Number | Date | Country | Kind |
---|---|---|---|
56-211399 | Dec 1981 | JPX |
Number | Name | Date | Kind |
---|---|---|---|
4047163 | Choate et al. | Sep 1977 | |
4051460 | Yamada et al. | Sep 1977 | |
4281398 | McKenny et al. | Jul 1981 | |
4346459 | Sud et al. | Aug 1982 | |
4376300 | Tsang | Mar 1983 | |
4380066 | Spencer et al. | Apr 1983 | |
4422161 | Kressel et al. | Dec 1983 | |
4441170 | Folmsbee et al. | Apr 1984 | |
4446534 | Smith | May 1984 | |
4480199 | Varshney et al. | Oct 1984 |
Entry |
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IEEE International Solid-State Circuits Conference, "Memories and Redundancy Techniques", by K. D. Wise, ISSCC 81, Session VIII, Feb. 18, 1981, pp. 79-85. |
IBM Technical Disclosure Bulletin, "Maximized LSSD Test I/O Pin Usage", by W. P. Whitley, vol. 24, No. 2, Jul. 1981, pp. 1193-1194. |