Claims
- 1. A semiconductor laser driving method, the method comprising the steps of:generating a driving current by modulating a D.C. current with a high-frequency current; and driving a semiconductor laser with the driving current; wherein said semiconductor laser is characterized by a curve representing relative intensity noise to average optical output, the curve having a plurality of peaks that correspond to jitter caused by modulating the D.C. current with the high-frequency current; and wherein said semiconductor laser is driven under a condition where the average optical output is offset from each of said peaks.
- 2. The semiconductor laser driving method of claim 1, wherein said semiconductor laser is an AlGaInP semiconductor laser.
- 3. The semiconductor laser driving method of claim 1, wherein said semiconductor laser has a quantum well active layer.
- 4. The semiconductor laser driving method of claim 1, wherein the step of generating the driving current comprises the step of configuring the high-frequency current to have a frequency, fm, in the range of fr>fm>fr/5 where fr is a predetermined relaxation oscillation frequency of the semiconductor laser when the average optical output of the semiconductor is lower than 10 mW.
- 5. The semiconductor laser driving method of claim 1, wherein the step of generating the driving current comprises the step of configuring the high-frequency current to have a rectangular waveform, the rectangular waveform having a pulse width, Wp, in the range of Td+1/fr>Wp>Td+2/fr where Td is a predetermined delay time in oscillation of said semiconductor laser and fr is a predetermined relaxation oscillation frequency of the semiconductor laser.
- 6. The semiconductor laser driving method of claim 1, wherein the step of generating the driving current comprises the step of configuring the high-frequency current to have a frequency, fm, in the range of fr>fm>fr/10 where fr is a predetermined relaxation oscillation frequency of the semiconductor laser when the average optical output of the semiconductor is greater than 10 mW.
Priority Claims (1)
Number |
Date |
Country |
Kind |
9-210690 |
Aug 1997 |
JP |
|
Parent Case Info
This application is a divisional of application Ser. No. 09/129,085, filed Aug. 5, 1998.
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