Current sensors are provided as an integral part of many electronic systems and employ different methods for the current sensing process. Generally, a current sensor is a device that provides a current path from a current input to a current output and that generates an output signal that is representative of the magnitude of the current flowing through the current path. Common current sensing methods include resistive shunt measurements, measurements based on the direct current resistance of a magnetic element, transformer based measurements, MOSFET RDS on or ratiometric measurements, Hall Effect measurements and Magneto Resistive measurement techniques. Each method has various advantages and disadvantages.
Resistive shunt sensors are one of the simplest techniques and potentially most accurate methods for sensing current. However, when measuring currents greater than approximately 10 amps, I2R ohmic power losses become significant and limit the application of this approach. Additionally, the resistive shunt technique is not galvanic plate isolated and thus becomes inappropriate for systems sensing voltages above 24 V and certainly above 60 V which is considered the maximum safe voltage that a human can directly touch. A resistive shunt sensor also has a limited dynamic range. A shunt resistor has to be scaled to give the right amount of voltage drop to be amplified and measured but not so high a resistance as too cause too large a voltage drop.
Hall Effect sensors are available in several configurations for the measurement of higher currents in the range of 50-20,000 amps. These configurations generally require that the current to be sensed pass through a large magnetic element. Transformer type current sensors employed in the sensing of currents in excess of 200 amps tend to be bulky devices. A conductor carrying the current to be measured typically passes through an opening in the transformer type current sensor which in turn is electrically coupled to an associated integrated circuit for processing. The transformer type current sensor and the integrated circuit are separate devices which are often mounted to a common substrate, such as a printed circuit board. Consequently, the end user must provide an external magnetic sensor and conductor associated with the sensor that is interconnected with the integrated circuit.
It is often desirable to sense currents which are greater than the maximum current rating of an integrated circuit sensor. This can be done by splitting the total current into two or more paths to and assuring that the current measured on each path with an integrated circuit does not exceed the maximum current rating for the respective device. However, due to practical considerations, it is difficult to know the current divide ratio and different currents may flow in different current paths. This approach therefore can lead to reduced accuracy or require a post-assembly calibration.
One current sensor that is capable of parallel interconnection for high current measurement is available from Texas Instruments™ under model number INA250. Each INA250 current sensor includes a shunt resistor. A portion of the current to be sensed passes through each of the shunt resistors when the INA250 devices are used in parallel. In this device, the resulting current that is sensed is the sum of the currents sensed by each of the current sensors and required bias and output voltages disadvantageously increase with an increasing number of parallel connected sensors, necessitating the addition of larger power voltages as the number of current sensors increase.
It would therefore be desirable to have a current sensor that was fabricated as a small integrated circuit (IC) that allowed the IC based current sensor to be used in high current measurement applications. Additionally, it would be desirable to have a current sensor that was scalable so as to permit the IC based current sensor to meet a wide range of application requirements, including high current measurement requirements, while avoiding the need to provide increasing bias power supplies and output voltages with an increasing number of current sensors.
In accordance with the present invention an IC based current sensor is disclosed. The disclosed current sensor is configured to permit multiple IC based current sensors to be connected in parallel as an array of current sensors. When configured as a plurality of current sensor interconnected in parallel as an array, a portion of the current to be measured passes through each one of the plurality of current sensors in the array. The maximum permissible current specification for the array is thus approximately the maximum current specification for each current sensor multiplied by the number of current sensors in the array. The array of current sensors provides as an output a signal that represents the average of the currents sensed by the plurality of current sensors in the array. Since any number of the IC based current sensors may be connected in parallel, a current sensing solution is provided that is scalable to satisfy any current sensing requirement.
The invention will be more fully understood by reference to the following Detailed Description of the Invention in conjunction with the Drawings of which:
U.S. provisional application 62/245,032 filed Oct. 22, 2015 and titled Scalable Average Current Sensor System is hereby incorporated herein by reference it its entirety.
A scalable IC based current sensor 200 in accordance with the present invention and an array of such sensors interconnected in parallel are depicted in
The disclosed current sensor may be provided as a fully integrated bi-directional current sensor that deliver both high accuracy and high bandwidth. In one embodiment Anisotropic Magneto Resistive (AMR) current sensing is employed which provides low noise, excellent linearity and repeatability. Any other suitable current sensing technology may also be utilized.
A fully isolated current path is provided by a low resistance copper conductor integrated into the package making it suitable for both high-side and low side bi-directional current sensing. The current sensor has a high bandwidth which makes it suitable for feedback loops in motor control and power supply applications.
Referring to
More specifically, the AMR sensor 202 monitors the magnetic field generated by the current I1 flowing through a U shaped current pathways from IP+ to IP− in an integrated circuit package lead frame. The AMR sensor 202 produces a voltage proportional to the magnetic field created by the positive or negative current in the IP+ to IP− current loop 210 while rejecting external magnetic interference. The current sensor 202 output voltage is coupled to a differential amplifier 230 whose gain is temperature compensated. The differential amplifier 230 output is in turn coupled to an output stage an amplifier 240. The output stage amplifier 240 produces an output voltage that is representative of the current passing through the IP+ to IP− pathway 210. To provide both positive and negative current data, the Voutoutput pin is referenced to the Vref output pin. The voltage on the Vref output is typically about one half of the full scale positive and negative range of the Vout output signal. With no current flowing through the IP+/IP− pins, the voltage on the Vout output will typically equal the voltage on the Vref output. Positive IP+/IP− current causes the voltage on Vout to increase relative to Vref while negative IP+/IP− current will cause it to decrease.
The current sensor 200 may optionally include a voltage regulator 220 to provide a regulated bias voltage to the current sensing element 202 and to provide fixed gain from the sensor resistors R1-R4. When a voltage regulator 220 is employed, the sensor resistors R1-R4 are biased with a fixed voltage so as to immunize the current sensing circuitry 202 from changes in the Vcc supply voltage.
When the voltage regulator 220 is omitted, the sensor resistors R1-R4 are biased to the Vcc supply voltage and produce a differential voltage that is ratiometric to V. This configuration is suited to applications where analog-to-digital converter (A-to-D) circuitry receiving the current sensor output signal from Vout are biased by, and ratiometric to, the same supply voltage as the current sensor. The ratiometric configuration provides increased gain and enhanced supply rejection compared to the embodiment that includes the regulator 220.
Power is provided to the current sensor 200 between Vcc and Gnd.
In
When the current sensor 200 is used as a single sensor, the output signal Vout is a voltage output that is representative of the current I1 through the current path 210 of the current sensing element 202. Additionally, when the current sensor 200 is used singularly, the maximum current that can be accommodated and measured by the device is limited to the maximum current rating of the respective sensor 200.
As illustrated in
Referring to illustrative
Since it is difficult to fabricate multiple current splitting paths so that the currents passing through each individual path are all exactly equal, the currents I1, I2 and I3 carried by the current pathways of the respective sensors may be mismatched. Thus, the output voltages from the output amplifiers 240 (See
The SHARE terminal is connected to the input of the Vout Buffer. The Vout Buffer provides a voltage output corresponding to the average of the voltage outputs of the Output Amplifiers 240 of the current sensors. An output from one of the Vout Buffers is employed, as illustrated in
The array of current sensors thus serves as a current sensor having a theoretical maximum amperage specification equal to the number of current sensors in the array times the maximum amperage specification of each of the current sensors. In practice, since the currents may not split evenly among multiple current paths, the actual maximum amperage specification will be less than the theoretical maximum amperage specification since no current path may exceed the maximum current rating for the respective current sensor and some current paths may carry less than the maximum current for which the respective sensors are rated. The disclosed system provides several advantages over known prior art systems using parallel connected current sensors to accommodate current measurements in excess of the maximum current specification of a single current sensor.
When a current sensor as described above is fabricated as an integrated circuit, a current sensing solution can be provided that is much smaller in size when compared to existing solutions used for sensing 50 amps or greater. Additionally, by sensing the average current sensed by the array of sensors, an accurate current measurement may be obtained even if the total current ITotal being measured is not divided equally among all of the individual sensors in the sensor array. Furthermore, since any number of current sensors may be connected in parallel, the array of current sensors formed upon interconnection can accommodate any level of current. Additionally, unlike known systems which require voltage supplies having higher voltages as the number of stages increase, the presently disclosed system employs a single Vcc supply voltage irrespective of the number of current sensors employed in the array. Thus, the need for multiple power supplies of different voltages is avoided. Lastly, thermal management is simplified since current sensors may be physically spread out to minimize local heating.
A digital compensation scheme allows for compensation due to variations of sensor sensitivity and offset with temperature. Both the offset and gain of the entire signal path are adjustable using the digital to analog converters (DACs). The high resolution (16 bit) digital temperature sensor 310 measures the temperature of the sensor 200. The arithmetic logic unit (ALU) 320 calculates trim codes for the offset and gain of the amplifiers 230, 240, 250, 260 based on the temperature sensor 310 inputs. When there is a change in these codes there will be a step at the output that provides a correction in gain or offset should such be necessary. The DACs have a small step size to provide a fine adjustment capability in sensor output voltage. In one embodiment, the temperature readings are collected and output codes are re-calculated at a rate of approximately 2 kHz although any suitable rate may be employed. The control codes do not change by more than 1 LSB at a time which guarantees a small step at the outputs. Filtering is used on the temperature sensor 310 output to minimize noise on the temperature sensor 310 output signal. Initial accuracy may be pre-programmed into a one-time programmable (OTP) memory through the two TST pins.
While the disclosed embodiment utilizes digital techniques for controlling temperature compensation and offset adjustments, it will be recognized by those of ordinary skill in the art that analog techniques for such control may alternatively be employed.
While the illustrated current sensor 200 provides an analog output, it should be recognized that an analog to digital converter (A-to-D) may be employed to convert the analog output to a digital output representative of the total current ITotal.
As described above, the disclosed current sensor and method of use permit like current sensors to be interconnected in parallel in a scalable manner to provide for the measure of large currents. When interconnected in parallel, the system provides an output that is the average of the currents flowing through the respective interconnected current sensors. It will be appreciated by those of ordinary skill in the art that variations of and modifications to the above-described current sensor and method may be made without departing from the inventive concepts disclosed herein.
Accordingly, the invention should not be viewed as limited except by the scope and spirit of the appended claims.
This application claims priority of U.S. provisional application 62/245,032 filed Oct. 22, 2015 and titled Scalable Average Current Sensor System.
Number | Date | Country | |
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62245032 | Oct 2015 | US |