SBIR Phase I: Whole Wafer Thermal Imaging for Real-Time Process Monitoring and Control

Information

  • NSF Award
  • 9860186
Owner
  • Award Id
    9860186
  • Award Effective Date
    1/1/1999 - 25 years ago
  • Award Expiration Date
    6/30/1999 - 25 years ago
  • Award Amount
    $ 99,816.00
  • Award Instrument
    Standard Grant

SBIR Phase I: Whole Wafer Thermal Imaging for Real-Time Process Monitoring and Control

9860186<br/> This Small Business Innovation Research Phase I will develop a whole wafer sensor for in situ measurements of temperature, emissivity and film stack properties, from a model-based analysis of thermal radiance images. Exploiting commercial infrared imaging hardware, the proposed compact system will provide high performance measurement capability from a single small infrared window with optical access to the wafer surface. Temperature monitoring has been identified as an important hurdle blocking future process enhancements in semiconductor manufacturing. Improved in situ diagnostics for substrate temperature, emissivity and film properties will incur many benefits inclunding improved quality and to optimize process process efficiency, reduced scrap and cost and reduced time parameters.

  • Program Officer
    Deborah L. Crawford
  • Min Amd Letter Date
    11/17/1998 - 26 years ago
  • Max Amd Letter Date
    11/17/1998 - 26 years ago
  • ARRA Amount

Institutions

  • Name
    Advanced Fuel Research, Inc.
  • City
    East Hartford
  • State
    CT
  • Country
    United States
  • Address
    87 Church Street
  • Postal Code
    061083720
  • Phone Number
    8605289806

Investigators

  • First Name
    Harri
  • Last Name
    Latvakoski
  • Email Address
    harri@AFRInc.com
  • Start Date
    11/17/1998 12:00:00 AM

FOA Information

  • Name
    Engineering & Computer Science
  • Code
    510403