Number | Date | Country | Kind |
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6-206967 | Aug 1994 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
5060037 | Rountree | Oct 1991 | |
5290724 | Leach | Mar 1994 | |
5495118 | Kinoshita et al. | Feb 1996 |
Entry |
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"Improvement of `Soft Breakdown` Leakage of off-State nMOSFETs Induced by HBM ESD Events Using Drain Engineering for LDD Structure", by Ikuo Kurachi and Yasuhiro Fukuda, in IEICE Transactions, vol. E77-A, No. 1, Jan. 1994, pp. 166-173. |