The invention relates to mass spectrometry, and more particularly to methods and apparatus utilizing a multipole ion guide for transmitting ions.
Mass spectrometry (MS) is an analytical technique for determining the elemental composition of test substances with both quantitative and qualitative applications. For example, MS can be used to identify unknown compounds, to determine the isotopic composition of elements in a molecule, and to determine the structure of a particular compound by observing its fragmentation, as well as to quantify the amount of a particular compound in the sample.
In mass spectrometry, sample molecules are generally converted into ions using an ion source and then separated and detected by one or more mass analyzers. For most atmospheric pressure ion sources, ions pass through an inlet orifice prior to entering an ion guide disposed in a vacuum chamber. In conventional mass spectrometer systems, a radio frequency (RF) signal applied to the ion guide provides collisional cooling and radial focusing along the central axis of the ion guide as the ions are transported into a subsequent, lower-pressure vacuum chamber in which the mass analyzer(s) are disposed. Because ionization at atmospheric pressure (e.g., by chemical ionization, electrospray) is generally a highly efficient means of ionizing molecules within the sample, ions of analytes of interests, as well as interfering/contaminating ions and neutral molecules, can be created in high abundance. Though it may be desirable to increase the size of the inlet orifice between the ion source and the ion guide to increase the number of ions of interest entering the ion guide (thereby potentially increasing the sensitivity of MS instruments), such a configuration can likewise allow more unwanted molecules to enter the vacuum chamber and potentially downstream mass analyzer stages located deep inside high-vacuum chambers where trajectories of the ions of interest are precisely controlled by electric fields. Transmission of undesired ions and neutral molecules can foul/contaminate these downstream elements, thereby interfering with mass spectrometric analysis and/or leading to increased costs or decreased throughput necessitated by the cleaning of critical components within the high-vacuum chamber(s). Because of the higher sample loads and contaminating nature of the biologically-based samples being analyzed with current day atmospheric pressure ionization sources, maintaining a clean mass analyzer remains a critical concern.
Accordingly, there remains a need for improved methods and systems for reducing contamination in downstream mass analyzers.
In accordance with an aspect of various embodiments of the applicant's teachings, there is provided a mass spectrometer system comprising an ion source for generating ions and an ion guide chamber having an inlet orifice for receiving the ions generated by the ion source and at least one exit aperture for transmitting ions from the ion guide chamber into a vacuum chamber that houses at least one mass analyzer (e.g., triple quadrupoles, linear ion traps, quadrupole time of flights, Orbitrap or other Fourier transform mass spectrometers, etc.). In accordance with various aspects, the ion guide chamber can be maintained at a pressure in a range from about 1 mTorr to about 10 mTorr, while the vacuum chamber can be maintained at a lower pressure (e.g., less than 1×10−4 Torr, about 5×10−5 Torr), all by way of non-limiting example. In some aspects, the ion guide chamber can be maintained at a pressure such that pressure×length of the quadrupole rods is greater than 2.25×10−2 Torr-cm. The system can also comprise a multipole ion guide disposed in the ion guide chamber, the multipole ion guide comprising: i) a quadrupole rod set extending from a proximal end disposed adjacent the inlet orifice to a distal end disposed adjacent the exit aperture, the quadrupole rod set comprising a first pair of rods and a second pair of rods, wherein each rod is spaced from and extends alongside a central longitudinal axis, and ii) a plurality of auxiliary electrodes (e.g., T-shaped electrodes) spaced from and extending alongside the central longitudinal axis along at least a portion of the quadrupole rod set (e.g., the length of the auxiliary electrodes if less than about 50%, less than about 33%, less than about 10% of the length of the quadrupole rod set). In various aspects, the plurality of auxiliary electrodes are interposed between the rods of the quadrupole rod set such that the auxiliary electrodes are separated from one another by a rod of the quadrupole rod set and such that each of the auxiliary electrodes is adjacent to a single rod of the first pair of rods and a single rod of the second pair of rods. In various aspects, the system also comprises a power supply coupled to the multipole ion guide operable to provide a first RF voltage to the first pair of rods at a first frequency and in a first phase, a second RF voltage to the second pair of rods at a second frequency equal to the first frequency and in a second phase opposite to the first phase, and a substantially identical auxiliary electrical signal to each of the auxiliary electrodes. By way of example, the power supply can comprise a first voltage source operable to provide the first RF voltage to the first pair of rods, a second voltage source operable to provide the second RF voltage to the second pair of rods, and at least one auxiliary RF voltage source operable to provide an RF voltage and/or DC voltage to the auxiliary electrodes. In various embodiments, the multipole ion guide can function as Q0 in a mass spectrometer system.
In accordance with various aspects of the present teachings, the auxiliary electrical signal can be a DC voltage that is different from the DC offset voltage at which the quadrupole rod set is maintained. In some related aspects, for example, the system can also comprise a controller configured to i) adjust the DC voltage provided to the auxiliary electrodes so as to attenuate ions transmitted from the multipole ion guide; ii) adjust the DC voltage provided to the auxiliary electrodes so as to adjust a m/z range of ions transmitted from the multipole ion guide; and/or iii) adjust at least one of the first RF voltage provided to the first pair of rods, the second RF voltage applied to the second pair of rods, and the DC voltage provided to the auxiliary electrodes such that substantially no ions are transmitted into the vacuum chamber (e.g., stop transmission from the multipole ion guide through the exit aperture). For example, by adjusting the voltages, the multipole ion guide can be configured to transmit less than 5%, less than 2%, less than 1%, or 0% of ions received from the ion source.
In accordance with various aspects of the present teachings, the auxiliary electrical signal can additionally or alternatively comprise an RF signal, e.g., an RF voltage at a third frequency (e.g., different than the first frequency) and in a third phase. In related aspects, the auxiliary electrical signal can comprise both an RF signal and a DC voltage different from a DC offset voltage at which the quadrupole rod set is maintained.
In various aspects, the power supply can be further operable to provide a supplemental electrical signal to at least one of the rods of the quadrupole rod set, the supplemental electrical signal being one of a DC voltage and/or an AC excitation signal. By way of example, the power supply can be operable to provide a supplemental electrical signal to the quadrupole rod set so as to generate a dipolar DC field, a quadrupolar DC field, or resonance excitation using a supplementary AC field that is resonant or nearly resonant with some of the ions in the ion beam.
The auxiliary electrodes can have a variety of configurations in accordance with various aspects of the present teachings. By way of example, the auxiliary electrodes can be round or T-shaped. In some aspects, the T-electrodes can have a constant T-shaped cross sectional area along their entire length. In various aspects, the auxiliary electrodes can have a length less than half of the length of the quadrupole rod set (e.g., less than 33%, less than 10%), and can be disposed at various locations along the length of the quadrupole rod set (e.g., in one or more of the proximal third, the middle third, or the distal third of the quadrupole rod set). In some aspects, the system can comprise two sets of auxiliary electrodes axially offset from one another along the length of the quadrupole rod set. In related aspects, for example, the power supply can be operable to provide a substantially identical second auxiliary electrical signal to each of the electrodes of the second set of auxiliary electrodes, wherein the second auxiliary electrical signal is different from the auxiliary signal provided to the first set of auxiliary electrodes. By way of non-limiting example, the auxiliary signal applied to the first set of auxiliary electrodes can comprise a DC voltage that is different from the DC offset voltage at which the quadrupole rod set is maintained, while the second auxiliary signal can comprise an RF signal.
In accordance with various aspects of certain embodiments of the applicant's teachings, a method of processing ions is provided comprising receiving ions generated by an ion source through an inlet orifice of an ion guide chamber and transmitting ions through a multipole ion guide disposed in the ion guide chamber, the multipole ion guide comprising: i) a quadrupole rod set extending from a proximal end disposed adjacent the inlet orifice to a distal end disposed adjacent an exit aperture of the ion guide chamber, the quadrupole rod set comprising a first pair of rods and a second pair of rods, wherein each rod is spaced from and extends alongside a central longitudinal axis, and ii) a plurality of auxiliary electrodes spaced from and extending alongside the central longitudinal axis along at least a portion of the quadrupole rod set. The plurality of auxiliary electrodes can be interposed between the rods of the quadrupole rod set such that the auxiliary electrodes are separated from one another by a rod of the quadrupole rod set and such that each of the auxiliary electrodes is adjacent to a single rod of the first pair of rods and a single rod of the second pair of rods. The method can also comprise applying a first RF voltage to the first pair of rods at a first frequency and in a first phase, applying a second RF voltage to the second pair of rods at a second frequency equal to the first frequency and in a second phase opposite to the first phase, and applying a substantially identical auxiliary electrical signal to each of the auxiliary electrodes. Ions can be transmitted from the multipole ion guide through the exit aperture into a vacuum chamber housing at least one mass analyzer (e.g., triple quadrupoles, linear ion traps, quadrupole time of flights, Orbitrap or other Fourier transform mass spectrometers, etc.). In some aspects, the method can also comprise maintaining the ion guide chamber at a pressure in a range from about 1 mTorr to about 10 mTorr, which can be higher than the pressure at which the downstream vacuum chamber is maintained (e.g., less than 1×10−4 Torr, about 5×10−5). In some aspects, the ion guide chamber can be maintained at a pressure such that pressure×length of the quadrupole rods is greater than 2.25×10−2 Torr-cm.
In accordance with various aspects, the step of applying a substantially identical auxiliary electrical signal to each of the auxiliary electrodes can comprise applying a DC voltage to each of the plurality of electrodes that is different from a DC offset voltage at which the quadrupole rod set is maintained. In related aspects, for example, the method can further comprise adjusting the DC voltage provided to the auxiliary electrodes so as to attenuate ions transmitted from the multipole ion guide (e.g., to reduce the ion current) and/or to adjust a m/z range of ions transmitted from the multipole ion guide. In some aspects, the method can further comprise preventing transmission through the exit aperture of ions received by the multipole ion guide by adjusting at least one of the first RF voltage provided to the first pair of rods, the second RF voltage applied to the second pair of rods, and the DC voltage provided to the auxiliary electrodes.
In accordance with various aspects of the present teachings, applying a substantially identical auxiliary electrical signal to each of the auxiliary electrodes can comprise applying an RF signal at a third frequency (e.g., different from the first frequency) and in a third phase. In related aspects, both an RF signal and a DC voltage different from a DC offset voltage at which the quadrupole rod set is maintained can be applied as the auxiliary electric signal.
In various aspects, the method can also comprise applying a supplemental electrical signal to at least one of the rods of the quadrupole rod set, the supplemental electrical signal being one of a DC voltage and an AC excitation signal. By way of example, the supplemental electrical signal applied to the quadrupole rod can be effective to additionally generate a dipolar DC field, a quadrupolar DC field, or resonance excitation using a supplementary AC field that is resonant or nearly resonant with some of the ions in the ion beam.
In some aspects, the auxiliary electrical signal applied to the auxiliary electrodes can be selected so as to promote the de-clustering of ions being transmitted through the multipole ion guide.
These and other features of the applicant's teaching are set forth herein.
The foregoing and other objects and advantages of the invention will be appreciated more fully from the following further description, with reference to the accompanying drawings. The skilled person in the art will understand that the drawings, described below, are for illustration purposes only. The drawings are not intended to limit the scope of the applicant's teachings in any way.
It will be appreciated that for clarity, the following discussion will explicate various aspects of embodiments of the applicant's teachings, while omitting certain specific details wherever convenient or appropriate to do so. For example, discussion of like or analogous features in alternative embodiments may be somewhat abbreviated. Well-known ideas or concepts may also for brevity not be discussed in any great detail. The skilled person will recognize that some embodiments of the applicant's teachings may not require certain of the specifically described details in every implementation, which are set forth herein only to provide a thorough understanding of the embodiments. Similarly it will be apparent that the described embodiments may be susceptible to alteration or variation according to common general knowledge without departing from the scope of the disclosure. The following detailed description of embodiments is not to be regarded as limiting the scope of the applicant's teachings in any manner.
The term “about” and “substantially identical” as used herein, refers to variations in a numerical quantity that can occur, for example, through measuring or handling procedures in the real world; through inadvertent error in these procedures; through differences/faults in the manufacture of electrical elements; through electrical losses; as well as variations that would be recognized by one skilled in the art as being equivalent so long as such variations do not encompass known values practiced by the prior art. Typically, the term “about” means greater or lesser than the value or range of values stated by 1/10 of the stated value, e.g., ±10%. For instance, applying a voltage of about +3V DC to an element can mean a voltage between +2.7V DC and +3.3V DC. Likewise, wherein values are said to be “substantially identical,” the values may differ by up to 5%. Whether or not modified by the term “about” or “substantially” identical, quantitative values recited in the claims include equivalents to the recited values, e.g., variations in the numerical quantity of such values that can occur, but would be recognized to be equivalents by a person skilled in the art.
While the systems, devices, and methods described herein can be used in conjunction with many different mass spectrometer systems, an exemplary mass spectrometer system 100 for such use is illustrated schematically in
As shown schematically in the exemplary embodiment depicted in
As shown in
As shown in
Q0, Q1, Q2, and Q3 can be disposed in adjacent chambers that are separated, for example, by aperture lenses IQ1, IQ2, and IQ3, and are evacuated to sub-atmospheric pressures as is known in the art. By way of example, a mechanical pump (e.g., a turbo-molecular pump) can be used to evacuate the vacuum chambers to appropriate pressures. An exit lens 115 can be positioned between Q3 and the detector 116 to control ion flow into the detector 116. In some embodiments, a set of stubby rods can also be provided between neighboring pairs of quadrupole rod sets to facilitate the transfer of ions between quadrupoles. The stubby rods can serve as a Brubaker lens and can help minimize interactions with any fringing fields that may have formed in the vicinity of an adjacent lens, for example, if the lens is maintained at an offset potential. By way of non-limiting example,
The ion source 102 can be any known or hereafter developed ion source for generating ions and modified in accordance with the present teachings. Non-limiting examples of ion sources suitable for use with the present teachings include atmospheric pressure chemical ionization (APCI) sources, electrospray ionization (ESI) sources, continuous ion source, a pulsed ion source, an inductively coupled plasma (ICP) ion source, a matrix-assisted laser desorption/ionization (MALDI) ion source, a glow discharge ion source, an electron impact ion source, a chemical ionization source, or a photo-ionization ion source, among others.
During operation of the mass spectrometer 100, ions generated by the ion source 102 can be extracted into a coherent ion beam by passing successively through apertures in an orifice plate 104 and a skimmer 106 (i.e., inlet orifice 112a) to result in a narrow and highly focused ion beam. In various embodiments, an intermediate pressure chamber 110 can be located between the orifice plate 104 and the skimmer 106 that can be evacuated to a pressure approximately in the range of about 1 Torr to about 4 Torr, though other pressures can be used for this or for other purposes. In some embodiments, the ions can traverse one or more additional vacuum chambers and/or quadrupoles (e.g., a QJet® quadrupole or other RF ion guide) to provide additional focusing of and finer control over the ion beam using a combination of gas dynamics and radio frequency fields.
Ions generated by the ion source 102 are transmitted through the inlet orifice 112a to enter the multipole ion guide 120 (i.e., Q0), which in accordance with the present teachings, can be operated to transmit a portion of the ions received from the ion source 102 into the downstream mass analyzers for further processing, while preventing unwanted ions (e.g., interfering/contaminating ions, high-mass ions) from being transmitted into the lower pressures of the vacuum chamber 114. For example, in accordance with various aspects of the present teachings and as discussed in detail below, the multipole ion guide 120 can comprise a quadrupole rod set 130 and a plurality of auxiliary electrodes 140 extending along a portion of the multipole ion guide 120 and interposed between the rods of the quadrupole rod set 130 such that upon application of various RF and/or DC potentials to the components of the multipole ion guide 120, ions of interest are collisionally cooled (e.g., in conjunction with the pressure of vacuum chamber 112) and transmitted through the exit aperture 112b into the downstream mass analyzers for further processing, while unwanted ions can be neutralized within the multipole ion guide 120, thereby reducing a potential source of contamination and/or interference in downstream processing steps. The vacuum chamber 112, within which the multipole ion guide 120 is housed, can be associated with a mechanical pump (not shown) operable to evacuate the chamber to a pressure suitable to provide collisional cooling. For example, the vacuum chamber can be evacuated to a pressure approximately in the range of about 1 mTorr to about 10 mTorr, though other pressures can be used for this or for other purposes. For example, in some aspects, the vacuum chamber 112 can be maintained at a pressure such that pressure×length of the quadrupole rods is greater than 2.25×10−2 Torr-cm. A lens IQ1 (e.g., an orifice plate) can be disposed between the vacuum chamber of Q0 and the adjacent chamber to isolate the two chambers 112, 114.
After being transmitted from Q0 through the exit aperture 112b of the lens IQ1, the ions can enter the adjacent quadrupole rod set Q1, which can be situated in a vacuum chamber 114 that can be evacuated to a pressure that can be maintained lower than that of ion guide chamber 112. By way of non-limiting example, the vacuum chamber 114 can be maintained at a pressure less than about 1×10−4 Torr (e.g., about 5×10−5 Torr), though other pressures can be used for this or for other purposes. As will be appreciated by a person of skill in the art, the quadrupole rod set Q1 can be operated as a conventional transmission RF/DC quadrupole mass filter that can be operated to select an ion of interest and/or a range of ions of interest. By way of example, the quadrupole rod set Q1 can be provided with RF/DC voltages suitable for operation in a mass-resolving mode. As should be appreciated, taking the physical and electrical properties of Q1 into account, parameters for an applied RF and DC voltage can be selected so that Q1 establishes a transmission window of chosen m/z ratios, such that these ions can traverse Q1 largely unperturbed. Ions having m/z ratios falling outside the window, however, do not attain stable trajectories within the quadrupole and can be prevented from traversing the quadrupole rod set Q1. It should be appreciated that this mode of operation is but one possible mode of operation for Q1. By way of example, the lens IQ2 between Q1 and Q2 can be maintained at a much higher offset potential than Q1 such that the quadrupole rod set Q1 be operated as an ion trap. In such a manner, the potential applied to the entry lens IQ2 can be selectively lowered (e.g., mass selectively scanned) such that ions trapped in Q1 can be accelerated into Q2, which could also be operated as an ion trap, for example.
Ions passing through the quadrupole rod set Q1 can pass through the lens IQ2 and into the adjacent quadrupole rod set Q2, which as shown can be disposed in a pressurized compartment and can be configured to operate as a collision cell at a pressure approximately in the range of from about 1 mTorr to about 10 mTorr, though other pressures can be used for this or for other purposes. A suitable collision gas (e.g., nitrogen, argon, helium, etc.) can be provided by way of a gas inlet (not shown) to thermalize and/or fragment ions in the ion beam. In some embodiments, application of suitable RF/DC voltages to the quadrupole rod set Q2 and entrance and exit lenses IQ2 and IQ3 can provide optional mass filtering.
Ions that are transmitted by Q2 can pass into the adjacent quadrupole rod set Q3, which is bounded upstream by IQ3 and downstream by the exit lens 115. As will be appreciated by a person skilled in the art, the quadrupole rod set Q3 can be operated at a decreased operating pressure relative to that of Q2, for example, less than about 1×10−4 Torr (e.g., about 5×10−5 Torr), though other pressures can be used for this or for other purposes. As will be appreciated by a person skilled in the art, Q3 can be operated in a number of manners, for example as a scanning RF/DC quadrupole or as a linear ion trap. Following processing or transmission through Q3, the ions can be transmitted into the detector 116 through the exit lens 115. The detector 116 can then be operated in a manner known to those skilled in the art in view of the systems, devices, and methods described herein. As will be appreciated by a person skill in the art, any known detector, modified in accord with the teachings herein, can be used to detect the ions.
Referring now to
As shown in
It will be appreciated in light of the present teachings that the auxiliary electrodes 140 can have a variety of configurations. By way of example, the auxiliary electrodes 140 can have a variety of shapes (e.g., round, T-shaped), though T-shaped electrodes can be preferred as the extension of the stem 140b toward the central axis of the ion guide 120 from the rectangular base 140a allows the innermost conductive surface of the auxiliary electrode to be disposed closer to the central axis (e.g., to increase the strength of the field within the ion guide 120). In various aspects, the T-shaped electrodes can have a substantially constant cross section along their length such that the innermost radial surface of the stem 140b remains at a substantially constant distance from the central axis along the entire length of the auxiliary electrodes 140. Round auxiliary electrodes (or rods of other cross-sectional shapes) can also be used in accordance with various aspects of the present teachings, but would generally exhibit a smaller cross-sectional area relative to the quadrupole rods 130a,b due to the limited space between the quadrupole rods 130a,b and/or require the application of larger auxiliary potentials due to their increased distance from the central axis.
As noted above, the auxiliary electrodes 140 need not extend along the entire length of the quadrupole rods 130a,b. For example, the auxiliary electrodes 140 can have a length less than half of the length of the quadrupole rod set 130 (e.g., less than 33%, less than 10%). Whereas the rod electrodes of a conventional Q0 quadrupole can have a length along the longitudinal axis in a range from about 10 cm to about 30 cm, the auxiliary electrodes 140 can have a length of 10 mm, 25 mm, or 50 mm, all by way of non-limiting example. Moreover, though
With reference now to
As noted above, a variety of RF and/or DC signals can be applied to the auxiliary electrodes 140 so as to control or manipulate the transmission of ions from the multipole ion guide 120 into the downstream vacuum chamber 114 in accordance with the present teachings. The above teachings will now be demonstrated using the following examples, provided to demonstrate but not limit the present teachings, in which i) a DC voltage (without an RF component) different than the DC offset voltage applied to the rods 130a,b is applied to the exemplary auxiliary T-shaped electrodes 140 of
With reference first to
With continued reference to
With reference now to
To generate the mass spectrogram of
Comparing
In comparing
With reference now to
In accordance with various aspects, ion guides in accordance with the present teachings can alternatively or additionally be coupled to an RF power supply such that an RF signal is applied to the auxiliary electrodes so as to control or manipulate the transmission of ions from the multipole ion guide 120 into the downstream vacuum chamber 114. With reference now to
To generate the mass spectrogram of
Further, in accordance with various aspects of the present teachings, both the auxiliary DC signal and auxiliary RF signal applied to the auxiliary electrodes can be adjusted so as to control or manipulate the transmission of ions from the multipole ion guide. With reference now to
Those skilled in the art will know or be able to ascertain using no more than routine experimentation, many equivalents to the embodiments and practices described herein. By way of example, the dimensions of the various components and explicit values for particular electrical signals (e.g., amplitude, frequencies, etc.) applied to the various components are merely exemplary and are not intended to limit the scope of the present teachings. Accordingly, it will be understood that the invention is not to be limited to the embodiments disclosed herein, but is to be understood from the following claims, which are to be interpreted as broadly as allowed under the law.
The section headings used herein are for organizational purposes only and are not to be construed as limiting. While the applicant's teachings are described in conjunction with various embodiments, it is not intended that the applicant's teachings be limited to such embodiments. On the contrary, the applicant's teachings encompass various alternatives, modifications, and equivalents, as will be appreciated by those of skill in the art.
This application claims the benefit of priority from U.S. Provisional Application Ser. No. 62/141,466, filed on Apr. 1, 2015, the entire contents of which is hereby incorporated by reference.
Filing Document | Filing Date | Country | Kind |
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PCT/IB2016/051611 | 3/22/2016 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
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WO2016/157032 | 10/6/2016 | WO | A |
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20180096832 A1 | Apr 2018 | US |
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62141466 | Apr 2015 | US |