The present invention relates to a sensor output circuit that outputs a pulse waveform to an output signal line (an output circuit of a sensor device), and more particularly to a sensor output circuit that can reduce radio wave radiation from the output signal line.
As an example of a method for reducing noise in an output circuit that outputs a pulse waveform to an output signal line, there is a technique described in PTL 1. In PTL 1, noise is reduced by converting the output current into a constant current and converting the output current into a differential signal.
PTL 1: JP 7-249975 A
In PTL 1, noise is reduced by converting an output current into a constant current and converting the output current into a differential signal. In addition, since PTL 1 intends signal transmission inside an LSI, it is possible to use a differential signal. The differential signal has an excellent effect on both noise effects and noise radiation. However, the output signal line is several meters or more like a sensor output circuit, and it is difficult to use a differential signal in an output circuit with strict cost restrictions, and signal transmission is performed by a single-line signal. For this reason, in the sensor output circuit, it is necessary to limit the output current with higher precision in order to suppress radio wave radiation. That is, in the above-described related art, consideration for limiting the output current with high accuracy is lacking.
The invention has been made in view of the above circumstances, and an object of the invention is to provide a sensor output circuit that reduces radio wave radiation even in signal transmission using the single-line signal.
In order to solve the above problem, in the invention, an output terminal for outputting a pulse signal is provided, a first MOS transistor and a second MOS transistor are connected to the output terminal in series, and the first MOS transistor is driven by a constant current, the second MOS transistor operates to maintain the drain terminal of the first MOS transistor at a constant voltage.
According to this invention, it is possible to provide a sensor output circuit which reduces a radio wave radiation even in signal transmission using a single-line signal.
Hereinafter, embodiments of the invention will be described with reference to the accompanying drawings. Further, the embodiments can be combined as long as there is no contradiction.
First, a sensor output circuit according to a first embodiment of the invention will be described with reference to
A sensor output circuit 1 of this embodiment includes a pulse signal Vin that changes according to a physical quantity to be measured, MOS transistors 3 and 5 that perform on/off operations according to the pulse signal Vin, a constant current source 2 that generates a constant current, a MOS transistor 4 which generates a gate voltage of a MOS transistor 7, MOS transistors 6 and 8 which form a current mirror circuit, and the MOS transistor 7 which works to maintain a drain voltage of the MOS transistor 8 at a constant voltage, and the output terminal 9 which is driven by the MOS transistors 7 and 8 connected in series. In addition, an output signal from the sensor output circuit 1 is transmitted to a control circuit 11 via an output signal line 10. The control circuit 11 includes a pull-up resistor 12, a capacitor 14, and an input gate circuit 13.
Here, the characteristics of the MOS transistor 8 are basically driven by a constant current as illustrated in
In particular, as the process becomes finer, the amount of increase in the drain current increases. In recent years, even in a circuit mainly configured by an analog circuit such as a sensor output circuit, the miniaturization of a sensor signal processing unit integrated on the same chip has been advanced. This characteristic of the increasing drain current causes radio wave radiation to increase as described later.
Therefore, in this embodiment, the MOS transistor 7 is disposed between the output terminal and the MOS transistor 8 so that the drain voltage of the MOS transistor 8 becomes constant. The gate voltage of the MOS transistor 7 is determined by the current value of the constant current source 2 and the diode-connected MOS transistors 4 and 6, and is kept substantially constant. The source voltage of the MOS transistor 7 (the drain voltage of the MOS transistor 8) is kept lower than the gate voltage of the MOS transistor 7 by a threshold value of the MOS transistor 7. As a result, as illustrated in
Next, the operation of the sensor output circuit 1 will be described with reference to
At this time, when the MOS transistor 7 is not provided, a large whisker-like current flowing to the output terminal 9 is generated as illustrated in
In addition, in this embodiment, a breakdown voltage of the output terminal 9 can be improved by adding the MOS transistor 7. In the sensor output circuit 1, it is necessary to prevent the sensor output circuit 1 from being destroyed even if static electricity or overvoltage is applied to the output terminal 9, and it is necessary to improve the breakdown voltage of the output terminal 9.
Hereinafter, the reason why the breakdown voltage of the output terminal 9 is improved in this embodiment will be described. First, in a case where the pulse signal Vin is at a high level and the MOS transistors 7 and 8 are turned off, the breakdown voltage of the output terminal 9 is the sum of the source=drain breakdown voltages of the MOS transistors 7 and 8. That is, by adding the MOS transistor 7, the breakdown voltage of the output terminal 9 can be improved by an amount corresponding to the source=drain breakdown voltage of the MOS transistor 7.
Next, in a case where the pulse signal Vin is at a low level and the MOS transistors 7 and 8 are turned on, the breakdown voltage of the output terminal 9 is determined by the product of the current flowing through the output terminal 9 and the voltage of the output terminal 9. Therefore, in this embodiment in which the current at the output terminal 9 can be kept constant regardless of the voltage at the output terminal 9, breakdown can be prevented up to a higher voltage. That is, a higher breakdown voltage can be obtained.
Next, the application of a high breakdown voltage MOS transistor to the first embodiment will be described.
The high breakdown voltage MOS transistor that can be used in the fine process has a drain voltage dependency of the drain current worse than the characteristics of the MOS transistor in the fine process illustrated in
Next, a driving method will be described in the first embodiment. The circuit configuration of this embodiment can be regarded as a current mirror circuit configured by the MOS transistors 4, 6, 7, and 8. The current on the source side of this current mirror circuit is controlled by using the MOS transistors 3 and 5. By controlling the current on the source side of the current mirror circuit in this manner, the amplitude of the voltage for driving the gate of the MOS transistor 7 can be reduced. The signal for driving the gate of the MOS transistor 7 leaks to the output terminal 9 via the capacitance between the gate and the drain of the MOS transistor 7, and causes radio wave radiation from the output signal line 10. That is, by controlling the current on the source side of the current mirror circuit configured by the MOS transistors 4, 6, 7, and 8 using the MOS transistors 3 and 5, the current between the gate and the drain of the MOS transistor 7 is controlled. Radio waves that leak to the output terminal 9 and are radiated from the output signal line 10 can be reduced.
A second embodiment of the invention will be described. The description of the same correspondence as in the first embodiment will be omitted.
In this embodiment, the MOS transistor 8 is a low breakdown voltage MOS transistor, and the MOS transistor 7 is a high breakdown voltage MOS transistor. Since the drain voltage dependency of the drain current of the MOS transistor 8 can be reduced, and the drain voltage of the MOS transistor 8 can be kept constant by the MOS transistor 7, the dependency of the current of the output terminal 9 on the voltage of the output terminal 9 is good.
This is because the drain voltage dependency of the drain current of the MOS transistor is better in the low breakdown voltage MOS than in the high breakdown voltage MOS transistor, and the effect of the MOS transistor 7 that keeps the drain voltage of the MOS transistor 8 constant is not different in between a high breakdown voltage MOS transistor and the low breakdown voltage MOS transistor. In addition, as for the chip size, the size of the high breakdown voltage MOS transistor for flowing the same drain current is larger than the size required for the low breakdown voltage MOS transistor. For this reason, it is possible to reduce the chip size by using the MOS transistor 7 as a high breakdown voltage MOS transistor and the MOS transistor 8 as a low breakdown voltage MOS transistor. In other words, the breakdown voltage of the output terminal 9 can be improved by increasing the breakdown voltage between the drain and source of the MOS transistor 7 compared to the breakdown voltage between the drain and source of the MOS transistor 8, the dependence of the voltage of the output terminal 9 on the current of the output terminal 9 can be improved, and the chip size can be reduced.
Next, a sensor output circuit according to a third embodiment of the invention will be described with reference to
A sensor output circuit 1 of this embodiment is basically the same as the sensor output circuit 1 of the first embodiment, except that a capacitor 15 is added. The addition of the capacitor 15 makes the change in the gate voltage of the MOS transistors 7 and 8 gentle. This is because the capacitor 15 is charged by the constant current source 2, and the change speed of the current flowing through the MOS transistors 4 and 6 is reduced by the capacitance value of the capacitor 15 and the current of the constant current source 2. As a result, as illustrated in
Next, a sensor output circuit according to a fourth embodiment of the invention will be described with reference to
A sensor output circuit 1 of this embodiment is basically the same as the sensor output circuit 1 of the first embodiment, except that the drive circuits for the MOS transistor 7 and the MOS transistor 8 are separately provided. The drive circuit of the MOS transistor 7 includes MOS transistors 17 and 18 that perform on/off operations in response to the pulse signal Vin, a constant current source 16 that generates a constant current, and a MOS transistor 19 that generates a gate voltage of the MOS transistor 7. The drive circuit of the MOS transistor 8 includes MOS transistors 21 and 22 that perform on/off operations in response to the pulse signal Vin, a constant current source 20 that generates a constant current, and a MOS transistor 23 that forms a current mirror circuit with the MOS transistor 8.
The configuration of the third embodiment allows the gate voltage of the MOS transistor 7 to be lower than that of the first embodiment. For this reason, the low level of the output terminal 9 can be made to be a lower voltage.
Next, a sensor output circuit according to a fifth embodiment of the invention will be described with reference to
A sensor output circuit 1 of this embodiment is basically the same as the sensor output circuit 1 of the fourth embodiment, except that the drive circuit of the MOS transistor 7 is changed to a DA converter 24, and the output voltage of the DA converter 24 is controlled by the signal Din to control the gate voltage of the MOS transistor 7. In the configuration of the third embodiment, since the gate voltage of the MOS transistor 7 can be controlled, the low level of the output terminal 9 can be controlled. As a result, as illustrated in
In a case where a voltage waveform as illustrated in
Number | Date | Country | Kind |
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JP2017-229802 | Nov 2017 | JP | national |
Filing Document | Filing Date | Country | Kind |
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PCT/JP2018/041424 | 11/8/2018 | WO | 00 |
Publishing Document | Publishing Date | Country | Kind |
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WO2019/107102 | 6/6/2019 | WO | A |
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20070257724 | Suzuki | Nov 2007 | A1 |
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English Translation of International Search Report, PCT/JP2018/041424 dated Feb. 26, 2019, 2 pgs. |
Number | Date | Country | |
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20210409012 A1 | Dec 2021 | US |