This application makes reference to, incorporates the same herein, and claims all benefits accruing under 35 U.S.C. § 119 from an application for SEALING STRUCTURE OF A FILED EMISSION DISPLAY DEVICE, AND A MANUFACTURING METHOD OF THE SAME, earlier filed in the Korean Intellectual Property Office on the 23rd of February, 2005 and there duly assigned Serial No. 10-2005-0015053.
1. Field of the Invention
The present invention relates to a field emission display (i.e., “FED”) device, and more particularly, to a sealing structure of a FED device and a method of manufacturing the same.
2. Description of the Related Art
In general, a field emission display (i.e., a “FED”) device is one of flat panel display devices, and formed of a tip-shaped or wedge-shaped cathode and an anode on which a fluorescent substance is coated. When electrons emitted from a predetermined portion of the cathode collide with the fluorescent substance, the fluorescent substance illuminates to visually display desired patterns, characters, or signs. The FED device can display high resolution and high luminance color patterns while consuming minimum electrical power.
Such a FED device forms a micro-tip shaped cathode in order to focus an electric field, forms a gate for inducing the electric field, and forms an anode on which a fluorescent substance is coated. Electrons are emitted from a plurality of micro-tips, and the electrons collide with the fluorescent substance of the anode having a transparent conductive film; thus the fluorescent substance is stimulated and the outermost electrons of the fluorescent substance are excited and transited. Then, the light generated by the excitement and transition is used to visually display desired images. Studies about such a FED device have been performed for a long time.
A substrate assembly for a FED device is manufactured during a packaging process, in which an upper substrate and a lower substrate having an anode and a cathode, respectively, are aligned and heated in a firing furnace at a temperature of 400° C.
In such a packaging process described above, however, carbon nano-tubes are easily oxidized in high temperature process due to the oxygen remaining in the firing furnace. In fact, during the packaging process, a large number of the carbon nano-tubes are oxidized, and the emission characteristic of carbon nano-tubes seriously deteriorates. In order to solve such problems, oxygen is completely removed from the firing furnace, and the baking process is performed after injecting an inert gas, such as nitrogen, into the firing furnace.
The present invention provides a sealing structure of a field emission display (FED) device for preventing the deterioration of an emission characteristic of carbon nanotubes, and reducing a process time and a number of steps in a high temperature process by improving the shape and manufacturing method of a frit which seals the FED device, and a method of manufacturing the same.
According to an aspect of the present invention, there is provided a sealing structure of an FED device, constructed with an upper substrate, a lower substrate separated from the upper substrate by a predetermined distance, spacers for maintaining the distance between the upper substrate and the lower substrate, and a frit for sealing the space between the upper substrate and the lower substrate, wherein at least one exhaust outlet is formed in the frit.
The exhaust outlet may be formed as a groove in the frit. The exhaust outlet may be formed as a hole in the frit. The frit may have connections for connecting the frit to other frits. The connections may be formed at both ends of the frit.
The frit may further include getter combining grooves for installing getters that absorb inner gas produced in the space between the upper substrate and the lower substrate.
The frit may be manufactured by forming at least two separate members and combining the separate members. The separate members may be formed by any one of molding and injection molding.
The frit may have at least two sub-frits connected to each other. The sub-frits may be connected to each other at a predetermined angle. The sub-frits may be identical.
A vacuum exhaust pipe may be formed in any one of the lower substrate and the upper substrate.
According to another aspect of the present invention, there is provided a method of manufacturing a sealing structure of an FED device, by preparing a lower substrate and an upper substrate, installing a frit which has at least one exhaust outlet, between the lower substrate and the upper substrate, and heating the lower substrate and the upper substrate while arranging the upper substrate on the lower substrate at a predetermined temperature to melt the frit in order to seal the space between the lower substrate and the upper substrate.
The method may install spacers separated from the frit by a predetermined distance before the heating of the lower substrate and the upper substrate.
According to still another aspect of the present invention, there is provided a method of manufacturing a sealing structure of an FED device by arranging a lower substrate and an upper substrate, forming spacers between the lower substrate and the upper substrate, forming a frit, which is longer than the spacer by a predetermined length, separated from the spacer by a predetermined distance, and heating the lower substrate and the upper substrate while arranging the upper substrate on the lower substrate to reduce the height of the frit in order for the spacers to contact the lower substrate and the upper substrate.
The frit may include at least one exhaust hole. According to the sealing structure of the FED device, the inner gas can be easily exhausted because the frit includes exhaust grooves or exhaust holes.
In addition, the sealing structure of the FED device manufactured according to the principles of the present invention can reliably seal the inside of the FED device while preventing the damage of the spacers.
A more complete appreciation of the invention and many of the attendant advantages thereof, will be readily apparent as the same becomes better understood by reference to the following detailed description when considered in conjunction with the accompanying drawings in which like reference symbols indicate the same or similar components, wherein:
As described above, carbon nano-tubes are easily oxidized during firing in the packaging process. Such a problem can be observed in a texture of carbon nano-tubes as shown in
The sealing structures of field emission display devices and methods of manufacturing the same according to embodiments of the present invention will now be described in detail with reference to the accompanying drawings. The same reference numerals refer to the same or comparable components.
Referring to
Each of the lower substrate 20 and the upper substrate 30 has an anode and a cathode. In addition, a plurality of carbon nano-tubes for emitting electrons are formed on the lower substrate 20.
On the other hand, a vacuum exhaust pipe (not shown) penetrates the upper substrate 30 or the lower substrate 20. In the sealing structure 10 of the FED device according to the present invention, the number of vacuum exhaust pipes can be reduced, since separate exhaust outlets for exhausting inner gas are formed on the frit 40.
When an inert gas such as nitrogen is injected into the FED device in a firing furnace as a substitute for the inner gas in the FED device, the exhausting speed and the amount of inner gas exhausted from the FED device are improved, because the frit 40A includes the convex units 42 and the concave units 43. Therefore, the inner gas in the FED device can be easily exhausted from the FED device.
The angle between the frits 40B can be easily controlled. Accordingly, the combination angle of the frits 40B can be controlled based on the sealing structure of the FED device. Therefore, a frit 40 having a required structure can be manufactured by combining sub-frits 40B.
Regarding
Since the exhaust holes 46 are formed in the body unit 45 of the frit 40C, the frit 40C can exhaust inner gas of the FED device, even without directly contacting another member, for example, an upper substrate 30 or a lower substrate 20. Accordingly, the arrangement of the frit 40C is not limited, and can be optimally selected to realize a required sealing structure of the FED device.
In this case, getters are installed in the getter combination grooves 48 to absorb the inner gas of the FED device during the manufacture of the sealing structure. Since the inner gas of the FED device is absorbed through the getters that are installed in the getter combining grooves 48, the inner gas can be easily exhausted.
Referring to
Referring to
Referring to
When the sealing structure of the FED device is formed according to the present invention, the space between the upper substrate 30 and the lower substrate 20 can be reliably sealed while preventing the damage of the spacers 60.
According to the sealing structure of the FED device according to the present invention, the exhaust grooves or the exhaust holes are formed in the frit that forms the sealing structure, and thus the inner gas can be easily exhausted.
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present invention as defined by the following claims.
Number | Date | Country | Kind |
---|---|---|---|
10-2005-0015053 | Feb 2005 | KR | national |
Number | Name | Date | Kind |
---|---|---|---|
5525861 | Banno et al. | Jun 1996 | A |
6113450 | Narayanan et al. | Sep 2000 | A |
6963165 | Park et al. | Nov 2005 | B2 |
20030013372 | Uemura et al. | Jan 2003 | A1 |
20030071562 | Ando | Apr 2003 | A1 |
20030071579 | Ryu et al. | Apr 2003 | A1 |
20030090196 | Ando | May 2003 | A1 |
20030137245 | Nakatani et al. | Jul 2003 | A1 |
20050085052 | Chen et al. | Apr 2005 | A1 |
20050179362 | Kijima et al. | Aug 2005 | A1 |
20060022594 | Kijima et al. | Feb 2006 | A1 |
Number | Date | Country |
---|---|---|
2002-134019 | May 2002 | JP |
2002-184328 | Jun 2002 | JP |
Number | Date | Country | |
---|---|---|---|
20060186789 A1 | Aug 2006 | US |