Claims
- 1. A semiconductive material having a negative temperature coefficient of resistance comprising (a) a negative temperature coefficient of resistance semiconductive ceramic comprising a rare earth transition element oxide excluding Ce and including Y, and (b) at least one element selected from the group consisting of Si, Zr, Hf, Ta, Sn, Sb, W, Mo, Te and Ce as an additive to said rare earth transition element oxide.
- 2. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, wherein the mole percent of said additive is about 0.001 to 10.
- 3. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, wherein the mole percent of said additive is about 0.1 to 5.
- 4. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, wherein said rare earth transition element oxide is an oxide being selected from a group of respective oxides of LaCoO3, LaCrO3, LaMnO3, SmNiO3, NdNiO3 and PrNiO3.
- 5. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 11, wherein said rare earth transition element oxide ALaCoO3 is La0.9Nd0.1CoO3.
- 6. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 11, wherein said rare earth transition element oxide ALaCoO3 is La0.9Gd0.1CoO3.
- 7. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 11, wherein said rare earth transition element oxide ALaCoO3 is La0.99Y0.01CoO3.
- 8. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, in combination with a circuit for preventing an inrush current.
- 9. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, in combination with a circuit for delaying motor starting.
- 10. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, wherein the rare earth transition element oxide includes a rare earth element and a transition element, and the mole ratio of the rare earth element to the transition element is within a range of 0.6 to 1.1.
- 11. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, wherein said rare earth transition element oxide is of the formula ACoO3, ACrO3, AMnO3, or BNiO3, wherein A includes the element La and B includes at least one element selected from the group consisting of Sm, Nd and Pr.
- 12. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, wherein the rare earth transition element oxide includes a rare earth element and a transition element, and the mole ratio of the rare earth element to the transition element is within a range of 0.6 to 0.989.
- 13. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 12, wherein the rare earth element is La and the transition element is Co.
- 14. The semiconductive material having a negative temperature coefficient of resistance in accordance with claim 1, wherein the mole percent of said additive is about 0.001 to 1.
Priority Claims (3)
Number |
Date |
Country |
Kind |
5-18997 |
Feb 1993 |
JP |
|
5-38328 |
Feb 1993 |
JP |
|
5-275443 |
Nov 1993 |
JP |
|
CROSS-REFERENCE TO RELATED APPLICATIONS
1. This is a continuing application of pending U.S. application Ser. No. 08/190,300, filed Feb. 2, 1994.
Divisions (1)
|
Number |
Date |
Country |
Parent |
09222676 |
Dec 1998 |
US |
Child |
09754603 |
Jan 2001 |
US |
Continuations (1)
|
Number |
Date |
Country |
Parent |
08632266 |
Apr 1996 |
US |
Child |
09222676 |
Dec 1998 |
US |
Continuation in Parts (1)
|
Number |
Date |
Country |
Parent |
08190600 |
Feb 1994 |
US |
Child |
08632266 |
Apr 1996 |
US |