Semiconductor testing machine

Abstract

Description

FIG. 1 is a front, top and right side perspective view of a semiconductor testing machine showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a right side elevational view thereof; and,

FIG. 7 is a left side elevational view thereof.

Claims

The ornamental design for a semiconductor testing machine, as shown.