The present invention generally relates to a sample-and-hold circuit, and, more particularly, to a sample-and-hold circuit having a correlated level shifting (CLS) function and a multiplying digital-to-analog converter (MDAC) using the sample-and-hold circuit.
Reference is made to
Continuing the previous paragraph, during the estimation phase Φe, the capacitor C3 and the capacitor C4 are charged to the output voltage Vo of the operational amplifier 110. During the amplification phase Φh, the voltage at the output terminal of the operational amplifier 110 is level shifted so that the alternating current (AC) signal is 0.
By using the CLS technique, the output swing of the operational amplifier 110 can be effectively reduced; as a result, the gain of the operational amplifier 110 can be reduced, thereby reducing the power consumption and area of the operational amplifier 110. However, the circuit in
In view of the issues of the prior art, an object of the present invention is to provide a sample-and-hold circuit and a multiplying digital-to-analog converter (MDAC) using the same, so as to make an improvement to the prior art.
According to one aspect of the present invention, a sample-and-hold circuit is provided. The sample-and-hold circuit has a first input terminal, a second input terminal, a first output terminal, and a second output terminal. The first input terminal receives a first input signal. The second input terminal receives a second input signal. The sample-and-hold circuit includes an operational amplifier, a first switched capacitor (SC) circuit, a second SC circuit, and a level shifting circuit. The operational amplifier has a first input node, a second input node, a first output node, and a second output node. The first SC circuit is coupled to the first input terminal, the first output terminal, and the first input node. The second SC circuit is coupled to the second input terminal, the second output terminal, and the second input node. The level shifting circuit is coupled to the first output node, the first output terminal, the second output node, and the second output terminal and configured to level shift a voltage at the first output node and a voltage at the second output node according to at least the first input signal and the second input signal.
According to another aspect of the present invention, a multiplying digital-to-analog converter (MDAC) is provided. The MDAC has a first input terminal, a second input terminal, a third input terminal, a fourth input terminal, a first output terminal, and a second output terminal. The first input terminal receives a first input signal. The second input terminal receives a second input signal. The third input terminal receives the second input signal. The fourth input terminal receives the first input signal. The MDAC includes an operational amplifier, a first SC circuit, a second SC circuit, a level shifting circuit, a first load capacitor, a second load capacitor, a first switch, a second switch, an analog-to-digital converter (ADC), and a selection circuit. The operational amplifier has a first input node, a second input node, a first output node, and a second output node. The first SC circuit is coupled to the first input terminal, the third input terminal, the first output terminal, and the first input node. The second SC circuit is coupled to the second input terminal, the fourth input terminal, the second output terminal, and the second input node. The level shifting circuit is coupled to the first output node, the first output terminal, the second output node, and the second output terminal and configured to level shift a voltage at the first output node and a voltage at the second output node. The first load capacitor has a first terminal and a second terminal. The first terminal is electrically connected to the first output terminal. The second load capacitor has a third terminal and a fourth terminal. The third terminal is electrically connected to the second output terminal. The first switch is coupled to the second terminal and receives a first reference voltage. The second switch is coupled to the fourth terminal and receives a second reference voltage. The ADC is configured to generate a selection signal according to the first input signal and the second input signal. The selection circuit is coupled to the ADC and configured to determine the first reference voltage and the second reference voltage from a plurality of preset voltages according to the selection signal.
The technical means embodied in the embodiments of the present invention can solve at least one of the problems of the prior art. Therefore, compared to the prior art, the present invention is easier to design and improves the circuit speed.
These and other objectives of the present invention no doubt become obvious to those of ordinary skill in the art after reading the following detailed description of the preferred embodiments with reference to the various figures and drawings.
The following description is written by referring to terms of this technical field. If any term is defined in this specification, such term should be interpreted accordingly. In addition, the connection between objects or events in the below-described embodiments can be direct or indirect provided that these embodiments are practicable under such connection. Said “indirect” means that an intermediate object or a physical space exists between the objects, or an intermediate event or a time interval exists between the events.
The disclosure herein includes a sample-and-hold circuit and a multiplying digital-to-analog converter (MDAC). On account of that some or all elements of the sample-and-hold circuit and the MDAC could be known, the detail of such elements is omitted provided that such detail has little to do with the features of this disclosure, and that this omission nowhere dissatisfies the specification and enablement requirements. A person having ordinary skill in the art can choose components or steps equivalent to those described in this specification to carry out the present invention, which means that the scope of this invention is not limited to the embodiments in the specification.
In the following description, signals are active-high, which means that signals are active at high levels and inactive at low levels, and that asserting/de-asserting a signal means setting the signal high/low. This is for the purpose of explanation, not for limiting the scope of the invention. In other words, in an alternative implementation, signals can be active-low, which means that signals are active at low levels and inactive at high levels, and that asserting/de-asserting a signal means setting the signal low/high. A level transition or a logic level transition means that a signal changes from an asserted (active) state to a de-asserted (inactive) state, or from a de-asserted (inactive) state to an asserted (active) state.
Reference is made to
The input signal Vsp1 and the input signal Vsn1 are inputted to the sample-and-hold circuit 300 via the input terminal Vin1 and the input terminal Vin2, respectively. The input signal Vsp1 (=Vdc+dV1) and the input signal Vsn1 (=Vdc−dV1) may be a differential signal pair, where Vdc is the common-mode voltage of the two, and dV1 is the signal component.
The input terminal Vin3 receives the direct current (DC) voltage Vcm_Vp0_Vn0. The DC voltage Vcm_Vp0_Vn0 may be the input common-mode voltage of the operational amplifier 310 (i.e., the common-mode voltage of the input node Vp0 and the input node Vn0, for example, it may be a DC voltage that does not saturate the operational amplifier 310).
The SC circuit 330p is coupled or electrically connected to the input terminal Vin1, the input terminal Vin3, the output terminal Vp2, and the input node Vp0. The SC circuit 330n is coupled or electrically connected to the input terminal Vin2, the input terminal Vin3, the output terminal Vn2, and the input node Vn0.
The two terminals of the capacitor C1p (capacitor C1n) are the node N1p (node N1n) and the node N2p (node N2n), respectively.
One terminal of the switch Ss0p (switch Ss0n) is coupled or electrically connected to the input terminal Vin3 (i.e., receiving the DC voltage Vcm_Vp0_Vn0); the other terminal of the switch Ss0p (switch Ss0n) is coupled or electrically connected to the node N1p (node N1n).
One terminal of the switch Ss1p (switch Ss1n) is coupled or electrically connected to the input terminal Vin1 (input terminal Vin2) (i.e., receiving the input signal Vsp1 (input signal Vsn1)); the other terminal of the switch Ss1p (switch Ss1n) is coupled or electrically connected to the node N2p (node N2n).
One terminal of the switch Ss2p (switch Ss2n) is coupled or electrically connected to the node N1p (node N1n); the other terminal of the switch Ss2p (switch Ss2n) is coupled or electrically connected to the input terminal of the operational amplifier 310 (more specifically, the input node Vp0 (input node Vn0)). The input node Vp0 and the input node Vn0 are the inverting input terminal and the non-inverting input terminal of the operational amplifier 310, respectively.
One terminal of the switch Ss3p (switch Ss3n) is coupled or electrically connected to the node N2p (node N2n); the other terminal of the switch Ss3p (switch Ss3n) is coupled or electrically connected to the output terminal Vp2 (output terminal Vn2).
The level shifting circuit 320 is coupled or electrically connected to the output node Vp1, the output node Vn1, the output terminal Vp2, the output terminal Vn2, the input terminal Vin1 (for receiving the input signal Vsp1), and the input terminal Vin2 (for receiving the input signal Vsn1). The output node Vp1 and the output node Vn1 are the non-inverting output terminal and the inverting output terminal of the operational amplifier 310, respectively. The level shifting circuit 320 level shifts the voltage at the output node Vp1 and the voltage at the output node Vn1 according to at least the input signal Vsp1 and the input signal Vsn1.
Reference is made to
During the sampling phase Φs (i.e., when the clock CLK1 is at the first level (e.g., high level) and the clock CLK2 is at the second level (e.g., low level)), the switch Ss0p, the switch Ss1p, the switch Ss0n, and the switch Ss1n are turned on, and the switch Ss2p, the switch Ss3p, the switch Ss2n, and the switch Ss3n are turned off, so that the capacitor C1p and the capacitor C1n sample the input signal Vsp1 and the input signal Vsn1, respectively. After the sampling phase Φs ends, the voltage Vxp across the capacitor C1p and the voltage Vxn across the capacitor C1n are shown in Equation (1) and Equation (2), respectively.
During the amplification phase Φh (i.e., when the clock CLK1 is at the second level and the clock CLK2 is at the first level), the switches Ss0p, Ss1p, Ss0n, and Ss1n are turned off, and the switches Ss2p, Ss3p, Ss2n, and Ss3n are turned on, so that the voltages maintained at the output terminals Vp2 and Vn2 are as shown in Equations (3) and (4), respectively.
where dV2 is the signal component of the input signal of the operational amplifier 310.
Reference is made to
The two terminals of the capacitor C2p (capacitor C2n) are the node N3p (node N3n) and the node N4p (node N4n), respectively.
One terminal of the switch Ss4p (switch Ss4n) receives the DC voltage Vcm_Vp1_Vn1; the other terminal of the switch Ss4p (switch Ss4n) is coupled or electrically connected to the node N3p (node N3n). The DC voltage Vcm_Vp1_Vn1 may be the output common-mode voltage of the operational amplifier 310 (i.e., the common-mode voltage of the output node Vp1 and the output node Vn1, for example, it may be a DC voltage that does not saturate the operational amplifier 310).
One terminal of the switch Ss5p (switch Ss5n) is coupled or electrically connected to the input terminal Vin1 (input terminal Vin2); the other terminal of the switch Ss5p (switch Ss5n) is coupled or electrically connected to the node N4p (node N4n).
One terminal of the switch Ss6p (switch Ss0n) is coupled or electrically connected to the node N3p (node N3n); the other terminal of the switch Ss6p (switch Ss0n) is coupled or electrically connected to the output node Vp1 (output node Vn1).
One terminal of the switch Ss7p (switch Ss7n) is coupled or electrically connected to the node N4p (node N4n); the other terminal of the switch Ss7p (switch Ss7n) is coupled or electrically connected to the output terminal Vp2 (output terminal Vn2).
Reference is made to
During the amplification phase Φh, the switch Ss4p, the switch Ss5p, the switch Ss4n, and the switch Ss5n are turned off, and the switch Ss0p, the switch Ss7p, the switch Ss0n, and the switch Ss7n are turned on, so that the capacitor C1p and the capacitor C2p are connected in series, and the capacitor C1n and the capacitor C2n are connected in series. Therefore, during the amplification phase Φh, the voltage at the output node Vp1 and the voltage at the output node Vn1 are shown in Equation (7) and Equation (8), respectively (Equation (7) is derived from Equation (3) and Equation (5), and Equation (8) is derived from Equation (4) and Equation (6)).
It is known from Equation (7) and Equation (8) that the level shift achieved by the level shifting circuit 320 (through the voltage Vyp and the voltage Vyn) ensures that the voltage at the output node Vp1, and the voltage at the output node Vn1 do not contain the signal component dV1 of the input signal Vsp1 and the input signal Vsn1. In addition, in the case of the CLS, because the signal swing at the output terminal of the operational amplifier 310 completely appears in the level shifting circuit 620, the AC signal at the output node Vp1 and the output node Vn1 (i.e., the signal component dV2) is very small. As a result, the output node Vp1 and the output node Vn1 of the operational amplifier 310 basically have only DC components, achieving the CLS effect.
Reference is made to
Reference is made to
The circuits in
Reference is made to
Reference is made to
Reference is made to
The circuits in
In some embodiments, Vsp1=Vsn2+Vcm1, and Vsn1=Vsp2+Vcm1, where Vcm1 is a DC voltage of any level.
In an alternative embodiment, Vsp2=Vsn1, and Vsn2=Vsp1, so that the voltage at the output terminal Vp2 contains 2 times the signal component dV1 (i.e., +2dV1 or −2dV1).
Reference is made to
The sample-and-hold circuit 1100 of
The ADC 1210 generates the selection signal SEL according to the input signal Vsp1 and the input signal Vsn1.
The selection circuit 1220 selects one of the preset voltages Vx, the preset voltage Vy, and the preset voltage Vcm as the reference voltage VR1 and/or the reference voltage VR2 according to the selection signal SEL. The preset voltage Vx may be Vcm+Vz, and the preset voltage Vy may be Vcm−Vz, where Vz is a DC voltage. For example, VR1=Vx and VR2=Vy, or VR1=VR2−Vcm. As people having ordinary skill in the art can understand the operating principles of the ADC 1210 and the selection circuit 1220 based on traditional MDACs, further elaboration is omitted for brevity.
The MDAC 1200 in
Reference is made to
Reference is made to
Note that the shape, size, and ratio of any element in the disclosed figures are exemplary for understanding, not for limiting the scope of this invention.
The aforementioned descriptions represent merely the preferred embodiments of the present invention, without any intention to limit the scope of the present invention thereto. Various equivalent changes, alterations, or modifications based on the claims of the present invention are all consequently viewed as being embraced by the scope of the present invention.
| Number | Date | Country | Kind |
|---|---|---|---|
| 112144147 | Nov 2023 | TW | national |