SEMICONDUCTOR-LASER ELEMENT

Information

  • Patent Application
  • 20230299560
  • Publication Number
    20230299560
  • Date Filed
    June 30, 2021
    3 years ago
  • Date Published
    September 21, 2023
    a year ago
Abstract
A semiconductor laser element includes: a resonator structure including a stacked structure in which a first compound semiconductor layer, an active layer, and a second compound semiconductor layer are stacked; and a first light reflective layer and a second light reflective layer which are provided at both ends along a resonance direction of the resonator structure. When an oscillation wavelength is set to λ, each of the first light reflective layer and the second light reflective layer includes a refractive index periodic structure including, in a stacked manner, a plurality of thin films each having an optical film thickness of k0 (λ/4). A phase shift layer is provided inside at least one light reflective layer of the first light reflective layer or the second light reflective layer.
Description
Claims
  • 1. A semiconductor laser element comprising: a resonator structure including a stacked structure in which a first compound semiconductor layer, an active layer, and a second compound semiconductor layer are stacked; anda first light reflective layer and a second light reflective layer which are provided at both ends along a resonance direction of the resonator structure, wherein, when an oscillation wavelength is set to λ0,the first light reflective layer includes a first refractive index periodic structure with a period having an optical film thickness of k10 (λ0/2) [where 0.9 ≤ k10 ≤ 1.1], the first refractive index periodic structure including, in a stacked manner, at least a plurality of first thin films each having an optical film thickness of k11 (λ0/4) [where 0.7 ≤ k11 ≤ 1.3] and a plurality of second thin films each having an optical film thickness of k12 (λ0/4) [where 0.7 ≤ k12 ≤ 1.3],the second light reflective layer includes a second refractive index periodic structure with a period having an optical film thickness of k20 (λ0/2) [where 0.9 ≤ k20 ≤ 1.1], the second refractive index periodic structure including, in a stacked manner, at least a plurality of first thin films each having an optical film thickness of k21 (λ0/4) [where 0.7 ≤ k21 ≤ 1.3] and a plurality of second thin films each having an optical film thickness of k22 (λ0/4) [where 0.7 ≤ k22 ≤ 1.3], anda phase shift layer is provided inside at least one light reflective layer of the first light reflective layer or the second light reflective layer.
  • 2. The semiconductor laser element according to claim 1, wherein the number of the phase shift layer is one or more and five or less.
  • 3. The semiconductor laser element according to claim 2, wherein the first thin film, the second thin film, or the first thin film and the second thin film are disposed between the phase shift layer and the phase shift layer.
  • 4. The semiconductor laser element according to claim 1, wherein the phase shift layer is not provided at an edge part of the refractive index periodic structure.
  • 5. The semiconductor laser element according to claim 1, wherein an optical film thickness of the phase shift layer is 0.1 times or more and 50 times or less of λ0.
  • 6. The semiconductor laser element according to claim 5, wherein a material configuring the phase shift layer is same as a material configuring the first thin film, or is same as a material configuring the second thin film.
  • 7. The semiconductor laser element according to claim 1, wherein an optical film thickness of the phase shift layer satisfies k3(λ0/4) (2r + 1) [where r is an integer of 100 or less, and 0.9 ≤ k3 ≤ 1.1].
  • 8. The semiconductor laser element according to claim 1, wherein the stacked structure includes, in a stacked manner, the first compound semiconductor layer having a first surface and a second surface opposed to the first surface,the active layer facing the second surface of the first compound semiconductor layer, andthe second compound semiconductor layer having a first surface facing the active layer and a second surface opposed to the first surface,the first light reflective layer is formed on a base part surface located on side of the first surface of the first compound semiconductor layer,the second light reflective layer is formed on side of the second surface of the second compound semiconductor layer, andthe semiconductor laser element includes a surface-emitting laser element.
  • 9. The semiconductor laser element according to claim 8, wherein the first light reflective layer functions as a concave mirror, andthe second light reflective layer has a flat shape.
  • 10. The semiconductor laser element according to claim 8, wherein a resonator length is 1 × 10-5 m or more.
  • 11. The semiconductor laser element according to claim 1, wherein the stacked structure includes, in a stacked manner, the first compound semiconductor layer having a first surface and a second surface opposed to the first surface,the active layer facing the second surface of the first compound semiconductor layer, andthe second compound semiconductor layer having a first surface facing the active layer and a second surface opposed to the first surface,the stacked structure is provided with a first edge surface that outputs a portion of laser light generated in the active layer and reflects a remainder, and a second edge surface that is opposed to the first edge surface and reflects the laser light generated in the active layer,the first edge surface is provided with the first light reflective layer, andthe second edge surface is provided with the second light reflective layer.
Priority Claims (1)
Number Date Country Kind
2020-124411 Jul 2020 JP national
PCT Information
Filing Document Filing Date Country Kind
PCT/JP2021/024690 6/30/2021 WO