The present invention relates to an integrated circuit, and more particularly to a resistance calibrating circuit for automatically calibrating a resistance of an in-chip resistor.
In the manufacture processes of various chips, the resistance of the in-chip resistor is closely related to the manufacture arts, so it is usually difficult to directly produce an in-chip resistor having a precise resistance, which requires additionally calibrating the resistance of the in-chip resistor.
According to the prior arts, the resistance of the in-chip resistors is usually calibrated via manually adjusting, i.e., via measuring the resistance of the in-chip resistor and correspondently controlling and adjusting the resistance, so as to obtain a relatively precise resistance. However, the manner of manually adjusting has a low efficiency and a low adjustment precision; it is difficult to adjust the resistances of resistors of all the chips into the expected values having relatively high precision via the manner.
Thus it is necessary to provide a resistance calibrating circuit to overcome the above disadvantages.
An object of the present invention is to provide a resistance calibrating circuit which is capable of automatically adjusting a resistance of a to-be-calibrated voltage-controlled resistor highly precisely and highly efficiently.
Accordingly, in order to accomplish the above objects, the present invention provides a resistance calibrating circuit comprising an external power source; a reference unit, a current calibrating unit and a voltage calibrating unit, which are respectively connected to the external power source; an external reference voltage which is respectively connected to the reference unit and the voltage calibrating unit; and a to-be-calibrated voltage-controlled resistor which is respectively connected to the current calibrating unit and the voltage calibrating unit, wherein the current calibrating unit is further connected to the reference unit.
Preferably, the reference unit comprises a reference resistor and and is respectively connected to the external reference voltage and the external power source, in such a manner that the reference resistor obtains defined current and voltage values; the voltage calibrating unit is respectively connected to the external reference voltage, the external power source and the to-be-calibrated voltage-controlled resistor, in such a manner that the to-be-calibrated voltage-controlled resistor obtains an identical voltage value to the reference resistor; and the current calibrating unit is respectively connected to the reference unit, the external power source and the to-be-calibrated voltage-controlled resistor, in such a manner that the to-be-calibrated voltage-controlled resistor obtains a proportional current value to the reference resistor.
Preferably, the reference unit further comprises a first operational amplifier (OA) whose non-inverting input terminal is connected to the external reference voltage and whose inverting input terminal and output terminal are both connected to a first terminal of the reference resistor; a second terminal of the reference resistor is connected to ground.
Preferably, the reference unit further comprises a first field effect transistor (FET), wherein an inverting input terminal of the first OA is connected to a source electrode of the first FET; an output terminal of the first OA is connected to a gate electrode of the first FET; a drain electrode of the first FET is connected to the external power source; and the source electrode of the first FET is connected to a first terminal of the reference resistor.
Preferably, the current calibrating unit comprises a second FET and a third FET, wherein a source electrode of the second FET and a source electrode of the third FET are both connected to the external power source; a gate electrode and a drain electrode of the second FET, a gate electrode of the third FET and a drain electrode of the first FET are connected together; a drain electrode of the third FET is connected to a first terminal of the to-be-calibrated voltage-controlled resistor; a second terminal of the to-be-calibrated voltage-controlled resistor is connected to ground; and the second FET proportionally mirrors the current value of the reference resistor into the third FET.
Preferably, the voltage calibrating unit comprises a second OA whose non-inverting input terminal is connected to the external reference voltage, whose inverting input terminal is connected to the first terminal of the to-be-calibrated voltage-controlled resistor and whose output terminal is connected to a control terminal of the to-be-calibrated voltage-controlled resistor.
Preferably, the first OA and the second OA are identical, i.e., have identical parameters and features.
Compared to prior arts, in the resistance calibrating circuit of the present invention, the current calibrating unit and the voltage calibrating unit are respectively connected to the to-be-calibrated voltage-controlled resistor, so the current calibrating unit and the voltage calibrating unit adjust the current and the voltage of the to-be-calibrated voltage-controlled resistor with reference to the reference unit, in such a manner that a resistance of the to-be-calibrated resistor which is connected into an integral circuit is of a required value, so as to accomplish a precise adjustment of the resistance of the to-be-calibrated voltage-controlled resistor without manually adjusting, improve an adjustment efficiency and maintain an adjustment precision.
These and other objectives, features, and advantages of the present invention will become apparent from the following detailed description, the accompanying drawings, and the appended claims.
The present invention provides a resistance calibrating circuit capable of automatically adjusting a resistance of a to-be-calibrated voltage-controlled resistor highly precisely and highly efficiently.
Further referring to
Further referring to
Referring to
The fourth FET M4, the fifth FET M5, the sixth FET M6, the seventh FET M7, the first FET M1 and the first current source I1 together form the first feedback loop; according to inherent features of the feedback loop, the value of the gate electrode voltage VFB of the fifth FET M5 is identical to the value of the reference voltage VF, i.e., VREF=VFB, in such a manner that a current running through the reference resistor R1 is
the ratio of the width to length ratio of the second FET M2 to that of the third FET M3 is n, so the current running through the to-be-calibrated voltage-controlled resistor Rd is n times of the current running through the reference resistor R1, i.e.,
As a result, the voltage value VR of the first terminal of the to-be-calibrated voltage-controlled resistor Rd is:
The eight FET M4′, the ninth FET M5′, the tenth FET M6′, the eleventh FET M7′, the second current source I1′ and the second resistor Rd together form the second feedback loop and the second OA AMP2 have identical parameters and features to the first OA AMP1, so the value of the gate electrode voltage VR of the eight FET M8 is identical to the value VREF of the external reference voltage VF, namely VREF=VR. Thus the equation (1) is transformed as:
which means that the resistance of the to-be-calibrated voltage-controlled resistor Rd is adjusted via the voltage at two ends thereof and the current running therethrough to finally become proportional to the resistance of the reference resistor R1; since the resistance of the reference resistor R1 is predefined and thus already known, the resistance of the to-be-calibrated voltage-controlled resistor Rd is precisely adjusted via the voltage calibrating unit and the current calibrating unit with reference to the resistance of the reference resistor.
As a conclusion, the resistance calibrating circuit of the present invention accomplishes automatically adjusting the resistance of the to-be-calibrated voltage-controlled resistor Rd, with reference to the standard reference resistor R1, to obtain the resistance of the to-be-calibrated voltage-controlled resistor in proportional to the resistance of the standard reference resistor R1, wherein the adjusting is highly precisely and highly efficiently without manual adjustment.
One skilled in the art will understand that the embodiment of the present invention as shown in the drawings and described above is exemplary only and not intended to be limiting.
It will thus be seen that the objects of the present invention have been fully and effectively accomplished. Its embodiments have been shown and described for the purposes of illustrating the functional and structural principles of the present invention and is subject to change without departure from such principles. Therefore, this invention includes all modifications encompassed within the spirit and scope of the following claims.
Number | Date | Country | Kind |
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201210438700.X | Nov 2012 | CN | national |