go to a low level, Vb2=Vbe+R3−2/R3*[kT/q*LN(n)] when input node Trma1 goes to a high level and input nodes Trma0 and Trma2 go to a low level, and Vb2=Vbe+[kT/q*LN(n)] when the input node Trma2 goes to a high level and input nodes Trma0 and Trma1 go to a low level.
Accordingly, the voltage V2b of connection node V2b can be expressed as follows:
Vb2=Vbe+γ*[kT/q*LN(n)] (10),
wherein γ is 0 to 1 and is determined by selection of input nodes Trma0 to Trma2 and a division ratio of voltage dividing resistors R3-1 and R3-2 in resistor R3.
Similarly, when a high level signal is applied to a selected one of the input nodes Trmc0 to Trmc2 of constant current generating circuit 18 and a low level signal is applied to the remaining input nodes, one of transistors MNtc0 to MNtc2 is selected and is turned on, and a voltage of connection node V2a becomes a voltage of connection nodes Vc0, Vc1 and Vc2 of voltage dividing resistors R1-0 to R1-2 in resistor R1.
The voltage of connection node V2a becomes equal to input 200 of differential amplifier 16, that is the voltage V2b of node V2b, according to a negative feedback operation through differential amplifier 16, transistor MP21 and resistor R1. Accordingly, the current Ir1 flowing through resistor R1 becomes Ir1=(Vbe+γ*[kT/q*LN(n)])/(R1-0) when input terminal Trmc0 goes to a high level and input terminals Trmc1 and Trmc2 go to a low level, becomes Ir1=(Vbe+γ*[kT/q*LN(n)])/(R1-0+R1-1) when input terminal Trmc1 goes to a high level and input terminals Trmc0 and Trmc2 go to a low level, and becomes Ir1=(Vbe+γ*[kT/q*LN(n)])/(R1-0+R1-1+R1-2) when input terminal Trmc2 goes to a high level and input terminals Trmc0 and Trmc1 go to a low level.
Accordingly, the current Ir1 can be expressed as follows:
Ir1=α*(Vbe+γ*[kT/q*LN(n)])/R1 (11),
wherein α is determined by selection via the input terminals Trmc0 to Trmc2 and a division ratio of voltage dividing resistors R1-0 to R1-2 in resistor R1.
In addition, as transistor MN2 and transistors MN2b0 to MN2b2 (
IdsMN2b=β*(1/R3*[kT/q*LN(n)]) (12),
wherein β is determined by selection via input terminals Trmb0 to Trmb2 and a mirror ratio of transistors MN2 and transistors MN2b0 to MN2b2.
From the above equations (9), (11) and (12), the current IdsMP26 can be expressed as follows in equation (13), and a reference current proportional to 1/R1 of a band gap voltage (Vbe+R1/R3*kT/q*LN(n)) having no temperature dependency can be generated:
IdsMP26=α*(Vbe+γ*[kT/q*LN(n)])/R1+β*(1/R3*[kT/q*LN(n)])=1/R1*{α*Vbe+(β*R1/R3+γ*α)*[kT/q*LN(n)]} (13).
From the above equation (13), the voltage Vref1 appearing at output terminal Vref1 can be expressed as follows:
Vref1=R4*IdsMP26=R4/R1*{α*Vbe+(β*R1/R3+γ*α)*[kT/q*LN(n)[} (14).
That is, it is possible to generate at the output terminal Vref1 a constant reference voltage which is R4/R1 times as high as the band gap voltage and that has no temperature dependency.
In the mean time, assuming that the mirror ratio of transistor MN22 and transistor MN30 is one, from the above equation (13), the voltage Vref2 appearing at output terminal Vref2 can be expressed as follows:
Vref2=Vcc−R5*IdsMP26=Vcc−R5/R1*{α*Vbe+(β*R1/R3+γ*α)*[kT/q*LN(n)]} (15).
That is, it is possible to generate at the output terminal Vref2 a constant reference voltage which is R5/R1 times as high as the band gap voltage from the power voltage Vcc and that has no temperature dependency.
As described above, according to the second embodiment, since it is configured that dividing voltage nodes are selected by voltage dividing resistors connected in series to diodes at an diode voltage input side of a differential amplifier that generates a constant current proportional to a diode voltage in order to adjust non-uniformity or dispersion of a reference current, it is possible to further raise precision of adjustment, in addition to the effect of the first embodiment.
Number | Date | Country | Kind |
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2007165960 | Jun 2007 | JP | national |