Sample analyzer and sample analyzing method

Information

  • Patent Application
  • 20070229830
  • Publication Number
    20070229830
  • Date Filed
    March 30, 2007
    17 years ago
  • Date Published
    October 04, 2007
    17 years ago
Abstract
A sample analyzer is disclosed that comprising: a light source section for emitting light; a first optical information acquiring section for illuminating a sample with the light emitted by the light source section, and for acquiring first optical information; and a second optical information acquiring section for illuminating a measurement specimen, to be prepared by adding a reagent to the sample, with the light emitted by the light source section, and for and acquiring second optical information. A sample analyzing method, intended for use in an automated sample analyzer, is also described.
Description

BRIEF DESCRIPTION OF THE DRAWINGS


FIG. 1 is a perspective view showing the general structure of an embodiment of the sample analyzer of the present invention;



FIG. 2 is a plan view of the detection device and transport device of the sample analyzer of the embodiment in FIG. 1;



FIG. 3 is a block diagram of the control device of the sample analyzer of the embodiment in FIG. 1;



FIG. 4 is a perspective view of a first optical information acquiring section of the embodiment of the sample analyzer shown in FIG. 1;



FIG. 5 is a schematic view of a first optical information acquiring section of the embodiment of the sample analyzer shown in FIG. 1;



FIG. 6 is a block diagram of a first optical information acquiring section of the embodiment of the sample analyzer shown in FIG. 1;



FIG. 7 is a graph of the light absorbance spectrum of interference substance (hemoglobin);



FIG. 8 is a graph of the light absorbance spectrum of interference substance (bilirubin);



FIG. 9 is a graph showing the light absorbance spectrum of interference substance (chyle);



FIG. 10 is a perspective view of a lamp unit of the embodiment of the sample analyzer shown in FIG. 1;



FIG. 11 is a schematic view of a lamp unit of the embodiment of the sample analyzer shown in FIG. 1;



FIG. 12 is an enlarged perspective view showing the filter of the lamp unit in FIG. 10;



FIG. 13 is a brief view illustrating the internal structure of the detection section of a second optical information acquiring section of the embodiment of the sample analyzer shown in FIG. 1;



FIG. 14 is a section view illustrating the structure of the detection section of a second optical information acquiring section of the embodiment of the sample analyzer shown in FIG. 1;



FIG. 15 is a block diagram of a second optical information acquiring section of the embodiment of the sample analyzer shown in FIG. 1; and



FIG. 16 is a flow chart showing the sequence of the sample analyzing operation of the embodiment of the sample analyzer shown in FIG. 1.


Claims
  • 1. A sample analyzer comprising: a light source section for emitting light;a first optical information acquiring section for illuminating a sample with the light emitted by the light source section, and for acquiring first optical information; anda second optical information acquiring section for illuminating a measurement specimen, to be prepared by adding a reagent to the sample, with the light emitted by the light source section, and for and acquiring second optical information.
  • 2. The sample analyzer of claim 1, wherein the light source section comprises: a light source;a first light guide for guiding the light emitted from the light source to the sample in the first optical information acquiring section; anda second light guide for guiding the light emitted from the light source to the measurement specimen in the second optical information acquiring section.
  • 3. The sample analyzer of claim 1, wherein the light source section has an emission wavelength switching part, and the light source section sequentially emits light of different wavelengths.
  • 4. The sample analyzer of claim 3, wherein: the first optical information acquiring section acquires first optical information, of a sample, corresponding to each wavelength using the light of different wavelengths sequentially emitted from the light source section;the second optical information acquiring section acquires second optical information, from a measurement specimen, corresponding to each wavelength using the light of different wavelengths sequentially emitted from the light source section; andthe sample analyzer further comprises a control section for selecting second optical information for analysis from among the second optical information, based on the first optical information.
  • 5. The sample analyzer of claim 4, further comprising: a reagent adding section for preparing a measurement specimen by adding reagent to a sample, andthe reagent adding section adding reagent to a sample on the basis of the first optical information.
  • 6. The sample analyzer of claim 5, wherein the reagent adding section refrains from adding reagent to the sample when the first optical information meets a predetermined condition.
  • 7. The sample analyzer of claim 4, wherein: the emission wavelength switching part switches the wavelength of the light emitted from the light source section to emit light of a first wavelength and light of a second wavelength;the control section determines whether the first optical information of the sample acquired using light of the first wavelength is within a first range; andthe control section analyzes the second optical information of the measurement specimen acquired using light of the first wavelength when the first optical information of the sample acquired using the light of the first wavelength is within the first range.
  • 8. The sample analyzer of claim 7, wherein: the control section determines whether or not first optical information of the sample acquired using light of the second wavelength meets a predetermined condition when first optical information of the sample acquired using light of the first wavelength is outside the first range; andthe control section analyzes second optical information of the measurement specimen acquired using light of the second wavelength when first optical information of the sample acquired using light of the second wavelength meets the predetermined condition.
  • 9. The sample analyzer of claim 2, wherein the light source section has a light collecting part for collecting and guiding the light emitted from the light source to the first light guide and the second light guide.
  • 10. The sample analyzer of claim 2, wherein: the second optical information acquiring section has a plurality of container holding sections for holding specimen containers that accommodate measurement specimens;the second light guide has a plurality of branches;the branches are connected to the container holding sections; andlight is supplied from the light source to the plurality of container holding sections.
  • 11. The sample analyzer of claim 10, wherein: each of the container holding sections further comprising a photoreceptor element, andthe photoreceptor element detects the intensity of the light obtained from the sample container accommodating the measurement specimen.
  • 12. The sample analyzer of claim 10, wherein: the second optical information acquiring section comprises a reference light monitoring section for monitoring the characteristics of the light supplied from the light source; andthe second light guide further comprises an additional branch which is connected to the reference light monitoring section whereby light is supplied from the light source to the reference light monitoring section.
  • 13. The sample analyzer of claim 12, wherein the reference light monitoring section further comprises a photoreceptor which detects the intensity of the light supplied from the light source to the reference light monitoring section via the additional branch.
  • 14. The sample analyzer of claim 4, wherein the light source is a light emitting element for emitting light having a plurality of wavelengths.
  • 15. The sample analyzer of claim 14, wherein: the emission wavelength switching part comprises a first optical filter and a second optical filter;the first optical filter and second optical filter transmit light of mutually different wavelengths; andthe emission wavelength switching part places the first optical filter and second optical filter on the optical path of the light emitted from the light source in sequence.
  • 16. The sample analyzer of claim 4, wherein: the light source comprises a first light emitting element for emitting light of a first wavelength, and a second light emitting element for emitting light of a second wavelength; andthe emission wavelength switching part controls the first light emitting element and the second light emitting element so that the first light emitting element and the second light emitting element emit light sequentially.
  • 17. A sample analyzing method, intended for use in an automated sample analyzer, comprising: (a) providing a sample at a predetermined position;(b) illuminating the sample with light emitted from a light source by using a light emitting device which has the light source, and acquiring first optical information from the sample;(c) preparing a measurement specimen by adding a reagent to the sample;(d) illuminating the measurement specimen with light emitted from the light source by using the light emitting device, and acquiring second optical information from the measurement specimen;(e) conducting an analysis of the characteristic of the sample based on the first optical information and second optical information; and(f) outputting a result of the analysis.
  • 18. The sample analyzing method of claim 17, wherein the light emitting device is controlled to sequentially emit light of different wavelengths in steps (b) and (d).
  • 19. The sample analyzing method of claim 18, wherein: in the step (b), the first optical information corresponding to each wavelength is acquired from the sample using light of different wavelengths sequentially emitted from the light emitting device;in the step (d), the second optical information corresponding to each wavelength is acquired from the measurement specimen using light of different wavelengths sequentially emitted from the light emitting device;in the step (e), the second optical information is selected for analysis from among the second optical information corresponding to each wavelength acquired in step (d) based on first optical information corresponding to each wavelength acquired in step (b); andin the step (e), the analysis is performed using the selected second optical information.
  • 20. A sample analyzing method, intended for use in an automated sample analyzer, comprising: (a) providing a sample to a predetermined position;(b) illuminating the sample with light emitted from a, light source by using a light emitting device which has a light source, and acquiring first optical information from the sample;(c) analyzing the first optical information and determining whether the analysis result is within a predetermined range;(d) preparing a measurement specimen by adding reagent to the sample when it has been determined in step (c) that the analysis result is within the predetermined range;(e) illuminating a measurement specimen with light emitted from a light source by using the light emitting device, and acquiring second optical information from the measurement. specimen;(f) analyzing the characteristics of the sample based on the second optical information; and(g) outputting the result of the analysis of step (f).
  • 21. The sample analyzing method of claim 20, wherein the execution of steps (d) through (g) are halted when it has been determined in step (c) that the analysis result is not within the predetermined range.
Priority Claims (1)
Number Date Country Kind
2006-092792 Mar 2006 JP national