A printing device may apply print agents to a paper or another substrate. One example of a printing device is a Liquid Electro-Photographic (“LEP”) printing device, which may be used to print using a fluid print agent such as an electrostatic printing fluid. Such electrostatic printing fluid includes electrostatically charged or chargeable particles (for example, resin or toner particles which may be colorant particles) dispersed or suspended in a carrier fluid).
In an example of LEP printing, a printing device may form an image on a print substrate by placing an electrostatic charge on a photo image plate (a “PIP”), and then utilizing a laser scanning unit to apply an electrostatic pattern of the desired image on the PIP to selectively discharge the PIP. The selective discharging forms a latent electrostatic image on the PIP. The printing device includes a development station to develop the latent image into a visible image by applying a thin layer of electrostatic ink (which may be generally referred to as “LEP ink”, or “electronic ink” in some examples) to the patterned PIP. Charged toner particles in the LEP ink adhere to the electrostatic pattern on the PIP to form a liquid ink image. The liquid ink image, including colorant particles and carrier fluid, is transferred from the PIP to an intermediate transfer member (referred herein as a “blanket”). The blanket is heated until carrier fluid evaporates and colorant particles melt, and a resulting molten film representative of the image is then applied to the surface of the print substrate via pressure and tackiness.
For printing with colored inks, the printing device may include a separate development station for each of the various colored inks. There are typically two process methods for transferring a colored image from the photoreceptor to the substrate. One method is a multi-shot process method in which the process described in the preceding paragraph is repeated a distinct printing separation for each color, and each color is transferred sequentially in distinct passes from the blanket to the substrate until a full image is achieved. With multi-shot printing, for each separation a molten film (with one color) is applied to the surface of the print substrate. A second method is a one-shot process in which multiple color separations are acquired on the blanket via multiple applications (each with one color) of liquid ink in from the PIP to the blanket, and then the acquired color separations are transferred in one pass from the blanket to the substrate.
The PIP is a consumable with a limited life span, and it should be replaced when it is damaged or aged. In order to extend the working life of the PIP, a cleaning procedure is typically performed on the PIP that includes wiping the foil of the PIP with a flexible wiper component. One of the most common issues with the PIP consumable is known as a wiper scratch defect, caused by small dust or ink particles getting caught in the wiper and forming a vertical process scratch. The wiper scratch may appear as a lighter than expected streak in prints where there is less than 50% ink coverage and may appear as a darker than expected streak in prints where there is greater than 50% ink coverage.
In order to save time and money for the customer and the provider of the LEP printing service, it is helpful to be able to distinguish PIP wiper scratch defects from other LEP press defects and operation errors. Commonly, the process of identifying a source of print errors can be a tedious manual process and can be error prone. Misdiagnosis of printing device errors can result in wasted time and resources as the operator may be replacing consumables that are still in good working order, with the replacements not addressing the true cause for the printing device not operating correctly.
To address these issues, various examples described in more detail below provide a system and a method that enables PIP scratch identification utilizing integrated defect maps. In an example, a set of scanned images is accessed. Each of the scanned images is a scan of one of a set of distinct printouts of a subject image made at a printing device. The distinct printouts were produced utilizing a same PIP at the printing device. A set of defect maps is created, with each defect map being created by comparing one of the scanned images to digital reference data for the subject image. The comparisons may be performed patch versus patch where each patch received a score that represents its similarity to the reference patch which result in the defect map image. Brighter areas in a defect map represent a potential defect.
The set of defect maps are combined to form an integrated defect map. In examples, the integration may be of 15-25 defect maps corresponding to consecutive frames printed by the printing device. In turn, the integrated defect map can be utilized to identify a scratch defect on the PIP. In examples, a scanner, e.g., an inline scanner at the printing device, can be used to create the set of scanned images. In examples, the set of defect maps may be created by comparing brightness of correlated patches of the scanned images and of the subject images image according to the reference data, and assigning a score representing a similarity of a scanned image to a subject image. In examples, the comparing of scanned images to reference data for the subject image to create a defect map may include subtracting one of image attribute data for a scanned image and image attribute data for the subject image from the other, such that the calculated difference is indicative of degree of similarity.
In this manner the disclosed apparatus and method should significantly save time and resources for customers and printing device providers alike as identification of PIP scratch defect errors will occur accurately and automatically. Users and providers of LEP printing systems will enjoy the cost savings made possible by the disclosed wiper scratch identification apparatus and method, as PIP consumables will be replaced when needed as opposed to replacing PIP consumables as part of a troubleshooting exercise. Utilization and installations of LEP printing devices should thereby be enhanced.
In an example, scanned image engine 102 represents generally a combination of hardware and programming to access a set of scanned images. Each of the scanned images is a scan of one of a set of distinct printouts of a subject image, wherein each of the printouts was produced utilizing a same PIP at a printing device. In certain examples, the scanning of the distinct printouts is accomplished utilizing an inline scanner at the printing device. As used herein “inline” refers generally to the scanner being located in the media path of the printing device. In some examples, the inline scanner may be a scanner that is situated in the media path of the printing device at a point after the creation of printouts, and before any post-printing activities such as laminating, winding (in the case of sheet fed media), or stacking (in the case of sheet media). In examples, the inline scanner may be one that is also utilized for color analysis (e.g., via spectrophotometry). In examples, the inline scanner may be one that is also utilized for image registration analysis, e.g. in guiding placement of images relative to each other or guiding placement of images relative to an edge or fiducial on a media.
In examples, scanned image engine 102 may access a set of scanned images that is between fifteen and twenty-five scanned images. In one example, the set of scanned images accessed may be a set of twenty scanned images. In a particular example, scanned image engine 102 may access a set of scanned images that is a set of twenty scanned image printed consecutively utilizing the same PIP and same printing device.
Defect map engine 104 represents generally a combination of hardware and programming to create a set of defect maps. Defect map engine 104 creates each defect map of the set by comparing one of the scanned images to reference data for the subject image. The resulting defect map is created in a manner that can be analyzed, e.g., via an applicable computer program, to identify defects in the scanned image relative to the subject image. In examples, defect map engine 104 is to create the set of defect maps by comparing correlated patches of the scanned images and reference data for the subject images. In some examples, defect map engine 104 is to create the set of defect maps by comparing brightness and/or contrast of correlated patches of the scanned images and reference data for the subject images. In some examples, defect map engine 104 may compare the correlated patches of the scanned images and of the subject images by assigning a score to each patch, with the scores representing a similarity to the subject image according to the reference data.
In certain examples, defect map engine 104 comparing one of the scanned images to reference data for the subject image may include a subtracting image attribute data for a scanned image from image attribute data for the subject image such that the calculated difference is indicative of degree of similarity. In other examples, defect map engine 104 may subtract image attribute data for the subject image from the image attribute data for the scanned image, with the calculated difference indicating degree of similarity.
Integration engine 106 represents generally a combination of hardware and programming to combine the set of defect maps into an integrated defect map.
Scratch identification engine 108 represents generally a combination of hardware and programming to identify a scratch defect on the PIP utilizing the integrated defect map. In some examples, scratch identification engine 108 identifying the scratch defect by analyzing the differences in pixels of a scanned image and of the subject image according to the reference data along a vertical column.
In particular examples, scratch identification engine 108 may obtain information as to a first set of pixels of the subject image that are pixels intended to be bright pixels. In these examples, scratch identification engine 108 may disregard this first set of pixels when analyzing the differences in pixels of the scanned image and of the subject image according to the reference data to identify the scratch defect. In examples, scratch identification engine 108 may access a lookup table or database that includes a luminosity threshold, and may identify bright pixels by comparing the luminosity of the first set of pixels with the accessed luminosity threshold.
As stated above, system 100 includes a scanned image engine 102 to access the set of scanned images. In certain examples, scanned image engine 102 may access these scanned images from a database or other location at which the scanned images have been stored. In some examples, these scanned images may be stored separate from the printing device that created the printouts. In other examples, system 100 additionally includes an image capture engine 110, representing generally a combination of hardware and programming to utilize a scanner to create the set of scanned images. In some examples, the scanner utilized to create the set of scanned images may be an inline scanner at the printing device. In examples, the inline scanner may be a multifunction scanner that is also utilized at the printing device for color analysis and/or image registration analysis.
In examples, the PIP 202 may receive the latent image as the result of a laser scanning unit applying an electrostatic pattern of a desired image on the PIP to selectively discharge the PIP. The selective discharging forms the latent electrostatic image on the PIP 202.
In examples, the PIP 202 may receive the ink to form an ink layer on the PIP from a development station that applies a thin layer of electrostatic ink to the patterned PIP. Charged toner particles in the LEP ink adhere to the electrostatic pattern on the PIP 202 to form a liquid ink image. In examples of printing with colored inks, printing device 200 may include multiple development stations for each of various colored inks, with each development station being utilized with the PIP 202 to create distinct printing separation for each color.
In examples, the PIP 202 may transfer the liquid ink layer to a transfer element to form one or more printouts. In certain examples, the PIP 202 may transfer a liquid ink layer, including colorant particles and carrier fluid, to a transfer element that is an intermediate transfer element or blanket, which in turn transfers the ink layer to a substrate. In other examples, the PIP 202 may transfer the liquid ink layer directly to a media. In other examples, the PIP 202 may transfer the ink layer directly to a media.
Printing device 200 includes an inline scanner 204 to capture a set of scanned images. Each of the scanned images is a scan of one of a set of distinct printouts of a subject image that are produced at the printing device utilizing the PIP. As used herein a “scanner” refers generally to an electromechanical device that captures an image of a subject. In examples, the inline scanner 204 is an optical scanner situated in the media path of the printing device such that scanning can occur during a printing process. As used herein, a “distinct printout” refers generally to an individual, or separately generated printout relative other generated printouts. In some use cases, the distinct printouts may be printouts of entirely different subject matters, e.g., a printouts of a skyline of a city, a printout of a sports photo, a printout of a product label, etc. In other use cases, one or all of the distinct printouts could be of a common subject.
Printing device 200 includes a defect map engine 104 to create a set of defect maps. In this example, each defect map is created by analyzing differences in pixels of a scanned image and of the reference data for the subject image along a vertical column. A vertical column is as a PIP with a wiper scratch commonly produces printouts with a vertical process line in the printouts, e.g., an unexpected line or swath of pixels that appear lighter or darker that what is intended for the printout.
Printing device 200 includes an integration engine 106 to combine the set of created defect maps into an integrated defect map. In an example, the combining may include a process of adding image attribute data each of the set of created defect maps to create the integrated defect map. In this manner, areas of the set of scanned images that have a common defect may be identifiable according to a scoring of differences from a registration image indicating a significant difference.
Printing device 200 includes a scratch identification engine 108 to identify a scratch defect on the PIP utilizing the created integrated defect map.
In the foregoing discussion of
Memory resource 330 represents generally any number of memory components capable of storing instructions that can be executed by processing resource 340. Memory resource 330 is non-transitory in the sense that it does not encompass a transitory signal but instead is made up of a memory component or memory components to store the relevant instructions. Memory resource 330 may be implemented in a single device or distributed across devices. Likewise, processing resource 340 represents any number of processors capable of executing instructions stored by memory resource 330. Processing resource 340 may be integrated in a single device or distributed across devices. Further, memory resource 330 may be fully or partially integrated in the same device as processing resource 340, or it may be separate but accessible to that device and processing resource 340.
In one example, the program instructions can be part of an installation package that when installed can be executed by processing resource 340 to implement system 100. In this case, memory resource 330 may be a portable medium such as a CD, DVD, or flash drive or a memory maintained by a server from which the installation package can be downloaded and installed. In another example, the program instructions may be part of an application or applications already installed. Here, memory resource 330 can include integrated memory such as a hard drive, solid state drive, or the like.
In
Continuing at
In examples, defect map engine 104 may create first and second defect maps 406408 by comparing correlated patches of the scanned images and reference data for the subject images, e.g., by comparing brightness and/or contrast of correlated patches of the scanned images and reference data for the subject images. In examples, defect map engine 104 may assign scores to correlated patch, with the scores representing a similarity to the correlated patches of the applicable subject image according to the reference data for the subject image.
In certain examples, defect map engine 104 comparing first and second scanned images 402404 to reference data for their applicable subject images may include a subtracting of image attribute data for the scanned images from image attribute data for the applicable subject images such that the calculated difference is indicative of degree of similarity. In the example of
Continuing at
In particular examples, scratch identification engine 108 may obtain information as to a pixels of subject images that are pixels intended to be bright pixels. In these examples, scratch identification engine 108 may disregard these intended bright pixels when analyzing the differences in pixels of the scanned image and of the subject image according to the reference data to identify the scratch defect. In examples, scratch identification engine 108 may access a lookup table or database that includes a luminosity threshold, and may identify such intended bright pixels by comparing the luminosity of the first set of pixels with the accessed luminosity threshold.
A set of defect maps is created by comparing the scanned images to reference data for the subject images (block 504). Referring back to
The set of defect maps are combined into an integrated defect map (block 506). Referring back to
A scratch defect on the PIP is identified utilizing the integrated defect map (block 508). Referring back to
Although the flow diagram of
It is appreciated that the previous description of the disclosed examples is provided to enable any person skilled in the art to make or use the present disclosure. Various modifications to these examples will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other examples without departing from the spirit or scope of the disclosure. Thus, the present disclosure is not intended to be limited to the examples shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein. All of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and/or all of the blocks or stages of any method or process so disclosed, may be combined in any combination, except combinations where at least some of such features, blocks and/or stages are mutually exclusive. The terms “first”, “second”, “third” and so on in the claims merely distinguish different elements and, unless otherwise stated, are not to be specifically associated with a particular order or particular numbering of elements in the disclosure.
Filing Document | Filing Date | Country | Kind |
---|---|---|---|
PCT/EP2017/056736 | 3/21/2017 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
---|---|---|---|
WO2018/171877 | 9/27/2018 | WO | A |
Number | Name | Date | Kind |
---|---|---|---|
5659863 | Kawabata | Aug 1997 | A |
7869099 | Mashtare | Jan 2011 | B2 |
9031470 | Kahatabi | May 2015 | B2 |
20050240376 | Uwatoko | Oct 2005 | A1 |
20060222387 | Burry | Oct 2006 | A1 |
20070086799 | Burry | Apr 2007 | A1 |
20090274342 | Wu | Nov 2009 | A1 |
20110051170 | Mongeon | Mar 2011 | A1 |
20110052228 | Kozitsky | Mar 2011 | A1 |
20130294791 | Nakamura | Nov 2013 | A1 |
20190335041 | Haik | Oct 2019 | A1 |
20190377296 | Haik | Dec 2019 | A1 |
Number | Date | Country |
---|---|---|
102004014084 | Oct 2004 | DE |
2008074051 | Apr 2008 | JP |
Entry |
---|
Tse, Ming-Kai, et al. “Advances in Instrumented Defect Mapping Technology for Photoreceptors.” In NIP & Digital Fabrication Conference, vol. 1998, No. 2, pp. 615-622. Society for Imaging Science and Technology, 1998. |
Number | Date | Country | |
---|---|---|---|
20200033783 A1 | Jan 2020 | US |