Claims
- 1. A releasing film (C) comprising:a polyester film (A), and a cured silicone resin layer (B) formed on at least one side of the polyester film (A), characterized in that (1) the film (A) is a biaxially oriented film formed of polyethylene-2,6-naphthalenedicarboxylate and has a surface center line average roughness (Ra) of 2 to 40 nm, (2) the film (A) contains inorganic or organic inactive fine particles having an average particle diameter of 0.01 to 20 μm in an amount of 0.001 to 20% by weight, and (3) the releasing film (C) has a dimensional stability of 0.2% or less under a stress of 150 gf/mm2 at 120° C.; wherein the film (A) contains foreign matters having sizes of from 50 μm to the thickness of the film (A) in the number of 100 or less per/m2, wherein the foreign matters are based on the inactive fine particles or agglomerated particles therefrom.
- 2. The releasing film of claim 1, wherein the film (A) has a thickness of 1 to 250 μm.
- 3. The releasing film of claim 1, wherein the cured silicone resin layer (B) has a thickness of 0.01 to 5 μm.
- 4. A method for production of a silicon wafer comprising using(1) a releasing film (C) as a protective film for an adhesive film used to fix the silicon wafer in a back-grinding step or dicing step of silicon wafer production, comprising a polyester film (A), and a cured silicone resin layer (B) formed on at least one side of the polyester film (A), characterized in that (i) the film (A) is a biaxially oriented film formed of polyethylene-2,6-naphthalenedicarboxylate and has a surface center line average roughness (Ra) of 2 to 40 nm and (ii) the releasing film (C) has a dimensional change rate of 0.2% or less under a stress of 150 gf/mm2 at 120° C. or (2) the releasing film (C) comprising a polyester film (A), and a cured silicone resin layer (B) formed on at least one side of the polyester film (A), characterized in that (a) the film (A) is a biaxially oriented film formed of polyethylene-2,6-naphthalenedicarboxylate and has a surface center line average roughness (Ra) of 2 to 40 nm, (b) the releasing film (C) has a primer layer (D) having a SiO bond, between the film (A) and the cured silicone resin layer (B), and the primer layer (D) having a SiO bond is a layer formed of a condensate obtained by hydrolysis of alkoxysilane, and (c) the releasing film (C) has a dimensional stability of 0.2% or less under a stress of 150 gf/mm2 at 120° C.
- 5. A method for preventing volatilization of a medicinal component from a plaster comprising using a releasing film (C) as a protective film for an adhesive plaster, comprisinga polyester film (A), and a cured silicone resin layer (B) formed on at least one side of the polyester film (A), characterized in that (1) the film (A) is a biaxially oriented film formed of polyethylene-2,6-naphthalenedicarboxylate and has a surface center line average roughness (Ra) of 2 to 40 nm and (2) the releasing film (C) has a primer layer (D) having a SiO bond, between the film (A) and the cured silicone resin layer (B), and the primer layer (D) having a SiO bond is a SiOx (1≦x≦2) layer formed by a gas-phase deposition method, and (3) the releasing film (C) has a dimensional stability of 0.2% or less under a stress of 150 gf/mm2 at 120° C.
- 6. A method of molding a resin sheet comprising using(1) a releasing film (C) as a carrier film which is coated with a resin solution, comprising a polyester film (A), and a cured silicone resin layer (B) formed on at least one side of the polyester film (A), characterized in that (i) the film (A) is a biaxially oriented film formed of polyethylene-2,6-naphthalenedicarboxylate and has a surface center line average roughness (Ra) of 2 to 40 nm and (ii) the releasing film (C) has a dimensional change rate of 0.2% or less under a stress of 150 gf/mm2 at 120° C. or (2) the releasing film (C) comprising a polyester film (A), and a cured silicone resin layer (B) formed on at least one side of the polyester film (A), characterized in that (a) the film (A) is a biaxially oriented film formed of polyethylene-2,6-naphthalenedicarboxylate and has a surface center line average roughness (Ra) of 2 to 40 nm, (b) the film (A) contains inorganic or organic inactive fine particles having an average particle diameter of 0.01 to 20 μm in an amount of 0.001 to 20% by weight, and (c) the releasing film (C) has a dimensional stability of 0.2% or less under a stress of 150 gf/mm2 at 120° C.
- 7. A method of molding a ceramic sheet comprising using(1) a releasing film (C) as a carrier film which is coated with a slurry, comprising a polyester film (A), and a cured silicone resin layer (B) formed on at least one side of the polyester film (A), characterized in that (i) the film (A) is a biaxially oriented film formed of polyethylene-2,6-naphthalenedicarboxylate and has a surface center line average roughness (Ra) of 2 to 40 nm and (ii) the releasing film (C) has a dimensional change rate of 0.2% or less under a stress of 150 gf/mm2 at 120° C. or (2) the releasing film (C) comprising a polyester film (A), and a cured silicone resin layer (B) formed on at least one side of the polyester film (A), characterized in that (a) the film (A) is a biaxially oriented film formed of polyethylene-2,6-naphthalenedicarboxylate and has a surface center line average roughness (Ra) of 2 to 40 nm, (b) the film (A) contains inorganic or organic inactive fine particles having a average particle diameter of 0.01 to 20 μm in an amount of 0.001 to 20% by weight, and (c) the releasing film (C) has a dimensional stability of 0.2% or less under a stress of 150 gf/mm2 at 120° C.
Priority Claims (3)
Number |
Date |
Country |
Kind |
8-262898 |
Oct 1996 |
JP |
|
8-269750 |
Oct 1996 |
JP |
|
8-301778 |
Nov 1996 |
JP |
|
CROSS REFERENCE TO RELATED APPLICATIONS
This is a continuation of application Ser. No. 09/091,034, now U.S. Pat. No. 6,057,041 filed Jun. 2, 1998, which is a 371 of PCT/JP97/03504, filed Oct. 1, 1997 the disclosure of which is incorporated herein by reference.
US Referenced Citations (12)
Foreign Referenced Citations (6)
Number |
Date |
Country |
4734447 |
Nov 1972 |
JP |
5240918 |
Oct 1977 |
JP |
525302 |
Feb 1993 |
JP |
6171026 |
Jun 1994 |
JP |
7268115A |
Oct 1995 |
JP |
08048004 |
Feb 1996 |
JP |
Continuations (1)
|
Number |
Date |
Country |
Parent |
09/091034 |
|
US |
Child |
09/499388 |
|
US |