Claims
- 1. A Semiconductor integrated circuit comprising:
a nonvolatile memory to store address information indicating a relationship between an address of a first memory space and an address of a second memory space; a plurality of functional modules each to has an address in the second memory space; and a bus control circuit, wherein the bus control circuit receives a first address in the first memory space and translates the first address into a second address in the second memory space using the address information and access is made to a functional module having the second address among the plurality of functional modules.
- 2. The semiconductor integrated circuit according to claim 1, further comprising:
a bus; and a switching circuit to control a connection between the plurality of functional modules and the bus, wherein:
the nonvolatile memory stores connect/disconnect information for the plurality of functional modules; and the switching circuit selects a functional module to be connected with the bus according to the connect/disconnect information.
- 3. The semiconductor integrated circuit according to claim 1, wherein the address information is stored in the nonvolatile memory when a probing test is conducted on the semiconductor integrated circuit.
- 4. The semiconductor integrated circuit according to claim 2, wherein the connect/disconnect information is stored in the nonvolatile memory when a probing test is conducted on the semiconductor integrated circuit.
Priority Claims (1)
Number |
Date |
Country |
Kind |
P2002-247969 |
Aug 2002 |
JP |
|
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application is related to U.S. application Ser. No. 10/173661 filed on Jun. 19, 2002, the disclosure of which is hereby incorporated by reference.