Claims
- 1. A semiconductor integrated circuit device comprising:
a CMOS circuit, and a first clock generating circuit and second clock generating circuit, wherein, after receiving a reference clock signal, the first clock generating circuit takes a longer time than the second clock generating circuit to generate an output clock signal which is phase-synchronized with the reference clock signal, and any one of the clock signal output by the first clock signal generating circuit, the clock signal output by the second clock signal generating circuit and said reference clock signal, are supplied to the CMOS circuit.
- 2. A semiconductor integrated circuit device as defined in claim 1, wherein:
said first clock signal generating circuit generates an output clock signal which is phase-synchronized with the reference clock signal at 10 or more clock signal periods after the reference clock signal is input, and said second clock signal generating circuit generates an output clock signal which is phase-synchronized with the reference clock signal at less than 10 clock signal periods after the reference clock signal is input.
- 3. A semiconductor integrated circuit device as defined in claim 1, wherein:
said first clock signal generating circuit generates an output clock signal which is phase-synchronized with the reference clock signal and has a frequency which is a multiple or fraction of the frequency of the reference clock signal, and said second clock signal generating circuit generates an output clock signal which is phase-synchronized with the reference clock signal and has a frequency which is a fraction of the frequency of the reference clock signal.
- 4. A semiconductor integrated circuit device as defined in claim 1, wherein:
the CMOS circuit outputs a clock selection signal to said first and second clock signal generating circuit, and the clock signal supplied to the CMOS circuit is selected by said clock selection signal.
- 5. A semiconductor integrated circuit device as defined in claim 1, wherein:
a clock signal selection terminal is provided outside the CMOS circuit, and the clock signal supplied to the CMOS circuit is selected by an external signal input to the clock signal selection terminal.
- 6. A semiconductor integrated circuit device as defined in claim 1, wherein:
a clock signal selection terminal is provided outside the CMOS circuit, the CMOS circuit outputs a clock selection signal to said first and second clock signal generating circuit, and the clock signal supplied to the CMOS circuit is selected by said clock selection signal and an external signal input to the clock signal selection terminal.
- 7. A semiconductor integrated circuit device comprising:
a CMOS circuit, first to third clock signal generating circuits, and an external clock output terminal, wherein, after receiving a reference clock signal, the first and second clock generating circuits take a longer time than the third clock generating circuit to generate an output clock signal which is phase-synchronized with the reference clock signal, and the clock signal output by the first clock signal generating circuit, or the reference clock signal supplied to the first clock signal generating circuit, is supplied to the CMOS circuit, the second and third clock signal generating circuits use the clock signal supplied to the CMOS circuit as a reference clock signal, and any one of the clock signal output by the second clock signal generating circuit, the signal output by the third clock signal generating circuit, and the clock signal supplied to the CMOS circuit, is output from said external clock output terminal.
- 8. A semiconductor integrated circuit device as defined in claim 7, wherein:
said first and second clock signal generating circuits generate an output clock signal which is phase-synchronized with the reference clock signal at 10 or more clock signal periods after the reference clock signal is input, and said third clock signal generating circuit generates an output clock signal which is phase-synchronized with the reference clock signal at less than 10 clock signal periods after the reference clock signal is input.
- 9. A semiconductor integrated circuit device as defined in claim 7, wherein:
said first and second clock signal generating circuits generate an output clock signal which is phase-synchronized with the reference clock signal and has a frequency which is a multiple or fraction of the frequency of the reference clock signal, and said third clock signal generating circuit generates an output clock signal which is phase-synchronized with the reference clock signal and has a frequency which is a fraction of the frequency of the reference clock signal.
- 10. A semiconductor integrated circuit device as defined in claim 7, wherein:
said CMOS circuit outputs a clock selection signal to said first to third clock signal generating circuits, and the clock signal supplied to the CMOS circuit and the clock signal output from the external clock output terminal are selected by said clock selection signal.
- 12. A semiconductor integrated circuit device as defined in claim 7, wherein
a clock signal selection terminal is provided outside said CMOS circuit, and the clock signal supplied to the CMOS circuit and clock signal output from the external clock output terminal are selected by an external signal input to the clock signal selection terminal.
- 13. A semiconductor integrated circuit device as defined in claim 7, wherein:
a clock signal selection terminal is provided outside the CMOS circuit, a clock selection signal is output to the first to third clock signal generating circuits, and the clock signal supplied to the CMOS circuit and clock signal output from the external clock output terminal are selected by the clock selection signal and external signal input to the clock signal selection terminal.
- 14. A semiconductor integrated circuit device as defined in claim 7, said device comprising a timer circuit, wherein:
said timer circuit stops supply and output of the clock signal for a predetermined time when the frequency of a clock signal supplied to the CMOS circuit and a clock signal output from the external clock output terminal change, and said timer circuit stops supply and output of the clock signal for a predetermined time when the operating state of the CMOS circuit changes.
- 15. A semiconductor integrated circuit device, comprising:
a first clock signal generating circuit which generates a first clock signal, a CMOS circuit to which said first clock signal is supplied, a second clock signal generating circuit which generates a second clock signal using said first clock signal as a reference clock signal, and an external clock output terminal which outputs said second clock signal to the outside, wherein:
said semiconductor integrated circuit device has first to third states such that:
in said first state, both said first clock signal generating circuit and said second clock signal generating circuit operate, in said second state, said first clock signal generating circuit operates, and said second clock signal generating circuit does not operate, and in said third state, both said first clock signal generating circuit and said second clock signal generating circuit do not operate.
- 16. A semiconductor integrated circuit device as defined in claim 15, wherein, after receiving a reference clock signal:
the first clock generating circuit takes a longer time than the second clock generating circuit to generate an output clock signal which is phase-synchronized with the reference clock signal,
- 17. A semiconductor integrated circuit device as defined in claim 15, wherein:
said first clock signal generating circuit generates an output clock signal which is phase-synchronized with the reference clock signal and has a frequency which is a multiple or fraction of the frequency of the reference clock signal, and said second clock signal generating circuit generates an output clock signal which is phase-synchronized with the reference clock signal and has a frequency which is a fraction of the frequency of the reference clock signal.
- 18. A semiconductor integrated circuit device, comprising:
a first clock signal generating circuit which receives a reference clock and outputs a first clock signal, a second clock signal generating circuit which receives said reference clock and outputs a second clock signal, a selector which selects one of said first clock signal and said second clock signal, and a clock control circuit which specifies whether said first clock signal or said second clock signal should be selected by said selector.
- 19. A semiconductor integrated circuit device as defined in claim 18, wherein:
said first clock signal generating circuit generates said first clock signal which is phase-synchronized with the reference clock signal and has a frequency which is a multiple or fraction of the frequency of the reference clock signal, and said second clock signal generating circuit generates said second clock signal which is phase-synchronized with the reference clock signal and has a frequency which is a fraction of the frequency of the reference clock signal.
- 20. A semiconductor integrated circuit device as defined in claim 18, wherein:
said clock control circuit comprises a register for setting an operating state of said first clock signal generating circuit and an operating state of said second clock signal generating circuit, and said register is updatable.
Priority Claims (1)
Number |
Date |
Country |
Kind |
11-147664 |
May 1999 |
JP |
|
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application is a Continuation application of U.S. application Ser. No. 09/580,646, filed May 30, 2000, the subject matter of which is incorporated by reference herein.
Continuations (1)
|
Number |
Date |
Country |
Parent |
09580646 |
May 2000 |
US |
Child |
10322594 |
Dec 2002 |
US |