SBIR Phase II: A Trace Contaminant Sensor for Semiconductor Process Gases

Information

  • NSF Award
  • 9983349
Owner
  • Award Id
    9983349
  • Award Effective Date
    7/1/2000 - 24 years ago
  • Award Expiration Date
    12/31/2002 - 22 years ago
  • Award Amount
    $ 400,000.00
  • Award Instrument
    Standard Grant

SBIR Phase II: A Trace Contaminant Sensor for Semiconductor Process Gases

This Small Business Innovation Research (SBIR) Phase II project will test a novel sensor for real-time detection of trace impurities important in micoelectronics manufacturing. Gas feedstock quality is an important measurement for any process control strategy because contamination at the part-per-billion (ppb) level may limit product yield. This project's technique, called wavelength modulated photo-acoustic spectroscopy, has the potential to achieve these detection levels at a significantly lower cost than is possible with current technology. This technology is compatible with both corrosive and non-corrosive gases. The Phase II will construct and field test a prototype trace moisture sensor that is expected to achieve 10-ppb detection limits in corrosive gases such as hydrogen chloride and ammonia.<br/><br/>Potential commercial applications are expected in on-line removal of trace impurities important in micoelectronics manufacturing.

  • Program Officer
    Muralidharan S. Nair
  • Min Amd Letter Date
    5/11/2000 - 24 years ago
  • Max Amd Letter Date
    5/11/2000 - 24 years ago
  • ARRA Amount

Institutions

  • Name
    Southwest Sciences Inc
  • City
    Santa Fe
  • State
    NM
  • Country
    United States
  • Address
    1570 PACHECO ST STE E11
  • Postal Code
    875053937
  • Phone Number
    5059841322

Investigators

  • First Name
    David
  • Last Name
    Bomse
  • Email Address
    dbomse@swsciences.com
  • Start Date
    5/11/2000 12:00:00 AM