The broken line showing of the semiconductor substrate is for the purpose of illustrating environmental structure and forms no part of the claimed design.
The broken line showing of the semiconductor substrate is for the purpose of illustrating environmental structure and forms no part of the claimed design.
Number | Date | Country | Kind |
---|---|---|---|
D2010-019920 | Aug 2010 | JP | national |
Number | Name | Date | Kind |
---|---|---|---|
D217594 | Bardell | May 1970 | S |
D262962 | Strumpell | Feb 1982 | S |
4630093 | Yamaguchi et al. | Dec 1986 | A |
5182233 | Inoue | Jan 1993 | A |
6927416 | Arai et al. | Aug 2005 | B2 |
7112952 | Arai et al. | Sep 2006 | B2 |
7205639 | Hierlemann et al. | Apr 2007 | B2 |
7476575 | Tsurume et al. | Jan 2009 | B2 |
D589473 | Takamoto et al. | Mar 2009 | S |
D614593 | Lee et al. | Apr 2010 | S |
7705430 | Sekiya | Apr 2010 | B2 |
D638382 | Kuzuoka | May 2011 | S |
20050106839 | Shimoda et al. | May 2005 | A1 |
20050287846 | Dozen et al. | Dec 2005 | A1 |
20060038182 | Rogers et al. | Feb 2006 | A1 |
20060091402 | Shiomi et al. | May 2006 | A1 |
20070082508 | Chiang et al. | Apr 2007 | A1 |
20090011598 | Nagaya et al. | Jan 2009 | A1 |
20100176403 | Sasaki et al. | Jul 2010 | A1 |
20110111593 | Kanno | May 2011 | A1 |
Number | Date | Country |
---|---|---|
8-32038 | Feb 1996 | JP |
2003-68592 | Mar 2003 | JP |
2005-260154 | Sep 2005 | JP |