The present disclosure relates to a ringing suppression circuit connected to a transmission line that transmits a differential signal.
In case of transmitting a digital signal via a transmission line, a part of a signal energy may be reflected at time when a signal level changes in a receiving side, and hence waveform distortion such as overshoot or undershoot, that is, ringing may occur in the signal. Various techniques for suppressing waveform distortion have been proposed.
For example, it is proposed to match impedances for reducing ringing by turning on an FET connected to a transmission line fixedly for a predetermined time period, when a signal on the transmission line changes from dominant to recessive in CAN communication.
According to the present disclosure, a ringing suppression circuit is connected to a transmission line to suppress ringing caused by the transmission line transmitting a differential signal, which varies between a high level and a low level. The transmission line includes a pair of signal lines including a high potential signal line and a low potential signal line. The ringing suppression circuit comprises an inter-line switching element and a control unit. The inter-line switching element is connected between the pair of signal lines. The control unit turns on the inter-line switching element to fix an ON state when detecting that the differential signal has changed from the high level to the low level, and releases the ON state after measuring a predetermined ON time period.
The present disclosure will become more apparent from the following detailed description with reference to the attached drawings. In the drawings:
A ringing suppression circuit according to the present disclosure is directed to a communication network. For example, the network is formed with a plurality of communication nodes including the conventional ringing suppression circuit. In this example, as shown in
As shown in
The present disclosure provides various embodiments, which solve the above problems caused by glitch noise.
Referring to
As disclosed in US 2018/0367127A, the ringing suppression circuit 21 is configured to suppress ringing caused in a transmission line 1 transmitting a differential signal using a pair of signal lines including a high potential signal line 1H and a low potential signal line 1L. The differential signal varies between a high level and a low level. The ringing suppression circuit 21 includes, as main components, an FET N4 that is connected as an inter-line switching element between the pair of signal lines 1H and IL n that is, and a control unit 9 that turns on the inter-line switching element N4 to fix the ON state when detecting that the differential signal has changed from the high level to the low level, and releases the ON state after measuring a predetermined ON time period.
The continuous activation prevention circuit 22 has the similar configuration as the configuration of an ON hold circuit 7 which includes a D flip-flop FF1. The continuous activation prevention circuit 22 specifically includes a D flip-flop FF3, an inverter gate INV4, an N-channel MOSFET N9, a buffer BUF3, a NOR gate NOR3, and a series circuit of a resistance element R14 and a capacitor C3. The series circuit forms a delay circuit 23. However, an output terminal of the buffer BUF3 is connected to one of input terminals of the NOR gate NOR3. A clock terminal C of the D flip-flop FF3 is connected to an output terminal of a comparator COMP1 of an ON confirmation circuit 3.
A NOT gate INV5 and an AND gate AND1 are connected between an output terminal of a buffer BUF1 and a clock terminal C of a D flip-flop FF2. An output terminal Q of the D flip-flop FF3 is connected to one of input terminals of the AND gate AND1, and outputs a high active mask signal. The AND gate AND1 may be provided in the continuous activation prevention circuit 22. The delay circuit 23 is provided as a reset signal generation unit, and the AND gate AND1 is provided as a logic gate.
Next, an operation of the present embodiment will be described. As shown in
Here, as in the prior art case shown in
A comparator COMP1 of the ON confirmation circuit 3 becomes high level, and the D flip-flops FF1 and FF3 are triggered. As a result, the D flip-flop FF3 outputs a mask signal of a predetermined mask time period. When the mask signal is the high level, the FET N9 is turned off and charging of the capacitor C3 is started. As a result, a signal level of an input terminal of the buffer BUF3 increases.
When the output terminal of the buffer BUF3 becomes high level, the D flip-flop FF3 is reset via the NOR gate NOR3, and the mask signal becomes low level. While the mask signal output from the D flip-flop FF3 is the high level, the D flip-flop FF2 is not triggered via the AND gate AND1 even if the differential signal changes to the recessive level while indicating the dominant. Therefore, the ringing suppression operation is not reactivated.
The above-described operation of the ringing suppression circuit 21 in the communication node A is also performed in a communication node B after a propagation delay time period associated with a wiring length of a wiring connecting the communication nodes A and B has elapsed. As a result, an application of the glitch noise on the communication node A side causes the ringing suppression operation to be performed only once in each of the communication nodes A and B. Although a signal waveform is distorted because of the ringing suppression operation, transmission of the signal having the distorted waveform as in the prior art is not repeated.
An end time of a mask time period predetermined by setting the delay time in the delay circuit 23 is set to a time period, which is at least 1-bit length of a signal data from a reference time of change of the differential signal from dominant to recessive but less than a period {(2-bit length)−(dominant mask period)} determined by subtracting the dominant mask period from 2-bit length of the signal data. This can prevent the ringing suppression operation from being performed when noise is superimposed during a period when the differential signal indicates recessive.
As shown in
As described above, according to the present embodiment, when detecting that the differential signal transmitted on the transmission line 1 has changed from dominant to recessive, the control unit 9 turns on the FET N4 to fix its state, and the ON state is released after a predetermined time period is measured by the delay circuit 6. The continuous activation prevention circuit 22 sets the predetermined mask time period from the time of turning on the FET N4, and performs masking to prevent the control unit 9 from detecting the change in the level of the differential signal from high to low during the mask time period.
More specifically, the continuous activation prevention unit 22 is configured by the D flip-flop FF3, the delay circuit 23 and the AND gate AND1. The D flip-flop FF3 is reset in the initial state, and outputs the mask signal for setting the mask time period when set in correspondence to setting of the D flip-flop FF1. The delay circuit 23 resets the D flip-flop FF3 when a time corresponding to the mask time period elapses after the D flip-flop FF3 has been set. The AND gate AND1 invalidates the signal that sets the D flip-flop FF2 by the mask signal.
With this configuration, the control unit 9 does not detect the change even when glitch noise that changes instantaneously and recessively is applied in the state where the differential signal indicates dominant. Therefore, unlike the prior art, it is possible to prevent the ringing suppression operation from being alternately performed between the communication nodes A and B and prevent the distortion of the signal waveform from being continuously generated.
Further, the end time point of the mask time period is set to be equal to or more than 1-bit length of the signal data and less than {(2-bit length)−(dominant mask time period)} from the reference time point when the level of the differential signal changes from dominant to recessive. As a result, it is possible to reliably prevent a malfunction during the recessive period immediately after the reference time and two bits after the reference time.
As disclosed in US 2018/0367127A, the control unit 9 is configured by a D flip-flop FF1, a D flip-flop FF2, an ON confirmation circuit 3, a comparison circuit 4, a delay circuits 5, 6, an FET N7, an ON setting unit 8 and the like. The D flip-flop FF1, the D flip-flop FF2, the delay circuits 5, 6 and the like form an ON hold circuit 7. The D flip-flop FF1 outputs a signal for resetting the D flip-flop FF2 when it is set. The delay circuit 6 is connected between an output terminal Q of the D flip-flop FF1 and a reset terminal RB of the D flip-flop FF2. The comparison circuit 4 outputs a signal for setting the D flip-flop FF2 when detecting that the differential signal has changed from recessive to dominant. The ON confirmation circuit 3 outputs a signal to set the D flip-flop FF1 when detecting that the FET N4 has turned on. The ON setting unit 8 enables a gate of the FET N4, which is the inter-line switching element, to become ON level when the D flip-flop FF2 is set to generate the signal RSC-EN. In the first embodiment, the D flip-flops FF2, FF1 and FF3 are provided as a first flip-flop, a second flip-flop and a third flip-flop, respectively.
Further, the ON confirmation circuit 3 includes an FET N6. A drain of the FET N6 is connected to a power supply line 2 via a resistance element R3. A source and a gate of the FET N6 are connected to a source and a gate of the FET N4, respectively. The ON setting unit 8 has FETs NO to N3 as first to fourth switching elements, FET P1 and FET P2 as fifth and sixth switching elements. Sources of the FETs NO to N3 are connected to the low potential side signal line 1L of the transmission line 1. A source of the FET P1 is connected to the power supply line 2. A drain of the FET P1 is connected to a drain of the FET N1 and a gate of the FET N2 via a resistance element R1. A source of the FET P2 is connected to the power supply line 2. A drain of the FET P2 is connected to a drain of the FET N3 and a gate of the FET N1 via a resistance element R2.
A gate of the FET NO is connected to a gate of the FET N4. Gates of the FET N1 and N3 are connected to a drain of the FET NO and to the high potential side signal line 1H of the transmission line 1 via the resistance element R0. The gate of the FET N2 is connected to the drain of the FET N1. When the D flip-flop FF2 is set, the FET P1 is turned on and the FET P2 is turned off.
When the delay circuit 5 detects that the level of the differential signal has changed from recessive to dominant, the delay circuit 5 delays the set signal of the D flip-flop FF2 output via the FET N7 by the comparison circuit 4, thereby masking the detection of the level change of the differential signal by the control unit 9 for the predetermined period of time (dominant mask period).
Hereinafter, the same components and functions as those in the first embodiment will be designated by the same reference numerals in the following embodiments, and explanations thereof will be simplified. Only differences from the first embodiment will be described.
In a second embodiment, as shown in
Operation of the second embodiment will be described next. In the initial state, the output terminal Q of the D flip-flop FF3 is at the low level. Therefore, as shown in
As described above, according to the second embodiment, the continuous activation prevention circuit 32 is provided with the D flip-flop FF3, the delay circuit 23, and the AND gate AND1 for invalidating the signal, by which the D flip-flop FF2 is set, by the mask signal. Thereby, the same effect as in the first embodiment can be provided.
As shown in
Next, operation of the third embodiment will be described. As shown in
As described above, according to the third embodiment, the OR gate OR1 of the continuous activation prevention circuit 42 is provided between the NOT gate INV0 of the comparison circuit 4, which is the preceding stage of the D flip-flop FF2, and the FET N7. Thereby, the same effect as in the first embodiment can be provided.
The NOT gates INV4 and INV5 connected to the comparator COMP1 in the third to sixth embodiments are changed to INV 6. The NOT gate INV4 of the fourth embodiment is changed to INV7. The OR gate OR1 of the fifth and sixth embodiments is changed to OR1.
A maximum value of the end of the mask time period is not limited to be set at least 1-bit length from the reference time and less than {(2-bit length)−(dominant mask time period)}.
Instead of the continuous activation prevention circuit 22 of the first embodiment, the continuous activation prevention circuit 32 or 42 of the second or third embodiment may be applied to the fourth to eighth embodiments.
The delay circuits 5, 6, 23 and 43 are not limited to those configured by a resistance element and a capacitor, but may be configured by, for example, a combination with a constant current source.
The resistance elements R1, R2, R21 and R22 may be replaced with a constant current source.
Although the present disclosure has been made in accordance with the embodiments, it is understood that the present disclosure is not limited to such embodiments and configurations. The present disclosure covers various modification examples and equivalent arrangements. In addition, various combinations and forms, and further, other combinations and forms including only one element, or more or less than these elements are also within the scope and the scope of the present disclosure.
Number | Date | Country | Kind |
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2017-247635 | Dec 2017 | JP | national |
The present application is a continuation application of International Patent Application No. PCT/JP2018/038667 filed on Oct. 17, 2018, which designated the United States and claims the benefit of priority from Japanese Patent Application No. 2017-247635 filed on Dec. 25, 2017. The entire disclosures of all of the above applications are incorporated herein by reference.
Number | Date | Country | |
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Parent | PCT/JP2018/038667 | Oct 2018 | US |
Child | 16878673 | US |