Embodiments of the invention are represented in the drawings. In the accompanying drawings:
a and 1b show a view of the symbolism of parameters used and the directions of reference;
a to 2b are schematic views of the components of the sensor arrangement of the invention, and
a to 3c are schematic views of the integration of the sensor arrangement into a packing.
a illustrates the symbols for sensors integrated in the sensor arrangement, which are used to explain the invention. Each sensor is shown as an arrow in combination with a parameter identification code. The arrow indicates the direction of measurement of the respective sensor. The arrow abstracts the presence of an associated transducer, which is realized e.g. in silicon by means of etching technology. Etching technologies of this type for different systems are known in the prior art. In particular, a linear acceleration sensor LA is represented. A positive sign implies in this case acceleration in the direction of the arrow. A yaw rate sensor AT is represented by a circle about an arrow, and the direction of rotation is clockwise in the direction of the arrow. This corresponds to the so-called ‘right-hand rule’, according to which the fingers of the right hand indicate the direction of rotation when the thumb is pointing in the direction of arrow. A yaw acceleration sensor AA is represented by two circles about an arrow, and the yaw acceleration is clockwise about the direction of the arrow.
b illustrates the directional characteristics explained with respect to
a to 2d represent the components of the sensor arrangement. The represented structures relate to embodiments based on micromechanical systems being made on the basis of silicon. Techniques of this type are known to one skilled in the art and can be adapted so as to conform to the respectively prevailing case of application of the invention.
a shows a silicon chip 4 with an integrated structure of yaw rate sensor 5, linear acceleration sensor 6, yaw acceleration sensor 7, and linear acceleration sensor 8. Surfaces 5a, 6a, 7a, 8a symbolize associated transducer chip surfaces. A surface 4a symbolizes a co-integrated electronic circuit for operation or pre-stage operation of the transducers 5, 6, 7. In a favorable case of application, this component is employed as a cased inertial analyzer for an ESP application combined with a rollover protection. For this purpose, the chip plane is aligned in parallel to the vehicle plane or the earth's surface. The direction of measurement of the sensors 7, 8 is identical with the driving direction of a vehicle into which the sensor arrangement is mounted. The inertial analyzer detects—in relation to the vehicle—the yaw rate, the roll acceleration, the longitudinal acceleration, and the lateral acceleration. This embodiment represents a favorable combination of known sensors with a yaw acceleration sensor 7.
b shows a diagrammatic view of a frequently required, reduced embodiment of the inertial analyzer of
c shows a component with a chip 13, a linear accelerator sensor 14, a yaw acceleration sensor 15, and a yaw rate sensor 16. The directions of measurement of all three sensors 14, 15, 16 are realized corresponding to the definition ‘out of plane’, which has been described hereinabove.
d shows a component with a chip 17, which comprises a linear accelerator sensor 18, a yaw rate sensor 19, and a yaw acceleration sensor 20. The directions of measurement of all three sensors are realized corresponding to the definition ‘in plane’, which has been described hereinabove.
In a possible embodiment of the invention, it is arranged that a chip 13 and two chips 17 are combined with each other in such a manner that an inertial analyzer develops which measures in all three directions in space the yaw rate, the linear acceleration, and the yaw acceleration in addition. The three chips are aligned ‘in plane’ for this purpose. In this arrangement, the two chips 17 rotate at a right angle relative to each other in plane so that their sensorial directions of measurement are aligned normal to each other and orthogonal to the directions of measurement of the sensors on the chip 13.
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Number | Date | Country | Kind |
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10 2004 012 686.0 | Mar 2004 | DE | national |
10 2004 012 688.7 | Mar 2004 | DE | national |
This application is the U.S. national phase application of PCT International Application No. PCT/EP2005/051213, filed Mar. 16, 2005, which claims priority to German Patent Application No. DE 10 2004 012 686.0, filed Mar. 16, 2004 and German Patent Application No. DE 10 2004 012 688.7, filed Mar. 16, 2004.
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/EP05/51213 | 3/16/2005 | WO | 00 | 6/6/2007 |