Semiconductor probe pin

Information

  • Patent Grant
  • D1051865
  • Patent Number
    D1,051,865
  • Date Filed
    Friday, October 28, 2022
    2 years ago
  • Date Issued
    Tuesday, November 19, 2024
    10 days ago
  • Inventors
    • Ahn; Bum Mo
  • Original Assignees
  • Examiners
    • Tarcza; Rosemary K
    • Kumpf; Seth David
    Agents
    • JCIPRNET
  • US Classifications
    Field of Search
    • US
    • D13 110
    • D13 118
    • D13 123
    • D13 133
    • D13 146
    • D13 147
    • D13 149
    • D13 154
    • D13 173
    • D13 175
    • D13 182
    • D13 184
    • D13 199
    • D10 78
    • D10 80
    • CPC
    • H01L23/04
    • H01L23/055
    • H01L23/24
    • H01L23/48
    • H01L23/552
    • H01L25/18
    • H01L25/50
    • H01R12/585
    • H05K5/00
    • H05K5/02
    • H05K7/00
    • H05K7/14
    • H05K7/1427
    • H05K7/1435
  • International Classifications
    • 1303
    • Term of Grant
      15Years
Abstract
Description


FIG. 1 is a perspective view of a semiconductor probe pin showing my new design;



FIG. 2 is a front view thereof;



FIG. 3 is a rear view thereof;



FIG. 4 is a left side view thereof;



FIG. 5 is a right side view thereof;



FIG. 6 is an enlarged top view thereof;



FIG. 7 is an enlarged bottom view thereof; and,



FIG. 8 is an enlarged partial view indicated in FIG. 4 thereof.


The dot-dash broken line indicates the boundary of the enlarged partial view and forms no part of the claimed design.


Claims
  • The ornamental design for a semiconductor probe pin as shown and described.
Priority Claims (1)
Number Date Country Kind
30-2022-0017283 Apr 2022 KR national
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Number Date Country
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Non-Patent Literature Citations (1)
Entry
“Notice of Allowance of Taiwan Counterpart Application”, issued on Jul. 31, 2023, with English translation thereof, pp. 1-6.