The present invention relates to lock assemblies that can be programmed to accept an existing key. Locks of this type are generally referred to as adaptable to being rekeyed.
Current lock cylinders and mating keys often wear from repeated use or may be otherwise damaged and need to be replaced. This problem is especially evident in the area of automotive ignitions. A problem arises with replacement of the lock cylinder in an automotive ignition or other similar application when the original key includes other functions such as opening doors, the trunk lid or windows. Furthermore, the original key maybe digitally coded to other automobile applications or anti-theft systems.
Current lock cylinders that can be rekeyed involve disassembly and re-assembly of internal components by a skilled user or are one-time only assemblies with no means to verify additional copies of the original key are functional after a rekeying procedure. Examples of prior attempts at solving the problems with the prior art are found in U.S. Pat. Nos. 3,589,153; 6,860,131; 7,007,528; 7,140,213; 7,213,429; 7,634,930; and 8,161,783.
There exists a need for a simplified self-learning lock assembly that enables the reuse of the original key when replacing a defective lock cylinder.
The present invention provides of a lock cylinder assembly or lock tumbler and tools capable of self-learning a key's configuration so it is usable with a pre-existing key. The individual performing the self-learning does not need to have prior locksmith experience. The individual performing the self-learning procedure can verify that the original key and copies of the original key function properly within the lock cylinder prior to final assembly and installation in the lock through a self-learning test housing. The advantage of the pre-installation testing is that it eliminates the problem associated with an incorrectly assembled lock cylinder.
The self-learning wafer sub-assembly,
After completing the self-learning procedure with the original key still in place, the key 50 and plug assembly can be tested for operation in the self-learning housing, shown in
If the keys do not function correctly, further adjustments can be made to the wafer sub-assemblies to obtain proper function. When the self-learning procedure is complete and verified, the key and plug sub-assembly is transferred to the housing 40 of
With reference to
This application claims the benefit of U.S. provisional application 62/056,918, filed Sep. 29, 2014 which is incorporated by reference as if fully set forth.
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