Sensor array, method for manufacturing sensor array, and ultrasonic diagnostic apparatus using the same

Information

  • Patent Grant
  • 6603240
  • Patent Number
    6,603,240
  • Date Filed
    Tuesday, September 26, 2000
    24 years ago
  • Date Issued
    Tuesday, August 5, 2003
    21 years ago
Abstract
A highly sensitive sensor array can be easily manufactured. An ultrasonic probe as the sensor array used in an ultrasonic diagnostic apparatus includes a substrate formed of a backing member. On a main surface of the substrate, a plurality of piezoelectric oscillators is fixed in a matrix form. Each of the piezoelectric oscillators includes a plurality of laminated piezoelectric layers. Between the piezoelectric layers, inner electrodes are formed. On each end face of the piezoelectric layers, an outer electrode is formed. The piezoelectric oscillators are bonded onto the substrate by adhesive in such a manner that the plurality of piezoelectric layers is laminated in a direction parallel to the main surface of the substrate. On the plurality of piezoelectric oscillators, an acoustic matching layer is formed, and on the acoustic matching layer, an acoustic lens is formed.
Description




BACKGROUND OF THE INVENTION




1. Field of the Invention




The present invention relates to sensor arrays, methods for manufacturing the sensor arrays, and ultrasonic diagnostic apparatuses incorporating the same. More particularly, the invention relates to sensor arrays such as ultrasonic probes used in ultrasonic diagnostic apparatuses, ultrasonic microscopes, metal flaw detecting apparatuses, and the like.




2. Description of the Related Art




Concerning the background of the present invention, an ultrasonic probe used in a conventional ultrasonic diagnostic apparatus will be described. For example, there is an ultrasonic probe disclosed in IEEE Transactions on Utltrasonics, Ferroelectrics, and Frequency Control, Vol. 44, No. 2, March 1997 Hybrid Multi/Single Layer Array Transducers for Increased Signal-to-Noise Ratio.





FIG. 7

is a perspective view showing the main part of an ultrasonic probe used in the conventional ultrasonic diagnostic apparatus.

FIG. 8

is a perspective view showing a piezoelectric oscillator used in the ultrasonic probe. An ultrasonic probe


1


shown in

FIG. 7

includes a substrate


2


formed of an acoustic absorber regarded as a backing member. A plurality of piezoelectric oscillators


3


is fixed on one main surface of the substrate


2


in a matrix form.




As shown in

FIG. 8

, the piezoelectric oscillators


3


include a plurality of laminated piezoelectric layers


4


. Inner electrodes


5


are formed between the piezoelectric layers


4


. An outer electrode


6


is formed on each of the top and bottom surfaces of the laminated piezoelectric layers


4


. In addition, on both ends of the laminated piezoelectric layers


4


, via-holes


7


are formed. Connecting electrodes


8


are formed inside the via-holes


7


. Every other layer of the laminated piezoelectric layers


4


is polarized in a reverse thickness direction. The piezoelectric oscillators


3


are bonded onto one main surface of the substrate


2


by adhesive in such a manner that the main surfaces of the piezoelectric layers


4


are parallel to the main surface of the substrate


2


.




Furthermore, on the plurality of piezoelectric oscillators


3


, an acoustic matching layer


9


is formed to obtain acoustic matching with a human body. On the acoustic matching layer


9


, an acoustic lens


10


is formed to converge ultrasonic beams.




In the piezoelectric oscillators


3


used in the above ultrasonic probe


1


, the inner electrodes


5


are extracted by the via-holes


7


and the like. However, alternatively, as the structure and method for extracting the inner electrodes, there is a structure and method for extracting the inner electrodes from side surfaces of the piezoelectric oscillators


3


, as usually seen in multi-layer capacitors and the like.




Since each of the piezoelectric oscillators


3


used in the above ultrasonic probe


1


shown in

FIG. 7

has a multi-layer structure, good functionality and high-resolution capability can be achieved, so that high sensitivity can be obtained. When the piezoelectric oscillators


3


are manufactured, via-holes need to be formed with high processing precision and electrodes need to be formed with high printing precision. As a result, due to shrinkage occurring when a member is burned, it is difficult to obtain linearity between the via-holes, and it is also difficult to cut the burned member in a matrix form. In addition, after cutting, outer electrodes easily fall off. Therefore, in order to manufacture the piezoelectric oscillators


3


, extremely high manufacturing precision is necessary. Since there are many problems in terms of manufacturing, variations in characteristics easily occur.




Similarly, when the inner electrodes


5


of the piezoelectric oscillators


3


are extracted from the side surfaces in the ultrasonic probe


1


, a high processing precision is required in manufacturing.




SUMMARY OF THE INVENTION




Accordingly, it is an object of the present invention to provide a sensor array that is highly sensitive and capable of being easily manufactured.




It is another object of the present invention to provide a method for manufacturing the above sensor array.




In addition, it is another object of the present invention to provide an ultrasonic diagnostic apparatus using the above sensor array.




The present invention provides a sensor array including a substrate and a plurality of piezoelectric oscillators fixed on a main surface of the substrate in a matrix form. Each of the plurality of piezoelectric oscillators includes a plurality of piezoelectric layers laminated in a direction parallel to the main surface of the substrate, inner electrodes disposed between the plurality of piezoelectric layers, and outer electrodes formed on end faces of the plurality of piezoelectric layers.




The present invention provides a method for manufacturing the above sensor array. The method includes the step of forming a multi-layer structure in which a plurality of piezoelectric layers and a plurality of inner electrodes are laminated, the step of forming a motherboard by cutting the multi-layer structure in the laminated direction, the step of forming outer electrodes on both main surfaces of the motherboard, the step of fixing the motherboard on one main surface of a substrate, and the step of cutting the motherboard to yield the plurality of piezoelectric oscillators.




The present invention provides an ultrasonic diagnostic apparatus including an ultrasonic probe, wherein the ultrasonic probe includes the above sensor array.




In the sensor array according to the present invention, since the piezoelectric oscillators having the multi-layer structure are used, high sensitivity can be obtained.




In addition, as described above, this sensor array can be manufactured by forming the multi-layer structure in which the plurality of piezoelectric layers and the plurality of inner electrodes are laminated, forming the motherboard by cutting the multi-layer structure in the laminated direction, forming the outer electrodes on the main surfaces of the motherboard, fixing the motherboard on one of the main surfaces of the substrate, and cutting the motherboard into the plurality of piezoelectric oscillators. As a result, when the motherboard is fixed on the substrate, since the outer electrodes are formed on the entire main surfaces of the motherboard, no high precision for determining positions is necessary. Thus, this method permits manufacturing of the sensor array to be facilitated.











In addition to the above-described objects of the present invention, other objects, characteristics, and advantages thereof will be clarified by the detailed description of embodiments of the present invention with reference to the drawings.




BRIEF DESCRIPTION OF THE DRAWINGS





FIG. 1

is a block diagram of a ultrasonic diagnostic apparatus according to an embodiment of the present invention;





FIG. 2

is a perspective view showing the main part of an ultrasonic probe used in the ultrasonic diagnostic apparatus shown in

FIG. 1

;





FIG. 3

is a perspective view showing a piezoelectric oscillator used in the ultrasonic probe shown in

FIG. 2

;





FIG. 4

is an illustration showing a first step of a procedure for manufacturing the ultrasonic probe shown in

FIG. 2

;





FIG. 5

is an illustration showing a second step of the procedure for manufacturing the ultrasonic probe shown in

FIG. 2

;





FIG. 6

is an illustration showing a third step of the procedure for manufacturing the ultrasonic probe shown in

FIG. 2

;





FIG. 7

is a perspective view showing the main part of an ultrasonic probe used in a conventional ultrasonic diagnostic apparatus; and





FIG. 8

is a perspective view showing a piezoelectric oscillator used in the ultrasonic probe shown in FIG.


7


.











DESCRIPTION OF THE PREFERRED EMBODIMENTS





FIG. 1

is a block diagram of an ultrasonic diagnostic apparatus according to an embodiment of the present invention.

FIG. 2

is a perspective view showing the main part of an ultrasonic probe used in the ultrasonic diagnostic apparatus shown in FIG.


1


.

FIG. 3

is a perspective view showing a piezoelectric oscillator used in the ultrasonic probe. An ultrasonic diagnostic apparatus


20


shown in

FIG. 1

includes an ultrasonic probe


22


.




The ultrasonic probe


22


, as shown in

FIG. 2

, includes a substrate


24


formed of an acoustic absorber, which is regarded as a backing member. On one of the main surfaces of the substrate


24


, a plurality of piezoelectric oscillators


26


is fixed in a matrix form.

FIG. 2

shows the plurality of piezoelectric oscillators


26


arranged in four lines. However, actually, the piezoelectric oscillators


26


are arranged in many more lines.




As shown in

FIG. 3

, the piezoelectric oscillators


26


include a plurality of laminated piezoelectric layers


28


formed of a material having a relative permittivity of substantially 2000. Between the piezoelectric layers


28


, inner electrodes


30


are formed. In this case, the inner electrodes


30


are alternately formed from one end of the piezoelectric layer


28


to the center thereof and from the other end of the piezoelectric layer


28


to the center thereof. Furthermore, on both end faces of the piezoelectric layers


28


, outer electrodes


32


are formed. The one-side outer electrode


32


is connected to the every other inner electrode


30


, and the other-side outer electrode


32


is connected to the remaining every other inner electrode


30


. Additionally, these piezoelectric layers


28


are polarized alternately in a reverse thickness direction. Regarding each of the piezoelectric oscillators


26


, an outer dimension thereof, that is, edges of the outer electrode


32


is set to be 250 μm, respectively, and the thickness thereof, that is, the distance between the outer electrodes


32


is set to be preferably more than or equal to two times the outer dimension in order to prevent coupling between a length oscillation (d31 mode) as a main mode and other unnecessary oscillations. For example, the thickness of the piezoelectric oscillator


26


is preferably set to be 500 μm. Furthermore, in each of the piezoelectric oscillators


26


, five to seven piezoelectric layers


28


are preferably formed due to the balance between impedance matching and wave-receiving sensitivity. For example, seven piezoelectric layers


28


may be formed. Then, each of the piezoelectric oscillators


26


is bonded onto the substrate


24


by adhesive such that the plurality of piezoelectric layers


28


is laminated in a direction parallel to the main surface of the substrate


24


, that is, the laminating direction of the piezoelectric layers is parallel to the main surface of the substrate.




In the above piezoelectric oscillators


26


, the inner electrodes


30


are alternately connected to the opposite outer electrode


32


. However, the structure of the piezoelectric oscillator


26


is not limited to this case. For example, the inner electrodes


30


may not be connected to the outer electrodes


32


.




Furthermore, among the plurality of piezoelectric oscillators


26


, wave-transmitting oscillators and wave-receiving oscillators have different optimum values. Thus, the two types of oscillators may have different configurations.




Additionally, on the plurality of piezoelectric oscillators


26


, an acoustic matching layer


34


is provided to obtain an acoustic matching with human bodies. On the acoustic matching layer


34


, an acoustic lens


36


is provided to converge ultrasonic beams.




The outer electrodes


32


of the piezoelectric oscillators


26


in the ultrasonic probe


22


are connected to a transmission/reception unit


40


via pattern electrodes (not shown) disposed on the acoustic matching layer


34


and conductors (not shown) disposed inside via-holes penetrating the substrate


24


. The transmission/reception unit


40


serves as a unit for driving the ultrasonic probe


22


and receiving ultrasonic waves. The transmission/reception unit


40


supplies a driving signal to the ultrasonic probe


22


to transmit an ultrasonic wave into a subject A. In addition, the transmission/reception unit


40


receives an echo signal from the subject A received by the ultrasonic probe


22


.




The transmission/reception unit


40


is connected to a B-mode processing unit


42


and a Doppler-processing unit


44


. Thus, an echo-reception signal for every sound ray, which is output from the transmission/reception unit


40


, is input to the B-mode processing unit


42


and the Doppler-processing unit


44


.




The B-mode processing unit


42


and the Doppler-processing unit


44


are connected to an image-processing unit


46


. The B-mode processing unit


42


, the Doppler-processing unit


44


, and the image-processing unit


46


serve as image-generating units. The image-processing unit


46


forms a B-mode image and a Doppler image based on data input from the B-mode processing unit


42


and the Doppler-processing unit


44


, respectively.




The image-processing unit


46


is connected to a display


48


. The display


48


receives an image signal from the image-processing unit


46


to display an image based on the received image signal.




The above-described transmission/reception unit


40


, the B-mode processing unit


42


, the Doppler-processing unit


44


, the image-processing unit


46


, and the display


48


are connected to a control unit


50


. The control unit


50


supplies a control signal to each of these units to control the operations thereof. In addition, various notice signals from the above units controlled by the control unit


50


are input to the control unit


50


. Under the control performed by the control unit


50


, B-mode operations and Doppler-mode operations are performed.




The control unit


50


is connected to an operational unit


52


. An operator operates the operational unit


52


to input desirable commands and information to the control unit


50


. The operational unit


52


is constituted of an operational panel having a keyboard and other operations tools.




Next, a description will be given of an example of the method for manufacturing the ultrasonic probe


22


used in the ultrasonic diagnostic apparatus


20


.




First, as shown in

FIG. 4

, a multi-layer structure


29


is formed by laminating a plurality of piezoelectric layers


28


and a plurality of inner electrodes


30


. In this case, the multi-layered structure


29


is formed by simultaneously firing both the piezoelectric layers


28


and the inner electrodes


30


. Furthermore, the positional arrangement of the inner electrodes


30


can be freely changed by considering cutting widths for later cutting, widths necessary for piezoelectric oscillators


26


, and the distance between the piezoelectric oscillators


26


after cutting. In

FIG. 4

, the piezoelectric layers


28


and the inner electrodes


30


are shown in a simplified manner.




Next, the multi-layer structure


29


is cut in the laminated direction as shown in

FIG. 4

, and a motherboard


31


is formed as shown in FIG.


5


. In this embodiment, the multi-layer structure


29


is cut into the motherboard


31


after firing the multi-layer structure


29


. However, before firing the multi-layer structure


29


, the multi-layer structure


29


may be cut into the motherboard


31


. When the motherboard


31


is cut away from the multi-layer structure


29


before firing the multi-layer structure


29


, the motherboard


31


can be fired after being cut.




Then, outer electrodes


32


are formed on both main surfaces of the motherboard


31


.




A DC voltage is applied between the two outer electrodes


32


, whereby the plurality of piezoelectric layers


28


is polarized alternately in a reverse thickness direction. Further, in the present invention, for example, the piezoelectric layers


28


may be polarized at the intervals of two layers in the reverse thickness direction. In other words, the present invention is not restricted to the above arrangement in which the piezoelectric layers


28


are polarized alternately in the reverse thickness direction.




The motherboard


31


is bonded onto one of main surfaces of the substrate


24


. In this case, no high precision for a position at which the motherboard


31


is bonded onto the substrate


24


is necessary, and any deviation leads to no serious problems.




Then, as shown in

FIG. 5

, the motherboard


31


is cut in a matrix form by a dicing method or the like to obtain the plurality of piezoelectric oscillators


26


. In this case, no high precision for cutting the motherboard


31


is required, and any deviation leads to no serious problems. In

FIG. 6

, the plurality of piezoelectric oscillators


26


is arranged in five rows and six columns. However, other arrangements may be made in different numbers of rows and columns.




After that, an acoustic matching layer


34


is formed on the plurality of piezoelectric oscillators


26


, and an acoustic lens


36


is formed on the acoustic matching layer


34


.




In the two-dimensional ultrasonic probe


22


of the ultrasonic diagnostic apparatus


20


adapted to three-dimensional imagining and high-resolution performance, the piezoelectric oscillators


26


having the multi-layer structures are used. As a result, the same impedance matching and wave-receiving sensitivity as those obtained in the conventional ultrasonic probe


1


shown in

FIG. 7

can be obtained, whereby high performance can be achieved.




Furthermore, in the ultrasonic diagnostic apparatus


20


, with the use of the piezoelectric oscillators


26


having the multi-layer structures, no complicated procedures and no high processing precision concerning formation of via-holes and cutting in accordance with the via-holes are required. Therefore, the manufacturing process can be simplified, and when the piezoelectric oscillators


26


are manufactured, no high processing precision is necessary. As a result, in the ultrasonic probe


22


shown in

FIG. 2

, characteristic variations between the piezoelectric oscillators


26


can be reduced and high-resolution performance can thereby be obtained.




In addition, in the ultrasonic probe


1


shown in

FIG. 7

, the piezoelectric oscillators


3


shown in

FIG. 8

are arranged on the substrate


2


in the matrix form. When a large number of piezoelectric oscillators


3


are arranged on the substrate


2


, as in the case of the above manufacturing method described with reference to

FIGS. 4

to


6


, usually, the piezoelectric oscillators are obtained by cutting away from a motherboard or a multi-layer structure on which piezoelectric oscillators


3


are arranged in a matrix form.




However, in the case of piezoelectric oscillators


3


shown in

FIG. 8

, due to variations in the positions of the via-holes


7


, dicing in accordance with the positions of the via-holes


7


is required. In addition, the distance between the piezoelectric oscillators


3


after cutting cannot be adjusted.




In contrast, in the piezoelectric oscillators


26


used in the ultrasonic diagnostic apparatus


20


, with the use of the above manufacturing method, the complicated procedures and high dimensional precision for forming the via-holes are not required. Moreover, this method can solve problems occurring when dicing is performed.




In addition, in the ultrasonic probe


22


, it is possible to obtain a large number of piezoelectric oscillators


26


from the large-sized multi-layer structure


29


as shown in FIG.


4


. Moreover, when the piezoelectric oscillators


26


are obtained by cutting, it is not necessary to cut in accordance with the via-holes. Furthermore, when the multi-layer structure


29


shown in

FIG. 4

is formed, cutting widths, the widths of the piezoelectric oscillators


26


, and the distance between the piezoelectric oscillators


26


after cutting, which are supposed to be obtained in the later procedures, can be considered so that the distance between the inner electrodes


30


can be freely determined. As a result, advantages in cost reduction and freedom in designing can be increased.




In the above ultrasonic diagnostic apparatus


20


, the piezoelectric oscillators


26


having specified dimensions are used in the ultrasonic probe


22


. However, the piezoelectric oscillators


26


used in the ultrasonic probe


22


may have other dimensions.




Furthermore, although the ultrasonic diagnostic apparatus


20


includes the transmission/reception unit


40


and the other units in addition to the ultrasonic probe


22


, these units may be replaced with other units.




The present invention is not limited to sensor arrays such as ultrasonic probes used in ultrasonic diagnostic apparatuses. For example, the invention can be applied to sensor arrays used in supersonic microscopes and metal-flaw detecting apparatuses.




As described above, the present invention provides a sensor array that is highly sensitive and capable of being easily manufactured. In addition, the invention provides the method for manufacturing the above sensor array and the ultrasonic diagnostic apparatus incorporating the sensor array.




While the present invention has been particularly shown and described with reference to preferred embodiments thereof, it will be understood by those skilled in the art that the foregoing and other changes in form and details can be made therein without departing from the spirit and scope of the invention.



Claims
  • 1. A sensor array comprising:a substrate; and a plurality of piezoelectric oscillators fixed on a main surface of the substrate in a matrix form, the main surface of the substrate extending in a plane defined by transverse x and y directions, each of the piezoelectric oscillators comprising: a plurality of piezoelectric layers which extend in a z-direction transverse to the plane defined by the x and y directions and which are laminated in the x or y direction of the main surface of the substrate; inner electrodes disposed between the plurality of piezoelectric layers; and outer electrodes formed on end faces of the plurality of piezoelectric layers.
  • 2. A method for manufacturing the sensor array according to claim 1, comprising the steps of:forming a multi-layer structure in which a plurality of piezoelectric layers and a plurality of inner electrodes are laminated; forming a motherboard by cutting the multi-layer structure in the laminated direction; forming outer electrodes on both main surfaces of the motherboard; fixing the motherboard on a main surface of a substrate; and cutting the motherboard to yield the plurality of piezoelectric oscillators.
  • 3. An ultrasonic diagnostic apparatus comprising an ultrasonic probe, wherein the ultrasonic probe comprises the sensor array according to claim 1.
Priority Claims (1)
Number Date Country Kind
11-273078 Sep 1999 JP
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